Description
Explore Higher Performance Options
Looking for stronger penetration or higher resolution?
Compare X-7100 with X-7900 / X-9200 / X-9200K →
Looking for stronger penetration or higher resolution?
Compare X-7100 with X-7900 / X-9200 / X-9200K →
Universal X-RAY X-7100 Inspection System (Brochure)
The X-7100 X-ray Inspection System is a compact and cost-effective solution designed for high-quality internal structure inspection. It is particularly suitable for universities, research institutes, and compound semiconductor labs requiring reliable imaging capability for analysis, failure investigation, and material research.
Designed for: Universities | Research Institutes | Compound Semiconductor Labs (GaN, SiC, III-V)
Key Features
- High-quality X-ray source and digital detector for stable imaging performance
- Compact footprint, ideal for laboratory and cleanroom environments
- User-friendly operation for both researchers and engineers
- Reliable system design with low maintenance requirements
Strong Selling Points
- Optimized for R&D Applications
Designed for flexible use in research environments including failure analysis and prototype validation. - Premium Core Components
Equipped with Hamamatsu X-ray tube (Japan) and high-resolution detector for long-term stability and consistent imaging. - Excellent Cost-Performance
Delivers performance comparable to major brands at a significantly lower investment cost. - Compact & Lab-Friendly Design
Small footprint ideal for universities and shared lab facilities. - Wide Application Coverage
Supports inspection of BGA, semiconductor devices, advanced materials, and internal defects.
Applications
- Failure analysis and defect inspection
- Compound semiconductor evaluation (SiC, GaN)
- Advanced materials research
- Electronic component and PCB inspection
- R&D laboratory analysis
Positioning
The X-7100 is an entry-level X-ray inspection system designed for research-focused users, offering a strong balance between performance, reliability, and cost.
Specifications
| Category | Item | Specification |
| X-ray Source | Tube Type | Closed micro-focus X-ray tube |
| Voltage | 90 kV | |
| Brand | Hamamatsu (Japan) | |
| Detector | Type | Flat panel detector |
| Resolution | High resolution digital imaging | |
| Brand | Iray Technology | |
| Imaging | Magnification | Geometric + digital magnification |
| Resolution Capability | Up to micron-level (depending on configuration) | |
| Image Processing | Real-time digital imaging and analysis | |
| Sample Stage | Max Sample Size | Up to 510 × 510 mm |
| Movement | Motorized multi-axis stage | |
| System | Type | Closed cabinet X-ray system |
| Control | PC-based control system | |
| Safety | Radiation shielding with safety interlock | |
| Applications | Typical Use | BGA, semiconductor devices, advanced materials, PCB inspection |
* Specifications are for reference only and may vary depending on configuration. Please contact SemiStar or the manufacturer for official specifications.
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