Description
Please contact us if you are interested in the following Metrology equipment. We do not own the items. These items are only for end user. They are subject to prior sales without notice. First come, first serviced. Appreciate your time.
- ADE FIT3120 PARTICLE COUNTER2018-11-20
- ADE WaferSight Wafer Flatness Measurement
- AMAT Orbot WF720 Metrology
- AMAT SEMVision G3 DR SEM
- AMAT, Methrology, WF-736XS(DUO), S/N T169
- AMAT, Methrology, WF736-XS(DUO), S/N T173
- AMAT, Methrology, WF736-XS(DUO), S/N T176
- Brooks Bright light 200 UV Inspection
- Brooks PRI7500 Pod Stocker
- Canon Aligner PLA-501F
- CANON PLA-501FA Mask Aligner
- CNC System (NIKON Model NEXIV VMR-3020)
- Dimension 5000 AFM
- DNS Model STM-603
- Dong-A LCM Inspector Pattern Generator (Cameleon)
- Electrode Inspecti
- FE SEM HITACHI S-43002018-11-21
- FEI AE2018-12-03
- FEI Helios 400 AE2018-12-03
- FEI Model Certus 3D
- FEI Normal SEM Inspect S50
- FIB – SEM ( FEI Model CERTUS 3D )
- Field Emission SEM (TESCAN MIRA2)
- Film thickness
- Film thickness measurement (DNS / STM-603)
- Film thickness measurement (KLA-Tencor / prometrix UV-1050)
- FT-IR Nanometrics QS-1200
- Hirayama PC-304R7 PCT System
- Hitachi I6300 Defect Inspection
- Hitachi I6300 Defect Inspection
- Hitachi IS2700 Dark Field inspection
- Hitachi Kokusai VR-120SD Resistivity Measurement
- Hitachi Kokusai VR120SD Resitivity Measurement
- Hitachi REVIEW SEM RS-4000
- Hitachi RS3000 DR SEM
- Hitachi RS3000T DR SEM
- Hitachi RS4000 DR SEM
- Hitachi RS4000 DR SEM2018-11-26
- Hitachi RS5000 DR SEM
- Hitachi S4300 FE SEM
- Hitachi S4700 FE SEM
- Hitachi S5200 FE SEM
- Hitachi S-5200 FE SEM
- Hitachi S-8840 CD-SEM
- Hitachi S-9380II CD SEM
- Hitachi S-9380II CD SEM
- Hitachi SEM S5000
- Hitachi, SEM, S-9380
- HITACHI-KOKUSAI
- Horiba PR-PD2 Reticle/Mask Particle Detection System
- Hypervision CHIP UNZIP Chip Unzip Process
- ICP-OES Spectrometer (LeeMan Labs)
- ISIS SENTRONICS SemDex 301-34 Wafer metrology system
- JEOL JSM-7401F FE SEM
- KLA AIT I Surfscan – 2 complete systems available for sale
- KLA CD-SEM 8100 – 2 systems for sale
- KLA CD-SEM 8100XP – 2 systems for sale
- KLA SFS6200 particle counter for sale
- KLA Tencor Alpha-Step 500 Surface Profiler2018-11-21
- KLA Tencor ICOS WI-2200 & HM-200 Used Wafer Inspetor
- KLA-TENCO 6420
- KLA-TENCO AIT Fusion Dark Field inspection
- KLA-TENCO AIT Fusion XUV Dark Field inspection
- KLA-TENCO Aleris CX Film thickness measurements
- KLA-TENCO Aleris HX8500 Thickness Mesurement
- KLA-TENCO Archer 10 AIM+ Overlay
- KLA-TENCO Archer 10XT+ Overlay
- KLA-TENCO Archer AIM MPX Overlay
- KLA-TENCO Archer AIM+ Overlay
- KLA-TENCO AWIS-3110 Particle counter
- KLA-TENCO AWIS-3110 Particle counter
- KLA-TENCO EDR5210 Defect Review SEM
- KLA-TENCO EDR5210 Defect Review SEM
- KLA-TENCO Ergolux Metrology
- KLA-TENCO INM100+INS10 Metrology
- KLA-TENCO INS3300 Macro-Defect inspection
- KLA-TENCO KLA2371 Inspection
- KLA-TENCO KLA2552 Data Review Station
- KLA-TENCO KLA2800 Bright Filed inspection
- KLA-TENCO KLA5200XP Overlay
- KLA-TENCO LDS3300M Macro inspection
- KLA-TENCO Model Candela 6300
- KLA-TENCO Model Candela 8620 (2~8 inch)
- KLA-TENCO NANOMAPPER Nanotopography
- KLA-TENCO P11 Profiler
- KLA-TENCO Puma 9000 Dark field defect Inspection
- KLA-TENCO Puma 9000S Dark field defect Inspection
- KLA-TENCO Puma 9100 Dark field defect Inspection
- KLA-TENCO Puma 9130 Dark field defect Inspection
- KLA-Tencor Archer AIM+ Overlay2018-11-27
- KLA-Tencor Archer AIM+ Overlay2018-11-27
- KLA-Tencor Archer AIM+ Overlay2018-11-27
- KLA-Tencor AWIS-3110 Wafer Inspection System
