Description
The following Metrology equipment are only for end user. Please contact us if you have any questions. Subject to prior sale without notice. Appreciate your time!
Condition: Used
1 | Accretech Huricane A5000 TSK A5000 |
2 | Accretech Win-Win 50 1500 TSK WIN 1500 |
3 | Accretech Win-Win 50 1600 Bright Field Inspection |
4 | ADE Episcan 1000 Epi Thickness Measurement System |
5 | Alcatel ASM 180 TD Helium Leak Detector |
6 | AMAT DFinder2 Defect Inspection |
7 | AMAT EBEAM eBeam Inspection |
8 | AMAT Elite MS MC AMAT ELITE M5 MC |
9 | AMAT NanoSEM 3D CD Metrology |
10 | AMAT NanoSEM 3D CD-SEM |
11 | AMAT NanoSEM 3D Scanning Electron, CDSEM Measurement |
12 | AMAT SEMVision CX Defect Review |
13 | AMAT UVision 200 Bright-Field Inspection |
14 | AMAT UVision 5 BFIUV5_Brightfield_AMAT |
15 | AMAT UVision 5 Brightfield inspection |
16 | AMAT Verity Metrology |
17 | Ametek/Cameca LEXFAB300 CAMECA LEXFAB300 uncond. Eval. |
18 | ANASYSTA SLURRY METROLOGY SYSTEM Optical Particle Sizer |
19 | Bruker D8 DISCOVER X-Ray Metrology |
20 | Bruker D8FABLINE X-ray |
21 | Bruker Insight 3D Mask House Photomask Inspection |
22 | Camtex X- ACT TEM Sample Preparation System |
23 | Carl Zeiss AIMS 32-193i Phtotomask Repair System |
24 | Carl Zeiss Axiospect 300 surface optical microscope |
25 | Carl Zeiss Axiospect 300 Wafer inspection microscope |
26 | Carl Zeiss Axiotron-2 Inspection Microscope |
27 | Carl Zeiss Axiotron-2 Microscope |
28 | Carl Zeiss LEA1530 SEM |
29 | Carl Zeiss MeRit HR32 Plus Mask Repair System |
30 | Estion / Benchmark TECHNOLOGIES E-RETICLE V 4M Electrostatic Charge Measurement |
31 | FEI CLM 3D TEM Preparation Tool |
32 | FEI CLM TEM Preparation Tool |
33 | FEI DA300 FIB -Focused Ion Beam Defect Analysis |
34 | FEI FIB200 |
35 | FEI Plucker TEM Prep tool |
36 | FEI TEMLINK – KY02 Ex-Situ Plucker, TEM Prep Tool |
37 | FEI TEMLINK 14771-003 TEM sample Pluck |
38 | FEI V600 Single Beam FIB. |
39 | FSM FSM128LC2C Film Stress Measurement |
40 | GEMETEC Elymat III WSPS |
41 | Hermes Microvision eP4 CFM_EBeam Inspection HMI |
42 | Hermes Microvision eScan320 ebeam Inspection |
43 | Hermes Microvision eScan500 ebeam Inspection |
44 | Hitachi AS5000 Wafer Particle & Defect Analysis System AS-5000 |
45 | Hitachi HD2300 STEM |
46 | Hitachi HF-2000 EDX/EELs/STEM imaging |
47 | Hitachi IS2700 Dark Field inspection |
48 | Hitachi Microanalysis EX-250/350/450 |
49 | Hitachi RS4000 DR SEM |
50 | Hitachi RS5000 Defect Review SEM |
51 | Hitachi S-4800 FE SEM |
52 | Hitachi S-5200 FE SEM |
53 | Hitachi S-5200 SEM, Ultra High Resolution |
54 | Hitachi S-9380 CDSEM |
55 | Hitachi S-9380II CD SEM |
56 | Hitachi Z-5700 |
57 | Horiba PR-PD2 Reticle/Mask Particle Detection System |
58 | HSEB AXIOSPECT 301 Optical Microscope |
59 | JEOL ARM200CF Super X PFA |
60 | JEOL JEM-2500SE Microscopes |
61 | JEOL JEM-2500SE TEM |
62 | JEOL JEM3200FS TEM |
63 | JEOL JWS-7515 SEM Wafer Inspection Tool |
64 | JEOL JWS-7555 SEM Wafer Inspection Tool |
65 | Jordan Valley JVX6200i TFM_THK_JV |
66 | Jordan Valley JVX7300 Film Thickness Measurement |
67 | KLA 3905 Broadband Plasma Patterned Wafer Inspection |
68 | KLA AIT Fusion Dark Field inspection |
69 | KLA Aleris CX Thickness measurement |
70 | KLA Aleris HX8500 Thickness measurement |
71 | KLA Archer 300 AIM Overlay |
72 | KLA ASET-F5x Thickness measurement |
73 | KLA CRS1010 Review Station |
74 | KLA DP2 Data Prep Station |
75 | KLA EDR5210 Defect Review SEM |
76 | KLA EDR5210 DRSEM |
77 | KLA eS31 E-beam Inspection |
