Description
Equipment Model: HITACHI S-4500 Type II Scanning Electron Microscope (SEM) with EDX
- Cold emission FEG
- 0.5KV – 30KV
- 1.5mm @ 15KV
- 4.0nm @ 1KV
- 6″ load dock
- Type 2 stage manual, electric
- 5-axis manual stage
- Stage XY range: 100mm x 50mm
- 25mm Z-
- -5 to +60 tilt
- Diffusion pump and mechanical pumps
- Chiller
- Compressor
- Transformer
- EDX system included
Maker: Hitachi
Condition: We sell it at (1) AS IS,WHERE IS. (2) Complete, working, functional test.
Price: Contact Us by filling the bottom form. Pls specify the condition you are going to buy at
Quantity: 1 set
Valid Time: Subject to prior sale without notice. This Item is only for end user. Appreciate your time.
Location: SS380EB
Pls contact us for the availability for the following items. These are only for end users and are subject to prior sale without notice. Appreciate your time.
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26 | FEI Company 18634-D Power Supply PCB Card BIAS,FPS XL 830 DualBeam FIB-SEM |
27 | FEI Company 4022 192 9350 Power Supply PCB Card SEM EDCU CLM-3D |
28 | FEI Company 4022 262 26331 CLM Column SEM Assembly CLM-3D 4022 268 00581 |
29 | FEI COMPANY 4022 262 76171 FEI05A SEM Controller |
30 | FEI Company 4022.192.57903 Backplane Board PCB XL 830 DualBeam FIB-SEM |
31 | FEI Company 4022.192.70072 Processor PCB Card MOB 7007 XL 830 FIB-SEM |
32 | FEI Company 4022.192.70072 Processor PCB Card MOB XL 830 DualBeam FIB-SEM |
33 | FEI Company 4022.192.70081 Processor PCB Card MIB XL 830 DualBeam FIB-SEM |
34 | FEI Company 4022.192.70094 Processor PCB Card HRDS 7009 XL 830 FIB-SEM |
35 | FEI Company 4022.192.70141 Processor PCB Card MDAC XL 830 DualBeam FIB-SEM |
36 | FEI Company 4022.192.71511 Processor PCB Card QDCR 7151 XL 830 FIB-SEM |
37 | FEI Company 4022.192.7213 Processor PCB Card HVG/D XL 830 DualBeam FIB-SEM |
38 | FEI Company 4022.192.72181 Processor PCB Card LNSA XL 830 DualBeam FIB-SEM |
39 | FEI Company 4022.192.9119 Backplane Board PCB 4022.199.70352 XL 830 FIB-SEM |
40 | FEI Company 4022.192.91281 Interface Relay PCB Card MRSF 1 XL 830 FIB-SEM |
41 | FEI Company 4022.192.91343 Processor PCB Card DDCB XL 830 DualBeam FIB-SEM |
42 | FEI Company 4022.192.9204 Processor PCB Card UDTB/N XL 830 FIB-SEM |
43 | FEI Company 4022.199.45262 Power Supply PCB Card LHN/2 XL 830 FIB-SEM |
44 | FEI Company 4022.199.66793 Processor PCB Card DLCB/SN XL 830 FIB-SEM |
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47 | FEI COMPANY SEM P/N 4022 192 71332 Board |
48 | FEI COMPANY SEM P/N 4022 192 71661 Board |
49 | FEI COMPANY SEM P/N 4022 192 7235 MDLN/I Board |
50 | FEI COMPANY SEM P/N 4022 192 9161 QDCR/SN Board |
51 | FEI COMPANY SEM P/N 4022 192 9270 Board |
52 | FEI COMPANY SEM P/N 4022 192 9297 Board |
53 | FEI COMPANY SEM P/N 4022 192 9316, 4022 262 1583 SCDR3 Board |
54 | FEI COMPANY SEM P/N 4022 296 0048 HTRB Board |
55 | FEI EXPIDA 1255 SEM, 4022 192 9694, 4022 192 8694 |
56 | FEI EXPIDA 1255 SEM, CHAB 4022 192 9603, 4022 192 9615 |
57 | FEI EXPIDA 1255, FEI Stainless Steel SEM Flange |
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60 | FEI Philips 4022 192 71192 FMSP board SEM Scanning Electron Microscope |
61 | FEI Philips 4022 192 71251 QDCA board SEM Scanning Electron Microscope |
62 | FEI Philips 4022 192 71511 Board Electron Microscope SEM |
63 | FEI Philips 4022 192 71511 Electron Microscope SEM Board |
64 | FEI Philips 4022 197 9476 SEM Scanning Electron Microscope Board 4022 192 7111 |
65 | FEI Philips DBTR board SEM Scanning Electron Microscope 4022 192 71121 |
66 | FEI Philips NLIM Board 4022 192 70382 Scanning Electron Microscopes (SEM) |
67 | FEI Philips XL 30 ADC EDAX Board 4035 007 076 SEM Scanning Electron Microscope |
68 | FEI Philips XL 30 Board 4035 007 007 ADC SEM Scanning Electron Microscope |
