Description
Please contact us for the availability of the used semiconductor equipment.
[Pls use “CTRL+F “key button to search the model/key word you are interested in]
The items are subject to prior sale without notice. These items are only for end users.
Size | Module | Fab | Machine Function | Vendor | Model |
12″ | SH-F8 | HDP PSG | AMAT | Centura Ultima X | |
12″ | SH-F8 | Depth Measurement (AFM) | Bruker | VX330 | |
12″ | SH-F8 | Film Thickness (Cu) | Jordan-Valley | JVX6200 | |
12″ | SH-F8 | VF Gate Oxide | TEL | Alpha-303i | |
12″ | SH-F8 | ULT ALD-Oxide | HIKE | QuixaceII QLV2 | |
12″ | SH-F8 | AEI | Leica | LDS3300M | |
12″ | SH-F8 | AEI | Leica | LDS3300M | |
12″ | SH-F8 | High Current IMP | AMAT | Quantum X | |
12″ | SH-F8 | ADI | Leica | LDS3300C | |
12″ | SH-F8 | ADI | Rudolph | AXI-935 | |
12″ | SH-F8 | ADI | Leica | INS-3300+DUV | |
12″ | SH-F8 | Barrier & Seed | Novellus | Inova NExT | |
12″ | SH-F8 | Dielectric Constant Measurement | Semilab | 5130 | |
12″ | SH-F8 | W.S. Oxide Etch | SES | BW3000-X | |
12″ | SH-F8 | AFM (Profiler) | Bruker | X1D | |
E200 | SZ | SOG Coater | DS | SC-W80A-AG | |
E200 | Litho | SZ | SOG Coater | DS | SC-W80A-AG |
E200 | PVD | SZ | PVD | Canon-ANELVA | I-1060SV2+1 |
E200 | PVD | SZ | PVD | Canon-ANELVA | I-1060SV2+1 |
E200 | Litho | SZ | inline Developper | YUASA | SR-8075 |
E200 | ETCH | SZ | UV/O3 treatment | DS(SOKUDO) | DP-W80A-AV (UV) |
E200 | DIFF | SZ | RTA(for every 5 wfrs) | WaferMasters | 5BAO-200 |
E200 | WET | SZ | Sheet remove Washer | TYK | 132566 |
E200 | WET | SZ | Nitride Etching Bath | TYK | 161028 |
E200 | DIFF | SZ | Block Controller | HITACHI KOKUSAI ELECTRIC | CX-9620 |
E200 | DIFF | SZ | Block Controller | HITACHI KOKUSAI ELECTRIC | CX-9620 |
E200 | DIFF | SZ | Degital profiler | Okura | DP2301 |
E200 | DIFF | SZ | Degital profiler | Okura | DP2301 |
E200 | DIFF | SZ | Degital profiler | Okura | DP2301A01 |
E200 | DIFF | SZ | Degital profiler | Okura | DP2301A01 |
E200 | DIFF | SZ | Degital profiler | Okura | DP2301A01 |
E200 | DIFF | SZ | EDSA | AMAT | – |
E200 | ETCH | SZ | W Dry Etcher | Canon-ANELVA | ILD-4100SR |
E200 | ETCH | SZ | W Dry Etcher | Canon-ANELVA | ILD-4100SR |
E200 | ETCH | SZ | W Dry Etcher | Canon-ANELVA | ILD-4100SR |
E200 | ETCH | SZ | OX Dry Etcher | TEL | UNITY-IEM |
E200 | ETCH | SZ | OX Dry Etcher | Canon-ANELVA | ILD-4100SDⅡ |
E200 | ETCH | SZ | OX Dry Etcher | Canon-ANELVA | ILD-4100SDⅡ |
E200 | ETCH | SZ | OX Dry Etcher | Canon-ANELVA | ILD-4100SDⅡ |
E200 | ETCH | SZ | OX Dry Etcher | Canon-ANELVA | ILD-4100SDⅡ |
E200 | ETCH | SZ | OX Dry Etcher | Canon-ANELVA | ILD-4100SR |
E200 | Litho | SZ | Overlay Measurement | TKK | MAC-92MV1 |
E200 | Litho | SZ | Overlay Measurement | TKK | MAC-92MV1 |
E200 | Litho | SZ | Overlay Measurement | TKK | MAC-92MV1 |
E200 | Litho | SZ | Overlay Measurement | TKK | MAC-92MV1 |
E200 | Litho | SZ | Overlay Measurement | TKK | MAC-110MV1 |
E200 | Litho | SZ | Overlay Measurement | TKK | MAC-110MV1 |
E200 | PVD | SZ | Surface reflection measurement | Beckman Coulter | DU-650 |
