Description
Semiconductor Diagnostics SDI 210, 210E-SPV, FAaST, Wafer Measurement
Tool composed of the following parts:
UniSlide Rotary Table B4818TS
Newport MM3000+23556
AD Technology 3800-1745
Photon Wheel BO76
SPV Lightsource
Signal Recovery Model 197 Light Chopper
Planar PL100M
ADEK R7IFI48AB
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Astrodyne MSCA-5005
API Getty’s 230-6102FH
EG&G Instruments 7265
Texas Industrial Peripherals DT-5K-PS/2
Logic Supply Power LPS-12
Watlow 96
Danaher Motion 1122317
MG Chemicals 846-80G
Valid Time: Subject to prior sale without notice.
SS172650347022
