Description
Please contact us if you are interested in the following Metrology/Characterization Equipment . The Metrology/Characterization Equipment are only for end users and are subject to prior sale without notice. Appreciate your time.
| Equip Code | Name | Type |
| 2 | 16 core Xeon High Perfomance Computing | Electrical |
| 4 | 300 MHz NMR Mazama (Solids) | NMR |
| 8 | 3D Atom Probe | Other |
| 10 | 3D optical microscope | Profilometry |
| 11 | 3D Optical Profiler | Profilometry |
| 12 | 3D Optical Profiler | Optical |
| 17 | 4-point Probe | Electrical |
| 19 | 400 MHz NMR Karloff (Solids) | NMR |
| 20 | 400 MHz solid state NMR | NMR |
| 21 | 4156c Seminconductor Analyzer No 2 | Electrical |
| 22 | 5-bounce | XRD |
| 23 | 500 MHz NMR Bastiat (Imaging) | NMR |
| 24 | 500 MHz NMR Shasta (Solids) | NMR |
| 25 | 500 MHz NMR Spectrometer with Direct Cryoprobe | NMR |
| 26 | 500 MHz NMR Spectrometer with Triple Resonance Cryoprobe | NMR |
| 28 | 600 MHz NMR Baker (Liquids) | NMR |
| 29 | 600 MHz NMR Hood (Metabolomics) | NMR |
| 30 | 600 MHz NMR Nittany (Solids) | NMR |
| 31 | 600 MHz NMR Spectrometer | NMR |
| 34 | 750 MHz NMR Rainier (Liquids) | NMR |
| 35 | 750 MHz Radiological NMR Bokan (Liquids, Solids) | NMR |
| 41 | 800 MHz NMR Denali (Liquids) | NMR |
| 42 | 81600B Tunable Laser Source | Electrical |
| 43 | 83453B High Resolution Spectrometer | Optical |
| 44 | 850 MHz NMR Ellis (Solids) | NMR |
| 45 | 86142B High Performance Optical Spectrum Analyzer | Optical |
| 71 | AFM Veeco/Bruker NanoMan | Profilometry |
| 73 | AFMs | Thickness |
| 75 | Agilent 212-LC/500-MS | Mass Spec |
| 76 | Agilent 34401A Multimeter | Electrical |
| 77 | Agilent 400 MHz NMR Spectrometer | NMR |
| 78 | Agilent 4294A Impedance Analyzer | Electrical |
| 79 | Agilent 450-GC/212-LC/320-MS | Mass Spec |
| 80 | Agilent 450-GC/240-MS | Mass Spec |
| 81 | Agilent 610 FT-IR Microscope | Spectroscopy |
| 82 | Agilent 6520 Q-TOF with Agilent 1100 nano-HPLC | Mass Spec |
| 83 | Agilent 6520 QTOF LCMS | Mass Spec |
| 84 | Agilent 6520 QTOF LCMS | Mass Spec |
| 85 | Agilent 6538 Q-TOF with Agilent 1290 UHPLC | Mass Spec |
| 86 | Agilent 700 Mhz NMR Spectrometer | NMR |
| 87 | Agilent 710-ES ICP-OES | Spectroscopy |
| 88 | Agilent 920-Liquid Chromatograpy | Chromatography |
| 89 | Agilent B1500 Semiconductor Analyzer | Electrical |
| 90 | Agilent B1500A Semiconductor Device Analyzer | Electrical |
| 91 | Agilent Cary 6000i UV-vis-NIR Spectrophotometer | Spectroscopy |
| 92 | Agilent Cary 670 FT-IR Spectrophotometer | Spectroscopy |
| 94 | Agilent E3620 | Electrical |
| 95 | Agilent intelliflash 310 Purification System | Chromatography |
| 96 | Agilent microwave vector network analyzer | Electrical |
| 98 | Agilent Technologies 54624A Oscilloscope | Electrical |
| 122 | Alessi Probe Station | Electrical |
| 123 | Alisse REL 4800 | Electrical |
| 126 | Alpha Step 200 | Profilometry |
| 127 | Alphastep | Profilometry |
| 128 | Alphastep 500 Profilometer | Profilometry |
| 129 | AmaZon X Ion Trap | Mass Spec |
| 130 | Ambios XP2 | Profilometry |
| 138 | Analytical Balance | Other |
| 147 | AP-XPS/AP-STM | XPS |
| 160 | ASAP 2460 Surface Area and Porosity Analyzer | Other |
