Main Maker

Metrology SEM Microscope


The following Metrology SEM Microscope Equipment are only for end user. Please contact us if you have any questions. Subject to prior sale without notice. Appreciate your time!

Condition: Used.

Location: USA

More Info: Pls email us with your company name, location, website, company email address and RFQ in detail if possible.

1 Accent Bio-Rad Q5 Registration System
2 Accent Bio-Rad Q8 Registration Tool
3 Caltex Systems Microscope
4 Coating Management Instruments (CMI) XRX-X4 X-Ray System
5 Jeol JSM-6400F Scanning Microscope
6 Jeol JSM-6400F Scanning Microscope
7 KLA Tencor P-1 Profiler
8 KLA Tencor Surfscan 6200 Surface Defect Inspection System
9 KLA-Tencor 2138XP Surface Inspection System
10 KLA-Tencor 5100 Overlay Registration System
11 KLA-Tencor AIT I Patterned Surface Defect Inspection System
12 KLA-Tencor Alpha-Step 200 Surface Profiler
13 KLA-Tencor ASET F5x Thin Film Measurement System
14 KLA-Tencor FLX-2320 Film Stress Measurement System
15 KLA-Tencor P-10 Surface Profiler
16 KLA-Tencor P-15 Long Scan Profiler
17 KLA-Tencor Prometrix RS55/tc Four Point Probe System
18 KLA-Tencor Prometrix RS55/tca Four Point Probe System
19 KLA-Tencor Prometrix UV-1050 Thin Film Measurement System
20 KLA-Tencor SP1 TBI Unpatterned Surface Inspection System
21 KLA-Tencor Surfscan 4000 Inspection System
22 KLA-Tencor Surfscan 4500 Inspection System
23 KLA-Tencor Surfscan 5000 Inspection System
24 KLA-Tencor Surfscan 6200 Defect Inspection System
25 KLA-Tencor Surfscan 6220 Defect Inspection System
26 KLA-Tencor Surfscan 6400 Defect Inspection System
27 KLA-Tencor Surfscan 6420 Defect Inspection System
28 Nikon Optiphot 200 Inspection Microscope
29 Plasmos SD-4000 Ellipsometer
30 Seiko SMI3050SE-FIB-SEM Dual Beam Microscope
31 SPEA C320-MX Semiconductor Tester w/ M300 Manipulator
32 Veeco Dimension 3000 AFM System
33 Veeco Instruments Dektak 3030 Profiler
34 Wentworth MP-1000A Manual Probe Station
35 Zygo NewView 5000

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