- KLA-Tencor KLA5100 Metrology
- KLA-Tencor KLA5200XP Overlay
- KLA-Tencor MPV CD2 AMC Metrology
- KLA-Tencor MPV CD2 AMC Metrology
- KLA-Tencor MPV-CD Metrology
- KLA-Tencor SFS7700 Particle Counter
- KLA-Tencor SP2 Ml2018-12-03
- KLA-Tencor Surfscan 2.1 Particle Counter
- KLA-Tencor UV-1280 SE Thin Film Measurement System
- KLA-Tencor, OVERLAY, Archer10XT
- K-MAC Spectra Thick
- Kubotek, Particle Inspections, SKLS2-3
- Laser Confocal ALICONA Infinite Focus IFM G2.0E
- Lifetime Measurement (SEMILAB WT-2000)
- Mask Aligner
- Mask Aligner
- Mask Aligner , 6″ Wafer
- Mask Aligner Karl Suss MA-6
- Mask Aligner6″
- Mask AlignerDNK MA-4200
- Mask Alinger Karl Suss MA150EL
- Met One DE712AF-5 Surface Particle Counter
- MICROSCOPE+AUTO LOADER OLYMPUS MX-61F+AL110 LMB 8
- MSP 2110 Particle Sampler
- Nanoin printer
- Nanometrics Caliper Mosaic Overlay
- Nanometrics Caliper Mosaic Overlay
- Nanometrics Caliper Mosaic Overlay
- Nanometrics CDS-200 Optical CD SEM
- Nanometrics Metra2200M Overlay
- Nanometrics Metra7200 Overlay
- Nanometrics NanoSpec 210 Metrology
- Nanometrics NanoSpec AFT400 Film Thickness Measurement
- Nanometrics Nanospec M5000 6″ Thickness Measurement_Used
- Nanometrics SIPHER EPI Slip and Defect
- Nicolet ECO3000 FT-IR
- Nikon Microscope ECLIPSE L200
- NIKON Model V-24B , V-12
- Nikon OPTIPHOT 66 Microscope
- NIKON Optistation VII
- Nikon SMZ-U Sterescopic Zoom Microscope
- Nikon SMZ-U Sterescopic Zoom Microscope
- Nikon VMZ-R3020 Measuring System2018-11-29
- Normal SEM HITACHI S-3000H2018-11-21
- Normal SEM JEOL JSM-55102018-11-21
- Noteh profiler (YUHI Model EPR-212N (2~12 inch))
- OAI 358 Stepper Exposure Analyzer
- OAI 358 Stepper Exposure Analyzer
- OAI 358 Stepper Exposure Analyzer
- Olympus BHMJL Microscope
- Olympus BHMJL Microscope
- Olympus MX61-F 8inch wafer
- Olympus MX61L Microcope
- Park Systems AFM XE-75
- Quick Coater (DC Sputter ) SC-701 구함
- Resistance Measurement (SEMILAB RT-100)
- Rigaku Ml2018-12-03
- Rigaku TXRF3750 X-Ray Fluorescence
- Rudolph/August 3Di8500 Wafer Inspection
- Rudolph/August Axi-S Macro Inspection
- Rudolph/August Axi-S Macro inspection
- Rudolph/August FE-IV Inspection
- Rudolph/August FE-VII Ellipsometer
- Rudolph/August FE-VII Focus Ellipsometer
- Rudolph/August FE-VII-D Focus Ellipsometer
- Rudolph/August FE-VII-D Focus Ellipsometer
- Rudolph/August MetaPULSE 300 Thickness Measurement
- Rudolph/August NSX105 Macro Inspection
- Rudolph/August NSX105 Macro Inspection
- SEM (HITACHI / S-5000 , with EDX)
- SEM (HITACHI)
- SEM FEI Inspect S50
- Semvision CX+ SEM Defect Analyser
- SEMVision G3 Defect Review SEM
- SEMVision G3 FIB DR SEM
- SEMVision G3
- Seojin SSM5200 Capacitancy-Voltage Tester
- Signatone S-1060R-6SND3L Thermal Probing System
- Silvaco S3245A Noise Amplifier
- Spectrometer Seiko Instrument SPA500
- Surface Inspection ( KLA Model CANDELA CS10 )
- Surftens Measurement Metrology
- Taylor Hobson Talyrond 265
- Temperature Forcing System / ex: T2800
- Thermo Emission SEM (TESCAN VEGA3 LMU)
- Through hole inspection (SHIMAKAWA)
- Topcon, Metrology, Vi-4203
- UV/Vis Perkin Elmer Lambda 950
- UVision 4 Bright field inspection
- Veeco Dimension X3D AFM
- Veeco UVX310 Step Profiler
- Veeco V200 Profiler
- Visual Inspector IMS LVIS-III
- Wafer Bump Inspect System (5 / 6 / 8 inch)
- Wafer peeling M/C(DAITRON)
- Wanted C-SAM Sonoscan D9000
- Wanted Suss MA150e mask aligner
- Wanted Wesco Union Hisomet DH-II Measuring Microscope
- WF720 Metrology
- WF730 Metrology
- X-ray thickness measurement (SII / SFT-3200S, SEA-1200VX)
- XRD
- XRD PANalytical X’Pert Pro
- XRD PANalytical X’Pert Pro
- XRD Sale ( Bruker )
