Description
Please contact us if you are interested in the following Component Testers , Handlers, Wafer Fabrication ,IC Assembly ,Wafer Inspection/Metrology , Wafer Probers , Board Testers etc Equipment and tools. The Equipment and tools are only for end users and are subject to prior sale without notice. Appreciate your time.
| Item | Mfgr. | Model | Description |
| 1 | Advantest | T2000 | SoC Test System |
| 2 | Advantest | T3324 | VLSI Tester Parts Machine |
| 3 | Advantest | T3324 | VLSI Tester Parts Machine |
| 4 | Advantest | T3326 | Memory Tester |
| 5 | Advantest | T5335P | Memory Tester |
| 6 | Advantest | T5335 | Memory Tester -Parts Machine |
| 7 | Advantest | T5335 | Memory Tester |
| 8 | Advantest | T3347 | Memory Tester |
| 9 | Advantest | T3347 | VLSI Tester Parts Machine |
| 10 | Advantest | T5365P | Memory Tester-Parts Machine |
| 11 | Advantest | T5371 | Memory Tester |
| 12 | Advantest | T5381 | Memory Tester |
| 13 | Advantest | T5382A | Memory Tester |
| 14 | Advantest | T5581H | Memory Tester |
| 15 | Advantest | T5585 | Memory Tester |
| 16 | Advantest | T6683 | SOC Test System |
| 17 | Agilent/HP | 4062UX | Parametric Test System |
| 18 | Agilent / HP | 4062UX | Parametric Test System |
| 19 | Agilent | 4071A | Parametric Test System |
| 20 | Agilent / HP | 82000 | D100 VLSI Tester 100 Mhz 96 pins |
| 21 | Agilent / HP | 82000 | D200 VLSI Tester 200 Mhz up to 240 pins |
| 22 | Agilent / HP | 82000 | D100 VLSI Tester 100 Mhz 176 pins |
| 23 | Agilent / HP | 82000 | D100 w/APG option, 128 pins |
| 24 | Agilent / HP | 83000 | VLSI Tester |
| 25 | Agilent / HP | 83000 | E2811, 256 pins |
| 26 | Agilent / HP | 83000 F120T | VLSI Tester 48 pins |
| 27 | Agilent / HP | 83000 F330T | VLSI Tester 224 pins |
| 28 | Agilent / HP | 83000 660I | VLSI Tester 96 Pins |
| 29 | Agilent / HP | 83000 F330T | VLSI Tester 80 Mhz 400 pins |
| 30 | Agilent / HP | 83000 F330T | VLSI Tester 120 Mhz 480 pins |
| 31 | Agilent / HP | 83000 F330T | VLSI Tester 330 Mhz 224 Pins/1 Meg |
| 32 | Agilent / HP | 83000 F330T | VLSI Tester 120 Mhz 336 pins 1 Meg |
| 33 | Agilent / HP | 83000 F330T | VLSI Tester 120 Mhz 256 pins 4 Meg |
| 34 | Agilent / HP | 84000 A120T | A120T RF Spares Tester |
| 35 | Agilent / HP | 94000 | Spare Parts Machine |
| 36 | Agilent / HP | 93000 PS3600 | SOC Test System |
| 37 | Agilent / Verigy | 93000 P1000 | SOC Test System |
| 38 | Agilent / Verigy | 93000 C400e | SOC Test System |
| 39 | Agilent / Verigy | 93000 C400e | SOC Test System |
| 40 | Agilent / Verigy | 93000 P600 | SOC Test System |
| 41 | Agilent / Verigy | V4400/V4436 | Memory Tester Parts Machine |
| 42 | Agilent / Verigy | V4436 | Memory Tester |
| 43 | Credence | ASL1000 | Linear Mixed Signal Tester |
| 44 | Credenc e (TMT) | ASL1000 | In Test Manipulator |
| 45 | Credence | Duo | Mixed Signal Tester |
| 46 | Credence | Duo | Mixed Signal Tester |
| 47 | Credence | Cal Station | Credence Calibration Station for Credence Quartet and Credence Duo’s |
| 48 | Credence | Duo XP | Mixed Signal Tester |
| 49 | Credence | Duo XP | Mixed Signal Tester |
| 50 | Credence | Duo SX | Mixed Signal Tester |
| 51 | Credence | Duo SX | Mixed Signal Tester |
| 52 | LTXC | Fusion MX | Mixed Signal Tester |
| 53 | LTXC | Fusion CX | Mixed Signal Tester |
| 54 | Credence | Octet 200 | Mixed Signal Tester |
