Description
Semiconductor equipment spare parts . These are only for END USERS. Please contact us for the availability of the following Semiconductor equipment spare parts . Subject to prior sale. Appreciate your time!
| 1 | Agilent | HP 83000 | Final Test |
| 2 | Agilent | Verigy 93000(part machine) | Final Test |
| 3 | Applied Precision | ProbeWorx 300 | Prober |
| 4 | ASM | AD809 | Bonder |
| 5 | CASCADE | SUMMIT 11000 | Prober |
| 6 | CASCADE | SUMMIT 12000 | Prober |
| 7 | DNS / DAINIPPON | SKW-629-BV Coater | Photoresist |
| 8 | DNS / DAINIPPON | SSW-629-B Develop | Photoresist |
| 9 | Electroglas | IR9850 | Lasers |
| 10 | Electroglas | EG1034 | Prober |
| 11 | Electroglas | EG2001X | Prober |
| 12 | Electroglas | EG2080X | Prober |
| 13 | Electroglas | EG3001X | Prober |
| 14 | Electroglas | EG4060 | Prober |
| 15 | Electroglas | EG4080 | Prober |
| 16 | Electroglas | EG4085 | Prober |
| 17 | Electroglas | EG4090, EG4090u | Prober |
| 18 | Electroglas | EG4090u Tri-Temp | Prober |
| 19 | Electroglas | EG4090FX Pathfinder | Prober |
| 20 | Electroglas | EG4090u+ | Prober |
| 21 | Electroglas | Hinged Manipulator | Spare Parts |
| 22 | Hitachi | S-806 | Microscope |
| 23 | Join Technology | Si Expander | Expander |
| 24 | KLA / TENCOR | P-2 Long Scan Profiler | Wafer Testing and Metrology |
| 25 | KNS | 1488L Turbo | Wire Bonder |
| 26 | Korea Vacuum Tech | SUS-304 | Evaporators |
| 27 | Lead Engineering | LDF-6100 Horizontal Furnace | Oven / Furnance |
| 28 | LTX-Credence | Quartet Tester | Final Test |
| 29 | Micromanipulator | MM9900 | Prober |
| 30 | Micromanipulator | MM8065 | Prober |
| 31 | MIDAS | MDA-400M | Mask Aligner |
| 32 | Nanometrics | AFT210 | Wafer Testing and Metrology |
| 33 | Neon Tech | NEX-6 | Wafer & Mask Scrubbers |
| 34 | OLYMPUS | BH-2 | Microscope |
| 35 | Osung | Dry oven | Oven / Furnance |
| 36 | PROBILT | PB6800 | Prober |
| 37 | QMC | DSR-400 | Die Attachers |
| 38 | SEMICS | OPUS3 | Prober |
| 39 | Sera Soft | SE2030 | Final Test |
| 40 | Sera Soft | SE202D Diode Tester | Final Test |
| 41 | Solid State Measurement | SS150 | Wafer Testing and Metrology |
| 42 | SZM | SZM-45B4 | Microscope |
| 43 | Tektronix | 370A | Electronic Test Equipment |
| 44 | TEL | D250 | Chiller |
| 45 | TEL | D204 | Chiller |
| 46 | TEL | D214 | Chiller |
| 47 | TEL | 19S | Prober |
| 48 | TEL | P-8 | Prober |
| 49 | TEL | P-8XL | Prober |
| 50 | TEL | P-8XLm | Prober |
| 51 | TEL | P-12XLn Tri-temp | Prober |
| 52 | TEL | P-12XLm | Prober |
| 53 | TEL | WDF 6 inch Frame | Prober |
| 54 | TEL | Hinged Manipulator | Spare Parts |
| 55 | TEMPTRONIC | TPO3000 | Chiller |
| 56 | TEMPTRONIC | TPO3200 | Chiller |
| 57 | Teradyne | J750(512CH) | Final Test |
| 58 | Teradyne | J750 part | Final Test |
| 59 | Thermco Systerms | TMX 10000 | Oven / Furnance |
| 60 | Thermco Systerms | TMX 9001 | Oven / Furnance |
| 61 | TSK | UF200 Tri-temp | Prober |
| 62 | TSK | UF200R | Prober |
| 63 | TSK | UF200A | Prober |
| 64 | TSK | UF200SA(Hot) | Prober |
| 65 | TSK | UF200S | Prober |
| 66 | TSK | UF200DR | Prober |
| 67 | TSK | UF2000 | Prober |
| 68 | TSK | UF3000 | Prober |
| 69 | Verteq | 1600 Spin Rinse | Dryer |
ID-SS5582-i-3
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