Used Semiconductor Equipment

Description

Used Semiconductor Equipment

Location: CA USA.

Valid: Subject to prior sale without notice. This is only for end users. Applicate your time.

Item	OEM	TOOL NAME	Model #	Process	Wafer Size (inch)
1	Advantest	Advantest T2000, with CMT308 Chip tester	T2000	Test	Chip
2	Aixtron	Aixtron Front End Transfer Module, Wafer Loader, Robot Controller, MagnaTran7	Transfer Module	Deposition
3	Alcatel	Alcatel, AMS 4200, Deep Reactive Ion Etch (DRIE), RF Generator, Mag 7 Robot, Controller rack, etc.	AMS 4200	Deep RIE	200mm
4	ALSI	ALSI DCM802 Laser Separation System w/ LCPU, Wafer,	Laser Dicing	Dicing
5	Angstrom	Angstrom SE200BM Spectroscopic Ellipsometer w/ ASTBench TFProbe Spectrometer	Spectroscopic Ellipsometer	Metrology	Solar Cell
6	Applied Material AMAT	AMAT 8100 Oxide Etcher w/ Pump Power Rack, 8100E, AME-8100, 451142	8110	Oxide Etch	6
7	Applied Material AMAT	8115 AMAT	8115	Oxide Etch	6
8	Applied Material AMAT	8310 PLASMA ETCHER	8310	Etch	6
9	Applied Material AMAT	8310 PLASMA ETCHER	8310	Etch	6
10	Applied Material AMAT	8310 PLASMA ETCHER	8310	Etch	6
11	ASM	ASM LPT08 Taping & Packaging Machine	LPT08	Backend
12	ASM	ASM MS100 Mapper Sorter	MS 100	Backend
13	ATMI	VECTOR Scrubber, facility tool	SCRUBBER	Facility
14	Axcelis Fusion	Axcelis Fusion 200ACU Asher. Dual robot arm	200ACU	Asher	8
15	Axcelis Fusion	Axcelis Fusion G03 Ozone Asher. Dual chamber, Dual robot arm	G03	Asher	8
16	Axcelis Fusion	Axcelis Fusion G03 Ozone Asher. Dual chamber, Dual robot arm	G03	Asher	8
	Fusion Systems	Fusion System Curing Epoxy Adhesives UV curing MC-6R and P 300 Power supply	MC-6R
17	AXIC	AXIC 1000 XRF, Metal Thickness measurement tool	1000 XRF	Metrology	4, 6, 2008
18	Bia	Bia Climatic Environmental Test Chamber/Oven		Test Chamber
19	BOC Edwards	BOC Edwards WLAM4D6900 Chemical Mover Cabinet, Acid, Filtration	WLAM4D6900
20	Brooks Automation	Brooks Automation 109752-147 FabExpress Load Port 002-720021 Wafer Transfer Cabinet, 107434 ATM Robot, 105947 Series 8 Robot Controller	Brooks Automation	Robot
21	Burkle	Bürkle Type BKL Film Coating System, Rolling Machine, AE 1376 500, 012995-0010	Type BKL
22	Carl Zeiss	Carl Zeiss Micro Imaging Gmbh 37081, Axio Imager.M1m Precision Microscope	37081
23	Chemcut	Chemcut’s Model 2315D Spray Resist Develop system	Model 2315D	Litho	Solar Cell
24	Chemcut	Chemcut’s Model 2315S Spray Resist Strip system	Model 2315S	Litho	Solar Cell
25	Cincinnati Sub-Zero	CSZ Cincinnati Sub-Zero Temperature Environmental Chamber ZHS-8-1-1-H/AC	ZHS-8-1-1-H/AC	Chip, PCB Testing	Chip, PCB
26	Credence	Credence Tester STS 4020 chip test system	STS 4020	Test
27	Credence	Chemcut’s Model 2315S Spray Resist Strip system	Saphare	Test	Chip
28	CVD Equipment	CVD Equipment RTP tool	RTP	Anneal
29	Delatech	Delatech 858 V-2 scrubber	858	Facility
