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  • HP 4062UX HEWLETT PACKARD Agilent Tester Semiconductor Process Control System

    HP 4062UX Tester

    The HP4062UX Semiconductor Process Control System is the high-end system of the HP4062 Semiconductor Parametric Test System family. The HP 4062UX satisfies all of the requirements of the Integrated Circuit Manufacturers for both process monitoring and process development. Since the HP 4062UX uses the same mea­surement hardware as the HP4062C, it maintains the same highly accurate and reliable measurement capabilities as the HP4062C, such as high-speed measurements over a wide measurement range.
    In addition to the sophisticated hardware of the HP4062C, the HP 4062UX provides powerful software capabilities with the HP BASIC/UX operating environment. HP BASIC/UX combines the most powerful instrument control language. HP BASIC, with all the elements of HP-UX, the Hewlett-Packard implementation of the AT&T System V UNIX* operating system. HP Interactive Mea­surement and Analysis (IMA) Software makes measurements inter­actively by providing a softpanel user interface.
     


  • HP 4062C HEWLETT PACKARD Agilent Tester Semiconductor Parametric Test System

    HP 4062C Tester

    The HP4062C Semiconductor Parametric Test System is the high-end system of the HP4062 Semiconductor Parametric Test System family. The HP 4062 satisfies all of the requirements of the Integrated Circuit Manufacturers for both process monitoring and process development. HP4062C maintains highly accurate and reliable measurement capabilities, such as high-speed measurements over a wide measurement range.


  • HP 4062F HEWLETT PACKARD Agilent Tester Semiconductor Parametric Test System

    HP 4062F Tester

    The HP4062F Semiconductor Parametric Test System is the high-end system of the HP4062 Semiconductor Parametric Test System family. The HP 4062 satisfies all of the requirements of the Integrated Circuit Manufacturers for both process monitoring and process development. HP4062C maintains highly accurate and reliable measurement capabilities, such as high-speed measurements over a wide measurement range.


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