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Universal X-RAY X-9200

Description

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Large X-RAY equipment_X-9200 Inspection System

The X-9200 X-ray Inspection System is designed for customers requiring inspection of larger samples with stable imaging performance and a larger working stage. It is well suited for universities, research institutes, compound semiconductor fabs, and advanced materials users who need reliable X-ray analysis for large-format samples, research evaluation, and failure analysis.

Designed for: Universities | Research Institutes | Compound Semiconductor Labs (GaN, SiC, III-V) | Large-Sample R&D Applications

Universal X-RAY equipment_X-9200

Key Features

  • Large 1700 × 1000 mm stage for oversized sample inspection
  • Closed X-ray tube design with 110 kV standard voltage
  • 5 μm spatial resolution for detailed internal structure analysis
  • 250X geometric magnification and 1500X system magnification
  • 1300 × 1100 digital flat panel detector with 14-bit imaging

Strong Selling Points

  • Designed for Large Samples
    The X-9200 is built with a large-size stage that can accommodate a variety of larger samples for X-ray inspection, making it suitable for labs and customers working with oversized components or assemblies.
  • Stable Imaging for Research and Inspection
    With 5 μm spatial resolution, 30 FPS image speed, and digital flat panel imaging, the system supports stable and efficient defect analysis and structure evaluation.
  • Flexible for Advanced Materials and Semiconductor Research
    The X-9200 fits universities, institutes, and advanced material fabs that need larger inspection capacity without moving to a more complex industrial CT platform.
  • Large Working Area with Broad Motion Range
    The 1700 × 1000 mm stage and 1700 × 700 mm X-Y stroke provide strong flexibility for different sample sizes and inspection tasks.
  • Balanced Capability for Specialized Applications
    This model is especially attractive for users who need larger sample handling, strong imaging performance, and a cost-effective solution for research and specialized inspection work.

Applications

  • Large-sample internal defect inspection
  • LED hard light bar testing
  • Advanced materials and component analysis
  • Semiconductor and compound material research
  • Laboratory evaluation and failure analysis

Positioning

The X-9200 is a large-stage X-ray inspection system designed for research-focused and specialized users who need to inspect larger samples while maintaining stable image quality, practical magnification, and efficient operation.

Specifications

Category Item Specification
X-ray Source Model X-9200
Tube Type Closed
Tube Voltage 110 kV (optional 100 / 90 kV)
Tube Current 800 μA
Imaging Spatial Resolution 5 μm
Geometric Magnification 250X
System Magnification 1500X
Image Speed 30 FPS
Support Rotation Angle 360°
Detector Detector Type Digital flat panel detector
Detector Resolution 1300 × 1100 px
Density Value 14 bit (16348)
Stage / Inspection Stage Size 1700 × 1000 mm
X-Y Stroke 1700 × 700 mm
Examination Range 1180 × 580 mm
Scope of Application Large samples for testing
System Machine Size 1250 × 1740 × 1750 mm (L × W × H)
Machine Weight 1400 kg
Operating System Windows 7 / Windows 10
Power Supply AC110–220V, 50–60Hz
Power 1200W
Radiation Safety Test < 1 μSv/h

* Specifications are for reference only and may vary depending on configuration. Please contact SemiStar or the manufacturer for official specifications.

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