| 55 | Credence | Quartet | Mixed Signal Tester |
| 56 | Credence | Quartet | Mixed Signal Tester |
| 57 | Credence | STS 8256 | Mixed Signal Tester |
| 58 | Credence | Vista Vision | Mixed Signal Tester |
| 59 | Delta Design | ETC2000 | Tester |
| 60 | Eagle | 5XP | Tester |
| 61 | EPRO | 142AX | EPROM Tester |
| 62 | HILEVEL | ETS300 | Digital Test System |
| 63 | HILEVEL | ETS300 | Digital Test System |
| 64 | Inovys | Ocelot | SOC Tester |
| 65 | Inovys | Ocelot | SOC Tester |
| 66 | Jetlight | 9290 | EEPROM Chip Eraser |
| 67 | Mosaid | MS4155 | Memory Tester Parts Machine |
| 68 | Mosaid | MS4155 | Memory Tester |
| 69 | Mosaid | MS4205EX | Bench Tester |
| 70 | Mosaid | MS3480 | Memory Tester |
| 71 | Mosaid | MS3495 | Memory Tester |
| 72 | Mosaid | MS4205EX | Memory Tester |
| 73 | Sentry/ Fairchild/Schlumberger | S21/S20 | 20 Mhz Digital Tester |
| 74 | Sentry/Fairchild/Schlumberger | S10 | 10 Mhz Digital Tester |
| 75 | Sentry/Fairchild/Schlumberger | Sentinel | Digital Tester |
| 76 | Sentry/Fairchild/Schlumberger | ITS 9000KX | VLSI Logic Test System 664 pins |
| 77 | Sentry/Fairchild/Schlumberger | ITS 9000KX | VLSI Logic Test System 376 pins |
| 78 | Sentry/Fairchild/Schlumberger | S1650 | Digital IC Test System, System and Spares |
| 79 | Sentry/Fairchild/Schlumberger | S790 | Parts Machine |
| 80 | Teradyne | Catalyst | D200 Test System with 384 Pins |
| 81 | Teradyne | Catalyst-RF | Parts Machine |
| 82 | Teradyne | Flex | Tester |
| 83 | Teradyne | MicroFlex | Parts Tester |
| 84 | Teradyne | Ultra Flex | Tester |
| 85 | Teradyne | A567 | Mixed Signal Test System |
| 86 | Teradyne | A575 | Parts Machine |
| 87 | Teradyne | A575 | Parts Machine |
| 88 | Teradyne | A585 | Parts Machine |
| 89 | Teradyne | J750 | Digital Test System |
| 90 | Teradyne | J937 | Memory Test System, 50 MHZ Mem Tester |
| 91 | Teradyne | J937 | Memory Test System, 100 MHZ |
| 92 | Teradyne | J971SP | Logic Test System |
| 93 | Teradyne | J971 | VLSI Logic Test System, 100 Mhz |
| 94 | Teradyne | J993 | Memory Test System |
| 95 | Teradyne | J995 | Memory Test System |
| 96 | Teradyne | J997 | Memory Test System |
| 97 | Teradyne | Tiger | System & Spares |
| 98 | Verigy / Agilent | PS800 (PS 3600) | SOC Tester |
| 99 | Versatest | VT2104 | Memory Tester |
| 100 | Advantest | 6761AD | Tri Temp |
| 101 | Aetrium | 5050S | Ambient only, 150 mil SOIC |
| 102 | Aseco | S130 | Single site, ambient and hot, various kits |
| 103 | Aseco | S170D | Dual site, ambient and hot, 173mil TSSOP, |
| 104 | Aseco | S170 | Ambient and hot, 7mm FPBGA |
| 105 | Daymarc | 3287 | Tri-Temp, 300 mil, SOJ kit |
| 106 | Daymarc | 717 Parts Machine | Single Site, Tri-Temp, TSSOP kit |
| 107 | Daymarc | 717 | 150 mil SOIC, Ambient |
| 108 | MCT | 3608E | Ambient and Hot, 300 mil SOIC kit |
| 109 | MCT | 3608E | Ambient and Hot, 300 mil SOIC kit |
| 110 | MCT | 3.608 | Ambient and Hot 400 mil SOJ |
| 111 | MCT | 3.608 | Ambient and Hot, SOP 32 |
| 112 | MCT | 3608EL | Ambient and Hot, 300 SOJ |
| 113 | MCT | 0.003608 | 300 Mil SOJ |
| 114 | MCT | 0.003608 | 600Mil DIP |
| 115 | MCT | 3608C-3 | Extended Back |
| 116 | MCT | 3608 CCA-3 | Handler Parts Machine |
| 117 | MCT | 4610 | Single Site, Tri-Temp 32 PLCC |
| 118 | MCT | 4610 | Dual site, Tri-temp, 32 PLCC |
| 119 | MCT | 4610 | Single Site 20 & 28 PLCC |
| 120 | Multitest | 8305L | Single Site, Ambient only, 600 Mil DIP |
