Description
Semiconductor Equipment parts-Metrology Probe
Location: CA, U.S.A.
These are subject to prior sale. These are only for end user. Appreciate your time.
The trademarks of the equipment and parts contained in this website belonged to the Original Equipment Manufacturers.
1 | ADE 1239B-3 75mm Wafer Positioning Ring |
2 | Alessi EC-01 controller |
3 | Alessi REL probe station with 4 inch vacuum chuck and Mitutoyo microscope- Rebuilt |
4 | Alessi REL-4100 manual prober with LY1 1064nm laser cutting system |
5 | Alessi/Cascade REL-4800 200mm manual wafer prober with Mitutoyo FS-60 microscope including Plan APO 10x/20x/50x objectives |
6 | AST Products VCA Optima XE Contact Angle Goniometer with motorized syringe |
7 | Brumley South/MEMC BSI-42P013H Latex Sphere Calibration Standard |
8 | Brumley South/MEMC BSI-42P013H Latex Sphere Calibration Standard |
9 | Brumley South/MEMC BSI-4P220H Latex Sphere Calibration standard |
10 | Brumley South/MEMC BSI-4P300H Latex Sphere Calibration standard |
11 | Brumley South/MEMC BSI-4P503H Latex Sphere Calibration standard |
12 | Brumley South/MEMC BSI-4P993H Latex Sphere Calibration standard |
13 | Cascade DCM-210V Micropositioners with vacuum base and 100TPI – set of 4 |
14 | Cascade Microtech (Formfactor) MPS150 manual prober with 150mm vacuum chuck |
15 | Cascade Microtech 115-418 |
16 | Cascade Microtech DCM-210V submicron positioner with vacuum base and 12C Picoprobe |
17 | Cascade Microtech MH2-B micropositioners with vacuum base |
18 | Cascade Microtech MS1-44/L Motorized Micropositioner |
19 | Cascade Microtech MS1-44/L Motorized Micropositioner |
20 | Cascade Microtech WPH-001-200 |
21 | Cascade Probe Card Holder 115-418 for Summit 11XXX and 12XXX series Probers with microchamber |
22 | Cascade RF1 Microwave probe station |
23 | DataPhysics ACA50 Dynamic Contact Angle with programmable stage |
24 | ESI New Wave Quiklaze 50ST2 532/355nm (2012) |
25 | Everbeing International 200mm hot chuck with digital controller |
26 | GGB Industries Picoprobe 12C |
27 | GGB Industries Power Supply |
28 | Giga Test Labs GTL4040 Precision Probing Platform |
29 | Giga Test Labs GTL4040 Precision Probing Platform |
30 | ICS Ceramic vacuum chuck 12in x 12in |
31 | Jandel RM3000 4 point probe (NEW UNUSED) with 200mm wafer platform |
32 | K&S 4 point probe head |
33 | Karl Suss PA200 semiautomatic prober with temperature controlled 200mm chuck and dark chamber |
34 | Karl Suss Prober Dark Box |
35 | Kruss DSA100S automated contact angle and drop shape analysis system |
36 | Lakeshore Cryogenics FWP6 probe station |
37 | Large sample scanning stage and AFM probe |
38 | Large sample scanning stage and AFM probe |
39 | Line Tool Mfg. Model A micropositioner |
40 | Metricon 2010 Prism Coupler 633nm (1997) |
41 | Micromanipulator 100PM test station |
42 | Micromanipulator 110/210 micropositioners with 10micron accuracy, vacuum base, and probe arm (NEW UNUSED) |
43 | Micromanipulator 2250 Large Area Panel Prober |
44 | Micromanipulator 2250 Large Area Panel Prober |
45 | Micromanipulator 250 micropositioner- left hand for probing 2-6 micron geometries |
46 | Micromanipulator 350 micropositioner- right hand for probing 2-6 micron geometries |
47 | Micromanipulator 450/550 Submicron positioner |
48 | Micromanipulator 450/550 Submicron positioner |
49 | Micromanipulator 450/550 submicron positioners with vacuum base |
50 | Micromanipulator 450/560VM UNUSED micropositioner with vacuum base |
51 | Micromanipulator 500MT positioner with magnetic base |
52 | Micromanipulator 6100 150mm Manual Prober with B&L Microzoom 2 |
53 | Micromanipulator 72-3-R-XX probe |
54 | Micromanipulator ECT-01 |
