Description
The following Metrology equipment are only for end user. Please contact us if you have any questions. Subject to prior sale without notice. Appreciate your time!
Condition: Used
| 1 | Accretech Huricane A5000 TSK A5000 |
| 2 | Accretech Win-Win 50 1500 TSK WIN 1500 |
| 3 | Accretech Win-Win 50 1600 Bright Field Inspection |
| 4 | ADE Episcan 1000 Epi Thickness Measurement System |
| 5 | Alcatel ASM 180 TD Helium Leak Detector |
| 6 | AMAT DFinder2 Defect Inspection |
| 7 | AMAT EBEAM eBeam Inspection |
| 8 | AMAT Elite MS MC AMAT ELITE M5 MC |
| 9 | AMAT NanoSEM 3D CD Metrology |
| 10 | AMAT NanoSEM 3D CD-SEM |
| 11 | AMAT NanoSEM 3D Scanning Electron, CDSEM Measurement |
| 12 | AMAT SEMVision CX Defect Review |
| 13 | AMAT UVision 200 Bright-Field Inspection |
| 14 | AMAT UVision 5 BFIUV5_Brightfield_AMAT |
| 15 | AMAT UVision 5 Brightfield inspection |
| 16 | AMAT Verity Metrology |
| 17 | Ametek/Cameca LEXFAB300 CAMECA LEXFAB300 uncond. Eval. |
| 18 | ANASYSTA SLURRY METROLOGY SYSTEM Optical Particle Sizer |
| 19 | Bruker D8 DISCOVER X-Ray Metrology |
| 20 | Bruker D8FABLINE X-ray |
| 21 | Bruker Insight 3D Mask House Photomask Inspection |
| 22 | Camtex X- ACT TEM Sample Preparation System |
| 23 | Carl Zeiss AIMS 32-193i Phtotomask Repair System |
| 24 | Carl Zeiss Axiospect 300 surface optical microscope |
| 25 | Carl Zeiss Axiospect 300 Wafer inspection microscope |
| 26 | Carl Zeiss Axiotron-2 Inspection Microscope |
| 27 | Carl Zeiss Axiotron-2 Microscope |
| 28 | Carl Zeiss LEA1530 SEM |
| 29 | Carl Zeiss MeRit HR32 Plus Mask Repair System |
| 30 | Estion / Benchmark TECHNOLOGIES E-RETICLE V 4M Electrostatic Charge Measurement |
| 31 | FEI CLM 3D TEM Preparation Tool |
| 32 | FEI CLM TEM Preparation Tool |
| 33 | FEI DA300 FIB -Focused Ion Beam Defect Analysis |
| 34 | FEI FIB200 |
| 35 | FEI Plucker TEM Prep tool |
| 36 | FEI TEMLINK – KY02 Ex-Situ Plucker, TEM Prep Tool |
| 37 | FEI TEMLINK 14771-003 TEM sample Pluck |
| 38 | FEI V600 Single Beam FIB. |
| 39 | FSM FSM128LC2C Film Stress Measurement |
| 40 | GEMETEC Elymat III WSPS |
| 41 | Hermes Microvision eP4 CFM_EBeam Inspection HMI |
| 42 | Hermes Microvision eScan320 ebeam Inspection |
| 43 | Hermes Microvision eScan500 ebeam Inspection |
| 44 | Hitachi AS5000 Wafer Particle & Defect Analysis System AS-5000 |
| 45 | Hitachi HD2300 STEM |
| 46 | Hitachi HF-2000 EDX/EELs/STEM imaging |
| 47 | Hitachi IS2700 Dark Field inspection |
| 48 | Hitachi Microanalysis EX-250/350/450 |
| 49 | Hitachi RS4000 DR SEM |
| 50 | Hitachi RS5000 Defect Review SEM |
| 51 | Hitachi S-4800 FE SEM |
| 52 | Hitachi S-5200 FE SEM |
| 53 | Hitachi S-5200 SEM, Ultra High Resolution |
| 54 | Hitachi S-9380 CDSEM |
| 55 | Hitachi S-9380II CD SEM |
| 56 | Hitachi Z-5700 |
| 57 | Horiba PR-PD2 Reticle/Mask Particle Detection System |
| 58 | HSEB AXIOSPECT 301 Optical Microscope |
| 59 | JEOL ARM200CF Super X PFA |
| 60 | JEOL JEM-2500SE Microscopes |
| 61 | JEOL JEM-2500SE TEM |
| 62 | JEOL JEM3200FS TEM |
| 63 | JEOL JWS-7515 SEM Wafer Inspection Tool |
| 64 | JEOL JWS-7555 SEM Wafer Inspection Tool |
| 65 | Jordan Valley JVX6200i TFM_THK_JV |
| 66 | Jordan Valley JVX7300 Film Thickness Measurement |
| 67 | KLA 3905 Broadband Plasma Patterned Wafer Inspection |
| 68 | KLA AIT Fusion Dark Field inspection |
| 69 | KLA Aleris CX Thickness measurement |
| 70 | KLA Aleris HX8500 Thickness measurement |
| 71 | KLA Archer 300 AIM Overlay |
| 72 | KLA ASET-F5x Thickness measurement |
| 73 | KLA CRS1010 Review Station |
| 74 | KLA DP2 Data Prep Station |
| 75 | KLA EDR5210 Defect Review SEM |
| 76 | KLA EDR5210 DRSEM |
| 77 | KLA eS31 E-beam Inspection |
