Description
Please contact us for the availability of the following used semiconductor equipment and parts-NANOMETRICS
[Pls use “CTRL+F “key button to search the model/key word you are interested in]
The items are subject to prior sale without notice. These items are only for end users.
| 1 | NANOMETRICS- 7006-0092 / FILM THICKNESS UNIT |
| 2 | Nanometrics- Power Supply, Nanometrics P/N 9062-0177 |
| 3 | NANOMETRICS # 7001-0092 FILM THICKNESS MEASUREMENT SYSTEM- Wafer Inspection (A1) |
| 4 | Nanometrics 180 AFT Film Measurng System |
| 5 | Nanometrics 210 NanoSpec AFT Film Thickness Measurement System COMPLETE |
| 6 | Nanometrics 210AFT Film Measurng System |
| 7 | Nanometrics 210AFT Film Measurng System |
| 8 | NANOMETRICS 30-05-037 DIFFUSER, GENESIS |
| 9 | Nanometrics 7200-1821 Rev. B NanoSpec 210XP Visible Film Thickness Optical Head |
| 10 | Nanometrics 7200-1821 Rev. B NanoSpec 210XP Visible Film Thickness Optical Head |
| 11 | NANOMETRICS 7200-2147 POWER SUPPLY ASSEMBLY |
| 12 | Nanometrics 7201-1045 Computer Control Module 220VAC 50Hz |
| 13 | Nanometrics 7201-1267 Wafer Inspection/Measuring Station W/Newport Table |
| 14 | NANOmetrics 7300-013555 CE-Chuck Full Contact AMAT 3820-00003 Used Working |
| 15 | Nanometrics 7300-3872 Semiconductor Part, Probe Carrier for Trolley Nano 215 |
| 16 | Nanometrics 8000 X |
| 17 | Nanometrics 8000 XSE |
| 18 | Nanometrics 9407-035569R |
| 19 | Nanometrics Cable Assembly P/N 8400-0897 |
| 20 | Nanometrics CS-2 Computer Control Module NanoSpec Film Thickness 0384-CS-2-00296 |
| 21 | NANOMETRICS CSPL STAGE CONTROLLER BOARD |
| 22 | NANOMETRICS INC 5-002299 MOTOR, FIXTURE |
| 23 | NANOMETRICS INC 7200-1469-R POWER SUPPLY LASER 115V 0.12A MODEL 1205 |
| 24 | NANOMETRICS INC 9530-0221 Coupling ROCOM THETA NANO 215VT |
| 25 | Nanometrics Inc Control Unit P/N 7200-020635 Powers Up! |
| 26 | Nanometrics Inc. NanoSpec / AFT 4150 Visible Film Thickness Optical Head 7200-18 |
| 27 | NANOMETRICS JAPAN CO LTD 8401-1190 Assembly, Cable, Coax, 18′ STG/PC VID |
| 28 | NANOMETRICS MODEL # 7201-1045 CONTROLLER FOR Wafer Inspection System |
| 29 | NANOMETRICS MODEL # 7201-1045 CONTROLLER FOR Wafer Inspection System (B2) |
| 30 | NANOMETRICS NANOSPEC / AFT 010-0174 MICRO AREA GAUGE (Quantity 8) nvdc-os |
| 31 | Nanometrics Nanospec 4000 Film Thickness Measurement System |
| 32 | NanoMetrics NanoSpec 8300 Automated Film Thickness Measurement System |
| 33 | Nanometrics Nanospec AFT Film Thickness Analyzer Head 010-0181 |
| 34 | Nanometrics Nanospec AFT Film Thickness Measurement System |
| 35 | NANOMETRICS NFT-8455 PN 8700-0811 SiO2 NIST NanoStandard Film Thickness Standard |
| 36 | Nanometrics PBC, Servo P/N 8200-0384 |
| 37 | Nanometrics PBC, X Trolley P/N 8202-0336 |
| 38 | Nanometrics PCB, Interconnect P/N 8200-0382 |
| 39 | Nanometrics PCB, PCAT Interface P/N 8200-0339 |
| 40 | Nanometrics PPD 7400/18 DCD PRO XRD Wafer Mapper ***Financing*** |
The items are subject to prior sale without notice. These items are only for end users.
SSEB380