Description
Refurbished SEM / FEG Equipment
SemiStar offers selected refurbished Scanning Electron Microscope (SEM) and Field Emission Scanning Electron Microscope (FEG-SEM) systems for semiconductor manufacturing, failure analysis, materials research, universities, laboratories, and other advanced microscopy applications.
The following systems are currently listed for end-user inquiries. Please reference the Equipment ID when contacting SemiStar so that we can identify the correct system and provide the available configuration, condition, specifications, photos, pricing, and other information.
Available Equipment
- SS11221-1 — Hitachi S-4800-1 Scanning Electron Microscope
Condition: Refurbished. Experience the precision and power of the Hitachi S-4800-1 Scanning Electron Microscope, a versatile tool essential for detailed material analysis. The upright microscope structure allows for comfortable operation and a broad field of view, ideal for both laboratory and industrial applications. Equipped with advanced features, the S4800-1 model offers exceptional image quality and resolution, making it a go-to instrument for researchers and technicians in various fields. Whether you’re examining surfaces or conducting material studies, this SEM is engineered to deliver reliable and accurate results. - SS11221-2 — Hitachi High-Tech TM1000 Tabletop Microscope
Condition: Refurbished. A Tabletop Scanning Electron Microscope, Model TM-1000 (Hitachi High-Technologies), is an easy-to-use introductory tool for microstructures at magnifications up to 10,000 x at a fixed working distance with minimal sample processing. Typical applications range from analyzing size distributions of carbon nanotubes to characterizing cell and tissue differentiation in developing insects. It also has the Windows 10 operating system. Key features are Auto image adjustment, Magnification: 20 x-10,000 x, Quick specimen exchange, quick pump-down, Easy operation from a laptop computer interface. - SS11221-3 — Hitachi TM-3030Plus Desktop Scanning Electron Microscope
Condition: Refurbished. The Hitachi TM-3030Plus Desktop Scanning Electron Microscope is a unit type microscope manufactured in Japan. It is designed for high-resolution imaging and analysis in various fields such as research, education, and industry. This SEM model offers advanced imaging capabilities and precise results, making it a valuable instrument in the scientific community. It has a premium SE detector which has been incorporated in FE-SEM and VP SEM, and well accepted by users as a high sensitivity detector. It can be operated effectively under a low-vacuum and allows for quick SE image observation without specimen preparation. - SS11221-4 — Hitachi S-3400N Scanning Electron Microscope
Condition: Refurbished. The Hitachi S-3400N Variable Pressure SEM has been developed by improving the design of the S-3000N VP SEM which has been well accepted in the world market. It allows the study of wet, oily and/or non-conductive samples without metal coating or other complicated specimen preparation techniques. The hardware and software functions have been developed after listening to our user’s requests for better imaging, larger sample sizes, analytical capabilities, higher throughput and ease to use. Better electron optics, larger specimen chamber, faster, cleaner evacuation system and fully automated software are just a few of the new features of the S-3400N. Due to a newly designed TMP evacuation system, no cooling water is necessary. It takes less than 100 seconds to exchange a specimen and 6 minutes to reach ready status from a cold start. It requires only 2.0 kVA for the power supply. The S-3400N will be a new world standard in the middle class Variable Pressure SEM. - SS11221-5 — FEI Nova NanoSEM 600 Field Emission Scanning Electron Microscope (FEG-SEM)
Condition: Refurbished. The FEI Nova NanoSEM 600 is a high-resolution Schottky Field Emission Scanning Electron Microscope (FEG-SEM) designed for advanced materials characterization and semiconductor applications. Manufactured by FEI in Czechia, the system supports both high- and low-vacuum operation while maintaining excellent imaging performance and features deceleration mode for enhanced low-kV imaging. It is equipped with SED, BSED, and STEM detectors, with STEM-mode resolution as low as 1 nm. A large specimen chamber and 150 mm stage provide flexibility for a wide range of samples and applications. The platform can also be configured with optional analytical capabilities such as EDS and EBSD, making it suitable for high-resolution imaging, materials analysis, failure analysis, research, and other advanced microscopy applications.
Request Equipment Information
If you are interested in one of these systems, please provide the Equipment ID, your company or organization name, installation location, and intended application. SemiStar can then provide the currently available information for the specific equipment.
Important Notice: All equipment listed on this page is subject to prior sale without notice. Availability must be confirmed at the time of inquiry. Equipment is offered to end users only. Configuration, condition, specifications, included accessories, refurbishment scope, warranty, price, and lead time should be confirmed before purchase.