Used Metrology Equipment

Description

These are subject to prior sale. These are only for end user. Appreciate your time.

The trademarks of the equipment and parts contained in this website belonged to the Original Equipment Manufacturers.

1	4WAVE	IBE12L01
2	Accent Optical	Caliper
3	Ancosys	P13010 Ancolyzer
4	Applied Materials	NanoSEM 3D
5	Applied Materials	Semvision G3
6	Applied Materials	Semvision G3
7	Applied Materials	Semvision G3
8	Applied Materials	NanoSEM 3D
9	Applied Materials	NanoSEM 3D
10	Applied Materials	Uvision 5
11	Applied Materials In	Dfinder
12	Blue M	DCC 206CY
13	Blue M	DDC 206CY Oven
14	Blue M	DCC-1406CY
15	Blue M	DDC-206CY
16	Blue M	DCC-206-EV-ST350
17	Blue M	RG-3010F-2
18	Blue M	RG-3010F-2
19	Bruker, AFM, 300mm, InSight 3D-DR
20	Bruker, D8FABLINE, 300mm, X-Ray Metrology
21	Cameca	EX300
22	Camtek	X-ACT
23	Carl Zeiss Meditec	Axiotron II (SMS)
24	Cascade Microtech	12000
25	Cascade Microtech	12000
26	Cascade Microtech	12000
27	Cascade Microtech	12000
28	Cascade Microtech	S300
29	Cascade Microtech	S300
30	Cascade Microtech	S300
31	Cascade Microtech	S300
32	Cascade Microtech	S300
33	Cascade Microtech	S300
34	Cascade Microtech	S300
35	Cascade Microtech	S300
36	Cascade Microtech	S300
37	Check Point Technolo	InfraScanTDM 300 TDE
38	Chemical Safety Tech	Dual Drum Waste Cabinet
39	Dektak, V200SI, Surface Profilometer
40	Denton	Infinity 18
41	Disco	DFG-82IF/8
42	Electroglas	2001X
43	Electroglas	2001X
44	Electroglas	3001X
45	Electroglas	HORIZON 4080X
46	Esco	EHWS 8C
47	ESI	9300
48	ESI	9300
49	ESI	9300
50	Estion	E-RETICLE V 4M
51	FEI	300
52	FEI	CLM3D
53	FEI	EX SITU PLUCKER
54	FEI	Ex-Situ Plucker
55	FEI	TEMLINK – KY02, 14771-003
56	FEI	ExSolve 2 WTP EFEM
57	FEI	FP5600 30 Titan80-300
58	FEI	Meridian-IV
59	FEI	QUANTA 600F
60	FEI	Taipan
61	GEMETEC	Elymat III
62	Hitachi	HF-2000
63	Hitachi	AS5000
64	HMI	ESCAN 315XP
65	HMI, eP4 320, 300mm, ebeam Inspection
66	Hologenix	MTX 2000/2/MIS SLIPBAY
67	HSEB	Axiospect 301
68	IMS	XTS-FT
69	JEOL	7555
70	JEOL	JWS 7555S
71	JEOL	JWS-7515
72	John Blanz Co	CRYOTEST MODEL 105
73	Jordan Valley	JVX6200i
74	KLA	Aleris 8350
75	KLA-Tencor	Uvision 5
76	KLA-Tencor	Viper 2438
77	KLA-Tencor	AIT1
78	KLA-Tencor	Viper 2435
79	KLA-Tencor	CRS1010 Review Station
80	KLA-Tencor	P2 Data Prep Station,
81	Kulicke and Soffa	8060
82	Lasertech	Reticle Inspection Tool
83	Leica	POLYLITE 88 METALLURGICAL SCOPE
84	Lyncee	Holographic Microscope
85	Metron	Extraction, Amine
86	Micro Control Co.	WRP256 Oven
87	MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm
88	Nanometrics	Caliper Q300
89	Nanometrics	Q200I
90	Nanometrics	Q200I
91	NCB Network	NF200
92	Nova	T600
93	Nova	V2600
94	NSC	PS102W
95	OEG	SURFTENSE WH300
96	Olympus	PMG3
97	Particle Meas Sys	LASAIR-110
98	Phoenix	Micromex SE 160T
99	Qcept, ChemetriQ-5000, 300mm, S/N 09-0212-SP01091
100	Revco	ULT 2140-5- D30 -40C
101	Rigaku	3272
102	Rudolph Technologies	Waferview 320
103	Rudolph Technologies	Waferview 320
104	SDI Diagnostics Inc	SPVCMS4000
105	SemiProbe	PS4L FA-12
106	Sopra	EP12
107	Star Technologies	Star Gemini
108	Tokyo Electron Limit	nFusion
109	Toray Industries Inc	HS-830
110	ULVAC-PHI	4700- Terminator.SCA.VP2
111	VLSI Standards	PDS-100
112	VWR Scientific	Sheldon Oven 1610
113	VWR Scientific	61161-326
114	VWR Scientific	1601
115	VWR Scientific	1601
116	VWR Scientific	Sheldon Oven 1601
117	Waters	2695
118	Zeiss	Axiotron II
119	Zeiss	Axiotron II
120	Zeiss	Axiotron II
121	Zeiss	LEA 1530