Description
Please contact us if you are interested in the following items. These items are only for end users and are subject to prior sale without notice. Appreciate your time.
| 1 | Quick Coater (DC Sputter ) SC-701 |
| 2 | Hitachi S-8840 CD-SEM |
| 3 | Hitachi S-9360 CD SEM |
| 4 | Hitachi S-9380II CD SEM |
| 5 | KLA-Tencor P11 Profiler |
| 6 | AMAT SEMVision G3 FIB DR SEM |
| 7 | KLA-Tencor KLA5200XP Overlay |
| 8 | Rudolph/August FE-VII-D Focus Ellipsometer |
| 9 | Rudolph/August FE-VII-D Focus Ellipsometer |
| 10 | KLA-Tencor KLA2371 Inspection |
| 11 | KLA-Tencor Aleris HX8500 Thickness Mesurement |
| 12 | Park Systems AFM XE-75 |
| 13 | Rudolph/August FE-VII Ellipsometer |
| 14 | Hitachi RS3000T DR SEM |
| 15 | Hitachi RS3000 DR SEM |
| 16 | KLA-Tencor 6420 |
| 17 | AMAT SEMVision G3 Defect Review SEM |
| 18 | KLA CD-SEM 8100XP – 2 systems for sale |
| 19 | KLA CD-SEM 8100 – 2 systems for sale |
| 20 | KLA AIT I Surfscan – 2 complete systems available for sale |
| 21 | AMAT Semvision CX+ SEM Defect Analyser |
| 22 | Nanometrics Nanospec 9100 Thickness measurement |
| 23 | For Sale Canon Aligner PLA-501F |
| 24 | For Sale Dimension 5000 AFM |
| 25 | KLA-Tencor EDR5210 Defect Review SEM |
| 26 | KLA-Tencor EDR5210 Defect Review SEM |
| 27 | Hitachi RS4000 DR SEM |
| 28 | Hitachi RS5000 DR SEM |
| 29 | AMAT UVision 4 Bright field inspection |
| 30 | KLA-Tencor Puma 9100 Dark field defect Inspection |
| 31 | Rudolph/August Axi-S Macro Inspection |
| 32 | Rudolph/August Axi-S Macro inspection |
| 33 | FEI Model Certus 3D |
| 34 | KLA-Tencor Archer 10 AIM+ Overlay |
| 35 | KLA-Tencor Puma 9000 Dark field defect Inspection |
| 36 | KLA-Tencor Puma 9130 Dark field defect Inspection |
| 37 | KLA-Tencor Aleris CX Film thickness measurements |
| 38 | KLA-Tencor AIT Fusion XUV Dark Field inspection |
| 39 | KLA-Tencor AIT Fusion Dark Field inspection |
| 40 | KLA-Tencor AIT UV Dark Field inspection |
| 41 | KLA-Tencor NANOMAPPER Nanotopography |
| 42 | Veeco Dimension X3D AFM |
| 43 | Nanometrics Metra2200M Overlay |
| 44 | Nanometrics Metra7200 Overlay |
| 45 | Wanted C-SAM Sonoscan D9000 |
| 46 | KLA-Tencor UV-1280 SE Thin Film Measurement System |
| 47 | KLA-Tencor AWIS-3110 Wafer Inspection System |
| 48 | Met One DE712AF-5 Surface Particle Counter |
| 49 | MSP 2110 Particle Sampler |
| 50 | Silvaco S3245A Noise Amplifier |
| 51 | Seojin SSM5200 Capacitancy-Voltage Tester |
| 52 | Nanometrics SIPHER EPI Slip and Defect |
| 53 | Hypervision CHIP UNZIP Chip Unzip Process |
| 54 | Hirayama PC-304R7 PCT System |
| 55 | Dong-A LCM Inspector Pattern Generator (Cameleon) |
| 56 | Signatone S-1060R-6SND3L Thermal Probing System |
| 57 | ISIS SENTRONICS SemDex 301-34 Wafer metrology system |
