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OEMs: AG Associates
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SemiStar Corp. Semiconductor Equipment Parts Service

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Agilent

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Test and Measurement Equipment

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Test and Measurement Equipment

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Agilent/Keysight N6700B

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helium leak detector

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Semiconductor Equipment Parts

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Semiconductor Probe Tester Equipment Parts

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Electronic test & measurement equipment

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Semiconductor Equipment Spare Parts

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Wafer Probe Tester Metrology

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Wafer Probe Tester Metrology

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Wafer Probe Tester Metrology

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Wafer Probe Tester Metrology

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We have recently acquired the following equipment from a 4-inch GaAs Fab in the USA: 8 sets of Lam AutoEtch 490 plasma etchers; 5 sets of Matrix 105 plasma asher/descum systems; 4 sets of AG Heatpulse RTP systems (models 4100 and 8108).

Main New Equipment & Parts Service

Vacuum Rapid Thermal Processors
Furnace :Atmosphere CVD/ PLCVD
Plasma Asher / Descum
Plasma Etch /RIE/ ICP/ DRIE/ PEALE
- Ion Beam Milling
Atomic Layer Deposition -ALD/PEALD
- Hybrid Systems
PECVD / Microwave PECVD
MOCVD, PA-MOCVD
Sputtering Deposition
E-Beam & Thermal Evaporator
Optical Coating System
Wet & Dry Cleaning, Reticle/Mask Cleaning
Space Simulation & Metrology Instruments
Accessories, Spare Parts & Service

Main Refurbished Equipment and Accessories

Rapid Thermal Processors
Plasma Asher /Descum
Plasma Etchers
Plasma Etch/ RIE/ ICP/ DRIE
ALD PECVD CVD
Sputtering Deposition
E-Beam & Thermal Evaporator
Metrology Instruments
Wafer Probes
SEM FEG
Tester
Mask Aligner
Robot Controller Aligner Accessories
Vacuum Pumps /Compressor Accessories
Chillers Accessories

Main Rapid Thermal Processors

Rapid Thermal Processors

The trademarks of the equipment and parts contained in this website belonged to the Original Equipment Manufacturers

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Navigation

Test and Measurement Equipment

Test and Measurement Equipment

Agilent/Keysight N6700B

helium leak detector

Semiconductor Equipment Parts

Semiconductor Probe Tester Equipment Parts

Electronic test & measurement equipment

Semiconductor Equipment Spare Parts

Wafer Probe Tester Metrology

Wafer Probe Tester Metrology

Wafer Probe Tester Metrology

Wafer Probe Tester Metrology