| 177 | Atomic Force Microscope | Electrical |
| 186 | attocube MFM | Profilometry |
| 189 | Auger | Spectroscopy |
| 190 | Auger: PHI 700 | Other |
| 225 | Bench-top crystal orientation analyzer | Other |
| 233 | Biologic Potentiostat | Electrical |
| 243 | Bond Tester | Mechanical |
| 247 | Bowoptic Stress Measurement | Mechanical |
| 254 | Bruker Autoflex | Mass Spec |
| 255 | Bruker AXS General Area Detector Diffraction System | Other |
| 256 | Bruker D8 Discover | XRD |
| 257 | Bruker D8 Discover | XRD |
| 263 | BRUKER Discovery D8 | XRD |
| 264 | Bruker Duo X-Ray Diffractomer | XRD |
| 265 | Bruker EDS | EDS/WDS |
| 267 | Bruker FTIR/FTRaman | Spectroscopy |
| 269 | Bruker maXis Impact with Dionex 3000 nano-uHPLC | Mass Spec |
| 270 | Bruker micrOTOF with Agilent 1290 UHPLC | Mass Spec |
| 272 | Bruker Photon 100 | XRD |
| 279 | CaBER | Other |
| 281 | Calorimeter | Other |
| 287 | Camera | XRD |
| 294 | Cary 5000UV-VIS NIR | Spectroscopy |
| 295 | Cascade Micromanipulator 6000 | Electrical |
| 296 | Cascade REL-4800 Manual Probe Station | Electrical |
| 299 | CCI HD Optical Profiler | Profilometry |
| 300 | CDE ResMap Resistivity 4-pt Probe | Electrical |
| 301 | CDE ResMap-178 | Electrical |
| 303 | CEI-XANES | Other |
| 315 | Characterization Electronics | Electrical |
| 318 | Circuit Tester | Electrical |
| 343 | Contact Angle and Surface Tension Measurement System | Contact Angle |
| 344 | Contact Angle Goniometer | Contact Angle |
| 345 | Contact Angle Goniometer: Rame-Hart 290 | Other |
| 346 | Contact Angle Measurement | Contact Angle |
| 347 | Contact Angle Measurement System | Contact Angle |
| 381 | CV Testing Station | Electrical |
| 382 | CV-IV | Electrical |
| 391 | CW X-Band (9.5 GHz) Radiological EPR | Other |
| 394 | Cyro Probe Station | Electrical |
| 395 | CyTOF – Mass Cytometer | Mass Spec |
| 396 | Cytoviva | Other |
| 397 | D-5000 | XRD |
| 399 | Dage X-Ray XD7600NT | Other |
| 411 | Dektak | Profilometry |
| 412 | Dektak 150 | Profilometry |
| 413 | Dektak 150 Profilometer | Profilometry |
| 414 | Dektak 150 Profilometer — Instructional Center | Profilometry |
| 415 | Dektak profilometer | Profilometry |
| 416 | Dektak Profilometer | Profilometry |
| 417 | Dektak Stylus Profilometer | Profilometry |
| 418 | DektakXT | Profilometry |
| 435 | Device probe station | Electrical |
| 442 | Differential Scanning Calorimeter | TGA |
| 443 | Differential Scanning Calorimeter | DSC |
| 445 | Digital Instruments Nanoscope 3000 AFM | Other |
| 470 | DMA: TA Instrument Q800 | Other |
| 480 | DSA91304A Infiniium High Performance Oscilloscope: 13 GHz | Electrical |
| 481 | DSC | Other |
| 482 | DSC: TA Instrument Q100 | DSC |
| 483 | DSC: TA Instrument Q2000 | DSC |
| 490 | Dynisco D4003 Melt Index Tester | Other |
| 501 | E8361C PNA Microwave Network Analyzer | Electrical |
| 514 | ED-XRF | XRF |
| 516 | EDS | EDS/WDS |
| 517 | EDS on FIB | EDS/WDS |
| 518 | EDS on SEM | EDS/WDS |
| 519 | EDS on TEM | EDS/WDS |
| 521 | Electrical Test Station | Electrical |
| 536 | Electron Spectrometer: Scanning Multiprobe Surface Analysis System – Versaprobe | Other |
