Description
The “Semiconductor Metrology Instruments and parts” below are only for end user. Please contact us if you have any questions. Subject to prior sale without notice. Appreciate your time!
| 1 | ADE 1239B-3 75mm Wafer Positioning Ring |
| 2 | Agilent 4155C semiconductor parameter analyzer with HP16058A test fixture |
| 3 | Alessi EC-01 controller |
| 4 | Alessi REL-4100 manual prober with LY1 1064nm laser cutting system |
| 5 | Alessi/Cascade REL-4800 200mm manual wafer prober with Mitutoyo FS-60 microscope including Plan APO 10x/20x/50x objectives |
| 6 | AST Products VCA Optima XE Contact Angle Goniometer with motorized syringe |
| 7 | Brumley South/MEMC BSI-42P013H Latex Sphere Calibration Standard |
| 8 | Brumley South/MEMC BSI-42P013H Latex Sphere Calibration Standard |
| 9 | Brumley South/MEMC BSI-4P220H Latex Sphere Calibration standard |
| 10 | Brumley South/MEMC BSI-4P220H Latex Sphere Calibration standard |
| 11 | Brumley South/MEMC BSI-4P300H Latex Sphere Calibration standard |
| 12 | Brumley South/MEMC BSI-4P300H Latex Sphere Calibration standard |
| 13 | Brumley South/MEMC BSI-4P503H Latex Sphere Calibration standard |
| 14 | Brumley South/MEMC BSI-4P503H Latex Sphere Calibration standard |
| 15 | Brumley South/MEMC BSI-4P993H Latex Sphere Calibration standard |
| 16 | Brumley South/MEMC BSI-4P993H Latex Sphere Calibration standard |
| 17 | Cascade Microtech MS1-44/L Motorized Micropositioner |
| 18 | Cascade Microtech MS1-44/L Motorized Micropositioner |
| 19 | Cascade Microtech WPH-001-200 |
| 20 | Cascade Microtech WPH-001-200 |
| 21 | Cascade Probe Card Holder for 11000 series Probers |
| 22 | DataPhysics ACA 50 Dynamic Contact Angle |
| 23 | DataPhysics ACA 50 Dynamic Contact Angle |
| 24 | First Ten Angstroms FTA1000B manual drop shape analyzer |
| 25 | GGB Industries Picoprobe 12C |
| 26 | GGB Industries Picoprobe 12C |
| 27 | GGB Industries Power Supply |
| 28 | GGB Industries Power Supply |
| 29 | Giga Test Labs GTL4040 Precision Probing Platform |
| 30 | Giga Test Labs GTL4040 Precision Probing Platform |
| 31 | K&S 4 point probe head |
| 32 | Large sample scanning stage and AFM probeQuick View |
| 33 | Large sample scanning stage and AFM probeQuick View |
| 34 | Leitz Ergolux |
| 35 | Leitz Ergolux |
| 36 | Line Tool Mfg. Model A micropositioner |
| 37 | Metricon 2010 Prism Coupler 633nm (1997) |
| 38 | Metricon 2010 Prism Coupler 633nm (1997) |
| 39 | Metricon 2010 Prism Coupler 633nm/ 1550nm, Ge detector (1998) |
| 40 | Micromanipulator 110/210 micropositioners with vacuum base and probe arm |
| 41 | Micromanipulator 2250 Large Area Panel Prober |
| 42 | Micromanipulator 2250 Large Area Panel Prober |
| 43 | Micromanipulator 450/550 Micropositioner |
| 44 | Micromanipulator 450/550 Micropositioner |
| 45 | Micromanipulator 450/550 set of 2 UNUSED micropositioners with vacuum base |
| 46 | Micromanipulator 450/560VM UNUSED micropositioner with vacuum base |
| 47 | Micromanipulator 500MT positioner with magnetic base |
| 48 | Micromanipulator 6100 150mm Manual Prober with B&L Microzoom 2 |
| 49 | Micromanipulator 7000LTE Dark Box |
| 50 | Micromanipulator 72-3-R-XX probe |
| 51 | Micromanipulator Analytical Probe Station |
| 52 | Micromanipulator Analytical Probe Station |
| 53 | Micromanipulator ECT-01 |
| 54 | Micromanipulator ECT-01 |
| 55 | Micromanipulator FET-PS4 Active Probe |
| 56 | Micromanipulator FET-PS4 Active Probe |
| 57 | Micromanipulator FPC-FRX |
| 58 | Micromanipulator FPC-FRX |