69 | FEI Philips XL 30 EDAX Board 4035 006 1610 SEM Scanning Electron Microscope |
70 | FEI Philips XL 30 EDAX Board 4035 006 1630 SEM Scanning Electron Microscope |
71 | FEI Philips XL 30 EDAX Board 4035 006 1640 SEM Scanning Electron Microscope |
72 | FEI Philips XL 30 EDAX Board 4035 006 1700 SEM Scanning Electron Microscope |
73 | FEI Philips XL 30 EDAX Board 4035 065 1510 SEM Scanning Electron Microscope |
74 | FEI Philips XL 30 EDAX SEM Defusion Vacuum Pump |
75 | FEI Philips: FMSP board for Scanning Electron Microscope (SEM) 4022 192 71193 |
76 | FEI Philips: MCCB board for Scanning Electron Microscope (SEM) |
77 | FEI Phillips 4022 192 70631 DCA Scanning Electron Microscope (SEM) |
78 | FEI Phillips MOB Board 4022 192 70072 Scanning Electron Microscope (SEM) |
79 | FEI Phillips PVG 4022 192 71382 Scanning Electron Microscope (SEM) |
80 | FEI Phillips PVG Scanning Electron Microscope (SEM) 4022 192 71382 |
81 | FEI Phillips Scanning Electron Microscope (SEM) SCB 4022 192 71791 |
82 | FEI PVG/SEM 4022 192 71382 |
83 | FEI SEM – 7 Servicing valve / CIV (Column Isolation Valve) for FEI microscopes |
84 | Fei SEM TEM Maxon DC Motor Red Plastic Cap 5322-695-15857 4022-199-5200.1 |
85 | FEI Unmarked FIB-SEM Column Assembly Ion Beam 545-220-2 Varian Nobel Diode |
86 | FEI XL830 4022 262 3171 Dualbeam Workstation SEM/FIB Power Supply FEI XL-830 |
87 | FEI/Philips/Thermo 4022.262.43531/16830 FIB/SEM High Tension (HT) Cap & Cable |
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89 | Frencken Mechatronics 4022 261 90802 SE Detector FEI Company 4022 268 02045 SEM |
90 | Hitachi 6800 CPU Plug-In Board 986-0680C for Scanning Electron Microscope System |
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94 | Hitachi S-3200N Scanning Electron Microscope Repair Part – VALVE & MOTOR |
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96 | Hitachi S-3200N Scanning Electron Microscope Repair Part with 2 Boards & mount |
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117 | Jeol JSM-6700F Field Emission Scanning Electron Microscope Edax Detector |
118 | JEOL JSM-7000F Field Emission Scanning Electron Microscope |
119 | JEOL Scanning Electron Microscope Adapter |
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124 | Philips / FEI – SEM TEM FIB DCEM VPA & HV CTRL Board Card 4022-192-35261 27021 B |
125 | Philips / FEI – SEM TEM FIB HV Power Supply Board Card 4022-192-7145 |
126 | Philips / FEI – SEM TEM FIB MICRION 9000 Colcon Analog Drive PCB 150-001080 |
127 | Philips / FEI Electron Microscope SEM Parts : XL-30 or XL-40 STPB PCB |
128 | Philips / FEI SEM Electron Microscope Parts : XL-30 or XL-40 FYHG PCB |
129 | Philips / FEI SEM Electron Microscope Parts : XL-30 or XL-40 FYHG PCB |
130 | Philips / FEI SEM Electron Microscope Parts : XL-30 or XL-40 SYNG/XL PCB |
131 | Philips 4022.192.71781 Processor PCB Card PLCB 2 FEI Company XL 830 FIB-SEM |
132 | Philips EM301 Operating Instruction Manual Em 301 Scanning Electron Microscope |
133 | Philips EM301 Pumping System Manual For Em 301 Scanning Electron Microscope |
134 | Philips EM301 Service Manual For Em 301 Scanning Electron Microscope PE6002 |
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136 | Philips FEI 4022 260 59601 500 microns aperture SEM |
137 | Philips FEI PCB Power Supply SEM Electron Microscope 4022-197-97752 |
138 | Philips FEI XL-30 4022-197-92313 IGP U F1 SA Slow SEM Electron Microscope |
139 | Philips FEI XL-30 4022-197-99122 Secondary Electron Detector SEM |
140 | Philips FEI XL-30 CCD Inspection Camera Head SEM Electron Microscope |
141 | Philips FEI XL-30 Philips SEM Scanning Electron Microscope Column Chamber Part 2 |
142 | Philips FEI XL-30 PW 6848/00 Current Detector SEM Electron Microscope |
143 | Philips PW6343 9432 063 43011 Autotransformer FEI Mains Matching Em201 SEM501 XL |