| 537 | Electron Spectrometer: XPS with Laser Interface | XPS |
| 547 | ELL1 | Thickness |
| 548 | Ellipsometer | Optical |
| 549 | Ellipsometer | Thickness |
| 550 | Ellipsometer | Thickness |
| 551 | Ellipsometer | Spectroscopy |
| 552 | Ellipsometer | Other |
| 553 | Ellipsometer | Thickness |
| 554 | Ellipsometer | Thickness |
| 555 | Ellipsometer (VASE) | Thickness |
| 556 | Ellipsometer: Horiba Smart SE | Other |
| 565 | Epitaxial Thin Film XRD | XRD |
| 577 | Everbeing 4-point Probe Station-Manual | Electrical |
| 578 | Everbeing EB-6 DC Probe Station | Electrical |
| 625 | Filmetrics | Optical |
| 626 | Filmetrics | Profilometry |
| 627 | Filmetrics | Thickness |
| 628 | FilMetrics F20 | Other |
| 629 | Filmetrics F20 | Thickness |
| 630 | Filmetrics F20 (2) | Thickness |
| 631 | FilMetrics F40 | Other |
| 632 | Filmetrics F40 | Optical |
| 633 | Filmetrics F50 | Optical |
| 634 | FilMetrics F50-EXR | Other |
| 635 | Filmetrics spectrophotometer | Optical |
| 636 | Filmetrics spectrophotometer | Optical |
| 641 | Flash Solar Cell Tester | Electrical |
| 643 | Flexus 2320 | Other |
| 644 | FleXus Film Stress Measurement | Other |
| 649 | Fluorimeter | Other |
| 650 | Fluorimeter | Spectroscopy |
| 651 | FLX-2320-S Thin Film Stress Measurement | Mechanical |
| 661 | Four Point Probe | Electrical |
| 662 | Four Point Probe | Electrical |
| 663 | Four point probe | Electrical |
| 664 | Four point probe | Electrical |
| 665 | Free Fall Shock Machine | Other |
| 667 | FT-IR | Spectroscopy |
| 668 | FTIR Microscope | Other |
| 669 | FTIR Spectrometer | Other |
| 684 | Gaertner L116C ellipsometer | Optical |
| 685 | Gaertner LSE-WS Ellipsometer | Thickness |
| 687 | Gas Chromatographer | Chromatography |
| 688 | Gas Chromatographer | Chromatography |
| 689 | Gas sorption: Quantachrome Autosorb iQ3 | Other |
| 694 | GC-MS Agilent | Chromatography |
| 695 | GC-TOF MS | Mass Spec |
| 698 | GDOES | Other |
| 721 | Hall Effect Measurement System | Electrical |
| 730 | HAST Chamber | Other |
| 754 | Hewlet Packard High performance liquid chromatograph (HPLC) | Chromatography |
| 758 | High Field W-Band (95 GHz) EPR | Other |
| 759 | High Resolution EELS | Other |
| 760 | High Resolution Microprobe XPS | XPS |
| 761 | High Resolution, Ultrafast SFG Vibrational Spectroscopy | Other |
| 762 | High Speed Optical Signal Testing | Optical |
| 790 | Horiba UVISEL 2 Spectroscopic Ellipsometer | Other |
| 792 | Horiba XploRA ONE Raman Confocal Microscope | Spectroscopy |
| 798 | HPLC System | Other |
| 799 | HT-GPC: Tosho High-temperature EcoSEC with MALS: Wyatt Dawn Heleos | Other |
| 800 | Huber 2-circle Cu | XRD |
| 801 | Huber 2-circle XSW Mo | XRD |
| 802 | Huber 4-circle | XRD |
| 811 | Hysitron TI 950 TriboIndenter | Mechanical |
| 812 | Hysitron TI950 Triboindenter | Mechanical |
| 813 | Hysitron TriboIndenter | Mechanical |
| 814 | Hysitron TriboIndenter | Mechanical |
| 825 | ICP-MS (Quadrupole) | Mass Spec |
| 827 | ID Quantique ID220 Single Photon Detector (one pair) | Optical |
| 831 | Imaging Ellipsometer Accurion EP3 | Thickness |
| 835 | Infrared Spectrometer Infinity Gold FTIR | Spectroscopy |
| 838 | Instron 3384 Materials Test Frame | Mechanical |
