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Metrology SEM Microscope

Category: Resell Products Tags: Accent, Caltex, CMI, Jeol, KLA-Tencor, Metrology, Nikon, Plasmos, Veeco, Wentworth, Zygo

Description

Description

The following Metrology SEM Microscope Equipment are only for end user. Please contact us if you have any questions. Subject to prior sale without notice. Appreciate your time!

Condition: Used.

Location: USA

More Info: Pls email us with your company name, location, website, company email address and RFQ in detail if possible.

1	Accent Bio-Rad Q5 Registration System
2	Accent Bio-Rad Q8 Registration Tool
3	Caltex Systems Microscope
4	Coating Management Instruments (CMI) XRX-X4 X-Ray System
5	Jeol JSM-6400F Scanning Microscope
6	Jeol JSM-6400F Scanning Microscope
7	KLA Tencor P-1 Profiler
8	KLA Tencor Surfscan 6200 Surface Defect Inspection System
9	KLA-Tencor 2138XP Surface Inspection System
10	KLA-Tencor 5100 Overlay Registration System
11	KLA-Tencor AIT I Patterned Surface Defect Inspection System
12	KLA-Tencor Alpha-Step 200 Surface Profiler
13	KLA-Tencor ASET F5x Thin Film Measurement System
14	KLA-Tencor FLX-2320 Film Stress Measurement System
15	KLA-Tencor P-10 Surface Profiler
16	KLA-Tencor P-15 Long Scan Profiler
17	KLA-Tencor Prometrix RS55/tc Four Point Probe System
18	KLA-Tencor Prometrix RS55/tca Four Point Probe System
19	KLA-Tencor Prometrix UV-1050 Thin Film Measurement System
20	KLA-Tencor SP1 TBI Unpatterned Surface Inspection System
21	KLA-Tencor Surfscan 4000 Inspection System
22	KLA-Tencor Surfscan 4500 Inspection System
23	KLA-Tencor Surfscan 5000 Inspection System
24	KLA-Tencor Surfscan 6200 Defect Inspection System
25	KLA-Tencor Surfscan 6220 Defect Inspection System
26	KLA-Tencor Surfscan 6400 Defect Inspection System
27	KLA-Tencor Surfscan 6420 Defect Inspection System
28	Nikon Optiphot 200 Inspection Microscope
29	Plasmos SD-4000 Ellipsometer
30	Seiko SMI3050SE-FIB-SEM Dual Beam Microscope
31	SPEA C320-MX Semiconductor Tester w/ M300 Manipulator
32	Veeco Dimension 3000 AFM System
33	Veeco Instruments Dektak 3030 Profiler
34	Wentworth MP-1000A Manual Probe Station
35	Zygo NewView 5000

ID-SS0992W

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Etcher, Please Etching, Dry Etching, Dry Clean, Semiconductor Equipment, Used Semiconductor Equipment, Semiconductor Process Equipment, Lam AutoEtch 490, Lam AutoEtch 590, Lam AutoEtch 690, Lam AutoEtch 790, Lam Rainbow 4400, Lam Rainbow 4420, Lam Rainbow 4428, Lam Rainbow 4500, Lam Rainbow 4520, Lam Rainbow 4528, Lam Rainbow 4600, Lam Rainbow 4620, Lam Rainbow 4628, Lam Rainbow 4700, Lam Rainbow 4720, Lam Rainbow 4728, Plasma Etcher, Plasma Etching, Dry Etching, Dry Clean, Semiconductor Equipment, Used Semiconductor Equipment, Semiconductor Process Equipment, Gasonics AE 2001, Microwave Etcher, Microwave Plasma Etcher, Microwave Etch, Downstream Plasma Etch,Enviro,ENVIRO-1XaENVIRO-1Xa ,2CENVIRO-Optima,Luminous NA,NA-8000NA-1300NA-1500 ,Multifilm,NE-550EXaNE-950EX, APIOSNE-5700Deep, Oxide Etching,NLD-570EXaRISE System,RISE Series,Cluster Systems,SME SeriesuGmni Series,SRH SeriesULDiS Series,SMV-500FRoll-coater,SPW SeriesIn-line Systems,SIV SeriesSDH-4550LR&D,CS-200, 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formation,radical-based oxidation process,rapid thermal processing spike anneal,300mm RTP spike anneal process,ramp-up methodologies, rampdown methodologies,Rapid thermal annealing apparatus,RTA furnace,Dai-ichi Kiden,Dai-ichi Kiden RSA, Combustion furnace, High vacuum heating system, Vertical high temperature heating system,Induction heating system(elevating),Ultra high temperature heating system,CreaTec Fischer,Growth Systems,Mini MBE System,LT-STM/AFM,Evaporators,Centrotherm,centrotherm c.HORICOO 300 ,horizontal batch-type system,centrotherm c.HORICOO 200 , field-proven , ultra-versatile tube furnace system ,centrotherm c.VERTICOO , batch-type wafer processing , semiconductor device fabrication, atmospheric processes, LPCVD processes,centrotherm c.ACTIVATOR, high-temperature annealing, high-volume SiC device manufacturing, electrical activation , post implantation annealing ,SiC MOSFET , diode manufacturing,Cost-efficient dopant activation,Annealing of AlN seed layers , Annealing of AlN epitaxial layers,centrotherm c.OXIDATOR , high-temperature oxidation furnace , Rapid Thermal Processing system for silicon and compound semiconductors,c.RAPID 200,fully automatic loading system,centrotherm PECVD,c.PLASMA, c.DIFF,centrotherm highly versatile diffusion,wide band gap,c.CRYSCOO HTA,AP Systems,AP Systems Korea,KORONA RTP-12MP, KORONA RTP-12LPO , KORONA RTP-12LR/LPRR,Seebeck Coefficient / Electric Resistance Measurement System ZEM-3 series，Mini Lamp Annealer MILA-5050， Atmospheric Thermoelectric Module Evaluation System F-PEM，