Description
Semiconductor Equipment Spare Parts
Valid: These are only for end users. Subject to prior sale without notice. Appreciate your time!
The trademarks of the equipment and parts contained in this website belonged to the Original Equipment Manufacturers.
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Nikon Metrology/Metris K-SCAN PROBE, S/N KSP-1284 W/ METRIS MODEL MAKER D200
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Jipelec Jetfirst 150 , Rapid Thermal Annealing System with Workstation
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Automatic Pick and Place Machine QM2100
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Tabai HROV82-315-PSLATCH Temp/Hum Chamber w/PS & Driver Rack
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Kulicke & Soffa iBOND5000B Manual Wire Bonder Ball Bond Model, Nikon SMZ660
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Kulicke & Soffa K&S K & S Wafer Dicing Saw System Model 7100AD
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BROOKS AUTOMATION RELIANCE ATR ROBOT & CONTROLLER SET P/N 017-0266-01
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Signatone 8″ Probe Station Prober Cascade Microtech RF RPP Probe
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THE MICROMANIPULATOR 6″ WAFER MANUAL PROBER STATION W/LASER,
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Mask Aligner MIDAS MDA-400M/midas/aligner semiconductor
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Veeco Wyko NT1100 Optical Profiling System Microscope w Illuminator Control Unit
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Tencor 148750 Alpha-Step 300 Profiler, AS-300
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MICRO CLEAVING SYSTEM MC 200
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PVD SYSTEM 6 CHAMBERS DP2000
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FTA 4100 Drop Shape Analyzer Surface Tension Contact Angle Interfacial Tension
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TEL P-12XL (Not including VIP3 board)
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ADVANTEST T5371 TESTER
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TECHNICS MIM-TLA20 Ion Miller w/ CTI CRYO-TORR 8 Pump
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Rudolph FE-IIID Ellipsometer
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Bürkle Type BKL Flim Coating System, Rolling Machine, AE 1376 500, 012995-0010
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SONIX QUANTUM 350 Scanning Acoustic Microscopes
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NORDSON March XTRAK – IFP / Plasma Treatment System Cleaning
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Adixen ASM1002 Leak detector
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CAMMAX PRECIMA DB600 DIE BONDER & PHOTONIC PL3000 FIBER OPTIC
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E+H Metrology MX 152 Wafer Thickness Measurement System Siemens PC Win 7 OS
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Thermo NORAN MXR, Microbeam X-ray Fluorescence System
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Diener Electronic Nano Plasma Cleaner
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Kulicke & Soffa 7100ad wafer dicing saw
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HD3300 DEKTAK VEECO WYKO PROFILOMETER 8″ 200mm Wafers PC/Optics/Controller
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Micromanipulator Probe System 6200 Leitz zoom m’scope. Signatone
SS380EB
