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Metrology/Characterization Equipment

Metrology/Characterization Equipment

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Please contact us if you are interested in the following Metrology/Characterization Equipment . The Metrology/Characterization Equipment are only for end users and are subject to prior sale without notice. Appreciate your time.

Equip Code Name Type
2 16 core Xeon High Perfomance Computing Electrical
4 300 MHz NMR Mazama (Solids) NMR
8 3D Atom Probe Other
10 3D optical microscope Profilometry
11 3D Optical Profiler Profilometry
12 3D Optical Profiler Optical
17 4-point Probe Electrical
19 400 MHz NMR Karloff (Solids) NMR
20 400 MHz solid state NMR NMR
21 4156c Seminconductor Analyzer No 2 Electrical
22 5-bounce XRD
23 500 MHz NMR Bastiat (Imaging) NMR
24 500 MHz NMR Shasta (Solids) NMR
25 500 MHz NMR Spectrometer with Direct Cryoprobe NMR
26 500 MHz NMR Spectrometer with Triple Resonance Cryoprobe NMR
28 600 MHz NMR Baker (Liquids) NMR
29 600 MHz NMR Hood (Metabolomics) NMR
30 600 MHz NMR Nittany (Solids) NMR
31 600 MHz NMR Spectrometer NMR
34 750 MHz NMR Rainier (Liquids) NMR
35 750 MHz Radiological NMR Bokan (Liquids, Solids) NMR
41 800 MHz NMR Denali (Liquids) NMR
42 81600B Tunable Laser Source Electrical
43 83453B High Resolution Spectrometer Optical
44 850 MHz NMR Ellis (Solids) NMR
45 86142B High Performance Optical Spectrum Analyzer Optical
71 AFM Veeco/Bruker NanoMan Profilometry
73 AFMs Thickness
75 Agilent 212-LC/500-MS Mass Spec
76 Agilent 34401A Multimeter Electrical
77 Agilent 400 MHz NMR Spectrometer NMR
78 Agilent 4294A Impedance Analyzer Electrical
79 Agilent 450-GC/212-LC/320-MS Mass Spec
80 Agilent 450-GC/240-MS Mass Spec
81 Agilent 610 FT-IR Microscope Spectroscopy
82 Agilent 6520 Q-TOF with Agilent 1100 nano-HPLC Mass Spec
83 Agilent 6520 QTOF LCMS Mass Spec
84 Agilent 6520 QTOF LCMS Mass Spec
85 Agilent 6538 Q-TOF with Agilent 1290 UHPLC Mass Spec
86 Agilent 700 Mhz NMR Spectrometer NMR
87 Agilent 710-ES ICP-OES Spectroscopy
88 Agilent 920-Liquid Chromatograpy Chromatography
89 Agilent B1500 Semiconductor Analyzer Electrical
90 Agilent B1500A Semiconductor Device Analyzer Electrical
91 Agilent Cary 6000i UV-vis-NIR Spectrophotometer Spectroscopy
92 Agilent Cary 670 FT-IR Spectrophotometer Spectroscopy
94 Agilent E3620 Electrical
95 Agilent intelliflash 310 Purification System Chromatography
96 Agilent microwave vector network analyzer Electrical
98 Agilent Technologies 54624A Oscilloscope Electrical
122 Alessi Probe Station Electrical
123 Alisse REL 4800 Electrical
126 Alpha Step 200 Profilometry
127 Alphastep Profilometry
128 Alphastep 500 Profilometer Profilometry
129 AmaZon X Ion Trap Mass Spec
130 Ambios XP2 Profilometry
138 Analytical Balance Other
147 AP-XPS/AP-STM XPS
160 ASAP 2460 Surface Area and Porosity Analyzer Other
177 Atomic Force Microscope Electrical
186 attocube MFM Profilometry
189 Auger Spectroscopy
190 Auger: PHI 700 Other
225 Bench-top crystal orientation analyzer Other
