Description
The following “Semiconductor Equipment Parts” are only for end user. Please contact us if you have any questions. Subject to prior sale without notice. Appreciate your time!
- HP/AGILENT 4156C SEMICONDUCTOR PARAMETER ANALYZER with 41501B SMU AND PULSE GENERATOR EXPANDER.4156C Precision Semiconductor Parameter Analyzer with Add On 41501B SMU AND PULSE GENERATOR EXPANDER. The Keysight 4156C Precision Semiconductor Parameter Analyzer is a highly accurate laboratory bench top solution for advanced device characterization. The 41501B Expander extends your capabilities to 1A/200V, and add a low noise ground unit and dual pulse generators on the 4156C
General features
Highly accurate laboratory bench top parameter analyzer for advanced device characterization
4x High-resolution SMU, 2xVSU and 2xVMU
Fill-in-the blanks front panel operation
Includes Desktop EasyEXPERT software for PC-based GUI instrument control
Measurement capabilities
1 femtoamp and 0.2 microvolt measurement resolution
QSCV, Stress Mode, Knob-sweep, Stand-by function
+/- 200 Volts and +/- 1 Amp High-Power SMU, Pulse Generator capabilities available by optional 41501B
Add on: Keysight 41501B SMU AND PULSE GENERATOR EXPANDER The Keysight 41501B SMU and Pulse Generator Expander unit is available to augment the measurement capabilities of the 4155C and 4156C. The 41501B plugs into the rear of the 4155C/4156C, and its additional measurement resources are automatically recognized by the 4155C/4156C during boot-up. These additional resources appear in the 4155C/4156C “Channels: Channel Definition” page and they are treated exactly the same as the measurement resources of the 4155C/4156C.
The 41501B PGUs can be used with the 16440A SMU/PGU selector to perform Write/Erase endurance testing on Flash memory cells and other types of non-volatile memory cells.
The 41501B HPSMU can source/sink up to 1 A of current and supply up to +/-200 V of voltage.
General features
Flexible resource expander unit for the 4155C and 4156C
2 pulse generator units (PGUs) are available as an option
1 high-power SMU or 2 medium-power SMUs are available as an option
1.6A ground unit included in all 41501B configurations - HP/Agilent 4142B DC Supply Mainframe and HP MODULAR DC SOURCE/ MONITOR. Modular DC Source/Monitor The HP 4142B has a wide measurement range with high resolution and excellent sensitivity. A user-definable system component, allows you to build a custom configuration to suit your measurement needs. The Agilent / HP 4142B Modular DC Source / Monitor Mainframe features flexible, modular architecture, pulse measurement capabilities, high-speed measurement, eight plug-in module slots, SMU, HCU, HVU, VS/VMU, AFU, enhance throughput, and a program memory >2000 commands. The Agilent/ HP 4142B Modular DC Source/Monitor Mainframe is a system-use dc measurement instrument especially designed for high-throughput dc semiconductor testers. A completely user-definable system component, the Agilent / HP 4142B features modular architecture that allows you to build a custom configuration to suit your measurement needs. Eight plug-in module slots can accommodate any combination of modules. Choose from two types of source/monitor units (SMUs) to force or measure up to ±200 V and ±1 A: a high-current source/monitor unit (HCU) up to ±10 A, a high voltage source/monitor unit (HVU) up to ±1000 V, a voltage source/voltage monitor unit (VS/VMU), and an analog feedback unit (AFU). The Agilent / HP 4142B’s instrument command and measurement data storage capabilities, coupled with the high-speed HP-IB interface, minimize computer loading, enhance throughput, and simplify systemization. There are 5 units with different configuration abailable.
- 4142B Mainframe with 1 unit of HP 41420A Hi current SMU & 5 unit of HP 41421B SMU
- 4142B Mainframe with 2 unit of HP 41420A Hi current SMU & 4 unit of HP 41421B SMU
- 4142B Mainframe with 2 unit of HP 41420A Hi current SMU & 3 unit of HP 41421B SMU
- 4142B Mainframe with 6 unit of HP 41421B SMU
- 4142B Mainframe with 2 unit of HP 41420A Hi current SMU & 1 unit of HP 41421B SMU
- Suss MicroTec / Karl Suss PA-200 SemiAutomatic Probe Station with Anti Vibration Table. The SUSS PA200 Semiautomatic Probe System is very stable, modular and flexible probe systems for wafers and substrates up to 200 mm (8). The standard ProberBench® Operating System provides ease of use and programmed automation for the most demanding analytical applications. The modular design is effective, versatile and has a defined upgrade path.
