Description
The Calibration Standards items are only for end user. They are subject to prior sale without notice. Appreciate your time.
| Item | Description |
| 1 | Gaertner Scientific STANDARDS 100mm silicon WAFER 615-1ECS PSI 10.75 thk. 19A, ALB-ELECTRIC Tech LLC |
| 2 | Mikropack Wafer Standard for Measuring Filmetrics or Ocean Optics Thin Film. 6 sizes |
| 3 | VLSI Absolute contamination STANDARDS 2 100mm silicon WAFER ACS4-2.02 |
| 4 | Filmetrics Wafer Standard for Measuring Thin Films – Spectrometer Thin Film,7112 angstroms |
| 5 |
4″ 100mm wafer Master Standard from Wacker Semiconductor.Standard to calibrate Thickness and resitivity for sheet resistance
|
| 6 |
VLSI Surface Contamination Standards 100mm Wafer SCS-1402 SEALED
|
| 7 |
Davidcalibration Model SRS-3-4 Standard to calibrate Thickness and resitivity for sheet resistance
|
| 8 |
Dektak Calibration Standard
|
| 9 | KLA , DEKTAK, VLSI PROFILER STEP HEIGHT STANDARD SET 182.9NM , 448 NM, 9443 ANG |
| 10 | KLA TENCOR, DEKTAK, VLSI PROFILER STEP HEIGHT STANDARD, 1000 ANG, 4632 ANG, 9624 |
| 11 | Oriel VLSI 91150V Solar Cell Reference Standard |
| 12 | VLSI Absolute contamination STANDARDS 2 100mm silicon WAFER ACS4-2.02 |
| 13 | VLSI SHS8-24.0 Autoload Step Hight Standard Calibration 200mm / 8″ |
| 14 | VLSI Standard INC SHS-9400 0C CAL 20 -9473_56A 16872/33 |
| 15 | VLSI Standards 1.79µm Step Height Standard Metrology Calibration Tool Used |
| 16 | VLSI STANDARDS 414 A |
| 17 | VLSI Standards 917Å Step Height Standard Metrology Calibration Tool Used Working |
| 18 | VLSI Standards 9218Å Step Height Standard Metrology Calibration Tool Used |
| 19 | VLSI STANDARDS INC STEP HEIGHT STANDARD MODEL SHS-7.0 Q – NEW |
| 20 | VLSI STANDARDS INC. / BRUKER NANO 8um STEP HEIGHT STANDARD |
| 21 | VLSI STANDARDS INC. / VEECO 10.04um STEP HEIGHT STANDARD & PSI CALIBRATION |
| 22 | VLSI STANDARDS INC. / VEECO MASTER STEP HEIGHT STANDARD , MULTIPLE STEP HEIGHT |
| 23 | VLSI Standards RS 3-0.01 Resistivity Standard 76.2mm |
| 24 | VLSI Standards RS 3-0.3 Resistivity Standard 76.2mm |
| 25 | VLSI Standards SHS-1.77 Step Height Standard |
| 26 | VLSI Standards SHS-1.8 QC Quartz Step Height Standard |
| 27 | VLSI Standards SHS-1.8 Step Height Standard Metrology Calibration Tool Used |
| 28 | VLSI Standards SHS-1.8M Step Height Standard |
| 29 | VLSI Standards SHS-180 QC Quartz Step Height Standard 375_VLSI |
| 30 | VLSI Standards SHS-180 Step Height Standard |
| 31 | VLSI Standards SHS-1800 QC Quartz Step Height Standard 374_VLSI |
| 32 | VLSI Standards SHS-1800 QC Step Height Standard |
| 33 | VLSI Standards SHS-1800 QC Step Height Standard 14874/33 |
| 34 | VLSI Standards SHS-4.5 QC Step Height Standard Working Surplus |
| 35 | VLSI Standards SHS-4.5 Step Height Standard |
| 36 | VLSI Standards SHS-440 QC Quartz Step Height Standard 380_VLSI |
| 37 | VLSI Standards SHS-4500 Step Height Standard |
| 38 | VLSI Standards SHS-50.0 Q Step Height Standard Metrology Calibration Tool Used |
| 39 | VLSI Standards SHS-50.0 Q Step Height Standard Working Surplus |
| 40 | VLSI Standards SHS-8 8.16µm Step Height Standard Metrology Calibration Tool Used |
| 41 | VLSI STANDARDS SHS-80 QC |
| 42 | VLSI Standards SHS-80 QC Quartz Step Height Standard 386_VLSI |
| 43 | VLSI Standards SHS-880 QC Quartz Step Height Standard 387_VLSI |
| 44 | VLSI Standards SHS-880 QC Step Height Standard Metrology Calibration Tool Used |
| 45 | VLSI Standards SHS-880 QC Step Height Standard Working Surplus |
| 46 | VLSI Standards SHS-880 Step Height Standard Metrology Calibration Tool Used |
| 47 | VLSI Standards SHS-9400 Step Height Standard |
| 48 | VLSI Standards SRS-2-T / SRS-2-G Sheet Resistance Standard Set Working Surplus |
| 49 | VLSI Standards Step Height Standard Model SHS-2000 |
| 50 | VLSI Standards STR10-1000 Surface Topography Standard Metrology Used Working |
| 51 | VLSI Standards, Inc. Solar Cell 42820DW |
| 52 | VLSI Step Height Standard 9545A |
| 53 | Vlsi Step Height Standard SHS-9400QC New 9 400 Step Height 9k Angstroms |
| 54 | VLSI Step Height Standards -4426 & 4405 w/ Tencor 9.4KA Calibration Standard |
| 56 | Monolayer Graphene on 6 in SiO |
| 57 | J.A. Wollam Reference Wafers for M-2000 Eliposometer SiO2 on Silicon |
| 58 | Davidcalibration Model SRS-3-0.02 Standard to calibrate Thickness and resitivity for sheet resistance |