30	Disco	Disco DAD320 Dicing Saws	DAD320	Dicing	6
31	Disco	Disco DAD320 Dicing Saws	DAD320	Dicing	6
32	Disco	Disco DAD651 Dicing Saws	DAD651	Dicing	6,8
33	Disco	Disco DAD651 Dicing Saws	DAD651	Dicing	6,8
34	Disco	Disco DAD651 Dicing Saws	DAD651	Dicing	6,8
35	ESMO FAM Cart	ESMO FAM Cart Failure Analytical Manipulator Cart adapted for Advantest T2000	ESMO FAM Cart	Tester Cart	Chip PCB
36	ExpertTech Furnace	ExpertTech furnace, Aneal, 2 stack model small foot print, looks very ckean, can handle upti 4 inch	ExpertTech	Furnace	100mm
37	FEI	FEI SEM, XL30	XL30	Metrology
38	FILM TEK 4000	Scientific Computing International FilmTek 4000-A Multiple Layer Thickness Measurement Tool, w/ LS-450 pulsed power supply, illuminator lamp mod# LS-1.	SCI 4000	Metrology	8
39	Four Dimension	Four Dimension 4D Model 280 Automatic Four Point Probe Meter, Wafer, 453291	Four Dimension	Metrology	6,8
40	Fusion Systems Inc.	Fusion System Inc. LC 6B 528481 UV Curing w/ P300MT Power Supply	LC 6B 528481
41	Gasonics	Gasonic 9104 Quartz Chamber Plasma Asher 15698-02, ENI OEM-12B-06 RF Generator	9104	Etch / Asher	4, 6
42	GWI Engineering	GWI Engineering LMF 2000 Web Laser Marking System, Miyachi Uniteck, Fumex	LMF 2000
43	HEKEDA	HEKEDA TY 250 Glass Cleaner, or wafer cleaner, HKD-700F Ultrasonic Generator	TY 250
44	Hitachi	Hitachi M-308ATE Metal Etch System w/ Power Rack, Delatech 858 V-2 scrubber, Gas Cabinet	M-308ATE	Etch	8
45	IMT	IMT SYO-200 Wafer Edge Grinder System	SYO-200	Backend
46	IPEC SpeedFam	IPEC Avanti 372M CMP, 200mm wafers	372M	Polishing, CMP
47	J.A. Woollam Co Inc	J.A. Woollam Co Inc, AccuMap-SE UI-1500 Spectroscopic Ellipsometer	UI-1500
48	Jandel	Jandel Four Point Probe	RM 3000	Metrology	Any
49	JEOL	JEOL JWS-7700 wafer inspection system	JWS-7700	Metrology
50	Kaijo	Wire Bonder		Chip Assembly	Chip
51	Karl Suss PA 200	PA 200 Prober manipulator	PA 200	Prober	6
52	KENSINGTON	KENSINGTON CASSETTE WAFER SORTER MAPPING STATION	KENSINGTON	Wafer Sorter	8
53	KLA Tencor	KLA Tencor FLX-2908 Thin Film Stress Measurement System 230v 15A 1Ph 50Hz	FLX-2908
54	Kullicke & Soffa	1488 plus, Wire Bonder	1488	Chip Assembly	Chip
55	Kullicke & Soffa	Kulicke & Soffa 982-6 Wafer Dicing Saw	982-6	Dicing	6
56	LAM	490 (LAM AUTO ETCHER) computer Base, RF Generator, Chiller	AUTO ETCH	Metal Etch	6
57	LAM	490 (LAM AUTO ETCHER) computer Base, RF Generator, Chiller	AUTO ETCH	Metal Etch	6
58	Laurel	Laurel Spin Coater (200 mm wafer)	Laurel Spin Coater 200mm	Litho	Any
59	Leatherwood	Leatherwood Stainless Steel Solvent Wet Bench		Solvent Wet Bench
60	Lintec RAD-2500	Lintec RAD-2500 Mwafer ounting Machine. Serial no. D4S-2510-1W.	Lintec RAD-2500	Wafer Taper	8
61	Mattson	Mattson Aspen III, Front End Transfer Chamber, Robot, Controller,	Aspen III	Asher	12
62	Mattson	Process chambers Module and RF30S RF generators qty =8	Chamber	Etch/deposition
