Options & Additional Models

In addition to our core X-ray inspection systems — X-7100, X-7900, X-9200, and X-9200K — SemiStar offers additional configurations, accessories, and specialized X-ray models to support a wider range of inspection and research requirements.

Overview

• Additional X-ray system configurations for different penetration, resolution, and sample size requirements
• Optional detector, software, and stage configurations for more specialized applications
• Application-oriented accessories to improve flexibility and ease of use
• Additional X-ray models available for customers with unique inspection needs

Options

• Detector Configurations
  Different detector resolutions and imaging configurations may be available depending on the application and selected system.
• X-ray Source Configurations
  Alternative voltage and source configurations may be available to better match inspection depth, material density, and image detail requirements.
• Stage & Motion Configurations
  Optional stage sizes, motion ranges, and sample handling arrangements may be available for different sample formats and inspection workflows.
• Software & Imaging Functions
  Additional image processing, measurement, analysis, and application-oriented software functions may be available depending on the selected platform.

Accessories

• Sample Holders & Fixtures
  Accessories may be available to support different sample types, improve positioning, and enhance inspection repeatability.
• Application-Specific Tooling
  Optional tooling may be available for specialized inspection tasks in semiconductor, electronics, advanced materials, and research environments.
• Safety & Support Components
  Supporting components and optional accessories may be provided depending on system configuration and customer requirements.

Additional Models

• Specialized X-ray Inspection Systems
  Additional models may be available for customers requiring different platform sizes, inspection capabilities, or application-specific configurations.
• Compact Lab-Oriented Systems
  Certain models may be suitable for smaller laboratories, universities, and research facilities with limited space or lighter inspection requirements.
• Higher Capability / Customized Systems
  Additional models may be available for users requiring enhanced penetration, larger handling range, or more specialized analysis capability.

Positioning

This page is intended to show that SemiStar can support more than the standard 4-model lineup. For customers with special inspection needs, additional options, accessories, and specialized models may be available to provide a better technical fit.

How We Recommend the Right Configuration

• Application Type
  Inspection needs vary depending on whether the system is used for semiconductor devices, advanced materials, electronics assemblies, batteries, or research samples.
• Material Density & Thickness
  Different applications may require different X-ray penetration capabilities and detector performance.
• Sample Size & Handling
  Stage size, motion range, and fixture requirements can affect the most suitable system selection.
• Image Detail Requirement
  Resolution, magnification, and software functions should be matched to the level of analysis needed.

Availability in North America

SemiStar Corp. provides sales support, application guidance, and service coordination in North America for core X-ray systems as well as selected additional configurations and specialized models.

* Product configurations, accessories, and additional models may vary depending on availability and application requirements. Please contact SemiStar for current options and official technical details.