78 | KLA eS32 E-beam Inspection |
79 | KLA FX200 Thickness measurement |
80 | KLA HRP-340 Profiler |
81 | KLA INM100+INS10 Marco inspection |
82 | KLA KLA2371 Bright Defect inspection |
83 | KLA KLA5100 Overlay |
84 | KLA P11 Surface Profilometer |
85 | KLA Polylite 88 METALLURGICAL SCOPE |
86 | KLA Puma 9000 Dark Field Inspection |
87 | KLA Puma 9130 Dark Field Inspection |
88 | KLA RS-50 Resitivity Profiler, RS50/e |
89 | KLA SLF576 Reticle inspection system |
90 | KLA SP1 DLS Particle counter |
91 | KLA Viper 2435 MACRO INSPECTION |
92 | KLA Viper 2438 Macro Defect Detection System |
93 | Kokusai VR-120SD Resistivity Measurement |
94 | LASERTEC BI100 EUV Reticle Back Side Inspection Tool |
95 | LASERTEC PEGSIS P100 Reticle Inspection Tool |
96 | M&W Products IPRO 7 Humidifier Module |
97 | Matsushita Seiki M515 Pellicle Mount Photomask Pellicle Mounting |
98 | Matsushita Seiki M515-III Photomask Pellicle Automounter |
99 | Matsushita Seiki M777 Pellicle Demount Automated Pellicle Demounter |
100 | Matsushita Seiki M777 Pellicle Demounter |
101 | Met One 3313 Portable cleanroom particle counter |
102 | METRON Extraction,Amine |
103 | Nanometrics Atlas Thickness measurement |
104 | Nanometrics Caliper Elan ACCENT CALIPER ELAN [OVERLAY MEASUREMEN |
105 | Nanometrics Caliper Elan Overlay Measurement |
106 | Nanometrics Caliper Mosaic Overlay |
107 | Nanometrics Caliper Q300 Overlay Inspection |
108 | Nanometrics NanoSpec 210 Thickness measurement |
109 | Nanometrics Q200I Overlay |
110 | Negevtech NT3100 Bright Field Inspection |
111 | Nicolet ECO1000 Film Thickness Gauge |
112 | Nikon mWL 300s for VMZ-R6555 Recon |
113 | Nikon OCDM 300MM Recon |
114 | Nikon Optistation 3000 RDL |
115 | Olympus metalurgical microscope Metallurgical Microscope |
116 | Phoenix micromex 160 2-D x-ray system |
117 | Phoenix Micromex SE 160T PHOENIX MICROMEX SE 160T |
118 | PMS Lasair 110 Maintenance Tool |
119 | Quantum Unknown Laser Scan Microscope |
120 | Raytex RXW-1226SFI |
121 | Rigaku 3272 |
122 | Rigaku SYS3620 Parts Tool |
123 | Rigaku SYS3630 X-ray, composition and thickness measurements |
124 | Rigaku TXRF3750 TXRF |
125 | RION KS-40AF Particle Measurement |
126 | RORZE B2-BL-R Wafer Sorter |
127 | RORZE RSR160 Reticle Handler |
128 | Rudolph 3Di8500 Wafer Inspection |
129 | Rudolph Axi-S Macro inspection |
130 | Rudolph NSX105 Backend, AUTO DEFECT INSPECTION SYSTEM |
131 | Rudolph NSX105 Macro Inspection |
132 | Rudolph NSX105C Macro Inspection |
133 | Rudolph NSX115 Macro inspection |
134 | Rudolph NSX115 Pre-Assy |
135 | Rudolph NSX115 RDL |
136 | Rudolph S300 Macro Defect inspection |
137 | Rudolph S3000S Xray thickness measurement |
138 | Rudolph S3000sx |
139 | Rudolph WV320 Macro Defect inspection |
140 | Rudolph WV320 Macro inspection |
141 | Scientech RVX5000 XPS |
142 | SDI SPVCMS4000 Surface Charge Measurement |
143 | Seiko Instrument Inc. XV 300DB Particle Measurement |
144 | Semilab ellipsometry Ellipsometric Porosimeter |
145 | Semilab IR3100s Dielectric characterization |
146 | SOLVISION PRECIS 3D Defect Inspection |
147 | SOLVISION PRECIS 3D SOLVISION PRECIS 3D |
148 | SOPRA EP12 Optical Dielectric Porosity Measurement System (300mm) |
149 | Toray HS-830 Gen 4 FPD particle counter |
150 | Veeco Dimension X1D ATOMIC FORCE MICROSCOPE (AFM) |
151 | Veeco Dimension X3D ATOMIC FORCE MICROSCOPE (AFM) |
152 | Veeco DUVx210 AFM |
153 | Veeco NT9800 RDL |
154 | Veeco V220SI Surface Profile Measurement |
155 | VLSI Standard PDS-100 Particle Deposition System |
ID-SS5684W