Description
X-RAY INSPECTION SYSTEMS COMPARISON
X-7100
X-7900
X-9200
X-9200K
SemiStar provides a focused X-ray inspection product line for universities, research institutes, compound semiconductor labs, and advanced material fabs in North America. The comparison below helps users quickly identify the most suitable system based on penetration capability, sample size, resolution, and application focus.
Product Line: X-7100 | X-7900 | X-9200 | X-9200K
Model Comparison
| Item | X-7100 | X-7900 | X-9200 | X-9200K |
| Positioning | Entry-level research and lab inspection | Mid-to-high level advanced inspection | Large-sample inspection platform | High-end deep penetration system |
| Best For | Universities, research labs, budget users | Institutes, compound semiconductor labs | Large samples, specialized inspection | SiC, GaN, power devices, dense materials |
| X-ray Tube Voltage | 90 kV | 130 kV | 110 kV | 160 kV |
| Spatial Resolution | Up to 5 μm | 3 μm | 5 μm | Micron-level |
| Stage / Sample Size | Up to 510 × 510 mm | 540 × 540 mm | 1700 × 1000 mm | Multi-axis stage |
| Main Advantage | Best value | Higher resolution | Large sample support | Max penetration |
Which Model Should You Choose?
- X-7100 – economical solution for routine inspection
- X-7900 – advanced resolution and broader applications
- X-9200 – large sample inspection
- X-9200K – high-end deep penetration applications
* Specifications are for reference only and may vary depending on configuration. Please contact SemiStar or the manufacturer for official specifications.
SS11139
