Description
Jeol JWS7500E w/Noran EDX Wafer Inspection System (SEM)
Condition: Used. De-installed and warehoused. Was in working condition when removed.
Location: USA
Wafe Size: 200mm
Valid time: Subject to prior sale without notice. This item is only for end user.
QTY: 1
ID-OEMMODEL-2 /ID-SS5303