- FEATURES AND BENEFITS Application flexibility for failure analysis, design and verification, parametric and functional tests Precision and stability for submicron probing Accommodates packaged parts and single chips as well as wafers and substrates Configurations for measuring from attoAmpere level DC to 220 GHz high frequency Low noise and frost-free measurements from –65°C to 400°C with the SUSS ProbeShield® Interfaces to leading analysis instrumentation, optics, software and testers ProberBench operating system, fully operable with or without a PC Full range of accessories
- To Include: Motorized XYZ Microscope, Mitutoyo Objectives & Eye Piece & Optem Fiber Illuminator -1 Unit Joystick Controller & Power Supply-1 Unit Basler Scout IR Camera – 1Unit Thermochuck – 1 Unit
Anti vibration table – 1 Unit
Karl Suss Manual High Frequency Probe Head (PH250HF) -3 Unit
Probe Arm and Probe Head – 3 Units
XYZ Edmund Optic Micro Positioner -1 Unit - Probe head & Probe Arm PH250HF (Karl SUSS) The SUSS PH250HF is specially designed to meet the strict demands of high frequency probing. Its rigid design is however also useful for special requirements in analytical and production probing such as holding large area detectors for optoelectronics applications. The PH250HF has a travel range of 25mm on both the X and Y axis, and 10mm in Z. All movement s are independent and are controlled by micrometers with a resolution of 500u/rev ( 50 tpi). The PH250HF footprint size allows upto four ProbeHeads to be used on any Suss Probe Station.
Features and Benefits
Rugged, precise construction
Ergonomic and robust design
Probe tip planarization
Flexible arm configurations enable left/right, front/rear and straight set-ups. - Optem Fiber Optic Light Source (Pair to Karl Suss PA 200 Scope)
- Fiber Optical Light Source and come with fiber optic
- Agilent-N5230A 300 kHz to 20 GHz, 4 Port Network Analyzer. 300KHz to 20GHz Network Analyzer. The Keysight (Agilent) PNA-L vector network analyzer is a member of the PNA series network analyzer platform and is designed for your general-purpose network analysis needs. Advanced features help you work quickly, easily, and accurately. With the same firmware as the PNA, the PNA-L offers the perfect balance of value and performance. PNA-L provides efficiency and flexibility in both manufacturing and R&D applications for industries from wireless LAN components to aerospace and defense.
Features:
High dynamic range: 127 dB at 20 GHz at test port
o Low trace noise: 0.002 dB rms at 1 kHz bandwidth
o Fast measurement speed: 4.5 to 26 ìsec/point
o High stability: 0.05 dB/degrees Celsius
State-of-the-art calibration capabilities and wide-range of ECal modules
Advanced applications for mixer and pulse measurements
Single-ended and balanced measurements
32 measurement channels, unlimited traces, and 16,001 points per channel
Connectivity with Open Windows XP, 6 USB connectors, LAN, and GPIB - TEMPTRONIC TITAN SERIES TPO3500 THERMOCHUCK SYSTEM -65°C TO +300°C and TEMPTRONIC TITAN SERIES THERMAL CHUCK CONTROLLER. TP03500 Titan Series Chuck Controller. The TP03500 Series ThermoChuck System is a revolutionary high-performance platform providing exceptional flatness, parallelism, mechanical and thermal stability over a wide temperature range for the high precision testing of wafers at the wafer probing station. The chuck design is based on new, patented1 technologies from Temptronic Corporation.
The TP03500 System consists of a low noise controller; a temperature-controlled vacuum chuck assembly and your choice of cooling options. Available in diameters of 200mm (8 inch) or 300 mm (12 inches), the TP03500 ThermoChuck accommodates a variety of wafer sizes. All ThermoChucks have the ability to shut off outer vacuum rings for better “hold down” of smaller wafers. The chuck surface is electrically isolated and plated (gold, nickel, anodized or other) for your application.
