Description
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Universal X-RAY X-9200K Inspection System
The X-9200K X-ray Inspection System is a high-power inspection platform designed for demanding applications requiring deep penetration and high-resolution imaging. It is ideal for universities, research institutes, and compound semiconductor fabs working with dense materials, thick structures, and advanced device analysis.

Key Features
- High-power 160 kV X-ray source for deep material penetration
- Micro-focus imaging capability for detailed internal structure analysis
- High-resolution flat panel detector for stable digital imaging
- Large inspection stage for flexible sample handling
- Designed for advanced semiconductor and material applications
Strong Selling Points
- High Penetration Capability for Dense Materials
The 160 kV X-ray source enables inspection of thick, high-density materials and complex assemblies not accessible with lower voltage systems. - Designed for Advanced Semiconductor Applications
Ideal for SiC, GaN, power devices, advanced packaging, and failure analysis requiring deeper imaging capability. - High-Resolution Imaging for Critical Analysis
Supports detailed internal inspection of complex structures, improving defect detection and research accuracy. - Flexible Platform for R&D and Specialized Labs
Suitable for universities, research institutes, and specialized fabs working on next-generation materials and devices. - Cost-Effective Alternative to High-End Systems
Provides strong performance comparable to premium European and US systems with a more competitive cost structure.
Applications
- SiC and GaN power device inspection
- Advanced semiconductor packaging analysis
- High-density material inspection
- Battery and energy device analysis
- Failure analysis and R&D evaluation
Positioning
The X-9200K is a high-end X-ray inspection system designed for research-focused users who require maximum penetration capability, advanced imaging performance, and reliable operation for complex inspection tasks.
Specifications
| Category | Item | Specification |
| X-ray Source | Model | X-9200K |
| Tube Type | Closed micro-focus | |
| Tube Voltage | 160 kV | |
| Tube Current | (Depending on configuration) | |
| Imaging | Spatial Resolution | Micron-level (depending on configuration) |
| Magnification | Geometric + digital magnification | |
| Image Processing | Real-time digital imaging and analysis | |
| Detector Type | Flat panel detector | |
| Stage / Inspection | Sample Handling | Motorized multi-axis stage |
| Application Range | Thick materials, high-density components | |
| System | System Type | Closed cabinet X-ray system |
| Control | PC-based control system | |
| Power Supply | AC110–220V, 50–60Hz | |
| Safety | Radiation shielding with safety interlock |
* Specifications are for reference only and may vary depending on configuration. Please contact SemiStar or the manufacturer for official specifications.




