Description
The following Analytical FA/TEST/ Metrology, 200mm, 300mm Equipment are only for end user. Please contact us if you have any questions. Subject to prior sale without notice. Appreciate your time!
Condition: Used; Location: USA
No. | OEM | Model and Description |
1 | Agilent | N5181A MXG RF Analog Signal Generator |
2 | Agilent | 81160A Pulse Function Arbitrary Generator |
3 | Anton Paar | MCR92 Rheometer |
4 | ASM | A412 Poly |
5 | ASM | A412 Poly |
6 | ASM | A412 Poly |
7 | DNS | SU-3100 |
8 | FEI | Helios 450S Dual Beam |
9 | FEI | Helios 400 Dual Beam |
10 | FEI | Nova Nanolab 200 dual beam |
11 | Four Dimension | 280 Four Point Prober |
12 | Hamamatsu | Phemos 1000 Emission Microscope |
13 | Hitachi | CG6300 |
14 | Hitachi | CG4000 |
15 | Hitachi | S-7840 |
16 | Hitachi | S-7800 |
17 | Hitachi | S-3700N |
18 | Hitachi | SU-70 |
19 | Hitachi | S-4700-II |
20 | Hitachi | S-4700-I w/EDX |
21 | Hitachi | S-4800-II |
22 | Hitachi | S-4800-II |
23 | Hitachi | SU8040 |
24 | Hitachi | S-5500 |
25 | Hitachi | SU82XX BF/DF STEM detector |
26 | Karl Suss | PM8 Prober |
27 | KLA | RS100C |
28 | KLA | Puma 9120 |
29 | KLA | Altair 8920 |
30 | KLA | Altair 8935 |
31 | KLA | HRP240 |
32 | Kulicke & Soffa | 4524A Bonder |
33 | Leica | DMS300 Digital Microscope |
34 | Moduteck | Wet Clean Wet Bench |
35 | Olympus | LEXT OLS4000 3D laser scanning microscope |
36 | Olympus | LEXT OLS5000 3D laser scanning microscope |
37 | Olympus | TH3 Microscope |
38 | Poloran | Sputter coater |
39 | ReVera | VeraFlex |
40 | Rigaku | MFM65 |
41 | Rigaku | TXRF V300 with VDP |
42 | SEZ | 323 (300 or 200mm) |
43 | SEZ | DV34 |
44 | Signatone | CM-465-22 probe station |
45 | Signatone | S-M90 w/probe station |
46 | Tektronix | TLA 7012 Logic Analyzer (portable mainframe) |
47 | ThermoFisher | Apreo C LoVac FESEM |
48 | Wentworth/SDI | Micro manipulators (various) |
49 | Zeiss | Merlin FESEM |
50 | Zeiss | Axiotron Inspection Micoscope – 452825 |
51 | Zeiss | Axio Imager M1m |
ID-SS7953-0-5-Seller -SS8347-Owner