233 Biologic Potentiostat Electrical
243 Bond Tester Mechanical
247 Bowoptic Stress Measurement Mechanical
254 Bruker Autoflex Mass Spec
255 Bruker AXS General Area Detector Diffraction System Other
256 Bruker D8 Discover XRD
257 Bruker D8 Discover XRD
263 BRUKER Discovery D8 XRD
264 Bruker Duo X-Ray Diffractomer XRD
265 Bruker EDS EDS/WDS
267 Bruker FTIR/FTRaman Spectroscopy
269 Bruker maXis Impact with Dionex 3000 nano-uHPLC Mass Spec
270 Bruker micrOTOF with Agilent 1290 UHPLC Mass Spec
272 Bruker Photon 100 XRD
279 CaBER Other
281 Calorimeter Other
287 Camera XRD
294 Cary 5000UV-VIS NIR Spectroscopy
295 Cascade Micromanipulator 6000 Electrical
296 Cascade REL-4800 Manual Probe Station Electrical
299 CCI HD Optical Profiler Profilometry
300 CDE ResMap Resistivity 4-pt Probe Electrical
301 CDE ResMap-178 Electrical
303 CEI-XANES Other
315 Characterization Electronics Electrical
318 Circuit Tester Electrical
343 Contact Angle and Surface Tension Measurement System Contact Angle
344 Contact Angle Goniometer Contact Angle
345 Contact Angle Goniometer: Rame-Hart 290 Other
346 Contact Angle Measurement Contact Angle
347 Contact Angle Measurement System Contact Angle
381 CV Testing Station Electrical
382 CV-IV Electrical
391 CW X-Band (9.5 GHz) Radiological EPR Other
394 Cyro Probe Station Electrical
395 CyTOF – Mass Cytometer Mass Spec
396 Cytoviva Other
397 D-5000 XRD
399 Dage X-Ray XD7600NT Other
411 Dektak Profilometry
412 Dektak 150 Profilometry
413 Dektak 150 Profilometer Profilometry
414 Dektak 150 Profilometer — Instructional Center Profilometry
415 Dektak profilometer Profilometry
416 Dektak Profilometer Profilometry
417 Dektak Stylus Profilometer Profilometry
418 DektakXT Profilometry
435 Device probe station Electrical
442 Differential Scanning Calorimeter TGA
443 Differential Scanning Calorimeter DSC
445 Digital Instruments Nanoscope 3000 AFM Other
470 DMA: TA Instrument Q800 Other
480 DSA91304A Infiniium High Performance Oscilloscope: 13 GHz Electrical
481 DSC Other
482 DSC: TA Instrument Q100 DSC
483 DSC: TA Instrument Q2000 DSC
490 Dynisco D4003 Melt Index Tester Other
501 E8361C PNA Microwave Network Analyzer Electrical
514 ED-XRF XRF
516 EDS EDS/WDS
517 EDS on FIB EDS/WDS
518 EDS on SEM EDS/WDS
519 EDS on TEM EDS/WDS
521 Electrical Test Station Electrical
536 Electron Spectrometer: Scanning Multiprobe Surface Analysis System – Versaprobe Other
537 Electron Spectrometer: XPS with Laser Interface XPS
547 ELL1 Thickness
548 Ellipsometer Optical
549 Ellipsometer Thickness
550 Ellipsometer Thickness
551 Ellipsometer Spectroscopy
552 Ellipsometer Other
553 Ellipsometer Thickness
554 Ellipsometer Thickness
555 Ellipsometer (VASE) Thickness
556 Ellipsometer: Horiba Smart SE Other
565 Epitaxial Thin Film XRD XRD
577 Everbeing 4-point Probe Station-Manual Electrical
578 Everbeing EB-6 DC Probe Station Electrical
625 Filmetrics Optical
626 Filmetrics Profilometry
627 Filmetrics Thickness
628 FilMetrics F20 Other
629 Filmetrics F20 Thickness
630 Filmetrics F20 (2) Thickness
631 FilMetrics F40 Other