| 121 | Multitest | 8589 | Tri Temp Handler |
| 122 | QMT | 1100 | Taping Machine |
| 123 | Synax | 1201 | Dual Site, Ambient and Hot |
| 124 | Synax | 121H | Single Site, Ambient and Hot |
| 125 | Synax | SX 141 | Single Site, Ambient and Hot, Pick and Place |
| 126 | Synax | 1601C | Quad Site, Tri temp |
| 127 | Convac | Solvent and Chemical Cabinet | |
| 128 | Fuji Impulse | FG-400E-SG | Wafer Cassette Vacuum Bag Sealer |
| 129 | SVG | 8126PC Coater | 8126PC/8136HPO Coater |
| 130 | Electroglas | 2001 | Various Configurations |
| 131 | Electroglas | 2080 | Various Configurations |
| 132 | Electrolas | 4080 | Various Configurations |
| 133 | Electroglas | 4085 | Various Configurations |
| 134 | KLA | 1011 | Wafer Prober |
| 135 | KLA | 1007 | Wafer Prober |
| 136 | RapidTran II | Wafer Transfer | |
| 137 | Semics | OPUS 2 | Wafer Prober |
| 138 | TEL | P8E | Wafer Prober |
| 139 | TEL | P8 LC | Wafer Prober |
| 140 | TEL | P8 | Wafer Prober |
| 141 | TEL | P8 | Wafer Prober |
| 142 | TEL | P8XL | Wafer Prober |
| 143 | TEL | P8XL | Wafer Prober |
| 144 | TEL | P8XL | Wafer Prober |
| 145 | TEL | P8XL | Wafer Prober |
| 146 | TEL | P8XL | Wafer Prober |
| 147 | TEL | P8XL | Wafer Prober |
| 148 | TEL | P12XL | Wafer Prober |
| 149 | TEL | P12XLn | Wafer Prober |
| 150 | TEL | P12XLn+ | Wafer Prober |
| 151 | TEL | 20 SR | 6 inch Auto Wafer Prober |
| 152 | TSK | APM 90A | Various configurations |
| 153 | TSK | FP200A | Wafer Prober |
| 154 | TSK | UF200 | Various configurations |
| 155 | TSK | Manipulator | MHF600S for use with TSK UF200 |
| 156 | TSK | Manipulator | MHF6000 for use with TSK UF3000 |
| 157 | TSK | Manipulator | MHF4000 for use with TSK UF3000 |
| 158 | TEL | Precio Octo | Wafer Prober 200mm |
| 159 | Markem | 452T/W | Marking System |
| 160 | Precision Technologies | LC2800 | PTI LC2800 Lead Conditioning System |
| 161 | Genrad | 2282 | Board Tester |
| 162 | Genrad | 2284 | Board Tester |
| 163 | Genrad | 2284E | Board Tester |
| 164 | Genrad | 2286i | Board Tetser |
| 165 | Genrad | 2287A | Board Tester |
| 166 | Genrad/Seica | S20 | Flying Prober |
| 167 | HP/Agilent | 3070 | Board Tester |
| 168 | Teradyne | Z1820 | 736 pins Board Tester |
| 169 | Teradyne | Z1840 | Board Tester |
| 170 | Teradyne | Z1880-1 | Board Tester |
| 171 | Teradyne | Z1880-2 | Board Tester |
| 172 | Teradyne | Z1884 | Board Tester |
| 173 | Teradyne | Z1888 | Board Tester |
| 174 | Teradyne | Z1890 | Board Tester |
| 175 | Teradyne | L210 | Board Tester |
| 176 | Teradyne | L321 | Board Tester |
| 177 | Teradyne | L353 | Functional Tester |
| 178 | Teradyne | L393 | Functional Tester |
| 179 | Teradyne | 8851 | Board Tester |
| 180 | Teradyne | 8852E | Board Tester |
| 181 | Aeroflex | Comstron FS1000 | Dual Synthesizer |
| 182 | Agilent | E5100A | Network Analyzer |
| 183 | Agilent | E1411B | VXI Multi Meter |
| 184 | Agilent | E2960A | Serial Protocal Tester XC for PCI Express |
| 185 | Agilent | E5810A | LAN/GPIB Gateway |
| 186 | Anritsu | ML2438A | Dual Input Power Meter |
| 187 | Gigatronics | 8652A | Power Meter |
| 188 | Elgar | AT8000 | Power Supply |
| 189 | E1215A | High Speed Width Generator | |
| 190 | HP | E1085a | HP 3070 Communication Tester VXI Chassis |
| 191 | HP | E1095a | LCU -Line Conditioning Unit |
| 192 | HP | E1095-66501 | LCU -Line Conditioning Unit |