For device characterization and analytical measurements on wafers and hybrids when the objective is to maintain probe contact during temperature excursions, Temptronic offers the Constant Height ThermoChuck. Designed utilizing Temptronic patented technology, the Constant Height ThermoChuck maintains growth as low as 50 microns and flatness to 50 microns throughout the entire temperature range.
Features
Patented TP03500 ThermoChuck design provides exceptional thermal and mechanical stability and precision
Superior Temperature Uniformity:
Surface Flatness
Surface to Base Parallelism: <20 microns @ +200°C
Surface Isolation: > 109 ohms standard; >1014 ohms available
Low noise DC Control System keeps electrical noise to a minimum
Modular System Design for convenient, cost-effective system upgrades as wafer diameter and temperature requirements change
CE Approved, ETL listed for U.S.A. and Canada and Compliant with SEMI S2-93A standards. - TELEDYNE LECROY 11GHz 4 Gb/s Serial Data Analyzer, SDA 11000. With serial data quickly becoming a dominant form of data transmission, fast and accurate analysis becomes a priority. The LeCroy SDA integrates all the key measurement and analysis tools into one device.
Here are a few of the measurements that are part of this powerful analyzer’s capabilities:
Serial data measurements up to 6.25 Gb/s
Supports testing of next generation serial data standards:
1. 5 Gb/s PCI Express™ Gen2
2. 4.25 Gb/s Fiber Channel
3. 6 Gb/s SATA III / SATA II
4. 4.8 Gb/s FB-DIMM
5. 6.25 Gb/s double XAUI
Capturing up to 12 million UI in a single acquisition allows measurements on important low frequency effects, such as spread spectrum clocking, and switching converter noise
The latest LeCroy DSP technology brings you uncompromised uniformity in frequency and phase response resulting in dependable eye pattern representation
Configure PLL response in software clock recovery for any standard or custom requirement - HP/AGILENT ELECTRONIC CALIBRATION, N4433A . N4433A Electronic Calibration (Ecal), 300kHz to 20GHz, 3.5mm, 4-port. The Keysight N4433A Microwave electronic calibration (ECal) module makes calibration of vector network analyzers fast, easy, and accurate. ECal is a precision, single-connection calibration technique for your vector network analyzer. Performing a full three- or four-port calibration takes less than half the time and number of connections using ECal versus mechanical cal kits. Furthermore, the accuracy of the calibration is comparable to mechanical methods. Traditional mechanical calibrations require intensive operator interaction, which is prone to errors. With ECal, the operator simply connects the ECal module to the network analyzer and the software controls the rest.
ECal modules are transfer standards capable of transferring the factory calibration accuracy to your network analyzer. The Keysight PNA and ENA series of network analyzers controls the N4433A module directly through a USB interface. PNA Series network analyzers require firmware revision 2.5 or higher.
HIGHLIGHTS
300 kHz to 20 GHz frequency range
Standard 3.5 mm (f) connectors
Fast full 3- or 4-port calibration with a single connection
NIST traceable accurate calibrations
Reduced connector wear
USB interface for direct control with PNA and ENA series of network analyzers
Reliable solid-state switching
Mixed 3.5 mm male/female connectors option available - LAUREL SPINNER COATER. WS-650-23B Spin Coater.The 650-series process controller utilizes a robust microprocessor and, with the use of its accompanying PC software (written in an object-oriented programming language), it achieves nearly unheard of flexibility both in process definition and use. This controller allows operator interaction in real-time during the process execution including pausing time, stopping and continuing on from that point. The 650-series controller can also be used in conjunction with a PC with Spin 3000, Laurell’s exclusive process management software. However, this is NOT required to program or run the equipment. The use of a PC adds the ability to record a process as it’s run, operate remotely, program or communicate across a LAN or the Internet. The software, which is supplied at no additional cost, allows the operator to create virtual process simulations even beyond the hardware actually installed spin processor, in effect, letting them try it before they commit to a process.