E200 | CMP | SZ | Wafer Surface measurement | TOKYO SEIMITSU | Surfcom 590A-64 |
E200 | CMP | SZ | Wafer Surface measurement | TOKYO SEIMITSU | Surfcom 578A |
E200 | CMP | SZ | Thickness Measurement | DS | VM-8200 |
E200 | CMP | SZ | Thickness Measurement | DS | VM-8200 |
E200 | CMP | SZ | Thickness Measurement | DS | VM-2010 |
E200 | CMP | SZ | Wafer Thickness measurement | TOKYO SEIMITSU | E-MF1000-100 |
E200 | DIFF | SZ | Polyimide Bake Furnace | Koyo Thermo Systems | VF-5300B V35X |
E200 | DIFF | SZ | Polyimide Bake Furnace | Koyo Thermo Systems | VF-5300B V35X |
E200 | ETCH | SZ | OX Dry Etcher | TEL | UNITY-IEM |
E200 | Litho | SZ | Polyimide Coater | DS | SD-W80A-AVQ |
E200 | Litho | SZ | Polyimide Developper | DS | SD-W80A-AVQ |
E200 | DIFF | SZ | Block Controller | HITACHI KOKUSAI ELECTRIC | CX-9620 |
E200 | DIFF | SZ | High energy IMPLA | SEN | NV-GSD-HE |
E200 | YE | SH | Inspection SEM | JEOL | JWS-7515 |
E200 | DIFF | SZ | LP-CVD(TEOS NSG) | TEL | α-808SC |
E200 | DIFF | SZ | High current IMPLA | SEN | NV-GSDⅢ-90 |
Maker | Model | Serial Number | Process | Size | Vintage |
AMAT | PRODUCER_SE | 418160 | CVD | * 12 | 2008-12-31 |
AMAT | PRODUCER_SE | 410621 | CVD | * 12 | 2006-08-31 |
AMAT | SEMVISION_G3 | W-3040 | METRO | * | 9/20/2007 |
KLA_TENCOR | HRP340 | 806158672 | METRO | * | 10/31/2006 |
LAM | 2300KIYO45 | 102890 | ETCH | * 12 | 2007-09-29 |
LAM | 2300FLEX45 | 60394 | ETCH | * | 9/2/2002 |
NOVELLUS | VECTOR | D8019A | CVD | * 12INCH | 7/31/2004 |
TEL | ACT12 | MD-E240732 | PHOTO | * | 2004-01-31 |
AMAT | ENDURA2 | 424492-PJ-ECH2 | METAL | * | 10/31/2012 |
AMAT | ENDURA2 | 424492-PJ-ECH5 | METAL | * | 10/31/2012 |
AMAT | ENDURA2 | 424492-PJ-ECHC | METAL | * | 10/31/2012 |
AMAT | ENDURA2 | 424492-PJ-ECHD | METAL | * | 10/31/2012 |
AMAT | ENDURA2 | SAP522-C | METAL | * | 7/27/2012 |
AMAT | ENDURA2 | SAP522-D | METAL | * | 7/27/2012 |
AMAT | ULTIMA_X | 409788 | CVD | * 12 | 2006-03-31 |
AMAT | PRODUCER_SE+ | 411875 | CVD | * 12 | 2006-07-31 |
AMAT | PRODUCER_SE | 407011 | CVD | * 12 | 2005-06-30 |
AMAT | ENDURA2 | 406919 | METAL | * 12인치 | 6/30/2005 |
AMAT | PRODUCER_GT | 424522 | CVD | * 12인치 | 2012-06-28 |
AMAT | PRODUCER_SE | 404249 | CVD | * 300mm | 7/31/2004 |
AMAT | PRODUCER-GT | 417824 | CLN | * 12 | 10/31/2008 |
KLA_TENCOR | HRP340 | 407160272 | METRO | * 12 | 12/30/2013 |
KLA_TENCOR | HRP340 | 205155872 | METRO | * 12 | 5/31/2005 |
LAM | 2300EXELAN | 79537 | ETCH | * 12 | 6/30/2005 |
NOVELLUS | VECTOR | D14937A | CVD | * 12inch | 6/29/2007 |
NOVELLUS | VECTOR | 02-19-C30128 | CVD | * 12INCH | 6/29/2007 |
Cannon | ES6a | 8479 | Photo | * | 2/28/2013 |
AMAT | PRODUCER_SE | 418159 | CVD | * 12 | 2008-11-30 |
AMAT | PRODUCER_SE | 420813 | CVD | * 12 | 2010-10-31 |
AMAT | PRODUCER_SE | 415383 | CVD | * 12 | 2008-11-30 |
AMAT | CENTURA_DPN | 413609 | DIFF | * 12 | 2007-06-29 |
AMAT | ENDURA2 | 406915 | METAL | * 12인치 | 8/26/2005 |
TEL | LITHIUS_I+ | MD-G371108 | PHOTO | * | 2008-03-31 |
These items are subject to sale without notice. These items are only for end users.
SS5582