| 839 | Instron 5569 Mechnical Tester | Other |
| 840 | Instron 5900R Material Test Frame | Mechanical |
| 841 | Instron 8802 Dynamic Test Frame | Mechanical |
| 842 | Instron 9250G Impact Test Frame | Mechanical |
| 843 | Instron E10000 Fatigue Test Equipment | Other |
| 844 | Instron Impact Tester 8250 | Other |
| 845 | Interferometer | Profilometry |
| 851 | inVia Raman/PL Microscope | Spectroscopy |
| 854 | Ion Chromatograph | Chromatography |
| 862 | ION-TOF | Mass Spec |
| 863 | IONTOF Time-of-Flight SIMS | SIMS |
| 864 | IPCE | Other |
| 869 | J.A. Woollam M-2000D Spectroscopic Ellipsometer | Thickness |
| 870 | J.A. Woollam M-2000D Spectroscopic Ellipsometer | Optical |
| 871 | J.A. Woollam M2000 Spectroscopic Ellipsometer | Thickness |
| 872 | J.A. Woollam V VASE Spectroscopic Ellipsometer | Optical |
| 873 | Jandel 4-point probe | Electrical |
| 874 | Jandel 4-point probe RM3000 | Electrical |
| 875 | Jandel Four Point Probe with RM3000 Test Unit | Electrical |
| 876 | Jasco UV/Vis/IR Spectrometer | Spectroscopy |
| 901 | JXA-8530F Electron Probe Microanalyzer (EPMA) | Spectroscopy |
| 920 | Karl Suss probe | Electrical |
| 926 | Keithley 2400 | Electrical |
| 927 | Keithley SCS | Electrical |
| 929 | Keyence | Optical |
| 934 | Kiethley 2400 Digital Source Meter | Electrical |
| 935 | Kiethley 2602A Dual Channel Source Meter | Electrical |
| 936 | Kinetic Laser | Other |
| 938 | KLA 2D Profilometer (MET-01) | Profilometry |
| 939 | KLA 3D Profilometer (MET-02) | Profilometry |
| 940 | KLA Tencor Surfscan 6100 | Optical |
| 941 | KLA-Tencor P-10 Profilometer | Profilometry |
| 942 | KLA-Tencor P-16 Stylus Profilometer | Profilometry |
| 943 | KLA-Tencor P-7 Surface Profilometer | Profilometry |
| 947 | Kratos | XPS |
| 948 | Kratos XPS | XPS |
| 954 | Labram HR Evolution Raman Spectrometer | Spectroscopy |
| 956 | Lakeshore 1.5K Probe Station | Electrical |
| 978 | LC-TOF MS | Mass Spec |
| 980 | LED Measurement System and Integrating Sphere | Optical |
| 986 | Leitz MVP-SP Interferometer | Other |
| 1010 | Liquid Chromatograph | Chromatography |
| 1022 | Low Temperature Photoelectron Spectroscopy | Spectroscopy |
| 1038 | Lucas Labs 4PP | Electrical |
| 1041 | MALDI-TOF MS | Mass Spec |
| 1044 | Malvern Zetasizer | Other |
| 1049 | Manual Probe Station | Electrical |
| 1063 | Mass Spectrometer | Spectroscopy |
| 1064 | Mass Spectrometer: 21T FTICR | Mass Spec |
| 1065 | Mass Spectrometer: Aerosol, time-of-flight, high resolution | Mass Spec |
| 1066 | Mass Spectrometer: FT-ICR, 6T (Ion Surface Collisions) | Mass Spec |
| 1067 | Mass Spectrometer: Inductively Coupled Plasma (ICP-MS), High Resolution (Element XR) | Mass Spec |
| 1068 | Mass Spectrometer: Inductively Coupled Plasma (ICP-MS), Multi-Collector (Neptune Plus) | Mass Spec |
| 1069 | Mass Spectrometer: Inductively Coupled Plasma (ICP-MS), Ultra-High Resolution | Mass Spec |
| 1070 | Mass Spectrometer: Ion Mobility Spectrometry, Time of Flight | Mass Spec |
| 1071 | Mass Spectrometer: Linear Ion Trap Quadrupole (LTQ) Orbitrap MS – for environmental research (nanoDESI) | Mass Spec |
| 1072 | Mass Spectrometer: Orbitrap | Mass Spec |