| 58 | KLA-Tencor LDS3300M Macro inspection |
| 59 | KLA-Tencor INS3300 Macro-Defect inspection |
| 60 | Nikon OPTIPHOT 66 Microscope |
| 61 | Olympus BHMJL Microscope |
| 62 | Olympus BHMJL Microscope |
| 63 | KLA-Tencor AWIS-3110 Particle counter |
| 64 | KLA-Tencor AWIS-3110 Particle counter |
| 65 | Hitachi S-5200 FE SEM |
| 66 | Hitachi Kokusai VR-120SD Resistivity Measurement |
| 67 | Rudolph/August 3Di8500 Wafer Inspection |
| 68 | Hitachi IS2700 Dark Field inspection |
| 69 | Horiba PR-PD2 Reticle/Mask Particle Detection System |
| 70 | Hitachi I6300 Defect Inspection |
| 71 | Hitachi I6300 Defect Inspection |
| 72 | Veeco V200 Profiler |
| 73 | KLA-Tencor Archer AIM+ Overlay |
| 74 | KLA-Tencor KLA2552 Data Review Station |
| 75 | Rudolph/August MetaPULSE 300 Thickness Measurement |
| 76 | KLA-Tencor KLA2800 Bright Filed inspection |
| 77 | KLA-Tencor Puma 9000S Dark field defect Inspection |
| 78 | Nanometrics Caliper Mosaic Overlay |
| 79 | Nanometrics Caliper Mosaic Overlay |
| 80 | Nanometrics Caliper Mosaic Overlay |
| 81 | JEOL JSM-7401F FE SEM |
| 82 | Rudolph/August NSX105 Macro Inspection |
| 83 | Rudolph/August NSX105 Macro Inspection |
| 84 | KLA-Tencor Archer AIM MPX Overlay |
| 85 | ADE WaferSight Wafer Flatness Measurement |
| 86 | KLA-Tencor Surfscan 2.1 Particle Counter |
| 87 | KLA-Tencor SFS7700 Particle Counter |
| 88 | FIB – SEM ( FEI Model CERTUS 3D ) |
| 89 | HITACHI REVIEW SEM RS-4000 |
| 90 | KLA-Tencor KLA5100 Metrology |
| 91 | Nanometrics NanoSpec 210 Metrology |
| 92 | KLA-Tencor MPV CD2 AMC Metrology |
| 93 | KLA-Tencor MPV CD2 AMC Metrology |
| 94 | KLA-Tencor MPV-CD Metrology |
| 95 | AMAT Orbot WF720 Metrology |
| 96 | AMAT WF730 Metrology |
| 97 | KLA Tencor ICOS WI-2200 & HM-200 Used Wafer Inspetor |
| 98 | Used XRD PANalytical X’Pert Pro |
| 99 | Used XRD PANalytical X’Pert Pro |
| 100 | Wanted Wesco Union Hisomet DH-II Measuring Microscope |
| 101 | Nikon Microscope ECLIPSE L200 |
| 102 | Lifetime Measurement (SEMILAB WT-2000) |
| 103 | FT-IR Nanometrics QS-1200 |
| 104 | Resistance Measurement (SEMILAB RT-100) |
| 105 | KLA-Tencor KLA5200XP Overlay |
| 106 | X-ray thickness measurement (SII / SFT-3200S, SEA-1200VX) |
| 107 | Film thickness measurement (KLA-Tencor / prometrix UV-1050) |
| 108 | Film thickness measurement (DNS / STM-603) |
| 109 | SEM (HITACHI / S-5000 , with EDX) |
| 110 | Wanted Suss MA150e mask aligner |
| 111 | NIKON Optistation VII |
| 112 | Surface Inspection ( KLA Model CANDELA CS10 ) |
| 113 | Field Emission SEM (TESCAN MIRA2) |
| 114 | KLA SFS6200 particle counter for sale |
| 115 | Hitachi Kokusai VR120SD Resitivity Measurement |
| 116 | Nicolet ECO3000 FT-IR |
| 117 | Olympus MX61-F 8inch wafer |
