AG ASSOCIATES MINIPULSE 310 RAPID THERMAL PROCESSOR

AG ASSOCIATES MINIPULSE 310 RAPID THERMAL PROCESSOR

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Description

Model:MINIPULSE 310 RAPID THERMAL PROCESSOR

OEM:  AG ASSOCIATES

Condition: Used.We did not test it. We sell it at AS IS,WHERE IS.

Description from OEM for your reference only.

Features and Applications

Manually loaded and capable of processing silicon and III-V substrates up to 75mm in diameter, Minipulse 310 provides solutions to your process development and monitoring needs. Equipped with a graphical user interface to improve operator productivity, Minipulse 310 offers recipe management and system diagnostics.

Major System Features

  • Semiconductor grade quartz process chamber
  • 21 tungsten halogen lamps in an upper and lower array
  • Extended Range Pyrometer: 400°C -1300oC (200°C w/TC)
  • Graphical User Interface(GUI)
  • Rebuilt to OEM specs- will look like new system

These capabilities, combined with the heating chamber’s cold-wall design and superior heating uniformity, provide significant advantages over conventional furnace processing.

Key Features Include

  • Closed-loop temperature control with pyrometer or thermocouple temperature sensing.
  • Precise time-temperature profiles tailored to suit specific process requirements.
  • Fast heating and cooling rates unobtainable in conventional technologies.
  • Consistent wafer-to-wafer process cycle repeatability.
  • Elimination of external contamination.
  • Small footprint and energy efficiency.

Performance Specifications

  • Recommended Steady State Temperature Range: 400-1250° C.
  • Steady-State Temperature Stability: ± 2° C.
  • Temperature Monitoring Mechanisms: Extended Range Pyrometer (ERP), used throughout the recommended temperature range, or a thermocouple, used for process temperatures below 400° C.
  • Heating Rate: 1-200° C per second, user-controllable.
  • Cooling Rate: Temperature dependent; max 150° C per second.
  • Maximum Non-uniformity:
  • ±5°C across a 6″ (150mm) wafer at 1150°C. (This is a one sigma deviation 100 angstrom oxide.) For a titanium silicidation process, no more than 4% increase in non-uniformity during the first anneal at 650°C to 700 °C.
  • Post-anneal sheet resistivity measured on a 150mm wafer annealed at 1100° C for 10 seconds. R&D models optimized for slip control.
  • Implant: As 1E16 50 KeV with implant uniformity ≤0.3%
  • Lamp Life: Unconditionally guaranteed for three years.
  • Steady State Time: 1-9999 sec. (1-600 sec. recommended)
  • Wafer Sizes for the HEATPULSE 610: 2″, 3″, 4″, 5″ and 6″.
  • Process Gases: The HEATPULSE system delivers one non-corrosive process gas with manually controlled flow. Optional MFC, Up to 4.
  • GUI software Standard , upgrade to P-CAT
  • 16 bit A/D

The item is subject to prior sale without notice.

Please contact us by email. We will send you more info on the RTP in stock.

 

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