632 Filmetrics F40 Optical
633 Filmetrics F50 Optical
634 FilMetrics F50-EXR Other
635 Filmetrics spectrophotometer Optical
636 Filmetrics spectrophotometer Optical
641 Flash Solar Cell Tester Electrical
643 Flexus 2320 Other
644 FleXus Film Stress Measurement Other
649 Fluorimeter Other
650 Fluorimeter Spectroscopy
651 FLX-2320-S Thin Film Stress Measurement Mechanical
661 Four Point Probe Electrical
662 Four Point Probe Electrical
663 Four point probe Electrical
664 Four point probe Electrical
665 Free Fall Shock Machine Other
667 FT-IR Spectroscopy
668 FTIR Microscope Other
669 FTIR Spectrometer Other
684 Gaertner L116C ellipsometer Optical
685 Gaertner LSE-WS Ellipsometer Thickness
687 Gas Chromatographer Chromatography
688 Gas Chromatographer Chromatography
689 Gas sorption: Quantachrome Autosorb iQ3 Other
694 GC-MS Agilent Chromatography
695 GC-TOF MS Mass Spec
698 GDOES Other
721 Hall Effect Measurement System Electrical
730 HAST Chamber Other
754 Hewlet Packard High performance liquid chromatograph (HPLC) Chromatography
758 High Field W-Band (95 GHz) EPR Other
759 High Resolution EELS Other
760 High Resolution Microprobe XPS XPS
761 High Resolution, Ultrafast SFG Vibrational Spectroscopy Other
762 High Speed Optical Signal Testing Optical
790 Horiba UVISEL 2 Spectroscopic Ellipsometer Other
792 Horiba XploRA ONE Raman Confocal Microscope Spectroscopy
798 HPLC System Other
799 HT-GPC: Tosho High-temperature EcoSEC with MALS: Wyatt Dawn Heleos Other
800 Huber 2-circle Cu XRD
801 Huber 2-circle XSW Mo XRD
802 Huber 4-circle XRD
811 Hysitron TI 950 TriboIndenter Mechanical
812 Hysitron TI950 Triboindenter Mechanical
813 Hysitron TriboIndenter Mechanical
814 Hysitron TriboIndenter Mechanical
825 ICP-MS (Quadrupole) Mass Spec
827 ID Quantique ID220 Single Photon Detector (one pair) Optical
831 Imaging Ellipsometer Accurion EP3 Thickness
835 Infrared Spectrometer Infinity Gold FTIR Spectroscopy
838 Instron 3384 Materials Test Frame Mechanical
839 Instron 5569 Mechnical Tester Other
840 Instron 5900R Material Test Frame Mechanical
841 Instron 8802 Dynamic Test Frame Mechanical
842 Instron 9250G Impact Test Frame Mechanical
843 Instron E10000 Fatigue Test Equipment Other
844 Instron Impact Tester 8250 Other
845 Interferometer Profilometry
851 inVia Raman/PL Microscope Spectroscopy
854 Ion Chromatograph Chromatography
862 ION-TOF Mass Spec
863 IONTOF Time-of-Flight SIMS SIMS
864 IPCE Other
869 J.A. Woollam M-2000D Spectroscopic Ellipsometer Thickness
870 J.A. Woollam M-2000D Spectroscopic Ellipsometer Optical
871 J.A. Woollam M2000 Spectroscopic Ellipsometer Thickness
872 J.A. Woollam V VASE Spectroscopic Ellipsometer Optical
873 Jandel 4-point probe Electrical
874 Jandel 4-point probe RM3000 Electrical
875 Jandel Four Point Probe with RM3000 Test Unit Electrical
876 Jasco UV/Vis/IR Spectrometer Spectroscopy
901 JXA-8530F Electron Probe Microanalyzer (EPMA) Spectroscopy
920 Karl Suss probe Electrical
926 Keithley 2400 Electrical
927 Keithley SCS Electrical
929 Keyence Optical
