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CDE ResMap 178 Four Point Probe

CDE ResMap 178 Four Point Probe

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CDE ResMap 178 Four Point Probe

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ResMap Four Point Probe

  • Model: CDE ResMap 178
  • Feature: Manual load “baby”
  • Wafer size: 2”-8” Manual load
  • Max round sample: 8.2” φ , Max square sample:5.8”x5.8”
  • Maximum throughput: 1min/wafer, (49pints)
  • MeasurementRange   1mΩ/☐ to 10MΩ/☐
  • Accuracy    0.5%
  • Repeatability       0.02% static, 0.1% dynamic
  • Repeatability       Measurement unit size: 12”W x 10”H x 18”D
  • Condition: Working. “AS IS”.
  • Availability: Subject to prior sale without notice. Appreciate your time!
  • Full functional unit Included: Measurement unit, computer, Keyboard/mouse,monitor.
  • FOB: Morgan Hill,CA USA.

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