Description
Please contact us for the availability of the JEOL JWS 8000Z CD-SEM.
JEOL JWS 8000Z CD Scanning electron microscope, 12 inch
Auto loader
Cassette-to-cassette robotic arm
Wafer random access
Wafer pre alignment
Wafer notch detection
Wafer position repeatability:
X and Y
Within ≤ ± 30 µm from center of wafer
R less
1997 vintage.
The items are subject to prior sale without notice. These items are only for end users.
SS5487