934 Kiethley 2400 Digital Source Meter Electrical
935 Kiethley 2602A Dual Channel Source Meter Electrical
936 Kinetic Laser Other
938 KLA 2D Profilometer (MET-01) Profilometry
939 KLA 3D Profilometer (MET-02) Profilometry
940 KLA Tencor Surfscan 6100 Optical
941 KLA-Tencor P-10 Profilometer Profilometry
942 KLA-Tencor P-16 Stylus Profilometer Profilometry
943 KLA-Tencor P-7 Surface Profilometer Profilometry
947 Kratos XPS
948 Kratos XPS XPS
954 Labram HR Evolution Raman Spectrometer Spectroscopy
956 Lakeshore 1.5K Probe Station Electrical
978 LC-TOF MS Mass Spec
980 LED Measurement System and Integrating Sphere Optical
986 Leitz MVP-SP Interferometer Other
1010 Liquid Chromatograph Chromatography
1022 Low Temperature Photoelectron Spectroscopy Spectroscopy
1038 Lucas Labs 4PP Electrical
1041 MALDI-TOF MS Mass Spec
1044 Malvern Zetasizer Other
1049 Manual Probe Station Electrical
1063 Mass Spectrometer Spectroscopy
1064 Mass Spectrometer: 21T FTICR Mass Spec
1065 Mass Spectrometer: Aerosol, time-of-flight, high resolution Mass Spec
1066 Mass Spectrometer: FT-ICR, 6T (Ion Surface Collisions) Mass Spec
1067 Mass Spectrometer: Inductively Coupled Plasma (ICP-MS), High Resolution (Element XR) Mass Spec
1068 Mass Spectrometer: Inductively Coupled Plasma (ICP-MS), Multi-Collector (Neptune Plus) Mass Spec
1069 Mass Spectrometer: Inductively Coupled Plasma (ICP-MS), Ultra-High Resolution Mass Spec
1070 Mass Spectrometer: Ion Mobility Spectrometry, Time of Flight Mass Spec
1071 Mass Spectrometer: Linear Ion Trap Quadrupole (LTQ) Orbitrap MS – for environmental research (nanoDESI) Mass Spec
1072 Mass Spectrometer: Orbitrap Mass Spec
1073 Mass Spectrometer: Proton Transfer Reaction (PTRMS) Mass Spec
1074 Mass Spectrometer: Single Particle (SPLAT II) Mass Spec
1075 Mass Spectrometer: Time of Flight Secondary Ion (ToF SIMS) – 1997 Mass Spec
1080 Mechanical Testing, Instron 5565 Other
1090 Metricon Other
1091 Metricon Refractometry System Thickness
1092 Mettler Thermogravimetric Analyzer TGA
1094 Micro-hardness Tester Other
1095 Micro-Raman spectrometer Spectroscopy
1096 Micro-Raman Spectrometer Alpha 300 Spectroscopy
1098 Microbeam XRD XRD
1104 Microfluidics Workstation – Valves Controller Other
1128 Microspectrophotometer Spectroscopy
1136 Millimeter-Wave Test-Bed Other
1152 Molecular Beam Kinetics Other
1156 MOS CV Analysis Electrical
1159 MPMS Squid Other
1168 MSA1 Other
1178 Multipurpose XRD XRD
1180 N4373C 67 GHz Lightwave Component Analyzer Electrical
1181 N4906B Serial BERT Electrical
1182 N9010A EXA Signal Analyzer, 26 GHz Electrical
1186 Nano-SIMS Mass Spec
1188 NANO1 Thickness
1194 Nanoindenter Mechanical
1195 Nanomanipulator: SEM accessory Other
1196 Nanometrics Thickness
1197 Nanometrics Thickness
1198 Nanometrics Nanospec Thin Film Thickness System #2 Thickness
1206 Nanospec Thickness
1207 Nanospec 3000 Optical
1208 Nanospec Film Thickness Measurement System Thickness
1209 Nanospec Reflectometer – Inorganic Thickness
1210 Nanospec Reflectometer – Pettit Thickness
1212 NEC Mini-Tandem 5.1 MeV Ion Accelerator Other
