Description
Used Semiconductor Equipment
Valid: Subject to prior payment/sale without notice. This is only for end users. Appreciate your time!
The trademarks of the equipment and parts contained in this website belonged to the Original Equipment Manufacturers.
| 1 | Wet Station | TEL | ＵＷ８０００ |
| 2 | Dry Etcher | TEL | Telius SP-Vesta |
| 3 | Dry Etcher | TEL | UNITY2e-855DD |
| 4 | LITHO | SOKUDO | SK-3000 |
| 5 | Inspection Equip. | KLA | es31 |
| 6 | LITHO | Dantakuma | DT-1600 |
| 7 | LITHO | Daito Elec. | BN3-S54 |
| 8 | Metrology | NC-80E-12 | |
| 9 | Etchers / Ashers | ULVAC | PHOENIX Ⅱ |
| 10 | Inspection/Metrology | TEL | 80S |
| 11 | Wet | TYK | NEL-HR8500 |
| 12 | OVEN | ESPEC | PHH-200 |
| 13 | OVEN | ESPEC | PHH-201M |
| 14 | Reading machine | Denken | DKH-2300KM |
| 15 | Emboss taping machine | Takaki | ETM-3010S |
| 16 | Taping machine | Syouryokuka | SVT-2000 |
| 17 | WET ( Evaporator ) | S.E.Tenno | VRC-200T |
| 18 | Asher | ULVAC | UNA2200 |
| 19 | Metrology | Miwa Opto | L115C 1520AK |
| 20 | WET | HUGLE ELECTRONICS | UPC12000R |
| 21 | INSPECTION | SONY | IRG-12 |
| 22 | Sputter | TRIKON | SIGMA200 |
| 23 | Vacuum Anodic Bonder | PLUS | 不明 |
| 24 | Polarization_Annealing Machine | AKIM | ATTS56 |
| 25 | Vacuum Oven | SEVERN SCIENCE | Heraeus Vacutherm |
| 26 | VT-6130M | ||
| 27 | Automatic Dicing Saw | Disco | DAD521 |
| 28 | Wedge Bonding System | K&S | 8060 |
| 29 | PI CURE OVEN | Dantakuma | SNOS 302FX |
| 30 | Grinding, Lapping & Polishing | EBARA | EAC300bi-T |
| 31 | PECVD | ASM | DRAGON |
| 32 | ASHER | SHIBA TEC | ICE300 |
| 33 | TESTER | YOKOGAWA | TS600 |
| 34 | Scrubber | EBARA | GDS500SA |
| 35 | Scrubber | EBARA | GDS250SA |
| 36 | Scrubber | EBARA | GDC250SA |
| 37 | Scrubber | EBARA | GDC250A |
| 38 | Surface Profiler | Veeco | DEK-TAK 8000 |
| 39 | Microscope | OLYMPUS | BH2 |
| 40 | Microscope | OLYMPUS | INSPB01 |
| 41 | Inspection Equip. | Toray Engineering | INSPECTRA 100EX |
| 42 | intray chip | TOPCON | VI-3200 |
| 43 | Inspection Equip. | TECHNOS | TREX610 |
| 44 | Microscope | NIDEK | IM-15 |
| 45 | Inspection Equip. | Hitachi Construction Machine | WA-200 |
| 46 | Inspection Equip. | PD-3000 | |
| 47 | Inspection Equip. | Rothse | RR6141 |
| 48 | Inspection Equip. | Lion.Mimus | KH-02 |
| 49 | Inspection Equip. | Lyon | KL-25 |
| 50 | Inspection Equip. | Lion.Mimus | KZ-36U |
| 51 | Inspection Equip. | Lyon | KL-22 |
| 52 | Inspection Equip. | Hitachi DECO | TS-3700 |
| 53 | Inspection Equip. | Lion.Mimus | KZ-30U |
| 54 | SEM(IS004) | Hitach High tec. | RS-3000 |
| 55 | SEM | Hitach High tec. | I-5320N |
| 56 | Inspection Equip. | INFICON | 14115 UL200 DRY |
| 57 | Wet Station | DNS | FC-821L |
| 58 | Dry Ashing | Fujitsu VLSI | VA-2000 |
| 59 | Defect Review Tool | SCREEN | MIS-200 |
| 60 | MI | KOKUSAI | VR120S |
| 61 | QE | Shinsung Eng | SGL-30 |
| 62 | QE | LEICA | UV Optic Scope |
| 63 | CLEAN | ZEUS | PEGASUS_NEW |
| 64 | CVD | LAM | ALTUS(Chamber only) |
| 65 | ETCH | FUSION | 200ACU |
| 66 | ETCH | LAM | TORUS200 |
| 67 | ETCH | PSK | ULTIMA3(AC Rack only) |
| 68 | MI | ELECTROGLAS | EG-4080X |
| 69 | MI | KLA TENCOR | AWUS3110 |
| 70 | DIFF | KE | DD1223V |
| 71 | DIFF | KE | DD1223VN |
| 72 | Wet | DNS | SS-W60A-AR |
| 73 | Metrology | AMAT | UVISION4 |
| 74 | METAL | TEL | TRIAS |
| 75 | Metrology | AMAT | UVISION7 |
| 76 | ANALYSIS | TERADYNE | MAGNUM1-PV |
| 77 | CVD | IPS | MAHA-SP |
| 78 | Microscope | OLYMPUS | OLS3000 |
| 79 | DIFF | HIKE | DJ1223VN-CX3 |
| 80 | METRO | HITACHI | IS3200SE |