144 | Philips/FEI MICRION 9000 Servo Cont -SEM TEM FIB PCB Card Assy No.150-001981 |
145 | Philips/FEI XL 30S FEG SEM Scanning Electron Microscope EDAX EDS |
146 | Philips/FEI XL 30S FEG SEM Scanning Electron Microscope EDAX EDS |
147 | Philips/FEI-SEM TEM FIB Back Scatter Detector Amplifier-6 Channel 4022 262 4 |
148 | Philips/FEI-SEM TEM FIB PC Servo-Axis Board Card P/N 10889-69002 |
149 | Phillips / FEI SEM Current Detector Type PW 6844 / 02 |
150 | Physical Electronics SuperSAM *VINTAGE* PHI Scanning Auger Electron Microscope |
151 | quandrant Backscatter Detector from Cambridge Scanning Electron Microscope |
152 | replace SEM scanning electron microscope (FEI / Zeiss) sample stage |
153 | replace SEM Scanning Electron Microscope (FEI/Zeiss) sample stage Groove Nai |
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155 | RHK Technology Model STM 100 Scanning Tunneling Microscope Control Electronics |
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157 | Scanning Electron Microscope (SEM) 4022 192 71241 EBD FEI Phillips Board |
158 | Scanning Electron Microscope (SEM) FEI Phillips Board 4022 192 72111 |
159 | Scanning Electron Microscope (SEM) FEI Phillips Board 4022 192 72111 |
160 | Scanning Electron Microscope SEM 4022 192 71331 EBD FEI Phillips Board |
161 | Tabletop Scanning Electron Microscope SEM |
162 | Topcon sm-300 Scanning Electron GUN Microscope SEM Evex Ulvac Adixen Vacuum Pump |
163 | Zeiss / LEO SEM Scanning Electron Microscope Stage Dovetail 36mm D 6mm Height |
164 Hitachi S-806 Field Emission Scanning Electron Microscope FE SEM HITACHI
165 Hitachi S-4500 Scanning Electron Microscope (SEM) Type II, With EDX
166 Hitachi S-806 Field Emission Scanning Electron Microscope FE SEM HITACHI
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168 JEOL JSM-5610 Scanning Electron Microscope, .5-30kV, X18-X300,000, 3.0nm, 200VAC
169 JEOL JSM-6360 Scanning Electron Microscope SEM SCANNING ELECTRON MICROSCOPE
170 Jeol JSM 7000F SEM Field Emission Scanning Electron Microscope Nice
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172 Hitachi S-520 SEM Scanning Electron Microscope
173 High-speed Microscope VW-9000 series KEYENCE + VW-6000C
174 ISI-SX-40 SEM Scanning Electron Microscope
175 JEOL JSM-6400 F SEM, scanning electron microscope
176 ASPEX PSEM PERSONAL SEM SCANNING ELECTRON MICROSCOPE P/N 40P01236
177 Denton Vacuum II Sputter / Sample Coater SEM Sample Prep
178 AMRAY 1820 1820D SEM SCANNING ELECTRON MICROSCOPE
179 JEOL JSM-6400F SEM Scanning Electron Microscope Column Assembly
180 Bausch & Lomb LE 2100 Nanolab SEM Scanning Electron Microscope
181 Jeol JWS-7855S SEM Mask Observation Scanning Microscope Main/Operation Consoles
182 Jeol JWS-7505 Wafer Inspection System Tilt SEM Scanning Electron Microscope
183 Jeol JSM-5200 Laboratory/Ind
184 Zeiss Leo 1450 Scanning Electron Microscope Microspec WDX-2A Leo SEM
185 FISCHIONE 1020 PLASMA CLEANER SEM/ TEM/ STEM
186 Hitachi S-520 Scanning Electron Microscope SEM & Inspection System
187 JEOL JSM 840 Microscope SEM Complete Working
188 Denton Desk V Standard Sputter Coater for SEM Samples
189 Leica Cambridge Instruments S 360FE SEM Scanning Electron Microscope Camscan
190 Etec SEM Scanning Electron Microscope System crystal detectors
191 IVS IVS200 SEM Vacuum Chamber XY Positioining Stage Dual Varian Ion Pump
192 SEM Hitachi S-520LB goniometric 6-axis stage XRF X-ray
193 LEICA BAL-TEC MED 020 HIGH-VACUUM CARBON/SPUTTER COATER w QSG 060 QUARTZ SEM/TEM
194 RJ LEE INSTRUMENTS ASPEX PSEM 2 PERSONAL SEM SCANNING ELECTRON MICROSCOPE
195 Denton Vacuum Desk II Self-contained Cool Sputter Coater for SEM Samples
LOCATION: SS380EB
All the used equipment trademarks belongs to the O.E.M. , the original equipment manufacturer. All rights reserved. -SS380EBFSM-199