Used Semiconductor Equipment

Description

Location: SS8347-S-2-20250423

Valid: Subject to prior sale without notice. This is only for end users. Applicate your time.

Condition: Used.

The trademarks of the equipment and parts contained in this page belonged to the Original Equipment Manufacturers.

1	AMAT	Centura DPHe	300mm Equipment
2	ASM	A412 Poly	300mm Equipment
3	ASM	A412 Poly	300mm Equipment
4	ASM	A412 Poly	300mm Equipment
5	Hitachi	CG6300	300mm Equipment
6	DNS	SU-3100	300mm Equipment
7	KLA	Puma 9120	300mm Equipment
8	KLA	Aleris 8350	300mm Equipment
9	LAM	Altus Max	300mm Equipment
10	LAM	Altus Max with PNL	300mm Equipment
11	ReVera	VeraFlex	300mm Equipment
12	Rigaku	MFM65	300mm Equipment
13	Rigaku	TXRF V300 with VDP	300mm Equipment
14	SEZ	323 (300 or 200mm)	300mm Equipment
15	SEZ	DV34	300mm Equipment
16	Hitachi	S-7840	200mm Equipment
17	Hitachi	S-7800	200mm Equipment
18	KLA	HRP240	200mm Equipment
19	Moduteck	Wet Clean Wet Bench	200mm Equipment
20	FEI	Helios 450S Dual Beam	ANALYTICAL EQUIPMENT
21	FEI	Helios 400 Dual Beam	ANALYTICAL EQUIPMENT
22	Hitachi	HD-2300	ANALYTICAL EQUIPMENT
23	Hitachi	S-5500	ANALYTICAL EQUIPMENT
24	Hitachi	SU-70	ANALYTICAL EQUIPMENT
25	Hitachi	S-4700-II	ANALYTICAL EQUIPMENT
26	Hitachi	S-4700-I w/EDX	ANALYTICAL EQUIPMENT
27	Hitachi	S-4800-II	ANALYTICAL EQUIPMENT
28	Hitachi	S-4800-II	ANALYTICAL EQUIPMENT
29	Hitachi	SU8040	ANALYTICAL EQUIPMENT
30	Hitachi	SU82XX BF/DF STEM detector	ANALYTICAL EQUIPMENT
31	ThermoFisher	Apreo C LoVac FESEM	ANALYTICAL EQUIPMENT
32	FEI	Nova Nanolab 200 dual beam	ANALYTICAL EQUIPMENT
33	Poloran	Sputter coater	ANALYTICAL EQUIPMENT
34	Hitachi	SU-8040	ANALYTICAL EQUIPMENT
35	Zeiss	Merlin	ANALYTICAL EQUIPMENT
36	Agilent	N5181A MXG RF Analog Signal Generator	FA/Test EQUIPMENT
37	Agilent	81160A Pulse Function Arbitrary Generator	FA/Test EQUIPMENT
38	Anton Paar	MCR92 Rheometer	FA/Test EQUIPMENT
39	Four Dimension	280 Four Point Prober	FA/Test EQUIPMENT
40	Karl Suss	PM8 Prober	FA/Test EQUIPMENT
41	Kulicke & Soffa	4524A Bonder	FA/Test EQUIPMENT
42	Leica	DMS300 Digital Microscope	FA/Test EQUIPMENT
43	Olympus	LEXT OLS4000 3D laser scanning microscope	FA/Test EQUIPMENT
44	Olympus	LEXT OLS5000 3D laser scanning microscope	FA/Test EQUIPMENT
45	Olympus	TH3 Microscope	FA/Test EQUIPMENT
46	Pico	Probes	FA/Test EQUIPMENT
47	Signatone	CM-465-22 probe station	FA/Test EQUIPMENT
48	Signatone	S-M90 w/probe station	FA/Test EQUIPMENT
49	Tektronix	TLA 7012 Logic Analyzer (portable mainframe)	FA/Test EQUIPMENT
50	Veeco	Veeco GXRS System XR X-Ray Thickness	FA/Test EQUIPMENT
51	Zeiss	Axiotron Inspection Micoscope – 452825	FA/Test EQUIPMENT
52	Zeiss	Axio Imager M1m	FA/Test EQUIPMENT
53	KLA	RS100C	FA/Test EQUIPMENT