Description
Panalytical X’Pert Pro.
ID-OEM-1-SS10045
Condition: Complete, working, functional test.
Location: Xian City, Shanxi Province, China.
Description of the system from the owner for your reference.
- With mainly configuration: Cradle(5-Axis X Y Z CHI PHI)
- parallel beam Mirror
- parallel beam collimator
- Xe detector
- Can be used for film phase ; fil thickness ; stress measurement.
- With software Data collector for measurement
- software high score for phase analysis
- software reflectivity for film thickness analysis
- without software for stress analysis
Lead time: 6 to 10 weeks
Valid Time: Subject to prior sale.
Pls contact us for the following availability. They are only for end users. They are subject to prior sale. Appreciate your time.
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