Description
The following Semiconductor Equipment are only for end user. Please contact us if you have any questions. Subject to prior sale without notice. Appreciate your time!
| 1 | 0020-0323 REV H | Applied Materials | Heat Exchanger |
| 2 | 0290-09018 Rev F | Applied Materials | Heat Exchanger |
| 3 | 11801C | Tektronix | Digital Sampling Oscilloscope |
| 4 | 14040-je24-0004 | VAT | HV Gate Valve |
| 5 | 14040-je24-0004 | VAT | HV Gate Valve |
| 6 | 14040-je24-0004 | VAT | HV Gate Valve |
| 7 | 162-0040K | MKS Instruments | Inline Pneumatic Valve ISO-KF NW 40 flanges |
| 8 | 1671G | Agilent | Logic Analyzer |
| 9 | 1671G | Agilent | Logic Analyzer |
| 10 | 2008XP | Esec | Die Bonder |
| 11 | 2008XP | Esec | Die Bonder |
| 12 | 2122 | KLA-TENCOR | WAFER DEFECT INSPECTION |
| 13 | 2200 APM | Datacon | Flip Chip Bonder |
| 14 | 2210PPS | Datacon | Die Bonder |
| 15 | 2432A | Tektronix | Digital Oscilloscope, 2 channel, with GPIB |
| 16 | 300LAH | Maxis | ICP Etcher |
| 17 | 3018 | ESEC | Gold Ball Bonder |
| 18 | 305W | Ebara | Turbo pump controller |
| 19 | 306W | Ebara | Turbo pump controller |
| 20 | 3088 | ESEC | Gold Ball Bonder |
| 21 | 320 PC | STS (SPTS) | Reactive Ion Etcher |
| 22 | 41501B | Agilent | SMU and PGU 2 units |
| 23 | 44 | ESI | LASER TRIMMER SPARE PARTS |
| 24 | 487 | KEITHLEY | PICO AMMETER |
| 25 | 5110 | Solitec | Spin Coater |
| 26 | 5410 | Delvotec | Wire Bonder |
| 27 | A30W | Ebara | Vacuum Pump |
| 28 | A30W | Ebara | Vacuum Pump |
| 29 | A412 Anneal | ASM | Vertical Anneal Furnace |
| 30 | AD809A-03 | ASM | Die Bonder |
| 31 | AD809C-00 | ASM | Die Bonder |
| 32 | AD809S-00 | ASM | Die Bonder |
| 33 | Alpha Step IQ | KLA-Tencor | Surface Profiler |
| 34 | AP11 | Versum Materials | Gas Cabinet with GASGUARD Controller |
| 35 | Aristo 1400L | AKT / Applied Materials | Vertical IN-line Sputtering Machine |
| 36 | ART 200 | ELES | Burn In Board testing system |
| 37 | AVR series | Genmark | Cleanroom Vacuum Robot |
| 38 | AVR series (1″ 2L15″) | Genmark | Cleanroom Vacuum Robot |
| 39 | BCU-750 | Rasco | Brine Chiller |
| 40 | Bestem D02 | Canon | Epoxy Die Bonder |
| 41 | BJ 820 | Hesse & Knipps | Inidexersystem |
| 42 | BK04A | K Tech Engineering | Blister tape applicator for microelectronic components |
| 43 | C7103 | Hamamatsu | PC Controlled IC Back-side Lapping and Wafer Grinding System |
| 44 | Candela 8600 | KLA-Tencor | Film Thickness Measurement |
| 45 | Candela CS20V | KLA-Tencor | Wafer Inspection |
| 46 | Catalyst | Teradyne | Mixed Signal Tester |
| 47 | Cell electrical tester | Baccini | Electrical Cell tester |
| 48 | Centronic E2000 | Centrotherm | Horizontal diffusion furnace for POCl3 doping |
| 49 | Centura ACP DPN HD | Applied Materials | Gate Stack Decoupled plasma Nitride |
| 50 | CHIP AND CRACK CAMERA | Baccini | Chip and Crack camera |
