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SURFSCAN 6220

Description

The following KLA-TENCOR SURFSCAN 6220 is only for end user. Please contact us if you have any questions. Subject to prior sale without notice. Appreciate your time!

Valid time: Subject to prior sale without notice. This item is only for end user. Appreciate your time

A surface inspection tool for unpatterned wafers. It accommodates wafer sizes: 100, 125, 150, and 200mm (round or rectangular substrates). The 6220 is a surface analyzer System detects sub micron particles on bare silicon. KLA-Tencor Surfscan 6420 Features/Specifications: Non-patterned wafer surface analyzer Accommodates wafer sizes: 100, 125, 150, 200mm (round or rectangular substrates) One automatic wafer handler Sensitivity Most surfaces: Better than 0.20µm @ 95% For polished surfaces: Better than 0.10µm @ 95% capture rate 0.12µm defect sensitivity on bare silicon Repeatability less than 1.0% at 1 standard deviation (Mean count greater than 500, 0.204 diameter latex spheres on bare silicon) Contamination less than 0.005 particles/cm greater than 0.15µm Haze sensitivity: 0.02ppm Defect Map & Histogram with zoom Illumination Source 30mW Argon-Ion Laser, 488nm wavelength 2D signal integration 50µm spatial resolution Non-contaminating robotic handler X-Y Cordinates Software Random Access Sender/Receiver Unit

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