| 81 | IMP | AP-SYSTEM | KORONA-1200P |
| 82 | DIFF | KE | DJ1223VN |
| 83 | Dry Cleaner | TEL | CERTAS |
| 84 | PR Strip | KCTEC | KCT-W300F |
| 85 | PECVD | ASM International | Eagle-12 Rapidfire |
| 86 | Macro-Defect | Nikon | AMI-3000 |
| 87 | Macro-Defect | Nikon | AMI-3500 |
| 88 | STRIPPER ASHERS | Canon | Surpass 320 |
| 89 | METAL CVD | TEL | Trias Ti/TiN |
| 90 | Batch Wafer Processing | TEL | UW300Z |
| 91 | METAL ETCH | Hitachi (Semiconductor) | U-702 |
| 92 | Tester | SHIBASOKU | WL25 |
| 93 | Inspectra | Toray Engineering | 1000EX-2 |
| 94 | OVEN | Oshitari | COL-8 OVEN SCOX-1300HY-S |
| 95 | OVEN | Oshitari | COL-12 OVEN |
| 96 | Prober | TEL | 20S PROBER |
| 97 | OVEN | TABAI | OVEN IPS-222 |
| 98 | DETECTOR | NAGASE SANGYO | HE LEAK_ＡＳＭ-１２ |
| 99 | METER | Hewlett-Packard | DIGITAL MULTI METER |
| 100 | OSCILLOSCOPE | ||
| 101 | OVEN | ESPEC | PVHC-211 |
| 102 | OVEN | Oshitari | SCOX-2000H-S OVEN |
| 103 | Wafer Loader | OLYMPAS | AL110 + MX61 |
| 104 | Tester | TESEC | 3701-ＴＴTT tester |
| 105 | Surface Shape Measurement | Toray Engineering | SP-500B |
| 106 | Surface Shape Measurement | OLYMPAS | MX-50A + AL110 + FD-120M |
| 107 | Scrubber | DNS | SSW-629B |
| 108 | Inspectra | Rudolph | FE-7 |
| 109 | Thin film measurement | HORIBA | UT-300 |
| 110 | Measurement | KOBELCO | LTA-1000 |
| 111 | Tape attachment | TAKATORI | ATM-1100B |
| 112 | Tape attachment | TAKATORI | ATM-2100 |
| 113 | Tape attachment | Nitto Seiki | TL-1 |
| 114 | Centrifugal dryer | SEMITOOL | A870S#1 |
| 115 | Wet Station | SCREEN | FC3000 |
| 116 | ETCH | ANELVA | ILD-4015 |
| 117 | WAFER TESTING AND METROLOGY | HITACHI KOKUSAI | VR-30B |
| 118 | WAFER TESTING AND METROLOGY | HITACHI KOKUSAI | VR-120 |
| 119 | Oven | Dan Takuma | SCOV-2900H-S |
| 120 | WET STATION | DNS | FL-820L |
| 121 | Wafer Surface Inspection | KLA | 2131 |
| 122 | Wafer setting system | SEIWA | WT256FS |
| 123 | Microscope | OLYMPUS | AL120-AMB6-150 |
| 124 | Wafer Surface Inspection | TOKYO AIRCRAFT | MAC-92 |
| 125 | Scrubber | DNS | SDW-629-BV(P) |
| 126 | Scrubber | DNS | DW-629-BV(P) |
| 127 | UV CURE | USHIO | UMA-802-HC551NW |
| 128 | Photo /Stepper | USHIO | SE-521D-NW |
| 129 | Defect Review Tool | DNS | MIS200 |
| 130 | Wafer Surface Inspection | KLA | SF4500 |
| 131 | Wafer Surface Inspection | KLA | FLX2908 |
| 132 | Wafer Surface Inspection | Rigaku | SYS-3630 |
| 133 | Asher | Tokyo Oka | TCA-3822 |
| 134 | Wafer Surface Inspection | Nidek | IM-7 |
| 135 | Corter | DNS | SC-200W |
| 136 | CHUO RIKEN | CS-60D1 | |
| 137 | OVEN | YAMATO | DP61 |
| 138 | X-ray inspection | PANalytical(PHILIPS) | PW2800 |
| 139 | Spin Dryer | Kokusan | G-6 |
| 140 | SEM | Hitachi | S-5000 |
| 141 | SEM | Topcon | DS-720 |
| 142 | ETCHER | NEC | RIE Dry Etching |
| 143 | Wafer Surface Inspection | Tencor | Step Guage(αSTEP） |
| 144 | Lamp anneal | Canon | HP-2106 |
| 145 | Microscope | Shinko-OLYMPUS | AHMT3 |
| 146 | BMP | AMAT | Raider ECD310 |
| 147 | ETCHER | HITACHI | M-602A |
| 148 | ETCH | AXCELIS | ES3 |
| 149 | DRY ETCH | TEL | VIGUS |
| 150 | DRY ETCH | TEL | Tactras NCCP SCCM |
| 151 | METROLOGY | Rudolph | MP200 |
| 152 | Coater/Developer | DNS | RF3 |
| 153 | ETCH | AMAT | Centura Enabler |
| 154 | RELACS TRACK | DNS | DUO |
| 155 | RELACS TRACK | DNS | RF3S |
| 156 | ARF IMMERSION TRACK | DNS | DUOI |
| 157 | Single Cleaning | DNS | SU3100 |
| 158 | METROLOGY | TOPCON | WM-5000 |
| 159 | METROLOGY | NONE | ST-3525 |
| 160 | METROLOGY | NONE | WS-211-4-FAR |
| 161 | METROLOGY | NONE | NWS-200R |
SS5305-1-9-1-1
