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Universal X-RAY X-9200K

Description

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Universal X-RAY X-9200K Inspection System

The X-9200K X-ray Inspection System is a high-power inspection platform designed for demanding applications requiring deep penetration and high-resolution imaging. It is ideal for universities, research institutes, and compound semiconductor fabs working with dense materials, thick structures, and advanced device analysis.

Designed for: Universities | Research Institutes | Compound Semiconductor Labs (SiC, GaN, Power Devices) | Advanced Materials Analysis

Universal X-RAY equipment_X-9200K

Key Features

  • High-power 160 kV X-ray source for deep material penetration
  • Micro-focus imaging capability for detailed internal structure analysis
  • High-resolution flat panel detector for stable digital imaging
  • Large inspection stage for flexible sample handling
  • Designed for advanced semiconductor and material applications

Strong Selling Points

  • High Penetration Capability for Dense Materials
    The 160 kV X-ray source enables inspection of thick, high-density materials and complex assemblies not accessible with lower voltage systems.
  • Designed for Advanced Semiconductor Applications
    Ideal for SiC, GaN, power devices, advanced packaging, and failure analysis requiring deeper imaging capability.
  • High-Resolution Imaging for Critical Analysis
    Supports detailed internal inspection of complex structures, improving defect detection and research accuracy.
  • Flexible Platform for R&D and Specialized Labs
    Suitable for universities, research institutes, and specialized fabs working on next-generation materials and devices.
  • Cost-Effective Alternative to High-End Systems
    Provides strong performance comparable to premium European and US systems with a more competitive cost structure.

Applications

  • SiC and GaN power device inspection
  • Advanced semiconductor packaging analysis
  • High-density material inspection
  • Battery and energy device analysis
  • Failure analysis and R&D evaluation

Positioning

The X-9200K is a high-end X-ray inspection system designed for research-focused users who require maximum penetration capability, advanced imaging performance, and reliable operation for complex inspection tasks.

Specifications

Category Item Specification
X-ray Source Model X-9200K
Tube Type Closed micro-focus
Tube Voltage 160 kV
Tube Current (Depending on configuration)
Imaging Spatial Resolution Micron-level (depending on configuration)
Magnification Geometric + digital magnification
Image Processing Real-time digital imaging and analysis
Detector Type Flat panel detector
Stage / Inspection Sample Handling Motorized multi-axis stage
Application Range Thick materials, high-density components
System System Type Closed cabinet X-ray system
Control PC-based control system
Power Supply AC110–220V, 50–60Hz
Safety Radiation shielding with safety interlock

* Specifications are for reference only and may vary depending on configuration. Please contact SemiStar or the manufacturer for official specifications.

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