Semiconductor Equipment parts-Metrology Probe

Description

Location: CA, U.S.A.

These are subject to prior sale. These are only for end user. Appreciate your time.

The trademarks of the equipment and parts contained in this website belonged to the Original Equipment Manufacturers.

1	ADE 1239B-3 75mm Wafer Positioning Ring
2	Alessi EC-01 controller
3	Alessi REL probe station with 4 inch vacuum chuck and Mitutoyo microscope- Rebuilt
4	Alessi REL-4100 manual prober with LY1 1064nm laser cutting system
5	Alessi/Cascade REL-4800 200mm manual wafer prober with Mitutoyo FS-60 microscope including Plan APO 10x/20x/50x objectives
6	AST Products VCA Optima XE Contact Angle Goniometer with motorized syringe
7	Brumley South/MEMC BSI-42P013H Latex Sphere Calibration Standard
8	Brumley South/MEMC BSI-42P013H Latex Sphere Calibration Standard
9	Brumley South/MEMC BSI-4P220H Latex Sphere Calibration standard
10	Brumley South/MEMC BSI-4P300H Latex Sphere Calibration standard
11	Brumley South/MEMC BSI-4P503H Latex Sphere Calibration standard
12	Brumley South/MEMC BSI-4P993H Latex Sphere Calibration standard
13	Cascade DCM-210V Micropositioners with vacuum base and 100TPI – set of 4
14	Cascade Microtech (Formfactor) MPS150 manual prober with 150mm vacuum chuck
15	Cascade Microtech 115-418
16	Cascade Microtech DCM-210V submicron positioner with vacuum base and 12C Picoprobe
17	Cascade Microtech MH2-B micropositioners with vacuum base
18	Cascade Microtech MS1-44/L Motorized Micropositioner
19	Cascade Microtech MS1-44/L Motorized Micropositioner
20	Cascade Microtech WPH-001-200
21	Cascade Probe Card Holder 115-418 for Summit 11XXX and 12XXX series Probers with microchamber
22	Cascade RF1 Microwave probe station
23	DataPhysics ACA50 Dynamic Contact Angle with programmable stage
24	ESI New Wave Quiklaze 50ST2 532/355nm (2012)
25	Everbeing International 200mm hot chuck with digital controller
26	GGB Industries Picoprobe 12C
27	GGB Industries Power Supply
28	Giga Test Labs GTL4040 Precision Probing Platform
29	Giga Test Labs GTL4040 Precision Probing Platform
30	ICS Ceramic vacuum chuck 12in x 12in
31	Jandel RM3000 4 point probe (NEW UNUSED) with 200mm wafer platform
32	K&S 4 point probe head
33	Karl Suss PA200 semiautomatic prober with temperature controlled 200mm chuck and dark chamber
34	Karl Suss Prober Dark Box
35	Kruss DSA100S automated contact angle and drop shape analysis system
36	Lakeshore Cryogenics FWP6 probe station
37	Large sample scanning stage and AFM probe
38	Large sample scanning stage and AFM probe
39	Line Tool Mfg. Model A micropositioner
40	Metricon 2010 Prism Coupler 633nm (1997)
41	Micromanipulator 100PM test station
42	Micromanipulator 110/210 micropositioners with 10micron accuracy, vacuum base, and probe arm (NEW UNUSED)
43	Micromanipulator 2250 Large Area Panel Prober
44	Micromanipulator 2250 Large Area Panel Prober
45	Micromanipulator 250 micropositioner- left hand for probing 2-6 micron geometries
46	Micromanipulator 350 micropositioner- right hand for probing 2-6 micron geometries
47	Micromanipulator 450/550 Submicron positioner
48	Micromanipulator 450/550 Submicron positioner
49	Micromanipulator 450/550 submicron positioners with vacuum base
50	Micromanipulator 450/560VM UNUSED micropositioner with vacuum base
51	Micromanipulator 500MT positioner with magnetic base
52	Micromanipulator 6100 150mm Manual Prober with B&L Microzoom 2
53	Micromanipulator 72-3-R-XX probe