1217 Netzsch STA Chromatography
1218 NewView 7300 3D Optical Surface Profiler Optical
1227 Nikon LV150 Optical
1228 Nikon Microscope Optical
1255 OPT1 Spectroscopy
1256 OPT2 Spectroscopy
1257 OPT3 Spectroscopy
1258 Optical Measuring System Optical
1263 Optical profilometer Optical
1264 Optical Profilometer Profilometry
1265 Optical Profilometer Profilometry
1298 P-7 Profilometer Profilometry
1299 P10 Profilometer Profilometry
1300 P15 Profilometry
1303 PANalytical Empyrean XRD
1304 Panalytical Empyrean XRD
1305 PANalytical Empyrean Linear Detector and Non-ambient Environment XRD
1306 PANalytical MRD XRD
1307 Panalytical X’Pert PRO MRD XRD XRD
1308 Panalytical XPert PRO Alpha-1 XRD XRD
1331 Peel Tester Mechanical
1332 Perkin Elmer DMA 8000 Dynamic Mechanical Analyzer Mechanical
1333 Perkin Elmer DSC 6000 Differential Scanning Calorimeter DSC
1334 Perkin Elmer Lambda 18 UV vis spectrometer Spectroscopy
1335 PerkinElmer Spectrum Other
1336 PESA: Riken AC-2 Photoelectron Spectrometer Other
1340 Philips Vertical Scanning Diffractometer XRD
1341 Philips X'Expert XRD XRD
1342 Philips XPERT Theta-Theta Diffractometer XRD
1362 Photovoltatic test system Electrical
1363 Physical Properties Measurement System (PPMS) Other
1366 PicoHarp 300 PicoQuant Time-Correlated Single Photon Counting (TCSPC) system Optical
1367 Picosecond SFG Other
1371 Plas-Mos Ellipsometer Thickness
1426 Potentiostat Electrical
1427 Potentiostat Electrical
1428 Potentiostat Electrical
1429 Potentiostat Electrical
1430 Potentiostat Electrical
1431 Powder X-Ray Diffractomer XRD
1432 Powder XRD XRD
1436 Princeton Instruments Tri-Vista spectrometer with SI and InGaAs array detectors Spectroscopy
1437 Princeton VeraSTAT4 Potentiostat/Galvanostat Other
1438 Probe Station Electrical
1439 Probe Station Electrical
1440 probe station Electrical
1441 Probe Station Electrical
1442 Probe station and Electronics Rack Electrical
1443 Probe Station I: I-V & C-V Testing Electrical
1444 PROBE2 Electrical
1445 PROF2 Profilometry
1446 Profilometer Profilometry
1447 Profilometer Profilometry
1448 Profilometer: Bruker Dektak 150 Profilometry
1449 Prometrix Resistivity Mapping System Electrical
1458 Pulsed/CW X-Band (9.5 GHz) EPR Other
1465 Q600 TGA/DSC TGA
1473 Quantum Design PPMS 9 T Other
1474 Quantum Design PPMS 9 Tesla with EverCool-II Other
1475 Quantum Design S-VSM Magnetic Particle Measuring System Electrical
1476 Quantum Designs MPMS 7 Tesla with EverCool-II Other
1477 Quantum Efficiency measurement tool Optical
1478 Quartz Crystal Microbalance with Dissapation (QCM-D) Other
1482 R Stand Electrical
1485 Radiological Powder XRD XRD
1495 Raman Microscope Spectroscopy
1496 Rame Hart 260-F4 Goniometer/Tensiometer Contact Angle
1522 Reflectance mapping system Thickness
1523 Reflectometer Thickness
1525 Renishaw inVia confocal Raman microscope Spectroscopy
1538 Rheometer: TA Instrument ARES-G2 Other
1545 Rigaku ATXG XRD
1546 Rigaku D / Max -B XRD
1547 Rigaku Dmax XRD
1548 Rigaku Gemini A Single Crystal Diffractometer XRD
1549 Rigaku Laue/Precession XRD
