Description
LTX Fusion HF Test System. The Fusion HF test head can be configured with up to 1024 digital pins that can include per-pin Algorithmic Pattern Generation (APG) capability for embedded memory testing. The test head also supports a wide range of mixed signal instruments such as RF, smart power, precise time measurement, powerful DSP-based synthesizers and digitizers for high-speed and high-resolution embedded converters.
Condition: New
Valid time: Subject to prior sale without notice.
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ID-SS380-e