Description
Universal X-RAY X-7100 Inspection System
The X-7100 X-ray Inspection System is a compact and cost-effective X-ray inspection solution designed for universities, research institutes, and research laboratories requiring reliable internal structure inspection, failure analysis, and material evaluation. It is an affordable research X-ray inspection system for academic and laboratory users who need practical inspection capability with a lower capital investment.

Key Features
- 90 kV X-ray inspection system for research and laboratory applications
- Hamamatsu X-ray tube and Iray Technology flat panel detector
- Compact platform with 540 × 540 mm stage size
- Suitable for BGA, PCB, electronic components, semiconductor devices, and material samples
- Cost-effective solution for universities and research laboratories
Strong Selling Points
- Affordable Research X-ray Inspection Solution
The X-7100 is mainly recommended for universities and research labs requiring reliable X-ray inspection capability with an affordable investment. - Premium Core Components
The system uses a Hamamatsu X-ray tube and Iray Technology flat panel detector to support stable imaging and dependable operation. - Compact and Lab-Friendly Platform
With a 540 × 540 mm platform, the X-7100 fits many research environments while still supporting a wide range of samples. - Good Fit for Academic Comparison and Evaluation
The system is suitable for academic users comparing X-ray inspection solutions for internal structure analysis, defect review, and failure analysis. - Practical Entry Model
The X-7100 is positioned as the entry model in SemiStar’s X-ray inspection lineup, suitable for routine inspection and R&D applications.
Applications
- BGA and solder joint inspection

X-ray tube

Detector
- PCB and electronic component inspection
- Semiconductor device evaluation
- Advanced materials and research sample analysis
- Failure analysis and internal defect inspection
- University and laboratory X-ray inspection applications
Positioning
The X-7100 is the entry-level model in SemiStar’s X-ray inspection lineup and is mainly recommended for universities, research institutes, and research laboratories requiring an affordable and practical X-ray inspection solution for research and internal structure analysis applications.
Specifications
| Category | Item | Specification |
| X-ray Source | Model | X-7100 |
| Tube Type | Enclosed type | |
| Tube Voltage | 90 kV | |
| Tube Current | 200 μA | |
| Imaging | Spatial Resolution | 5 μm |
| Optical / System Magnification | 250X / 1000X | |
| Detector Resolution | 1536 × 1536 pixels | |
| A/D Density Value | 16 bit (65536) | |
| Frame Frequency | 20 FPS | |
| Image Taking Type | Flat-panel digital | |
| Stage / Inspection | Stage Size | 540 × 540 mm |
| Detection Range | 510 × 510 mm | |
| Load-bearing | ≤10 kg | |
| Detector Rotation Angle | 60° | |
| Stage Movement | Automatic / manual | |
| System | Operating System | Windows 11 |
| Power Supply | AC110–220V, 50–60Hz | |
| Power | 1200W | |
| Radiation Safety Test | <1 μSv/h | |
| Machine Size | 1102 × 1360 × 1602 mm (L × W × H) | |
| Machine Size Including Monitor | 1607 × 1903 × 1957 mm (L × W × H) | |
| Machine Weight | 950 kg |
* Specifications are for reference only and may vary depending on configuration. Please contact SemiStar or the manufacturer for official specifications.
Looking for stronger penetration, higher resolution, or 3D/CT capability?
Compare X-7100 with X-7900 / X-9200 / X-7900 ULTRA →