| 51 | Climatest C320G5 | Mazzali | Temperature and humidity testing chamber |
| 52 | Climatest C320G5 | Mazzali | Temperature and humidity testing chamber |
| 53 | C-SAM D6000 | Sonoscan | Acoustic Microscope |
| 54 | Custom | Gigi Molina Brevetti Plastici SpA | Manual wet bench |
| 55 | Custom | Gigi Molina Brevetti Plastici SpA | Manual wet hood |
| 56 | Custom | Gigi Molina Brevetti Plastici SpA | Manual wet hood |
| 57 | Custom | Poly Design Inc. | Heated Quartz Boat storage / drying system |
| 58 | D150 | Edwards | Dual GRC unit |
| 59 | D150 | Edwards | Dual GRC unit |
| 60 | D3100V | Veeco | AFM |
| 61 | DAD320 | Disco | Dicing Saw |
| 62 | DAD522 | Disco | DICING SAW |
| 63 | DAD6450 | Disco | Dicing Saw + Hanmi 3000 |
| 64 | DB 608-PRL | Alphasem | Bonder |
| 65 | DFD620 | Disco | Dicing Saw |
| 66 | DFD681 | Disco | Dicing Saw |
| 67 | DFL 7161 | Disco | Laser Saw |
| 68 | DO 12.000-200-FF-HTO-CAN-NT4.0 | CentroTherm | Fast Firing Funace with Dryer |
| 69 | Dryer 1 | Baccini | Dryer 1 |
| 70 | Dryer 2 | Baccini | Dryer 1 |
| 71 | DUO CHUCK CSM16 | MDC (Materials Development Corp.) | CV Measurement system |
| 72 | Duo SX (Spare Parts) | Credence | SPARE PARTS FROM AUTOMATED TEST SYSTEM |
| 73 | Dynascope | Vision Engineering | Inspection Microscope |
| 74 | E2M40 FSPX | Edwards | Rotary Vacuum Pump with oil filter |
| 75 | E4915A | Agilent / Verigy | Cyrstal impedance LCR meter |
| 76 | E8001 | Alphasem | Die Sort System |
| 77 | Eclipse LV 100 | Nikon | Stereomicroscope |
| 78 | ET300WS | Ebara | Turbo pump |
| 79 | ET300WS | Ebara | Turbo pump |
| 80 | ET300WS | Ebara | Turbo pump |
| 81 | ET300WS | Ebara | Turbo pump |
| 82 | ET300WS | Ebara | Turbo pump |
| 83 | Etcher | Rena | In-Line Etching System |
| 84 | EXCAL 7728 HE | Climats | Environmental Test Chamber |
| 85 | F6000QS | FORTREND | 6 INCH WAFER TRANSFER |
| 86 | F6000QS | Fortrend | 6 INCH WAFER TRANSFER |
| 87 | FLUOROCARBON RD4500 CLASSIC | VERTEQ | SRD |
| 88 | FPA 5000 ES2+ | Canon | 248 nm lithography exposure system |
| 89 | FPA-5500 iZa | Canon | i-Line Wide-Field Stepper |
| 90 | FPA-5500iZa | CANON | Stepper |
| 91 | G6 | Nikon | Stepper |
| 92 | Gencobot 9 GPR series | Genmark | Cleanroom Vacuum Robot |
| 93 | GPR series | Genmark | Cleanroom Vacuum Elevator |
| 94 | Hifix for PQFP80 (14 x 20) | Advantest | Hi-fix for Advantest T5371 package type PQFP80 (14 x 20) |
| 95 | Horizon 4085X | Electroglas | Fully Automatic Prober with an inker |
| 96 | HX-2000 | Neslab | 75 KW Recirculating Chiller |
| 97 | IDSCOPE | GL Automation | Wafer bar code reader |
| 98 | IDSCOPE | GL Automation | Wafer bar code reader |
| 99 | IDSCOPE | GL Automation | Wafer bar code reader |
| 100 | IDSCOPE | GL Automation | Wafer bar code reader |
| 101 | IDSCOPE | GL Automation | Wafer bar code reader |
| 102 | ILS 700P | Innolas | Laser Edge Isolation |
| 103 | Infinity SACS 251216-120-CE | Seminet | Semi-Automatic Carousel Boxed Reticle Stocker |