54	Micromanipulator ECT-01
55	Micromanipulator FET-PS4 Active Probe
56	Micromanipulator FPC-FRX
57	Micromanipulator HCSM
58	Micromanipulator Probe card holder with planarization and theta adjustment
59	MMR Technologies Hall effect (2016)
60	Nanometrics AUV-321-RO2 Type I/II
61	Nanometrics Hamamatsu L2196 Deuterium Lamp
62	Nanometrics Nanospec AFT2100 Film Thickness Measurement System
63	New Wave EZlaze 532nm with Mitutoyo FS60 microscope
64	Newport XYZ Micropositioners, pair
65	Newport XYZ Micropositioners, pair
66	Oyama OYM-131 micropositioner with magnetic base
67	PPL 4×6 2-axis calibration standard
68	Probing Solutions PSI200 Test Station
69	Probotech P11-LX6x9 Flying Micro-Prober, Dual Sided
70	Probotech P11-LX6x9 Flying Micro-Prober, Dual Sided
71	R&K 260 manual prober with 2 micropositioners
72	RMS Systems/Hologenix NGS 3500 Defect Detection System
73	RMS Systems/Hologenix NGS 3500 Defect Detection System
74	Semilab CMS3 non contact sheet resistance measuring system
75	Sentech SE400adv-16 wafer mapping ellipsometer with motorized 8×8 stage- Factory recertified December 2019
76	Signatone CM100 ultra stable 200mm manual prober with Mitutoyo microscope
77	Signatone CM310 manual prober with 300mm(12in) wafer stage
78	Signatone CM460-22 semiautomatic probe station
79	Signatone S463 Semiautomatic Prober
80	Signatone S-925 micropositioners with vacuum base
81	Signatone S-926 Micropositioner with magnetic base
82	Signatone S-926 Micropositioner with magnetic base
83	Signatone S-926 positioners with vacuum base
84	Stylus for Veeco Dektak 2, 2A, 3, 3ST, 3030
85	Suss Microtec PH150 micropositioner with vacuum base and probe arm
86	Suss Microtec PH250HF manual high frequency probehead with 3um resolution
87	Suss Microtech PH500 Motorized Micropositioners
88	Suss PH120 micropositioner
89	Suss PH150 micropositioner with vacuum hold-down – New unused
90	Suss PH400 manual Submicron Positioner with vacuum base
91	Suss PH600HF High Frequency Positioners (set of 4)
92	Suss PM-5 manual prober with 6in vacuum chuck and Mitutoyo FS60 microscope with motorized XY
93	Suss/MFI Vibsense
94	Suss/MFI Vibsense
95	Temptronic 150mm thermal chuck, max temp 200C, with TPO3020B-2300-1 controller and venturi vacuum generator
96	Temptronic SA76440 Air Dryer
97	Temptronic-TPO3500 Titan thermal chuck controller
98	TNP Instruments Micropositioners with vacuum base
99	Tropel 129745-04 75mm Wafer Chuck
100	Tropel 8240-FSI 100mm Wafer Chuck
101	Ultracision 680e semiautomatic prober with optional 150mm thermal chuck
102	Veeco CPII Atomic Force Microscope
103	Veeco CPII Atomic Force Microscope
104	Veeco Dektak V200-Si Stylus Profiler
105	Veeco Digital Instruments D3100AFM
106	Veeco Digital Instruments Dimension Large Sample Scanning Atomic Force microscope, LS-SPM with Nanoscope III controller and LSS large sample scanning stage
107	Veeco Digital Instruments Dimension Large Sample Scanning Atomic Force microscope, LS-SPM with Nanoscope III controller and LSS large sample scanning stage
108	Veeco Digital Instruments Large Sample Scanning Stage
109	Veeco Digital Instruments Large Sample Scanning Stage
110	Veeco Wyko NT8000 3D surface optical profiler
111	Veeco-Miller Design FPP-5000 with external 4 pt probe for large substrates
112	Wentworth CAP 3000 Motorized Positioner
113	Wentworth CAP 4000 Motorized Positioner
114	Wentworth MP-1100 Prober
115	Zeiss MSM193 Laser Aperture Set
116	Zygo 5x NV objective