| 1073 | Mass Spectrometer: Proton Transfer Reaction (PTRMS) | Mass Spec |
| 1074 | Mass Spectrometer: Single Particle (SPLAT II) | Mass Spec |
| 1075 | Mass Spectrometer: Time of Flight Secondary Ion (ToF SIMS) – 1997 | Mass Spec |
| 1080 | Mechanical Testing, Instron 5565 | Other |
| 1090 | Metricon | Other |
| 1091 | Metricon Refractometry System | Thickness |
| 1092 | Mettler Thermogravimetric Analyzer | TGA |
| 1094 | Micro-hardness Tester | Other |
| 1095 | Micro-Raman spectrometer | Spectroscopy |
| 1096 | Micro-Raman Spectrometer Alpha 300 | Spectroscopy |
| 1098 | Microbeam XRD | XRD |
| 1104 | Microfluidics Workstation – Valves Controller | Other |
| 1128 | Microspectrophotometer | Spectroscopy |
| 1136 | Millimeter-Wave Test-Bed | Other |
| 1152 | Molecular Beam Kinetics | Other |
| 1156 | MOS CV Analysis | Electrical |
| 1159 | MPMS Squid | Other |
| 1168 | MSA1 | Other |
| 1178 | Multipurpose XRD | XRD |
| 1180 | N4373C 67 GHz Lightwave Component Analyzer | Electrical |
| 1181 | N4906B Serial BERT | Electrical |
| 1182 | N9010A EXA Signal Analyzer, 26 GHz | Electrical |
| 1186 | Nano-SIMS | Mass Spec |
| 1188 | NANO1 | Thickness |
| 1194 | Nanoindenter | Mechanical |
| 1195 | Nanomanipulator: SEM accessory | Other |
| 1196 | Nanometrics | Thickness |
| 1197 | Nanometrics | Thickness |
| 1198 | Nanometrics Nanospec Thin Film Thickness System #2 | Thickness |
| 1206 | Nanospec | Thickness |
| 1207 | Nanospec 3000 | Optical |
| 1208 | Nanospec Film Thickness Measurement System | Thickness |
| 1209 | Nanospec Reflectometer – Inorganic | Thickness |
| 1210 | Nanospec Reflectometer – Pettit | Thickness |
| 1212 | NEC Mini-Tandem 5.1 MeV Ion Accelerator | Other |
| 1217 | Netzsch STA | Chromatography |
| 1218 | NewView 7300 3D Optical Surface Profiler | Optical |
| 1227 | Nikon LV150 | Optical |
| 1228 | Nikon Microscope | Optical |
| 1255 | OPT1 | Spectroscopy |
| 1256 | OPT2 | Spectroscopy |
| 1257 | OPT3 | Spectroscopy |
| 1258 | Optical Measuring System | Optical |
| 1263 | Optical profilometer | Optical |
| 1264 | Optical Profilometer | Profilometry |
| 1265 | Optical Profilometer | Profilometry |
| 1298 | P-7 Profilometer | Profilometry |
| 1299 | P10 Profilometer | Profilometry |
| 1300 | P15 | Profilometry |
| 1303 | PANalytical Empyrean | XRD |
| 1304 | Panalytical Empyrean | XRD |
| 1305 | PANalytical Empyrean Linear Detector and Non-ambient Environment | XRD |
| 1306 | PANalytical MRD | XRD |
| 1307 | Panalytical X’Pert PRO MRD XRD | XRD |
| 1308 | Panalytical XPert PRO Alpha-1 XRD | XRD |
| 1331 | Peel Tester | Mechanical |
| 1332 | Perkin Elmer DMA 8000 Dynamic Mechanical Analyzer | Mechanical |
| 1333 | Perkin Elmer DSC 6000 Differential Scanning Calorimeter | DSC |
| 1334 | Perkin Elmer Lambda 18 UV vis spectrometer | Spectroscopy |
| 1335 | PerkinElmer Spectrum | Other |
| 1336 | PESA: Riken AC-2 Photoelectron Spectrometer | Other |
| 1340 | Philips Vertical Scanning Diffractometer | XRD |
| 1341 | Philips X'Expert XRD | XRD |
| 1342 | Philips XPERT Theta-Theta Diffractometer | XRD |
| 1362 | Photovoltatic test system | Electrical |
| 1363 | Physical Properties Measurement System (PPMS) | Other |