All 650 systems can be upgraded or re-purposed without return to the factory with simple plug-in modules, either actually or virtually, and can contain a virtually unlimited number of processes and steps. - BUEHLER BETA SERIES TWIN VARIABLE SPEED GRINDER-POLISHER. BUEHLER BETA – Twin Variable Speed Grinder Polisher with Vector Power Head Metallurgical Sample Prep.The Buehler polisher is suitable for microscopy such as grain size and other structural analysis. The combination of a variable speed base and a head with load setting allows automated polishing of metallurgical samples suitable for microscopy such as grain size and other structural analysis.
- JEOL JFC-1600 AUTO FINE COATER. This coater, which consists of a main unit and a pump, is intended mainly to preparing specimens for SEM observation. It coats biological and other nonconductive specimens with metals, efficiently and in a short time.
Features:
The cathode contains a permanent magnet to create an efficient glow discharge for sputtering.
It is possible to set the chamber pressure in addition to the sputtering current.
This enables the uniformity of the coating to be controlled so that a shadow-free coating can be obtained.
Operation is easy, and a fine coating can be obtained in a short time. - ESPEC MODEL PR-3KP TEMPERATURE & HUMIDITY CHAMBER. With the Platinous Series of standard environmental test chambers, our goal has been to achieve optimum operational ease, safety and environmental friendliness in addition to offering superb performance and reliability. It offers remarkable ease of use and materials recycling, and marketed as an approaching ideal environmental test chamber. The Platinous K Series is an embodiment of a design concept featuring energy conservation, reduced maintenance, and improved recycling of natural resources after disposal. Tabai Espec Corp. PR-3KP Temperature and Humidity Chamber unit is manufactured in Japan in Year 2006.
Features:
Temperature range :-20 to +100°C / 20 to 98%rh
Refrigerant R-404A:-CFC Free – Ozone Gentle
Power Input::200V, 3phase, 50/60HZ
Others:
Highly accurate temperature and humidity control over an extended range
The refrigeration system, equipped with an electronic auto-expansion valve, achieves high-precision single step control of the temperature and humidity from +10°C for the temperature, and from 20%rh for the humidity (from +70°C to +85°C).
Prevention of condensed water droplets from the wick pan
The arm and drain of the wick pan are integrated to prevent any condensation contained in the wick pan to drip. The wick pan is featuring an automatic water feed system which reduces risks of spatters resulting from pressure fluctuations.
Space-saving vertical exhaust system (air-cooling system)
Heat from the refrigerator is vertically expelled through a port mounted on the ceiling, which allows saving space usually required behind the equipment.
Large viewing window
Cartridge tank water supply system - VOTSCH CHAMBER H SERIES TEMPERATURE CHAMBER.Chamber H Series Model VT 3050. The VT 3050, manufactured by Vötsch Industrietechnik GmbH, is a temperature test chamber which has a test space which is less than 1m2. This space is enough to handle any type of specimen that will be put inside the device. The equipment also features a glass door which permits clear view on the test specimen.
Features:
Type: Temperature
Options and accessories: with window
Capacity: 500 l (132 gal)
Temperature: Max.: 100 °C (212 °F), Min.: -30 °C (-22 °F) - OPTELLANT MODEL OPTOBERT 4250 SYSTEM. OptoBERT™ OPB4250 4.25Gbps Optical & Electrical Bit-Error-Rate Tester (BERT)
The OPTELLENT OptoBERT™ OPB4250 is a cost-effective easy-to-use bit-error-rate tester (BERT) for testing Fibre Channel (FC) devices, components, modules and systems in R&D and manufacturing environments as well as field installations of Storage Area Networks (SANs). OPB4250 supports 4GFC, 2GFC and 1GFC. The OPB4250 tester is also ideal for Gigabit Ethernet and Infiniband (2.5G) testing. It incorporates a pattern generator, clock recovery circuits, and a bit-error-ratio analyzer in one compact module that provides optical and electrical interfaces at up to 4.25Gb/s. An intuitive graphical user interface (GUI) enables easy point-and-click operation. The GUI displays error counts, BER, and related statistics. The OptoBERT has a recording feature to output the measured BER results into a spreadsheet file without any programming or scripting. Key Features:
Integrated Generator and Analyzer
Internal Clock & Data Recovery
Electrical and Optical Interfaces
Automated Measurement Report
Intuitive GUI and Automated Test Report
Cost-efficient and Easy-to-use
Applications
Testing of optical and electronic devices, components, modules and systems for 1x, 2x and 4 x Fibre Channel (FC), Gigabit Ethernet and Infiniband
IC testing at Fibre Channel rates
Installation testing and troubleshooting of Storage Area Networks (SANs)
Manufacturing testing of Fibre Channel transceivers, eliminating expensive traditional BER test equipment in production lines - TELEDYNE LECROY WAVE EXPERT 100H SAMPLING OSCILLOSCOPE SYSTEM. LeCroy WaveExpert 100H Overview
WaveExpert 100H, the first sampling oscilloscope capable of acquiring, measuring and processing signals that cannot be physically probed. It completely addresses the analysis and compliance requirements of the long serial data patterns required by standards such as second generation PCI Express, serial ATA, XAUI and 10 Gigabit Ethernet. The modular architecture of the Wave Expert supports up to four optical or electrical channels with bandwidths up to 100 GHz as well as clock recovery and serial pattern generation up to 13.5 Gb/s.
