Main Maker

Jeol JWS7500E

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Description

Jeol JWS7500E w/Noran EDX Wafer Inspection System (SEM)

Condition: Used. De-installed and warehoused. Was in working condition when removed.

Location: USA

Wafe Size: 200mm

Valid time: Subject to prior sale without notice. This item is only for end user.

QTY: 1

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