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Cascade Microtech S300 12 inch WAFER PROBE SYSTEM

Cascade Microtech S300

Categories: 0-Partners, Metrology Probe Tags: Cascade, Cascade Microtech, JFP MicroTechnic

Description

Description

Cascade Microtech S300 12 inch WAFER PROBE SYSTEM

Cascade Microtech S300 semi-automatic and manual RF/Microwave Probing System for quick and reliable 300 mm on-wafer test and characterization. The S300 supports wafer sizes and shards from 0.5 in. (1 mm) all the way up to 12 in. (300mm). Use the same prober for all of your wafer sizes. This probe station sets the measurement standard for 300mm on-wafer test. Whether your application is device characterization and modeling, wafer-level reliability, design de-bug or IC failure analysis, the S300 probe station has the precision and versatility needed for the most advanced semiconductor processes and aggressively scaled devices. MicroChamber(TM) and AttoGuard(TM) shielding reduces external noise signals. With the FemtoGuard chuck and its triaxial connections, noise and leakage are significantly reduced to provide measurements down to 1 fA. The thermal chuck heats and cools your test devices from –55°C to 200°C.

Location: U.S.A.

Condition: Great condition. We sell this item at AS IS WHERE IS

Quantity: 7 sets. Photos are only for your reference. Pls contact us for real photos

Price: Contact us pls.

These are subject to prior sale. These are only for end user. Appreciate your time.

The trademarks of the equipment and parts contained in this website belonged to the Original Equipment Manufacturers.

SS4781-0-4-1-1 OEM-Module-3

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