63	Mattson	Process chambers Module Qty = 2	Chamber	Etch/deposition
64	Metara	Metara LMS-300 TCA Trace Contaminant Analysis Tool	LMS 300	Metrology	6
65	Modo	Modo LS-200F-10 UV Light Source	Modo LS-200F-10	Metrology	Any
66	MRL	MRL Horizontal furnace, CVD 200mm, 4 Tube stack, model 1148G2,	MRL	Furnace	200 mm
67	MRL	MRL Inline Muffle Furnace, 18 zone, conveyor. It has a conveyor as well, ceramic material	MRL	Furnace
68	MRSI	MRSI 505 pick and place system	MRSI-505	Backend
69	MTI	MTI DZF-6050-HT/500 High Temp Compact Vacuum Oven, 2500W, 50~500 C	DZF-6050-HT/500	Vacuum Oven	Any
70	MTS MARANGONI	MTS MARANGONI wafer Dryer		Wafer Cleaning	Any
71	Nanometrics	Nanometrics 50-2 CD Measurement System, 3″ to 6″ Wafers, 10x Eyepieces – 5x, 10x, 40x Objectives, Includes Nanoline Computer Controller, Monitor, Keyboard	50-2 CD	CD Measurement	3,4,5,6
72	Nanometrics	Nanometrics NANOSPEC 8300X Wafer thickness measurement tool	8300	Metrology	6,8,12
73	NEL System	NEL MA1508N wafer mounter	MA1508N	Dicing	6,8
74	Newport	Newport TracQ Basic Solar Simulator w/ Oriel Merlin Radiometry System Controller
75	NewWave Research	NewWave Research, Model Titan Accuscribe Laser Scriber System, Model 2150	Model 2150	Backend
76	Novellus	Novellus Saber Integrated INT1-APM1 300mm Wafer Cleaner Spin Rinse Dry Module H9/10 SRDi, chamber part	Saber Chamber	Plating	12
77	Novellus	Novellus INOVA XT Sputter PVD Tool, 300MM, Mag 7 Robot, PDX 5000, RFG 5500 RF Generators, CTI 9600 Compresor, Cables, complete tool, manuals	INOVA XT	PVD. Sputter	12
78	Pacific western Systems	P5MS Wafer Prober, tester, power supply	P5MS	Metrology	6
79	Pacific western Systems	PWS P5MS, Pacific Western Systems Wafer Prober Assy, Probe II, 20, Controller	P5MS	Metrology	6
80	PAL Custom Bench Plating	Cu/Sn Plating tool, can handle Solar or PCB	PAL Custom Bench	Sn Marking	Any
81	Perkin Elmer 4450	Perkin-Elmer 4450 Sputtering System (Delta target), Crup Pump, Vacuum Pump, RF Generator, DC Power Supply	PE 4450	PVD. Sputter	4,5,6,9
82	Philips	Philips Ruby, Ellipsometer, with Genmark Robotand Aligner, cassette load, 200mm, 100-150-200mm wafer size capable		Metrology
83	Photon Dynamics	Photon Dynamics SV7550 High Speed Color AOI for Printed Wiring Assemblies	SV7550
84	Plasmatherm	Plasmatherm SL-730 PECVD equipment, SL730 CVD processing tool	SL-730	USG	6
85	Quincy	Quincy Compressor Model QGS-30	Model QGS-30	Facility	Any
86	Radiant Surge Technologies	Radiant Surge Technology Solar Simulator, Omron S8VS-06024, SY5140-5GZ
87	Ransco	Ransco Despatch Fast Rate Cycling Chamber Oven with LN2 low pressure injection	Temp Cycle Oven	Chip, PCB Testing	Chip, PCB
88	Rofin	Rofin Laser scribe-EasyScribe F20	EasyScribe F20	Laser Marking	Any
89	RUDOLPH	Rudolph FE-3 Focus Ellipsometer, 4″ 6″ 8″ capable	FE-3	Metrology	4, 6, 2008