| 1366 | PicoHarp 300 PicoQuant Time-Correlated Single Photon Counting (TCSPC) system | Optical |
| 1367 | Picosecond SFG | Other |
| 1371 | Plas-Mos Ellipsometer | Thickness |
| 1426 | Potentiostat | Electrical |
| 1427 | Potentiostat | Electrical |
| 1428 | Potentiostat | Electrical |
| 1429 | Potentiostat | Electrical |
| 1430 | Potentiostat | Electrical |
| 1431 | Powder X-Ray Diffractomer | XRD |
| 1432 | Powder XRD | XRD |
| 1436 | Princeton Instruments Tri-Vista spectrometer with SI and InGaAs array detectors | Spectroscopy |
| 1437 | Princeton VeraSTAT4 Potentiostat/Galvanostat | Other |
| 1438 | Probe Station | Electrical |
| 1439 | Probe Station | Electrical |
| 1440 | probe station | Electrical |
| 1441 | Probe Station | Electrical |
| 1442 | Probe station and Electronics Rack | Electrical |
| 1443 | Probe Station I: I-V & C-V Testing | Electrical |
| 1444 | PROBE2 | Electrical |
| 1445 | PROF2 | Profilometry |
| 1446 | Profilometer | Profilometry |
| 1447 | Profilometer | Profilometry |
| 1448 | Profilometer: Bruker Dektak 150 | Profilometry |
| 1449 | Prometrix Resistivity Mapping System | Electrical |
| 1458 | Pulsed/CW X-Band (9.5 GHz) EPR | Other |
| 1465 | Q600 TGA/DSC | TGA |
| 1473 | Quantum Design PPMS 9 T | Other |
| 1474 | Quantum Design PPMS 9 Tesla with EverCool-II | Other |
| 1475 | Quantum Design S-VSM Magnetic Particle Measuring System | Electrical |
| 1476 | Quantum Designs MPMS 7 Tesla with EverCool-II | Other |
| 1477 | Quantum Efficiency measurement tool | Optical |
| 1478 | Quartz Crystal Microbalance with Dissapation (QCM-D) | Other |
| 1482 | R Stand | Electrical |
| 1485 | Radiological Powder XRD | XRD |
| 1495 | Raman Microscope | Spectroscopy |
| 1496 | Rame Hart 260-F4 Goniometer/Tensiometer | Contact Angle |
| 1522 | Reflectance mapping system | Thickness |
| 1523 | Reflectometer | Thickness |
| 1525 | Renishaw inVia confocal Raman microscope | Spectroscopy |
| 1538 | Rheometer: TA Instrument ARES-G2 | Other |
| 1545 | Rigaku ATXG | XRD |
| 1546 | Rigaku D / Max -B | XRD |
| 1547 | Rigaku Dmax | XRD |
| 1548 | Rigaku Gemini A Single Crystal Diffractometer | XRD |
| 1549 | Rigaku Laue/Precession | XRD |
| 1550 | Rigaku Multiflex | XRD |
| 1551 | Rigaku SmartLab | XRD |
| 1552 | Rigaku Smartlab | XRD |
| 1553 | Rigaku SmartLab X-Ray Diffractometer | XRD |
| 1554 | Rigaku Smax3000 | XRD |
| 1555 | Rigaku Ultima IV | XRD |
| 1556 | Rigaku Ultima IV | XRD |
| 1557 | Rikagu | XRD |
| 1559 | Rotating Disc Electrode | Other |
| 1565 | Rudolph Auto EL Ellipsometer | Thickness |
| 1566 | Rudolph Auto Ellipsometer VIS/NIR | Optical |
| 1567 | Rudolph EL4 Ellipsometer | Thickness |
| 1568 | S-Probe | XPS |
| 1581 | SAXS1 | Other |
| 1582 | SAXS2 | Other |
| 1587 | Scanning Auger Electron Microprobe | Other |
| 1588 | Scanning confocal Raman spectrometer with atomic force microscope / near-field scanning optical microscope | Spectroscopy |
| 1594 | Scanning Ellipsometer | Thickness |
| 1599 | Scanning Tunneling Microscope | Profilometry |
| 1603 | Sciex Qtrap 6500 | Mass Spec |
| 1604 | Scintag X1 Theta-Theta Diffractometer | XRD |
| 1605 | Scintag XDS2000 | XRD |
| 1632 | Semi-Automatic Probe Station | Other |