| 78 | KLA eS32 E-beam Inspection |
| 79 | KLA FX200 Thickness measurement |
| 80 | KLA HRP-340 Profiler |
| 81 | KLA INM100+INS10 Marco inspection |
| 82 | KLA KLA2371 Bright Defect inspection |
| 83 | KLA KLA5100 Overlay |
| 84 | KLA P11 Surface Profilometer |
| 85 | KLA Polylite 88 METALLURGICAL SCOPE |
| 86 | KLA Puma 9000 Dark Field Inspection |
| 87 | KLA Puma 9130 Dark Field Inspection |
| 88 | KLA RS-50 Resitivity Profiler, RS50/e |
| 89 | KLA SLF576 Reticle inspection system |
| 90 | KLA SP1 DLS Particle counter |
| 91 | KLA Viper 2435 MACRO INSPECTION |
| 92 | KLA Viper 2438 Macro Defect Detection System |
| 93 | Kokusai VR-120SD Resistivity Measurement |
| 94 | LASERTEC BI100 EUV Reticle Back Side Inspection Tool |
| 95 | LASERTEC PEGSIS P100 Reticle Inspection Tool |
| 96 | M&W Products IPRO 7 Humidifier Module |
| 97 | Matsushita Seiki M515 Pellicle Mount Photomask Pellicle Mounting |
| 98 | Matsushita Seiki M515-III Photomask Pellicle Automounter |
| 99 | Matsushita Seiki M777 Pellicle Demount Automated Pellicle Demounter |
| 100 | Matsushita Seiki M777 Pellicle Demounter |
| 101 | Met One 3313 Portable cleanroom particle counter |
| 102 | METRON Extraction,Amine |
| 103 | Nanometrics Atlas Thickness measurement |
| 104 | Nanometrics Caliper Elan ACCENT CALIPER ELAN [OVERLAY MEASUREMEN |
| 105 | Nanometrics Caliper Elan Overlay Measurement |
| 106 | Nanometrics Caliper Mosaic Overlay |
| 107 | Nanometrics Caliper Q300 Overlay Inspection |
| 108 | Nanometrics NanoSpec 210 Thickness measurement |
| 109 | Nanometrics Q200I Overlay |
| 110 | Negevtech NT3100 Bright Field Inspection |
| 111 | Nicolet ECO1000 Film Thickness Gauge |
| 112 | Nikon mWL 300s for VMZ-R6555 Recon |
| 113 | Nikon OCDM 300MM Recon |
| 114 | Nikon Optistation 3000 RDL |
| 115 | Olympus metalurgical microscope Metallurgical Microscope |
| 116 | Phoenix micromex 160 2-D x-ray system |
| 117 | Phoenix Micromex SE 160T PHOENIX MICROMEX SE 160T |
| 118 | PMS Lasair 110 Maintenance Tool |
| 119 | Quantum Unknown Laser Scan Microscope |
| 120 | Raytex RXW-1226SFI |
| 121 | Rigaku 3272 |
| 122 | Rigaku SYS3620 Parts Tool |
| 123 | Rigaku SYS3630 X-ray, composition and thickness measurements |
| 124 | Rigaku TXRF3750 TXRF |
| 125 | RION KS-40AF Particle Measurement |
| 126 | RORZE B2-BL-R Wafer Sorter |
| 127 | RORZE RSR160 Reticle Handler |
| 128 | Rudolph 3Di8500 Wafer Inspection |
| 129 | Rudolph Axi-S Macro inspection |
| 130 | Rudolph NSX105 Backend, AUTO DEFECT INSPECTION SYSTEM |
| 131 | Rudolph NSX105 Macro Inspection |
| 132 | Rudolph NSX105C Macro Inspection |
| 133 | Rudolph NSX115 Macro inspection |
| 134 | Rudolph NSX115 Pre-Assy |
| 135 | Rudolph NSX115 RDL |
| 136 | Rudolph S300 Macro Defect inspection |
| 137 | Rudolph S3000S Xray thickness measurement |
| 138 | Rudolph S3000sx |
| 139 | Rudolph WV320 Macro Defect inspection |
| 140 | Rudolph WV320 Macro inspection |
| 141 | Scientech RVX5000 XPS |
| 142 | SDI SPVCMS4000 Surface Charge Measurement |
| 143 | Seiko Instrument Inc. XV 300DB Particle Measurement |
| 144 | Semilab ellipsometry Ellipsometric Porosimeter |
| 145 | Semilab IR3100s Dielectric characterization |
| 146 | SOLVISION PRECIS 3D Defect Inspection |
| 147 | SOLVISION PRECIS 3D SOLVISION PRECIS 3D |
| 148 | SOPRA EP12 Optical Dielectric Porosity Measurement System (300mm) |
| 149 | Toray HS-830 Gen 4 FPD particle counter |
| 150 | Veeco Dimension X1D ATOMIC FORCE MICROSCOPE (AFM) |
| 151 | Veeco Dimension X3D ATOMIC FORCE MICROSCOPE (AFM) |
| 152 | Veeco DUVx210 AFM |
| 153 | Veeco NT9800 RDL |
| 154 | Veeco V220SI Surface Profile Measurement |
| 155 | VLSI Standard PDS-100 Particle Deposition System |
ID-SS5684W