| 59 | Micromanipulator HCSM |
| 60 | Micromanipulator HCSM |
| 61 | Micronics Japan Ltd. 705A Manual Prober |
| 62 | Micronics Japan Ltd. 705A Manual Prober |
| 63 | Nanometrics AUV-321-RO2 Type I/II |
| 64 | Nanometrics AUV-321-RO2 Type I/II |
| 65 | Nanometrics Hamamatsu L2196 Deuterium Lamp |
| 66 | Nanometrics Hamamatsu L2196 Deuterium Lamp |
| 67 | New Wave EZlaze 532nm with Mitutoyo FS60 microscope |
| 68 | Newport XYZ Micropositioners, pair |
| 69 | Newport XYZ Micropositioners, pair |
| 70 | Oyama OYM-131 micropositioner with magnetic base |
| 71 | PPL 4×6 2-axis calibration standard |
| 72 | Probotech P11-LX6x9 Flying Micro-Prober, Dual Sided |
| 73 | Probotech P11-LX6x9 Flying Micro-Prober, Dual Sided |
| 74 | R&K 260 manual prober with 2 micropositioners |
| 75 | Rame Hart model 100 Contact angle Goniometer with tilting base |
| 76 | RMS Systems/Hologenix NGS 3500 Defect Detection System |
| 77 | RMS Systems/Hologenix NGS 3500 Defect Detection System |
| 78 | Rucker Kolls 329 micropositioners |
| 79 | Sentech SE400adv-16 wafer mapping ellipsometer with motorized 8×8 stage- Factory recertified December 2019 |
| 80 | Signatone CM310 manual 300mm(12in) |
| 81 | Signatone S-302-8 Resistivity Test stand |
| 82 | Signatone S463 Semiautomatic Prober |
| 83 | Signatone S463 Semiautomatic Prober |
| 84 | Signatone S-925 micropositioners with vacuum base |
| 85 | Signatone S-926 Micropositioner with magnetic base |
| 86 | Signatone S-926 Micropositioner with magnetic base |
| 87 | Signatone S-926 positioners with vacuum base |
| 88 | Stylus for Veeco Dektak 2, 2A, 3, 3ST, 3030 |
| 89 | Suss Microtec PH250HF manual high frequency probehead with 3um resolution |
| 90 | Suss Microtech PH500 Motorized Micropositioners |
| 91 | Suss PH400 manual Submicron Positioner with vacuum base |
| 92 | Suss PH600HF High Frequency Positioners (set of 4) |
| 93 | Suss/MFI Vibsense |
| 94 | Suss/MFI Vibsense |
| 95 | TechnoOrg Linda IV5 Gentle Mill |
| 96 | TechnoOrg Linda IV5 Gentle Mill |
| 97 | Temptronic 150mm thermal chuck, max temp 200C, with TPO3020B-2300-1 controller and venturi vacuum generator |
| 98 | Temptronic SA76440 Air Dryer |
| 99 | Temptronic SA76440 Air Dryer |
| 100 | Temptronic-TPO3500 Titan thermal chuck controller |
| 101 | Tropel 129745-04 75mm Wafer Chuck |
| 102 | Tropel 129745-04 75mm Wafer Chuck |
| 103 | Tropel 8240-FSI 100mm Wafer Chuck |
| 104 | Tropel 8240-FSI 100mm Wafer Chuck |
| 105 | Ultracision 680e semiautomatic prober with optional 150mm thermal chuck |
| 106 | Veeco CPII Atomic Force Microscope |
| 107 | Veeco CPII Atomic Force Microscope |
| 108 | Veeco Dektak V200-Si Stylus Profiler |
| 109 | Veeco Digital Instruments D3100AFM |
| 110 | Veeco Digital Instruments Dimension Large Sample Scanning Atomic Force microscope, LS-SPM with Nanoscope III controller and LSS large sample scanning stage |
| 111 | Veeco Digital Instruments Dimension Large Sample Scanning Atomic Force microscope, LS-SPM with Nanoscope III controller and LSS large sample scanning stage |
| 112 | Veeco Digital Instruments Large Sample Scanning Stage |
| 113 | Veeco Digital Instruments Large Sample Scanning Stage |
| 114 | Veeco/Miller Design FPP5000 Four Point Probe |
| 115 | Wentworth CAP 3000 Motorized Positioner |
| 116 | Wentworth CAP 4000 Motorized Positioner |
| 117 | Wentworth MP-1100 Prober |
| 118 | Wentworth MP-1100 Prober |
| 119 | Zygo 5x NV objective |
ID-SS7270W
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