Description
The following Semiconductor Equipment are only for end user. Please contact us if you have any questions. Subject to prior sale without notice. Appreciate your time!
| ASHER | AXCELIS | Fusion 200 MCU | Asher |
| ASHER | GASONICS | IRIDIA 4800 DL | Stripper / Asher |
| ASHER | GASONICS | IRIDIA 4800 DL | Stripper / Asher |
| ASHER | GASONICS | IRIDIA 4800 DL | Stripper / Asher |
| ASHER | GASONICS | IRIDIA 4800 DL | Stripper / Asher |
| ASHER | GASONICS | IRIDIA 4800 DL | Stripper / Asher |
| ASHER | HITACHI | UA-7200 | Stripper/Asher |
| CVD | AMAT | CENTURA 5200 | DxZ (SiLAINE) |
| CVD | AMAT | CENTURA 5200 | WxZ |
| CVD | AMAT | CENTURA 5200 | WxZ |
| CVD | AMAT | CENTURA 5200 | MxP+ |
| CVD | AMAT | CENTURA MCVD | WxZ Optima |
| CVD | AMAT | CENTURA MCVD | WxZ Optima |
| CVD | AMAT | CENTURA MCVD | WxZ Optima |
| CVD | AMAT | CENTURA MCVD | WxZ Optima |
| CVD | AMAT | CENTURA MCVD | WxZ Optima |
| CVD | AMAT | CENTURA MCVD | WxZ Optima |
| CVD | AMAT | CENTURA MCVD | WxZ Optima |
| CVD | AMAT | CENTURA MCVD | WxZ Optima |
| CVD | AMAT | CENTURA MCVD | WxZ Optima |
| CVD | AMAT | P5000 | Delta Dlh |
| CVD | AMAT | P5000 | Delta Dlh |
| CVD | AMAT | P5000 | Delta Teos |
| CVD | AMAT | P5000 | Delta Teos |
| CVD | AMAT | P5000 | Delta Teos |
| CVD | AMAT | P5000 | Delta Teos 3ch, Sputter 1ch |
| CVD | AMAT | P5000 | Delta Teos 3ch, Sputter 1ch |
| CVD | AMAT | P5000 | Delta Teos 3ch, Sputter 1ch |
| CVD | AMAT | P5000 | Delta Teos 3ch, Sputter 1ch |
| CVD | AMAT | P5000 | Delta Teos 3ch, Sputter 1ch |
| CVD | AMAT | P5000 | Delta Teos 3ch, Sputter 1ch |
| CVD | AMAT | P5000 | DxL |
| CVD | AMAT | P5000 | DxL |
| CVD | AMAT | P5000 | DxL |
| CVD | AMAT | P5000 | DxL |
| CVD | AMAT | P5000 | DxL 2CH |
| CVD | AMAT | P5000 | DxZ 4CH |
| CVD | AMAT | P5000 | PECVD |
| CVD | AMAT | P5000 | SACVD Delta ,Teos |
| CVD | AMAT | P5000 | SACVD Delta Teos 3ch, sputter 1ch |
| CVD | AMAT | P5000 | Sputter |
| CVD | AMAT | P5000 | Teos |
| CVD | AMAT | P5000 | Teos |
| CVD | AMAT | P5000 | Teos |
| CVD | AMAT | P5000 | Teos 2ch, Sputter 2ch |
| CVD | AMAT | P5000 | Teos 2ch, Sputter 2ch |
| CVD | AMAT | P5000 | Teos 2ch, Sputter 2ch |
| CVD | AMAT | P5000 | Teos 3ch, Sputter 1ch |
| CVD | AMAT | P5000 | Teos, DxL |
| CVD | AMAT | P5000 | WxL |
| CVD | AMAT | P5000 | WxL |
| CVD | AMAT | P5000 | WxL |
| CVD | AMAT | P5000 | WxZ |
| CVD | AMAT | P5000 | WxZ |
| CVD | AMAT | P5000 | WxZ |
| CVD | AMAT | P5000 | WxZ 1ch, Sputter 1ch |
| CVD | AMAT | P5000 | WxZ 1ch, Sputter 1ch |
| CVD | AMAT | P5000 | WxZ 2ch, Sputter 1ch |
| CVD | AMAT | P5000 | WxZ Mark II |
| CVD | BMR | HIDEP | PECVD |
| CVD | GEMINI | GEMINI III E | EPI Reactor Batch |
| CVD | KORNIC (AP system) | RTP-600M | RTP, Wafer Diffusion |
| CVD | NOVELLUS | Concept 2 Speed | Triple Chamber, MAG 2000 |
| ETCHER | AMAT | CENTURA 5200 | MxP Poly |
| ETCHER | AMAT | P5000 | Mark II Metal |
| ETCHER | AMAT | P5000 | Mark II OXIDE |
| ETCHER | AMAT | P5000 | MxP |
| ETCHER | AMAT | P5000 | MxP+ metal |
| ETCHER | AMAT | P5000 | MxP+ metal |
| ETCHER | AMAT | P5000 | MxP+ Poly |
| ETCHER | AMAT | P5000 | No Chamber (PLIS type) |