| 1635 | Semiconductor Characterization System | Electrical |
| 1636 | Semiconductor Parameter Analyzer #1-#2 | Electrical |
| 1637 | SemiTest SCA-2500 Surface Charge Analyzer | Other |
| 1639 | Semprex Spectrometer — Instructional Center | Spectroscopy |
| 1640 | Sensofar S-neox, non contact 3D optical profiling | Profilometry |
| 1648 | Shielded Antenna Chamber | Other |
| 1649 | Shimadzu Prominence HPLC | Chromatography |
| 1650 | Shimadzu Prominence HPLC | Chromatography |
| 1651 | Siemens Magnetom Trio MRI 3T Scanner | Other |
| 1652 | Signatone Four-point Probe | Electrical |
| 1653 | Signatone Probe Station | Electrical |
| 1654 | Signatone Probe Station | Electrical |
| 1658 | SIMS | SIMS |
| 1659 | SIMS: Cameca IMS 7f GEO | SIMS |
| 1660 | SIMS: Cameca NanoSIMS 50l | SIMS |
| 1661 | Simultaneous Thermal Analyzers | TGA |
| 1664 | Sinton Lifetime Tester | Optical |
| 1666 | Small Angle X-Ray Scattering (SAXS) | XRD |
| 1669 | Solar Cell Testing Glovebox | Electrical |
| 1670 | Solar Simulator | Other |
| 1671 | Solar Simulator | Other |
| 1690 | Spectrometer: Mossbauer | Spectroscopy |
| 1691 | Spectrophotometer | Spectroscopy |
| 1692 | Spectroscopic Ellipsometer | Thickness |
| 1693 | Spectroscopic Ellipsometer | Thickness |
| 1694 | Spectroscopy: Agilent Cary 6000i UV/Vis/NIR | Spectroscopy |
| 1695 | Spectroscopy: Horiba FluoroLog Fluorimeter | Other |
| 1697 | Spectroscopy: Nicolet iS50 FT/IR Spectrometer | Spectroscopy |
| 1741 | SQUID Magnetometer | Electrical |
| 1744 | SRI Gas Chromatographer | Chromatography |
| 1754 | Stopped-Flow Absorbance/Fluorescence Spectrometer | Spectroscopy |
| 1774 | stylus profilometer | Profilometry |
| 1775 | Stylus Profilometer | Profilometry |
| 1776 | Stylus Profilometer | Profilometry |
| 1784 | Sum Frequency Generation for Surface Vibrational Spectroscopy | Spectroscopy |
| 1785 | Surface particle Measurement | Other |
| 1788 | Suss Backside Alignment Measurement | Other |
| 1804 | TA Q200 DSC Differential Scanning Calorimeter | DSC |
| 1805 | TA Q500 TGA Thermogravimetric Analyzer | TGA |
| 1806 | Tandem Accelerator | Other |
| 1810 | Tau Science Flash QE | Spectroscopy |
| 1830 | Temp/Humidity Chamber | Other |
| 1836 | Tencor P15 Profilometer | Profilometry |
| 1837 | Tencor P15 Profilometer (left) | Profilometry |
| 1838 | Tencor P15 Profilometer (right) | Profilometry |
| 1839 | Tencor P2 Profilometer | Profilometry |
| 1840 | Tencor profilometer | Profilometry |
| 1849 | TGA/DTA | Other |
| 1850 | TGA: TA Instrument Q500 | TGA |
| 1851 | Thermal Analysis Equipment | Other |
| 1859 | Thermal Shock Chamber | Other |
| 1867 | Thermo K-Alpha XPS | XPS |
| 1869 | Thermo Nicolet Almega XR Dispersive Raman Spectrometer | Spectroscopy |
| 1872 | Thermo UV-VIS Spectrometer | Spectroscopy |
| 1874 | Thermogravimetric Analyzer | TGA |
| 1875 | Thermogravimetry analysis system | TGA |
| 1877 | Thermtest TPS2500S Thermal Conductivity Instrument | Other |
| 1878 | Thin Film Measurement System | Thickness |
| 1879 | Thin Film Measurement System | Profilometry |
| 1881 | Thin Film Stress Measurement System | Mechanical |
| 1882 | Thin Film Stress Measurement System | Other |