In recent years, the rates of serial data signals have increased steadily from 2.5 Gb/s to 40 Gb/s and beyond. All this speed, of course, pushes up the bandwidth requirements of oscilloscopes. However simply providing this bandwidth is not sufficient for qualifying these high-speed links. High bandwidth oscilloscopes must have the detailed analysis capability required by next-generation standards. Adding to the measurement complexity is the emergence of receiver equalization which allows high-speed serial data links to operate error-free even when the signal is severely distorted. The WaveExpert 100H is the ideal signal integrity analysis solution for these applications.
Ultra-High Bandwidth Signal Analysis
Highly Accurate Jitter Analysis
Fast acquisition, deep memory, and low jitter of HCIS timebase provide an unprecedented level of waveform analysis
Up to 20 GHz TDR with Full S-paramter Measurements
Eye Doctor™ Offers Virtual Probing and Equalized Signals
Optical measurements at high data rates
Modular acquisition covers bandwidth from 20 to 100 GHz
Electrical and optical clock recovery modules
PRBS pulse pattern generator module - FINETECH FINEPLACER-96 LAMBDA HIGH PRECISION DIE BONDER & FLIP CHIP BONDER With FULL SYSTEM UPGRADE.The completely revised table top die bonding platform can be easily configured for a wide range of applications for process development or prototyping. Numerous process module options and in-field-retrofit capabilities guarantee maximum technological flexibility of the table top die bonder to protect your investment in the face of ever-changing challenges. Due to the table top flip chip bonder’s ergonomic machine design and software-supported user guidance, the user remains at the center of action. Powerful optical systems allow the user to keep an overview at all times, even when working in the sub-micron range. The table top die bonder FINEPLACER® lambda shares a common module range and innovative operating software with Finetech’s automatic die bonding systems to ensure a seamless process migration to series production.
Features:
Sub-micron placement accuracy
Superior optical resolution
Excellent price performance ratio
Individual configurations with process modules
Numerous bonding technologies (adhesive, soldering)
Data/media logging and reporting function
Wide range of controlled bonding forces
Full process access & easy visual programming with touch screen interface
Various bonding technologies in one recipe
Process module compatibility across Finetech platforms
In-situ process observation in HD
Modular machine platform allows in-field retrofitting during entire service life
Synchronized control of all process related parameters Overlay vision alignment system (VAS) with fixed beam splitter
Sequence control with predefined parameters
Upgrade Option:
Fineplacer-96 Lambda Base Module
Fineplacer-96 Lambda Flip Control Module
Fineplacer-96 Lambda Pick Up Module
Heating Plate & Heating Plate-2
Loctite, Uv Wand Curing System
Epoxy Dispenser Module
Wafer Holder Ring
Anti-Vibration Isolated Table
Accessories, VIBRAPLANE Anti-Vibration Isolation Table - ACROSS INTERNATIONAL LAB DIGITAL VACUUM OVEN VO-16020
Brands: Across International