| 104 | INR-341-59A | SMC | DUAL CHILLER |
| 105 | INR-341-61A | SMC | Triple Loop Chiller |
| 106 | iQDP40 | Edwards | Dry Mechanical Pump |
| 107 | iQDP80 / QMB1200 | Edwards | Dry Vacuum Pump combo |
| 108 | iQDP80 / QMB1200 | Edwards | Dry Vacuum Pump combo |
| 109 | iQDP80 / QMB1200 | Edwards | Dry Vacuum Pump combo |
| 110 | J750E-100 | TERADYNE | Test System |
| 111 | J971SP (Spares) | Teradyne | Boards from VLSI test system |
| 112 | J994 | Teradyne | Memory Tester |
| 113 | JWS7500E w/Noran EDX | Jeol | Wafer Inspection System (SEM) |
| 114 | K465 with Reactor upgrade K465i 2-6″ | VEECO | GaN Epitaxy |
| 115 | KPK 200 Type 3423/16 | Feutron | Climate Chamber |
| 116 | KY8030II | Kohyoung | AOI & SPI |
| 117 | KY8030II-L | Kohyoung | AOI & SPI |
| 118 | Liquitrack 776200 | PMS | Non volatile residual Monitor |
| 119 | MA 25 | Karl Suss | Mask Holder |
| 120 | MA 45 | Karl Suss | Mask Aligner |
| 121 | Maverick 2 GT, base | NexTest | Tester |
| 122 | MB2 730 HT HT | TEL TOKYO ELECTRON | CVD SYSTEM, 2 CHAMBER WSi Process |
| 123 | MB2 730HT | TEL TOKYO ELECTRON | CVD SYSTEM, 3 CHAMBER WSi Process |
| 124 | MCR3200C‐ 400‐AM‐ 10358 | Jel | Cleanroom Handling Robot |
| 125 | MHF300L | Accretech TSK | Test head manipulators |
| 126 | MHF300L | Accretech TSK | Test head manipulators |
| 127 | MHF300L | Accretech TSK | Test head manipulators |
| 128 | MHF300L | Accretech TSK | Test head manipulators |
| 129 | MHF300L | Accretech TSK | Test head manipulators |
| 130 | MHF300L | Accretech TSK | Test head manipulators |
| 131 | MHF300L | Accretech TSK | Test head manipulators |
| 132 | Mirra 3400 Standalone | Applied Materials | CMP Wafer Polisher |
| 133 | Mirra Mesa | Applied Materials | CMP System |
| 134 | Mirra Mesa Integrated | Applied Materials | Oxide/STI CMP |
| 135 | MPA-600 Super | Canon | Mirror Projection Mask Aligner |
| 136 | MSX1000 | SVS | Auto Develop |
| 137 | MT 32 SX | ST Automation | Fully Automated Memory Test System for BIST and NAND Memories |
| 138 | MT32 | ST Automation | Flash Memory Test System |
| 139 | MTM 32 V01 | Sytrama | ST Test Head Manipulator QT 124 |
| 140 | MTM 32 V01 | Sytrama | ST Test Head Manipulator QT 124 |
| 141 | MWE Plus | Microcontrol | UV Wafer Eraser with cassette loading |
| 142 | N8241A, ATO‐S4744, 008 062 | Agilent | Arbitrary Waveform Generator |
| 143 | N8241A, ATO‐S4744, 008 062 | Agilent | Arbitrary Waveform Generator |
| 144 | NE-950EX V | Ulvac | Plasma Etching System |
| 145 | Neptune 635-850-00 | TERADYNE | Validation Tester |
| 146 | Neptune 635-850-10 | TERADYNE | Validation Tester |
| 147 | Novaline K2005 | LAMBDA PHYSIK | EXCIMER LASER |
| 148 | NSC | NTS Co., Ltd | NSC-20280 |
| 149 | NSC-4028 | NTS Co., Ltd | CMP Equipment 6″ |
| 150 | Omega | SPTS | ICP etcher |
| 151 | OMEGA 4″ | SPTS | ICP Etcher |