| 1883 | Thin Film Thickness Measurement System | Thickness |
| 1887 | Ti-Sapphire Laser | Other |
| 1888 | Time of Flight Secondary Ion Mass Spectrometer (TOF.SIMS 5) | SIMS |
| 1889 | Time-of-Flight Secondary Ion Mass Spectrometer | SIMS |
| 1890 | Time-of-Flight SIMS | Spectroscopy |
| 1891 | Time-of-Flight SIMS | SIMS |
| 1894 | Toho Technology FLX-2320 Thin Film Stress Measurement System | Mechanical |
| 1895 | Total internal reflection fluorescence atomic force microscope | Spectroscopy |
| 1908 | Triboindenter | Other |
| 1909 | Triboindenter | Mechanical |
| 1915 | TriStar 3000 | Profilometry |
| 1964 | UPS | Other |
| 1970 | UV-VIS Spectrophotometer | Spectroscopy |
| 1971 | UV-Vis Spectrophtometer | Spectroscopy |
| 1979 | Varian 5000, UV-Vis-NIR Spectrophotometer | Spectroscopy |
| 1980 | VCA Optima Contact Angle | Contact Angle |
| 1981 | Veeco 4-point probe | Electrical |
| 1983 | Veeco AP-150 | Electrical |
| 1985 | Veeco Dektak 150 Profilometer | Profilometry |
| 1986 | Veeco Dektak Profilometer | Profilometry |
| 1987 | Veeco Four-point Probe — Instructional Center | Electrical |
| 1990 | Veeco NT1100 Optical Profiling System | Optical |
| 1998 | VG Scientific Multilab 3000 | XPS |
| 1999 | Vibrating Sample Magnetometer | Other |
| 2021 | Wafer Inspection Camera | Optical |
| 2025 | Waters Prep150 HPLC | Chromatography |
| 2026 | Waters Prep150 HPLC | Chromatography |
| 2027 | Waters Synapt G2S-i Q-TOF with ion mobility | Mass Spec |
| 2044 | Wild | Optical |
| 2049 | Wire Pull/Ball Shear Tester | Other |
| 2053 | Witec Raman Confocal Atomic Force Microscope | Spectroscopy |
| 2054 | Wollam Ellipsometer | Thickness |
| 2055 | Woollam Ellipsometer | Thickness |
| 2056 | Woollam M2000 Ellipsometer | Thickness |
| 2057 | Woollam Spectroscopic Ellipsometer | Spectroscopy |
| 2058 | Woollam Spectroscopic Ellipsometer | Thickness |
| 2059 | Woollam Spectroscopic Ellipsometer | Optical |
| 2060 | Woollam Spectroscopic Ellipsometer | Thickness |
| 2061 | Woollam Vase Ellipsometer | Thickness |
| 2064 | Wyko | Optical |
| 2065 | Wyko NT2000 Profilometer (VEECO) | Profilometry |
| 2066 | Wyko Profilometer NT3300 | Profilometry |
| 2067 | X-Ray Fluorescence Spectrometer | XRF |
| 2069 | X-ray Photoelectron Spectrometer | XPS |
| 2070 | X-ray Photoelectron Spectrometer Axis Ultra DLD | XPS |
| 2071 | X-ray Powder Diffraction Spectrometer | XRD |
| 2072 | X-ray Powder Diffractometer | Other |
| 2073 | X-ray topography instrument | XRD |
| 2080 | XDIFF1 | XRD |
| 2086 | XPS | XPS |
| 2087 | XPS | XPS |
| 2088 | XPS | XPS |
| 2089 | XPS | XPS |
| 2090 | XPS | XPS |
| 2091 | XPS1 | XPS |
| 2092 | XPS: PHI Quantera SXM | XPS |
| 2093 | XPS: PHI Versaprobe | XPS |
| 2094 | XPS: PHI Versaprobe | XPS |
| 2095 | XRD: Bruker Single Crystal D8 Venture | XRD |
| 2096 | XRD: Multiwire Laue | XRD |
| 2097 | XRD: PANalytical X’Pert 1 | XRD |
| 2098 | XRD: PANalytical X’Pert 2 | XRD |
| 2133 | Zygo Optical Profilometer | Profilometry |
| 2134 | ZYGO1 | Profilometry |
| 2135 | Zyvex Nanoprobes for Ultra SEM | Other |
ss380nnci
All used equipment /parts trademarks belongs to the original equipment manufacturer. All rights reserved.