1550 Rigaku Multiflex XRD
1551 Rigaku SmartLab XRD
1552 Rigaku Smartlab XRD
1553 Rigaku SmartLab X-Ray Diffractometer XRD
1554 Rigaku Smax3000 XRD
1555 Rigaku Ultima IV XRD
1556 Rigaku Ultima IV XRD
1557 Rikagu XRD
1559 Rotating Disc Electrode Other
1565 Rudolph Auto EL Ellipsometer Thickness
1566 Rudolph Auto Ellipsometer VIS/NIR Optical
1567 Rudolph EL4 Ellipsometer Thickness
1568 S-Probe XPS
1581 SAXS1 Other
1582 SAXS2 Other
1587 Scanning Auger Electron Microprobe Other
1588 Scanning confocal Raman spectrometer with atomic force microscope / near-field scanning optical microscope Spectroscopy
1594 Scanning Ellipsometer Thickness
1599 Scanning Tunneling Microscope Profilometry
1603 Sciex Qtrap 6500 Mass Spec
1604 Scintag X1 Theta-Theta Diffractometer XRD
1605 Scintag XDS2000 XRD
1632 Semi-Automatic Probe Station Other
1635 Semiconductor Characterization System Electrical
1636 Semiconductor Parameter Analyzer #1-#2 Electrical
1637 SemiTest SCA-2500 Surface Charge Analyzer Other
1639 Semprex Spectrometer — Instructional Center Spectroscopy
1640 Sensofar S-neox, non contact 3D optical profiling Profilometry
1648 Shielded Antenna Chamber Other
1649 Shimadzu Prominence HPLC Chromatography
1650 Shimadzu Prominence HPLC Chromatography
1651 Siemens Magnetom Trio MRI 3T Scanner Other
1652 Signatone Four-point Probe Electrical
1653 Signatone Probe Station Electrical
1654 Signatone Probe Station Electrical
1658 SIMS SIMS
1659 SIMS: Cameca IMS 7f GEO SIMS
1660 SIMS: Cameca NanoSIMS 50l SIMS
1661 Simultaneous Thermal Analyzers TGA
1664 Sinton Lifetime Tester Optical
1666 Small Angle X-Ray Scattering (SAXS) XRD
1669 Solar Cell Testing Glovebox Electrical
1670 Solar Simulator Other
1671 Solar Simulator Other
1690 Spectrometer: Mossbauer Spectroscopy
1691 Spectrophotometer Spectroscopy
1692 Spectroscopic Ellipsometer Thickness
1693 Spectroscopic Ellipsometer Thickness
1694 Spectroscopy: Agilent Cary 6000i UV/Vis/NIR Spectroscopy
1695 Spectroscopy: Horiba FluoroLog Fluorimeter Other
1697 Spectroscopy: Nicolet iS50 FT/IR Spectrometer Spectroscopy
1741 SQUID Magnetometer Electrical
1744 SRI Gas Chromatographer Chromatography
1754 Stopped-Flow Absorbance/Fluorescence Spectrometer Spectroscopy
1774 stylus profilometer Profilometry
1775 Stylus Profilometer Profilometry
1776 Stylus Profilometer Profilometry
1784 Sum Frequency Generation for Surface Vibrational Spectroscopy Spectroscopy
1785 Surface particle Measurement Other
1788 Suss Backside Alignment Measurement Other
1804 TA Q200 DSC Differential Scanning Calorimeter DSC
1805 TA Q500 TGA Thermogravimetric Analyzer TGA
1806 Tandem Accelerator Other
1810 Tau Science Flash QE Spectroscopy
1830 Temp/Humidity Chamber Other
1836 Tencor P15 Profilometer Profilometry
1837 Tencor P15 Profilometer (left) Profilometry
1838 Tencor P15 Profilometer (right) Profilometry
1839 Tencor P2 Profilometer Profilometry
1840 Tencor profilometer Profilometry
1849 TGA/DTA Other
1850 TGA: TA Instrument Q500 TGA
1851 Thermal Analysis Equipment Other
1859 Thermal Shock Chamber Other
1867 Thermo K-Alpha XPS XPS