| ETCHER | BMR | GAN (A49-3) | Etcher |
| ETCHER | LAM | 4720 | Oxide Etch |
| ETCHER | LAM | Raindow4500 | Etcher |
| ETCHER | OXFORD | 800+ | RIE |
| ETCHER | PLASMA THERM | WAFER/ BATCH 740 | Dual Plasma Etch And Rie |
| ETCHER | PLASMA THERM | WAFER/ BATCH 741 | Dual Plasma Etch And Rie |
| ETCHER | PSC | DES-220-456AVL | Dry Etching System |
| ETCHER | TEGAL | PLASMA 900E | Plasma Dry Etch |
| ETCHER | TEGAL | PLASMA 903E | Plasma Dry Etch |
| ETCHER | TEL | 8500 | Etcher |
| ETCHER | TEL | 8500 | Etcher |
| ETCHER | TEL | 8500 | Etcher |
| ETCHER | TEL | 8500 | Etcher |
| MET | AMRAY | SEM-3800C | |
| MET | APPIIED BOISYSTEM | ABI-3700 ANALYZER | Automatic Sequencer |
| MET | AUGUST | CV-9812 | Wafer Carrier Inspection Tool |
| MET | BROOKS | METARA 7200 | Overlay |
| MET | CYBER OPTICS | CYBERSCAN C212/110 | Laser Measure |
| MET | EO TECHNOLOGY | FOR GLASS PANEL | Laser Marker for Glass |
| MET | ESI | M9275 | Laser Repair |
| MET | ESI | M9825 | Laser Repair |
| MET | ESI | M9825 | Laser Repair |
| MET | ESI | M9825 | Laser Repair |
| MET | ESI | M9830 | Laser Repair |
| MET | ESI | M9830 | Laser Repair |
| MET | FSM | SYMPHONYMC | Life Time |
| MET | HITACHI | FB2100 | FIB |
| MET | HITACHI | RS-4000 | Defect Review Sem |
| MET | HITACHI | RS-4000 | Defect Review Sem |
| MET | HITACHI | S-4160 | FE Sem |
| MET | HITACHI | S-5000 | FE Sem |
| MET | HITACHI | S-5000 | FE Sem |
| MET | HITACHI | S-5000 | FE Sem |
| MET | HITACHI | S-5000 | FE Sem |
| MET | HITACHI | S-5000 | FE Sem |
| MET | HITACHI | S-5000 | FE Sem |
| MET | HITACHI | S-7800 | CD Sem |
| MET | HITACHI | S-7800HSA | CD Sem |
| MET | HITACHI | LS-6800 | Wafer Surface Inspection |
| MET | J.A.WOOLAM | VUV-VASE VU302 (Gen I) | Ellipsometer |
| MET | JEOL | JWS-7500E | Wafer Inspection System |
| MET | JEOL | JSM-5600 | CD Sem |
| MET | JEOL | JSM-6340F | FE Sem |
| MET | JEOL | JSM-6700F | FE Sem |
| MET | JEOL | JWS-7500E | Wafer Inspection System |
| MET | KLA_TENCOR | 2132 (mainbody only) | Inspection Unit |
| MET | KLA_TENCOR | AIT | Particle Review |
| MET | KLA_TENCOR | AIT I | Patterned Wafer Inspection |
| MET | KLA_TENCOR | AIT UV | Darkfield Defect Inspection |
| MET | KLA_TENCOR | AIT XP+ | Darkfield Defect Inspection |
| MET | KLA_TENCOR | ARCHER AIM | Overlay |
| MET | KLA_TENCOR | P-2 | Disk Profiler |
| MET | KLA_TENCOR | P-12 | Disk Profiler |
| MET | KLA_TENCOR | PROMETRIX FT750 | Film Thickness Measurement |
| MET | KLA_TENCOR | PROMETRIX FT750 | Film Thickness Measurement |
| MET | KLA_TENCOR | SP1 Tbi | Unpatterned wafer inspection |
| MET | KLA_TENCOR | THERMA-WAVE OP 2600 |
Opti-Probe |
| MET | KLA_TENCOR | THERMA-WAVE OP 2600 |
Opti-Probe |
| MET | KLA_TENCOR | THERMA-WAVE OP 2600 |
Opti-Probe |
| MET | KLA_TENCOR | THERMA-WAVE OP 2600B | Opti-Probe |
| MET | KLA_TENCOR | THERMA-WAVE OP 2600B | Opti-Probe |
| MET | KLA_TENCOR | THERMA-WAVE OP 2600B | Opti-Probe |
| MET | KLA_TENCOR | THERMA-WAVE OP 2600B | Opti-Probe |
| MET | KLA_TENCOR | THERMA-WAVE OP 2600 DUV |
Opti-Probe |
| MET | LASERTEC | BGM300 | Wafer Surface Analyzing and VIsualization System |
| MET | LG SEMICON | CLS-9002 | 3rd Optical Inspection |