| 152 | Opal 7830i Enhanced | Applied Materials | CD-SEM |
| 153 | P5000 | Applied Materials | CVD System, 2 Chamber TEOS Oxide CVD |
| 154 | P8 | TEL TOKYO ELECTRON | Wafer Prober |
| 155 | Personal Kalos I | Credence | Test system |
| 156 | PH10 Adjustment system | Digital Analysis | PH Adjustment system |
| 157 | PLA501 | Canon | Contact and Prossimity Mask Aligner |
| 158 | Producer GT Celera | Applied Materials | PECVD |
| 159 | Producer SE BD/BLOk Low k Dielectric | Applied Materials | PECVD |
| 160 | PTM1 | ST Automation | Flash Memory Tester |
| 161 | Puma 9120 | KLA-Tencor | Darkfield Inspection |
| 162 | Purion H2 | Axcelis | High Current Implanter |
| 163 | PWB | Salon Teknopaja OY | Printed Wire Board Level Drop Tester with Solder Joint Reliability tester |
| 164 | Q2 WHD A | Jonas and Redmann | Loader for Centrotherm E2000 furnace |
| 165 | QDP80 | Edwards | Dry Vacuum Pump |
| 166 | QDP80 + QMB 250F | Edwards | Dry Vacuum Pump combo |
| 167 | QDP80 + QMB 250F | Edwards | Dry Vacuum Pump combo |
| 168 | QT200 | ST Automation | Automated Tester System with monitor |
| 169 | QT200 | ST Automation | Automated Tester System with monitor |
| 170 | QT200 | ST Automation | Automated Tester System with monitor |
| 171 | QT200 | ST Automation | Automated Tester System with monitor |
| 172 | QT200 | ST Automation | Automated Tester System with monitor |
| 173 | QT200 | ST Automation | Automated Tester System with monitor |
| 174 | QT200 | ST Automation | Automated Tester System with monitor |
| 175 | QT200 | ST Automation | Automated Tester System with monitor |
| 176 | QT200 | ST Automation | Automated Tester System with monitor |
| 177 | QT200 | ST Automation | Test System |
| 178 | QT200 | ST Automation | Tester System with monitor |
| 179 | QT200 (spares) | ST Automation | boards from qt 200 test system – see attached list |
| 180 | R.S.V. | ST Automation | ST Memory Test System Electronic Automation |
| 181 | Raider ECD | Semitool | Wet Bench |
| 182 | Reflexion LK Prime Oxide | Applied Materials | Dielectric CMP |
| 183 | RSPX-EUV-036 | Entegris | EUV Reticle stocker |
| 184 | S450 | Keithley | Test System |
| 185 | S-9300 | HITACHI | SEM – CD (CRITICAL DIMENSION) |
| 186 | S-9300 | HITACHI | SEM – CD (CRITICAL DIMENSION) |
| 187 | SCR32000CS‐ 450‐PM | Jel | Cleanroom Handling Robot |
| 188 | Screen Printer 2 | Baccini | screen printer |
| 189 | Screen Printer 3 | Baccini | screen printer |
| 190 | SFX100 | KLA-Tencor | Thickness Measurement System |
| 191 | SiNA Plus | Roth & Rau | PECVD – Deposition of Silicon Nitride |
| 192 | Spare Parts | Agilent/HP, GenRad, Teradyne | More than 100 Spare Parts |
| 193 | Spartan EFEM | Asyst | Wafer sorter |
| 194 | SpectraFX 200 | KLA-Tencor | Film Thickness Measurement System |
| 195 | ST-240 | Semitool | Spin Rinse Dryer |
| 196 | ST-921R-AA | Semitool | Spin Rinse Dryer |
