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Universal X-RAY X-7100

Description

Universal X-RAY X-7100 Inspection System

The X-7100 X-ray Inspection System is a compact and cost-effective X-ray inspection solution designed for universities, research institutes, and research laboratories requiring reliable internal structure inspection, failure analysis, and material evaluation. It is an affordable research X-ray inspection system for academic and laboratory users who need practical inspection capability with a lower capital investment.

Designed for: Universities | Research Institutes | Research Labs | Semiconductor & Advanced Materials Inspection

Universal X-RAY X-7100 Inspection System

Key Features

  • 90 kV X-ray inspection system for research and laboratory applications
  • Hamamatsu X-ray tube and Iray Technology flat panel detector
  • Compact platform with 540 × 540 mm stage size
  • Suitable for BGA, PCB, electronic components, semiconductor devices, and material samples
  • Cost-effective solution for universities and research laboratories

Strong Selling Points

  • Affordable Research X-ray Inspection Solution
    The X-7100 is mainly recommended for universities and research labs requiring reliable X-ray inspection capability with an affordable investment.
  • Premium Core Components
    The system uses a Hamamatsu X-ray tube and Iray Technology flat panel detector to support stable imaging and dependable operation.
  • Compact and Lab-Friendly Platform
    With a 540 × 540 mm platform, the X-7100 fits many research environments while still supporting a wide range of samples.
  • Good Fit for Academic Comparison and Evaluation
    The system is suitable for academic users comparing X-ray inspection solutions for internal structure analysis, defect review, and failure analysis.
  • Practical Entry Model
    The X-7100 is positioned as the entry model in SemiStar’s X-ray inspection lineup, suitable for routine inspection and R&D applications.

Applications

  • BGA and solder joint inspection

    X-ray tube

    Detector

  • PCB and electronic component inspection
  • Semiconductor device evaluation
  • Advanced materials and research sample analysis
  • Failure analysis and internal defect inspection
  • University and laboratory X-ray inspection applications

Positioning

The X-7100 is the entry-level model in SemiStar’s X-ray inspection lineup and is mainly recommended for universities, research institutes, and research laboratories requiring an affordable and practical X-ray inspection solution for research and internal structure analysis applications.

Specifications

Category Item Specification
X-ray Source Model X-7100
Tube Type Enclosed type
Tube Voltage 90 kV
Tube Current 200 μA
Imaging Spatial Resolution 5 μm
Optical / System Magnification 250X / 1000X
Detector Resolution 1536 × 1536 pixels
A/D Density Value 16 bit (65536)
Frame Frequency 20 FPS
Image Taking Type Flat-panel digital
Stage / Inspection Stage Size 540 × 540 mm
Detection Range 510 × 510 mm
Load-bearing ≤10 kg
Detector Rotation Angle 60°
Stage Movement Automatic / manual
System Operating System Windows 11
Power Supply AC110–220V, 50–60Hz
Power 1200W
Radiation Safety Test <1 μSv/h
Machine Size 1102 × 1360 × 1602 mm (L × W × H)
Machine Size Including Monitor 1607 × 1903 × 1957 mm (L × W × H)
Machine Weight 950 kg

* Specifications are for reference only and may vary depending on configuration. Please contact SemiStar or the manufacturer for official specifications.

Explore Higher Performance Options
Looking for stronger penetration, higher resolution, or 3D/CT capability?
Compare X-7100 with X-7900 / X-9200 / X-7900 ULTRA →

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