| MET | LINDA | IV5_HI | |
| MET | NANOMETRICS | 9-7200-0195E | Mask & Wafer Inspection |
| MET | NEC | SL-473D2 | Si Wafer Marker |
| MET | NEC | SL-473F | Si Wafer Marker |
| MET | NIKON | 3 | Opti station |
| MET | NIKON | 3 | Opti station |
| MET | NIKON | 3A | Opti station |
| MET | RAYTEX | RXW-800 | Edge Scan |
| MET | RIGAKU | XRF3640 (Handle include) |
Wafer/ Disk Analyzer |
| MET | RIGAKU | XRF3640 (Handle not include) |
Wafer/ Disk Analyzer |
| MET | RUDOLPH | FE-3 | Focus Ellipsometer |
| MET | RUDOLPH | FE-4D | Focus Ellipsometer |
| MET | RUDOLPH | WS2500 | Wafer Inspection System |
| MET | RUDOLPH | WS2500 | Wafer Inspection System |
| MET | RUDOLPH | WS2500 | Wafer Inspection System |
| MET | RUDOLPH | WS2500 | Wafer Inspection System |
| MET | RUDOLPH | MP1-200 | Film thickness measurement |
| MET | RUDOLPH | MP1-200 | Film thickness measurement |
| MET | RUDOLPH | MP1-200 | Film thickness measurement |
| MET | RUDOLPH | MP1-200 | Film thickness measurement |
| MET | SSM | 5200 | Resistivity |
| MET | TEKRONIX | 1765 | Vector Analyzer |
| MET | THERMO FISHER | ECO 1000 | FTIR System |
| PHOTO | DNS | SK-200W-AVPF | Coater / Developer system (2C/2D) |
| PHOTO | DNS | SK-200W-BVPE | i-Line Photo Track Coater (3C3D) |
| PHOTO | DNS | SK-80B-BVPF | Coater (3C) |
| PHOTO | DNS | SK-80BW-AVPE | Coater/ Developer (2C/2D) |
| PHOTO | DNS | SK-W80B-AVPE | Coater/ Developer (2C/2D) |
| PHOTO | DNS | SK-W80B-AVPE | Coater/ Developer (2C/2D) |
| PHOTO | DNS | SKW-80A-AVPE | Developer (3D) |
| PHOTO | DNS | SKW-80A-AVPE | Track (1C2D) |
| PHOTO | DNS | SD-W80A-AVP | Developer system (1D) |
| PHOTO | DNS | SSW-60A-AR | Scrubber (4B) |
| PHOTO | KARLSUSS | ACS 200 | Coater / Developer |
| PHOTO | KARLSUSS | RC 16 | Spin Coater |
| PHOTO | KARLSUSS | RC 16(RC5) | Spin Coater |
| PHOTO | LABOTECH | Hot Plate | Photonics |
| PHOTO | NIKON | NSR-4425i | Stepper (left) |
| PHOTO | NIKON | NSR-4425i | Stepper (left) (FIA) |
| PHOTO | NIKON | NSR-S204B | Scanner DUV (GigaphtonI G20K2 KRF laser) |
| PHOTO | NIKON | NSR-S204B | Scanner DUV (GigaphtonI G20K2 KRF laser) |
| PHOTO | NIKON | NSR-S306B | Scanner DUV |
| PROBER | KARLSUSS | PM8 | Prober |
| PROBER | ELECTROGLAS | EG4090 | Automatic Wafer Prober |
| PROBER | ELECTROGLAS | EG4090 | Automatic Wafer Prober |
| PROBER | ELECTROGLAS | EG4090 | Automatic Wafer Prober |
| PROBER | ELECTROGLAS | EG4090 | Automatic Wafer Prober |
| PROBER | ELECTROGLAS | EG4090U | Automatic Wafer Prober |
| PROBER | ELECTROGLAS | EG4090U | Automatic Wafer Prober |
| PVD | VARIAN | MBB | |
| PVD | VARIAN | M2I | Sputter |
| PVD | VARIAN | M2I | Sputter |
| RTP | AMAT | Centura RTP | Tpcc / Xe+ / Atm |
| RTP | AMAT | Centura RTP | Tpcc / Xe+ / Atm |
| RTP | AMAT | Centura RTP | Tpcc / Xe+ / Rp(ISSG) |
| ETC | BROOKS | SORTER MTX 2000 | |
| ETC | BROOKS | SORTER MTX 2000 | |
| ETC | CARL ZEISS | S-INDUSTRIAL | Zeiss Excistar S-industrial |
| ETC | LUMONICS | SUPERCLEAN | Laser Marking System(Lamp type) |
| ETC | NANO OPTICS | HAZE 2 | Nano Optics Haze 2 |
| ETC | SVS | MSX1000 | TRACK_SVS#02 MSX1000 |
| ETC | THERMAL | GYE-12000 | Evaporator System |
ID-SS5588-2-1-1