Description
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Compustage for CM and Tecnai TEM. FEI-Philips TEM Part
FEI-Philips Transmission Electron Microscopes ( TEM) Part X, Y movement Å} 1 mm, Z movement Å} 0.375 mm; specimen size 3 mm. These products are subject to export restrictions under U.S. law. The Bureaus of U.S. Census and theBureau of Industry and Security (BIS) regulate exports through the Export Administration Regulations (EAR)
The Item is subject to prior sale without notice.
The Item is only for end user.
SS122875144096