Models: VO-16020
Voltage: 220V
Power: 1000W
Temperature Range: 50°C to 250°C
Serial Number: 1201028
Manufactured: 01-2012
Status: Fully functional when switch off. - KTC BT-30 DIE AND BALL SHEER TESTER. Die and Ball Sheer Tester. Keller Technology Corporation (KTC) is a global supplier of manufacturing and engineering services, with facilities located in Buffalo, New York, Charlotte, North Carolina, and Seoul, South Korea.Bondtest-30 BT-30 is for Die and Ball Shear Testing
- USI ULTRON UH114 Tape Mounter . USI ULTRON TAPE MOUNTER. Specification:- Model: UH114 Serial No: 000816 Volts: 115Vac/ 3Amps Phase: 1 Frequency: 50/60 Hz . FEATURES: – Easily adjustable spring-loaded roller assembly – Uniform film tension: Film tensioner bars (along both x/y-axes and front/rear for UH114; – Uniform adhesion provides bubble-free lamination – Circular cutter (wheel-type) for cutting film on film frame – Adjustable cutting pressure for different films (thickness/hardness) – Digital temperature controlled platen – Adjustable workstage height from top of unit – Operates with non-backed or backed (optional) film – Accommodates film/protective layer wound on the outside or inside – Adjustable alignment pins and vacuum cups – Accepts all film frames (specify type and size) – End cutter for film separation – Accommodates wafer up to 6″ capability (UH114);
OPTIONS: – Protective Film Take-up Roller Assembly for use with film with backing layer
MODEL UH114: – Vacuum-Securing Standard Wafer Stage: up to 6″ wafer, or 3″-6″ multi-chuck – Thin Wafer Stage, up to 6″ wafer - SMT MAX QM1500 AUTO PICK & PLACE SYSTEM (
Pick & Place System
The QM1500 is a fully automated pick & place machine intended for SMT manufacturing and producing prototypes, developed by SMTmax. This remarkable, highly flexible and economical pick & place machine provides the need for a machine that produces small batches & prototypes for the SMT industry.
Features and Benefits
Teledyne DALSA Vision System
2 pick and place heads
PCB Fixture max size 17″(431mm)×12″(304mm) capable of holding one JEDEC Tray once PCB.
Operates with pneumatic feeders, 20 ports installed in the front side, 20 more ports optional (for rear side)
One up looking camera for part inspection before placement.
One Down looking camera for Fiducial Recognition & feeder set up.
Placement rate 3,000 Parts Per Hour
Dual Linear Guide Way and Ball Screws.
System Includes
10 feeder ( Model KW1-M1500-110) - ESCO ISOTHERM OVEN WITH FORCED CONVECTION, 32L
ESCO Isotherm 32L Force Convection Oven
Isotherm® Forced Convection Laboratory Oven offers maximum thermal performance. This lab equipment is used to perform precise drying, heating, annealing, and sterilizing of samples/agents from 7.5°C above ambient to 300°C. Esco laboratory oven has ergonomic and intuitive interfaces, microprocessor PID controls with programming options, 4-zone heated air jacket, precisely tuned and tested ventilation, and insulation package ideal for your research, industry, and quality assurance needs.
Ovens can vary in size. Typically, a lab oven has a capacity of 28 liters (1 ft3) to 240 liters (8.5ft3) with temperatures that can reach 200°C (392°F) to 300°C (572°F).
