Used Semiconductor Equipment Metrology

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Please contact us for the availability of the used semiconductor equipment Metrology:

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Location: U.S.A.

Olympus MX50A-F with Al100-L6

Nanometrics 210 Nanospec AFT 

Tencor M-Gage 200

NanoX-2000 Introduction

Veeco Bruker Wyko SP9900

 

 

The items are subject to prior sale without notice. These items are only for end users.

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