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JEOL JWS 8000Z CD-SEM

Description

Please contact us for the availability of the JEOL JWS 8000Z CD-SEM.

JEOL JWS 8000Z CD Scanning electron microscope, 12 inch
Auto loader
Cassette-to-cassette robotic arm
Wafer random access
Wafer pre alignment
Wafer notch detection
Wafer position repeatability:
X and Y
Within ≤ ± 30 µm from center of wafer
R less
1997 vintage.

The items are subject to prior sale without notice. These items are only for end users.

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