55 | Micromanipulator FET-PS4 Active Probe |
56 | Micromanipulator FPC-FRX |
57 | Micromanipulator HCSM |
58 | Micromanipulator Probe card holder with planarization and theta adjustment |
59 | MMR Technologies Hall effect (2016) |
60 | Nanometrics AUV-321-RO2 Type I/II |
61 | Nanometrics Hamamatsu L2196 Deuterium Lamp |
62 | Nanometrics Nanospec AFT2100 Film Thickness Measurement System |
63 | New Wave EZlaze 532nm with Mitutoyo FS60 microscope |
64 | Newport XYZ Micropositioners, pair |
65 | Newport XYZ Micropositioners, pair |
66 | Oyama OYM-131 micropositioner with magnetic base |
67 | PPL 4×6 2-axis calibration standard |
68 | Probing Solutions PSI200 Test Station |
69 | Probotech P11-LX6x9 Flying Micro-Prober, Dual Sided |
70 | Probotech P11-LX6x9 Flying Micro-Prober, Dual Sided |
71 | R&K 260 manual prober with 2 micropositioners |
72 | RMS Systems/Hologenix NGS 3500 Defect Detection System |
73 | RMS Systems/Hologenix NGS 3500 Defect Detection System |
74 | Semilab CMS3 non contact sheet resistance measuring system |
75 | Sentech SE400adv-16 wafer mapping ellipsometer with motorized 8×8 stage- Factory recertified December 2019 |
76 | Signatone CM100 ultra stable 200mm manual prober with Mitutoyo microscope |
77 | Signatone CM310 manual prober with 300mm(12in) wafer stage |
78 | Signatone CM460-22 semiautomatic probe station |
79 | Signatone S463 Semiautomatic Prober |
80 | Signatone S-925 micropositioners with vacuum base |
81 | Signatone S-926 Micropositioner with magnetic base |
82 | Signatone S-926 Micropositioner with magnetic base |
83 | Signatone S-926 positioners with vacuum base |
84 | Stylus for Veeco Dektak 2, 2A, 3, 3ST, 3030 |
85 | Suss Microtec PH150 micropositioner with vacuum base and probe arm |
86 | Suss Microtec PH250HF manual high frequency probehead with 3um resolution |
87 | Suss Microtech PH500 Motorized Micropositioners |
88 | Suss PH120 micropositioner |
89 | Suss PH150 micropositioner with vacuum hold-down – New unused |
90 | Suss PH400 manual Submicron Positioner with vacuum base |
91 | Suss PH600HF High Frequency Positioners (set of 4) |
92 | Suss PM-5 manual prober with 6in vacuum chuck and Mitutoyo FS60 microscope with motorized XY |
93 | Suss/MFI Vibsense |
94 | Suss/MFI Vibsense |
95 | Temptronic 150mm thermal chuck, max temp 200C, with TPO3020B-2300-1 controller and venturi vacuum generator |
96 | Temptronic SA76440 Air Dryer |
97 | Temptronic-TPO3500 Titan thermal chuck controller |
98 | TNP Instruments Micropositioners with vacuum base |
99 | Tropel 129745-04 75mm Wafer Chuck |
100 | Tropel 8240-FSI 100mm Wafer Chuck |
101 | Ultracision 680e semiautomatic prober with optional 150mm thermal chuck |
102 | Veeco CPII Atomic Force Microscope |
103 | Veeco CPII Atomic Force Microscope |
104 | Veeco Dektak V200-Si Stylus Profiler |
105 | Veeco Digital Instruments D3100AFM |
106 | Veeco Digital Instruments Dimension Large Sample Scanning Atomic Force microscope, LS-SPM with Nanoscope III controller and LSS large sample scanning stage |
107 | Veeco Digital Instruments Dimension Large Sample Scanning Atomic Force microscope, LS-SPM with Nanoscope III controller and LSS large sample scanning stage |
108 | Veeco Digital Instruments Large Sample Scanning Stage |
109 | Veeco Digital Instruments Large Sample Scanning Stage |
110 | Veeco Wyko NT8000 3D surface optical profiler |
111 | Veeco-Miller Design FPP-5000 with external 4 pt probe for large substrates |
112 | Wentworth CAP 3000 Motorized Positioner |
113 | Wentworth CAP 4000 Motorized Positioner |
114 | Wentworth MP-1100 Prober |
115 | Zeiss MSM193 Laser Aperture Set |
116 | Zygo 5x NV objective |
SS7270-1-2-1-1 and SS7270W