Applications:
– Curing
– Drying
– Heated storage
– Material testing
– Vulcanization - UV Ozone Cleaning System UVOCS T10X10/OES
UVOCS 10X10/OES UV Ozone Cleaning System
The UVOCS T10x10/OES Ultraviolet Ozone Cleaning System provides a simple, inexpensive and fast method of obtaining ultra-clean surfaces free of organic contaminants. This process is ideal when thin film deposition with excellent adhesion to the surface is required. Ultra-clean surfaces can easily be achieved by UV/Ozone processing in one to several minutes after the surface has been cleaned by conventional techniques. UV ozone cleaning system 10″x10″ UV source lamp active area 100 sq in 3″ exhaust port - SPRINT T-01 HIGHSPEED AUTOMATIC WIRE BONDER
Highly productive and always aiming for zero defects: the fully automatic, compact wire bonder SPRINT-T 01 was adapted to the special requirements of mass production of power semiconductors and power modules in the automotive industry. - CASCADE MICROTECH/PROBER/PA200HS
CASCADE Microtech Karl Suss PA 200HS Prober with Vibration Isolation Table - SENSOFAR 3D Optical Profiler and stent inspection systems Model: PLU-NEOX with Motorized X-Y Stage
3D Optical profiler nanometer measurement with confocal, interferometry and focus variation technology
A QA/QC and R&D solution engineered for speed. 3D profiling to the nanometer with 3 optical technologies and the ability to measure smooth and shiny surfaces. The S Neox measures using confocal, interferometry and focus variation techniques. For the measurement of roughness, surface finish, flatness and waviness on materials such as thin film and wafers. Ai focus variation – Saves each layer as the lens moves upward allowing you to see shape and curvature. Confocal – Only allows focused light through allowing you to see the surface structure. Interferometry – Uses a laser to allow very accurate measurement down to nanometers great for shiny surfaces such as wafers. Spectroscopic Reflectometry – Perform thickness measurements on transparent layers in a quick, accurate and non-destructive way. Accessories Includes:
Joystick & Power Module
Microscope Magnification Lens: Nikon LU Plan Flour 10X, 20X, 50X, 100X
Motorized X-Y Profiler
Vibration Isolation Table - LUCEO BIT ERROR RATE TESTER
Bit Error Rate Test
PARALLEX® Platform System
Modular Multifunctional Multichannel
Start small – grow later …. mix various functions in one frame …. single channel – multiple channel …. everything is possible with this modular approach. Already as a single channel BERT the PARALLEX® system offers full functionality for testing high speed components. PRBS and user pattern generation and error detection for 2..13Gbit/s.
Configuration:
POW4: Mainframe with power supply
GP-4: Module for GPIB/USB communication
CLK20: Clock source 20GHz with divider output and multiplier function
EPG10: Pattern generator 2-13G
EED10: Error detector 2-13G - SMT Max Precision Lead Free Reflow Oven
SMT Max Precision Lead Reflow Oven - AGILENT N6700B Low-Profile Modular Power System Mainframe, 400W, 4 Slots- (Lot of 9 N6700B + power module) (Including Cabinet)
N6700B Low-Profile Modular Power System Mainframe, 400W, 4 Slots
The Keysight N6700B is a 400 W 1U high, 4-slot modular power system mainframe that accepts from 1 to 4 N6700 series DC power modules in any combination. Modules are ordered separately. The N6700B offers GPIB, LAN, and USB, interfaces standard, and LXI compliance. There are 9 units of N6700B. 7 Units is equipped with N6732B (4 unit of DC power module, 0-8V, 6.25A, 50W) and 2 Units is equipped with N6731B DC power modules, 0-5V, 0 to 10A, 50W.
Maximum Total Output Power (= Sum of Total Module Output Power)
400 W when operating from 100 – 240 VAC input
AC Input: Nominal Input Ratings: 100 VAC – 240 VAC; 50/60/400 Hz
Input Range: 86 VAC – 264 VAC
Power Consumption: 1000 VA typical
Fuse: Internal fuse (not customer accessible)
Protection Response Characteristics: INH input: 5 μs from receipt of inhibit to start of shutdown
Fault on coupled outputs: < 10 μs (from receipt of fault to start of shutdown)
Configuration:
1. N6700B installed with N6732B. N6732B is a Modular Power Supplies DC Power Module 8V, 6.25A, 50W – 7units
2. N6700B installed with N6731B. N6731B is a Modular Power Supplies DC Power Module 5V, 10A, 50W – 2 units - AGILENT 4145B SEMICONDUCTOR PARAMETER ANALYZER
Agilent / HP 4145B Semiconductor Parameter Analyzer
The Agilent / HP 4145B Semiconductor Parameter Analyzer is capable of complete dc characterization of semiconductor devices and materials. It stimulates voltage and current sensitive devices, measures the resulting current and voltage response, and displays the results in a user-selectable format.3.5 inch floppy is built in for storage capability.
FEATURES:
Fully automatic, high-speed dc characterization of semiconductor devices
High resolution, wide range sourcing and measurement
Maximum 1150 measurement and display points for precise measurement and analysis
Flexible graphic analysis functions for quick parameter extraction
Built-in micro flexible disc drive - NIKON OPTISTATION
Model: OPTISTATION 3
Microscope Wafer Inspection Station with cassette to cassette handling. Comes with Nikon Fiber Illuminator
ID-SS10534-1-1-1
