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NanoSpec 3000

Category: Metrology Probe Tag: Nanometrics

Description

Description

NanoSpec 3000 Nanometrics Nanospec Thin Film Thickness System

Condition: Great condition. We sell this item at Complete, working, functional test

Quantity:1 set

These are subject to prior sale. These are only for end user. Appreciate your time.

The trademarks of the equipment and parts contained in this website belonged to the Original Equipment Manufacturers.

Info below is from OEM for your reference only.

The NanoSpec 3000 is a film thickness measurement system that utilizes a modern small spot spectroscopic reflectometer that is built on a simple-to-use tabletop platform.
The Nanospec 3000 Film Thickness Measurement System (AFT) utilizes non-contact, spectro-reflectometry to determine the thickness and refractive index of transparent films on substrates
System Features & Capabilities:
– Continuous scanning from 400 – 800nm
– Measurements as small as 100A up to 20um with a resolution of 50A
– Measurements down to 100nm in diameter at 40X objective
– Measurement spot size of 25um
– Measures up to 3 films on substrate
– Can support up to 200 different programs or recipes.
– Measurement time is less than 3 seconds
– Maximum film thickness measurable is 30um.
– Processes up to 6″/150mm wafers.
– Database storage of measurements
– Data Management – Statistics, Histogram & Mapping, Print & Export

System Configuration:
– Olympus 10x objective
– 10x eyepiece
– Computer, Monitor, Keyboard, Trackball and Software included
– Voltage Regulator and Line Conditioner
– Original Manuals and Documentation

SS9127W

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