| 118 | Thermo Emission SEM (TESCAN VEGA3 LMU) |
| 119 | DB-FIB (TESCAN LYRA3 XMH) |
| 120 | Wafer peeling M/C(DAITRON) |
| 121 | Through hole inspection (SHIMAKAWA) |
| 122 | HITACHI-KOKUSAI |
| 123 | Film thickness |
| 124 | Wafer Bump Inspect System (5 / 6 / 8 inch) |
| 125 | Nanoin printer |
| 126 | Electrode Inspecti |
| 127 | Taylor Hobson Talyrond 265 |
| 128 | Rudolph/August FE-VII Focus Ellipsometer |
| 129 | Olympus MX61L Microcope |
| 130 | ICP-OES Spectrometer (LeeMan Labs) |
| 131 | Mask Aligner , 6″ Wafer |
| 132 | ALICONA Infinite Focus IFM G2.0E |
| 133 | Nanometrics Nanospec M5000 6″ Thickness Measurement_Used |
| 134 | Hitachi S4700 FE SEM |
| 135 | Hitachi S4300 FE SEM |
| 136 | FEI Normal SEM Inspect S50 |
| 137 | CANON PLA-501FA Mask Aligner |
| 138 | Temperature Forcing System / ex: T2800 |
| 139 | Mask Aligner |
| 140 | Mask Aligner 6″ |
| 141 | Hitachi S5200 FE SEM |
| 142 | SEM (HITACHI) |
| 143 | Mask Aligner |
| 144 | Hitachi SEM S5000 |
| 145 | K-MAC Spectra Thick |
| 146 | Visual Inspector IMS LVIS-III |
| 147 | Mask Alinger Karl Suss MA150EL |
| 148 | Mask Aligner Karl Suss MA-6 |
| 149 | Spectrometer Seiko Instrument SPA500 |
| 150 | SEM FEI Inspect S50 |
| 151 | UV/Vis Perkin Elmer Lambda 950 |
| 152 | Mask Aligner DNK MA-4200 |
| 153 | DNS Model STM-603 |
| 154 | (NIKON Model V-24B , V-12 |
| 155 | CNC System (NIKON Model NEXIV VMR-3020 |
| 156 | KLA-TENCO Model Candela 8620 (2~8 inch) |
| 157 | Noteh profiler (YUHI Model EPR-212N (2~12 inch)) |
| 158 | KLA-TENCO Model Candela 6300 |
| 159 | Kubotek, Particle Inspections, SKLS2-3 |
| 160 | AMAT, Methrology, WF736-XS(DUO), S/N T176 |
| 161 | AMAT, Methrology, WF736-XS(DUO), S/N T173 |
| 162 | AMAT, Methrology, WF-736XS(DUO), S/N T169 |
| 163 | KLA-Tencor, OVERLAY, Archer10XT |
| 164 | Hitachi, SEM, S-9380 |
| 165 | Topcon, Metrology, Vi-4203 |
| 166 | Rigaku TXRF3750 X-Ray Fluorescence |
| 167 | MICROSCOPE+AUTO LOADER OLYMPUS MX-61F+AL110 LMB 8 |
| 168 | XRD Sale ( Bruker ) |
| 169 | Surftens Measurement Metrology |
| 170 | AMAT WF720 Metrology |
| 171 | OAI 358 Stepper Exposure Analyzer |
| 172 | OAI 358 Stepper Exposure Analyzer |
| 173 | OAI 358 Stepper Exposure Analyzer |
| 174 | KLA-Tencor INM100+INS10 Metrology |
| 175 | KLA-Tencor Ergolux Metrology |
| 176 | Rudolph/August FE-IV Inspection |
| 177 | XRD |
| 178 | Veeco UVX310 Step Profiler |
| 179 | Brooks PRI7500 Pod Stocker |
| 180 | Nanometrics NanoSpec AFT400 Film Thickness Measurement |
| 181 | Nikon SMZ-U Sterescopic Zoom Microscope |
| 182 | Nikon SMZ-U Sterescopic Zoom Microscope |
| 183 | Nanometrics CDS-200 Optical CD SEM |
| 184 | Brooks Bright light 200 UV Inspection |
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