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ADE ESTEK Wafer Inspection System 600

Category: Resell Products Tag: ADE

Description

Description

ADE ESTEK Wafer Inspection System 600

Location: USA

Used. Did not test. We sell it at AS IS without warranty, return.

Valid Time: Subject to prior sale.

Info on the instrument from website. This is only for your reference.

Designed to completely analyze substrates, films and oxides used in the manufacture of semiconductors. Dark and light channel system. Dark channel is used for detecting particles and any light scattering defects. Light channel is useful for detecting non-light scattering defects such as mounds, dimples and non uniformity. Detects specular flaws, including large particles, mounds, dimples, saw marks, grooves, fractures, slip, epi-spikes, small particles on large grained surfaces, particles buried in/under a film. Detection 0.30 um or .20 um(optional) on Silicon at 95% capture rate. Verified by NIST Traceable Standards. Remanufactured system to factory production specifications.

ID-OEM-1

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Metrology | Tester | Wafer Carriers
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