| 193 | HP | E1095-66510 | PCA Terminal Block |
| 194 | HP | E1466-66201 | Cross Point Switch |
| 195 | HP | E1406A | Command Module |
| 196 | HP | E1430A | 10msa ADC filter |
| 197 | HP | E1445A | Arbitrary Function Generator |
| 198 | HP | E1485A | Signal Processor and FIFO |
| 199 | HP | E1490B | Breadboard W/O Interface |
| 200 | HP | E1401B | High Power Mainframe |
| 201 | HP | E1419A | Multifunctional Card |
| 202 | HP | E1433A | Digitizer |
| 203 | HP | E1433B | Digitizer |
| 204 | HP | E1438A | Digitizer |
| 205 | HP | E1441A | Waveform Generator |
| 206 | HP | E1482B | VXI Bus Extender |
| 207 | HP | E1488A | Memory Module |
| 208 | HP | 3458A | Mutlimeter |
| 209 | HP | 3488A | HP-IB Switch Control Unit |
| 210 | HP | 3499A | Switch/Control Mainframe 5 Slot |
| 211 | HP | 4084 | Switching Matrix |
| 212 | HP | 4085A | Switch Matrix for HP4062UX |
| 213 | HP | 4085B | Switch Matrix for HP4062UX |
| 214 | HP | 4086A | Switching Matrix |
| 215 | HP | 4087A | Switching Matrix |
| 216 | HP | 4142B | Modular DC Source Monitor |
| 217 | HP | 41420A | Source Monitor Unit / Module |
| 218 | HP | 41421B | Source Monitor Unit |
| 219 | HP | 41424A | Source Monitor Unit |
| 220 | HP | 41425A | Analog Feedback Unit |
| 221 | HP | 4156B | Parameter Analyzer |
| 222 | HP | 4194A | Impedance Fain- Phase Analyzer |
| 223 | HP | 4284A | LCR Meter |
| 224 | HP | 4432B | Series Signal Generator |
| 225 | HP | E4425B | 3Ghz Signal Generator |
| 226 | HP | 5314A | Universal Counter |
| 227 | HP | 54100A | Digital Oscilloscope |
| 228 | HP | 54502A | Digital Oscilloscope |
| 229 | HP | 59303A | Digital to Analog Converter |
| 230 | HP | 59401A | Bus Analyzer |
| 231 | HP | 6023A | Power Supply |
| 232 | HP | 6625A | DC Power Supply |
| 233 | HP | 6626A | DC Power Supply |
| 234 | HP | 6627A | Power Supply |
| 235 | HP | 6624A | DC Power Supply |
| 236 | HP | 6552A | DC Power Supply |
| 237 | HP | 6572A | DC Power Supply |
| 238 | HP | 8110A | 150 mhz Pulse Generator |
| 239 | HP | 8566B | Microwave Spectrum Analayzer |
| 240 | HP-Agilent | 8753ES | Network Analyzer |
| 241 | HP | E8491B | Controller Interface |
| 242 | IWATSU | TS8123 | Storage Scope |
| 243 | Kinetic Systems | 400145-3-1 | Vibraplane Table |
| 244 | Lecroy | LC584 | AL Oscilloscope |
| 245 | National Instruments | GPIB-120A | Bus Expander/Isolator |
| 246 | PTS | 310 | Frequency Synthesizer |
| 247 | PTS | x10 | Frequency Synthesizer |
| 248 | PTS | 500 | Frequency Synthesizer |
| 249 | PTS | 620 | Frequency Synthesizer |
| 250 | Racal | 1260-22 | 40 Channel Hi Current Switch |
| 251 | Racal | 6062 | |
| 252 | Sorensen | DCS40 | Power Supply |
| 253 | Stanford Research | PS325 | High Voltage Power Supply |
| 254 | Tektronik | TLA7N4 | Logic Anlayzer Module |
| 255 | Tektronix 601A | DSA 601A | Digitizing Signal Analyzer |
| 256 | Tektronix | 11801B | Digital Sample Oscilloscope |
| 257 | Tektronix | 520A | NTSC Vectorscope |
| 258 | Wavecrest | DTS 2075 | Digital Time Scope |
| 259 | Wavecrest | DTS 2077 | Digital Time Scope |
| 260 | Electrical Specialists | ISO/T-34 | Power Conditioner |
| 261 | Agilent/Verigy 93000 | CDR451 | Power Conditioner |
| 262 | Kensington | Scope | |
| 263 | Schlumberger | IDS P2X | |
| 264 | Schlumberger | IDS 2000 | Focus Ion Beam System |
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