| 197 | STP 1000C | SEIKO SEIKI | TURBO PUMP TMP 100C 250 ISO-K/KF40 |
| 198 | STPiXA2205C PN: YT63‐1Z‐040 | Edwards | Turbomolecular Vacuum Pump |
| 199 | STPiXA2205C PN: YT63‐1Z‐040 | Edwards | Turbomolecular Vacuum Pump |
| 200 | STPiXA2205C PN:YT63‐1Z‐000 | Edwards | Turbomolecular Vacuum Pump |
| 201 | STPiXA2205C PN:YT63‐1Z‐000 | Edwards | Turbomolecular Vacuum Pump |
| 202 | STPiXA2205C PN:YT63‐1Z‐000 | Edwards | Turbomolecular Vacuum Pump |
| 203 | Stringer TT 1800 w/ Confirmware Cell loader | Team Technik | Stringer |
| 204 | SU1510 | Hitachi | SEM |
| 205 | Suprema | Mattson | PR Stripper |
| 206 | Surfscan SP2 | KLA-Tencor | Particle Measurement |
| 207 | SX3100 | SYNAX | Handler |
| 208 | SX3100 | SYNAX | Handler Ambient/Hot |
| 209 | System 16 | MDA Scientific | Toxic Gas Monitor |
| 210 | T5335P (Spares) | Advantest | Spare Boards from test system (See attached list for details) |
| 211 | T5371 | Advantest | Test system (With a single test head ) |
| 212 | T600 TU5 | ANGELANTONI | Large Clean-room Oven with internal blowers |
| 213 | T600 TUS | Angelantoni | Large Clean-room Oven with internal blowers |
| 214 | TCW-12000 CV | Sankei Giken | Process Module Chiller |
| 215 | TDS 544A | Tektronix | Color 4 channel digitizing oscilloscope |
| 216 | TDS694C | Tektronix | Digital 3 GHz real-time oscilloscope |
| 217 | TE 5480 | TEL TOKYO ELECTRON | Nitride Plasma Reactive Ion Etch |
| 218 | Tecnai G2 F30 | FEI Company | TEM |
| 219 | Tetra 150 | Diener | Plasma Cleaner/Asher |
| 220 | TMB 150 | Extraction Systems | Photoresist Contamination Monitor System / Total Amine Analyzer |
| 221 | Trikon Delta | SPTS | CVD |
| 222 | TS130 | Weiss | Thermal shock testing chamber |
| 223 | TS-130 | Weiss | Temperature Shock Test Chamber |
| 224 | Turbo-V 250 MacroTorr | Varian | Turbo Pump DN ISO 100 Type |
| 225 | Turbo-V 250 MacroTorr | Varian | Turbo Pump DN ISO 100 Type |
| 226 | TwinStep-B H3P04 | AP & S | Semi-Automatic H3PO4 2 stage Megasonic QDR |
| 227 | UG 50 E | COLUSSI | AUTOCLAVE FOR STERILIZATION |
| 228 | UH 110 | Ultron Systems | Backgrinding Film Remover |
| 229 | UNISITE 68 | DATA IO | EPROM PROGRAMMER WITH USPIN 84 |
| 230 | UR25K429 | Matheson | GaN MOCVD (6″x7) |
| 231 | V6000e | Verigy / Agilent | Test system |
| 232 | VANTEC SIGMA 200 K1 | SEKISUI | Antistatic 200 MM Wafer shipping box |
| 233 | Various | Advantest Nextest Verigy | Mini-Batch of Automated Test Equipment |
| 234 | Veeco V695 8″ | VEECO | MOVPE Thin GaN |
| 235 | VeritySEM 2 | Applied Materials | SEM – Critical Dimension (CD) Measurement |
| 236 | VIISta 3000 | Varian | High Energy Implanter |
| 237 | VT 4002 | Voetsch | Temperature Test Chamber |
| 238 | WaferSight | KLA-Tencor | WAFER FLATNESS CHECKER |
| 239 | WS-820C | DNS | WET HOOD (HF / HNO3 Process) |
| 240 | WT-2000PVN | Semilab | Measurement Machine |
| 241 | XP243E | FUJI | Pick and Place |
ID-SS5303-0-4-1-1