1869 Thermo Nicolet Almega XR Dispersive Raman Spectrometer Spectroscopy
1872 Thermo UV-VIS Spectrometer Spectroscopy
1874 Thermogravimetric Analyzer TGA
1875 Thermogravimetry analysis system TGA
1877 Thermtest TPS2500S Thermal Conductivity Instrument Other
1878 Thin Film Measurement System Thickness
1879 Thin Film Measurement System Profilometry
1881 Thin Film Stress Measurement System Mechanical
1882 Thin Film Stress Measurement System Other
1883 Thin Film Thickness Measurement System Thickness
1887 Ti-Sapphire Laser Other
1888 Time of Flight Secondary Ion Mass Spectrometer (TOF.SIMS 5) SIMS
1889 Time-of-Flight Secondary Ion Mass Spectrometer SIMS
1890 Time-of-Flight SIMS Spectroscopy
1891 Time-of-Flight SIMS SIMS
1894 Toho Technology FLX-2320 Thin Film Stress Measurement System Mechanical
1895 Total internal reflection fluorescence atomic force microscope Spectroscopy
1908 Triboindenter Other
1909 Triboindenter Mechanical
1915 TriStar 3000 Profilometry
1964 UPS Other
1970 UV-VIS Spectrophotometer Spectroscopy
1971 UV-Vis Spectrophtometer Spectroscopy
1979 Varian 5000, UV-Vis-NIR Spectrophotometer Spectroscopy
1980 VCA Optima Contact Angle Contact Angle
1981 Veeco 4-point probe Electrical
1983 Veeco AP-150 Electrical
1985 Veeco Dektak 150 Profilometer Profilometry
1986 Veeco Dektak Profilometer Profilometry
1987 Veeco Four-point Probe — Instructional Center Electrical
1990 Veeco NT1100 Optical Profiling System Optical
1998 VG Scientific Multilab 3000 XPS
1999 Vibrating Sample Magnetometer Other
2021 Wafer Inspection Camera Optical
2025 Waters Prep150 HPLC Chromatography
2026 Waters Prep150 HPLC Chromatography
2027 Waters Synapt G2S-i Q-TOF with ion mobility Mass Spec
2044 Wild Optical
2049 Wire Pull/Ball Shear Tester Other
2053 Witec Raman Confocal Atomic Force Microscope Spectroscopy
2054 Wollam Ellipsometer Thickness
2055 Woollam Ellipsometer Thickness
2056 Woollam M2000 Ellipsometer Thickness
2057 Woollam Spectroscopic Ellipsometer Spectroscopy
2058 Woollam Spectroscopic Ellipsometer Thickness
2059 Woollam Spectroscopic Ellipsometer Optical
2060 Woollam Spectroscopic Ellipsometer Thickness
2061 Woollam Vase Ellipsometer Thickness
2064 Wyko Optical
2065 Wyko NT2000 Profilometer (VEECO) Profilometry
2066 Wyko Profilometer NT3300 Profilometry
2067 X-Ray Fluorescence Spectrometer XRF
2069 X-ray Photoelectron Spectrometer XPS
2070 X-ray Photoelectron Spectrometer Axis Ultra DLD XPS
2071 X-ray Powder Diffraction Spectrometer XRD
2072 X-ray Powder Diffractometer Other
2073 X-ray topography instrument XRD
2080 XDIFF1 XRD
2086 XPS XPS
2087 XPS XPS
2088 XPS XPS
2089 XPS XPS
2090 XPS XPS
2091 XPS1 XPS
2092 XPS: PHI Quantera SXM XPS
2093 XPS: PHI Versaprobe XPS
2094 XPS: PHI Versaprobe XPS
2095 XRD: Bruker Single Crystal D8 Venture XRD
2096 XRD: Multiwire Laue XRD
2097 XRD: PANalytical X’Pert 1 XRD
2098 XRD: PANalytical X’Pert 2 XRD
2133 Zygo Optical Profilometer Profilometry
2134 ZYGO1 Profilometry
2135 Zyvex Nanoprobes for Ultra SEM Other

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