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Semiconductor Equipment

Description

The following  Analytical FA/TEST/ Metrology, 200mm, 300mm Equipment are only for end user. Please contact us if you have any questions. Subject to prior sale without notice. Appreciate your time!

Condition: Used;  Location: USA

No. OEM Model and Description
1 Agilent N5181A MXG RF Analog Signal Generator
2 Agilent 81160A Pulse Function Arbitrary Generator
3 Anton Paar MCR92 Rheometer
4 ASM A412 Poly
5 ASM A412 Poly
6 ASM A412 Poly
7 DNS SU-3100
8 FEI Helios 450S Dual Beam
9 FEI Helios 400 Dual Beam
10 FEI Nova Nanolab 200 dual beam
11 Four Dimension 280 Four Point Prober
12 Hamamatsu Phemos 1000 Emission Microscope
13 Hitachi CG6300
14 Hitachi CG4000
15 Hitachi S-7840
16 Hitachi S-7800
17 Hitachi S-3700N
18 Hitachi SU-70
19 Hitachi S-4700-II
20 Hitachi S-4700-I w/EDX
21 Hitachi S-4800-II
22 Hitachi S-4800-II
23 Hitachi SU8040
24 Hitachi S-5500
25 Hitachi SU82XX BF/DF STEM detector
26 Karl Suss PM8 Prober
27 KLA RS100C
28 KLA Puma 9120
29 KLA Altair 8920
30 KLA Altair 8935
31 KLA HRP240
32 Kulicke & Soffa 4524A Bonder
33 Leica DMS300 Digital Microscope
34 Moduteck Wet Clean Wet Bench
35 Olympus LEXT OLS4000 3D laser scanning microscope
36 Olympus LEXT OLS5000 3D laser scanning microscope
37 Olympus TH3 Microscope
38 Poloran Sputter coater
39 ReVera VeraFlex
40 Rigaku MFM65
41 Rigaku TXRF V300 with VDP
42 SEZ 323 (300 or 200mm)
43 SEZ DV34
44 Signatone CM-465-22 probe station
45 Signatone S-M90 w/probe station
46 Tektronix TLA 7012 Logic Analyzer (portable mainframe)
47 ThermoFisher Apreo C LoVac FESEM
48 Wentworth/SDI Micro manipulators (various)
49 Zeiss Merlin FESEM
50 Zeiss Axiotron Inspection Micoscope – 452825
51 Zeiss Axio Imager M1m

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