90	Schmid	Schmid 4 zone digital controlled conveyorreflow oven (belt can handle up to 8″ wafers	4K14-62C26-4A	Reflow oven Furnace
91	Scientific Computing International SCI	Scientific Computing International FilmTek 4000-A Multiple Layer Thickness Measurement Tool,	Film Tk 4000	Metrology	4,6,8
92	SELA	SELA EM2 precision dicing saw, SEM and TEM		Backend
93	Semiconductor Diagnostics SDI 210	Semiconductor Diagnostics SDI 210, 210E-SPV, FAaST, Wafer Measurement.	SDI 210, 210E-SPV, FAaST,	Metrology	4, 6, 2008
94	SEMITOOL	Semitool SST408 Solvent Chemical Stripping Resist Remover Tool, SST, 6 inch wafer, 2 chemcial tank	SST408	Resist Remove	6
95	SEMITOOL	Semitool SSTF42120F Solvent Chemical Stripping Resist Remover Tool, 6 Inc wafer, 2 chemical tank	SSTF42120F	Resist Remove	6
96	Sencera	Sencera In-line Sputter 6 target large panel DC power supply vacuum & Turbo pump
97	SSEC	SSEC Evergreen M20 Mask, Wafer Cleaner, Solid State Equipment	M20	Mask Clean
98	STS , SPTS, KLA	STS, SPTS ASE Multiplex ICP System, RIE Etch Advanced Silicon Etcher, complete		Dry Etch	150 mm
99	SVG ASML	SVG 8620 & 8636 dual track wafer scrubber, 150mm (6″) wafer size	8620	Coating Litho	150 mm
100	Technical Instruments	AMS 310 Mask Inspection tool	AMS 310	Metrology
101	THERMO SCIENTIFIC	Thermo Scientific ARL-QUANT’X EDXRF Analyzer, XRF Spectrometer (Needs Service)	ARL-QUANT’X
102	Thermo Scientific, Nicolet	THERMO SCIENTIFIC NICOLET 6700 FT-IR SPECTROMETER, MAP300 and Wafer Stage	6700	Metrology	4, 6, 2008
103	TOWA	TOWA FFT1030W System, Liquid resin Model, very very low use time	FFT1030W	Backend
104	VBS	VBS Automatic Dewar Filling Station ADF 10.3, LN2, w/ Chart – MVE, Cryo, 451908	ADF10B	Facilities
105	Veeco	Veeco DEKTAK SXM Atomic Force Microscope, VENT RAK VD6200-99-1637	VD6200-99-1637		8
106	Veeco	Veeco Optical Profiler – Bruker Contour GT-K, EN 61010-1	GT-K
107	Veeco DEKTAK	Veeco DEKTAK SXM Atomic Force Microscope	SXM Atomic Force Microscope	Metrology	6, 8
108	Verteq Wet Bench	Verteq Wet Bench, Oxide Etch, robot arm	Verteq	Wet Etch	8
109	Verteq Wet Bench	Verteq Wet Bench, Nitride Etch, robot arm	Verteq	Wet Etch	8
110	Verteq SRD	Verteq SRD, stand alone	SRD	Wet Etch
111	Von Ardenne	Von Ardenne Sputter, 2 Cluster Tool – Model CF 850S, Turbo pump, Brooks Robot	CF 850S	Sputter, Metal Dep	8
112	WaFab	WaFab Acid Wet Bench		Wet Bench clean
113	Wentworth Lab	Wentworth Lab 0-043-0001 Prober, Lamp, 8″ Wafer Chuck Temptronic TP03000A-2300-1	0-043-0001	Prober	4, 6, 2008
114	Wentworth Lab	Wentworth Laboratory 2803 Wafer Prober, 280X, 450797	2803	Prober
115	Wet Bench	Wet Bench Storage Area, Parts Cleaned		Facility
116	Yield Engineering	Yield Engineering Systems YES-5 Vacuum Oven	YES-5	Vacuum Oven	4, 5, 6, 8
117	Carl Zeiss AIMS	Carl Zeiss AIMS 193 Mask Qualification System w/Coherent LDU ESI 500Hz FT 193nm	AIMS 193	Metrology
118	Zygo	Zygo KMS 450i Mask Inspection tool	KMS 450i	Metrology