Description
Please contact us for the availability of the used semiconductor equipment . The items are subject to prior sale without notice. This items are only for end users.
| 1 | AMAT | COMPLUS 4T | WAFER INSPECTION | 1 |
| 2 | AMAT | PRODUCER SE2 | CVD System | 1 |
| 3 | AMAT | REFLEXION | CMP | 1 |
| 4 | AMAT | REFLEXION SEMES | CMP | 1 |
| 5 | AMAT | REFLEXION SEMES | CMP | 1 |
| 6 | AMAT | SEM VISION G2 | INSPECTION SEM | 1 |
| 7 | DNS | SS3100 | WET CLEANER | 1 |
| 8 | EBARA | FREX 200 | CMP POLISHER | 1 |
| 9 | HITACHI | S9380ii | CD SEM | 1 |
| 10 | KLA-TENCOR | P2H | PROFILOMETER | 1 |
| 11 | KLA-TENCOR | 2810 | bright-field WAFER INSPECTION | 1 |
| 12 | LAM RESEARCH | 2300 METAL 45 | METAL ETCHER | 1 |
| 13 | LAM RESEARCH | 2300 METAL 45 | METAL ETCHER | 1 |
| 14 | LAM RESEARCH | ALTUS | TUNGSTEN CVD | 1 |
| 15 | LAM RESEARCH | ALTUS | TUNGSTEN CVD | 1 |
| 16 | LAM RESEARCH | KIYO 2300 | DRY ETCHER | 1 |
| 17 | LAM RESEARCH | KIYO 2300 | DRY ETCHER | 1 |
| 18 | LAM RESEARCH | VECTOR | PE CVD | 1 |
| 19 | LAM RESEARCH | VECTOR | PE CVD | 1 |
| 20 | LAM RESEARCH | VECTOR | PE CVD | 1 |
| 21 | LAM RESEARCH | VECTOR | PE CVD | 1 |
| 22 | LAM RESEARCH | VECTOR | PE CVD | 1 |
| 23 | NANOMETRICS | ATLAS | THIN FILM MEASUREMENT | 1 |
| 24 | TEL TOKYO ELECTRON | ACT 8 | PHOTORESIST COATER AND DEVELOPER | 1 |
| 25 | TEL TOKYO ELECTRON | ACT 8 | PHOTORESIST COATER AND DEVELOPER | 1 |
| 26 | TEL TOKYO ELECTRON | ACT 8 | PHOTORESIST COATER AND DEVELOPER | 1 |
| 27 | TEL TOKYO ELECTRON | ACT 8 | PHOTORESIST COATER AND DEVELOPER | 1 |
| 28 | ZEISS | CDC 200 | PHOTOMASK TRANSMITTANCE | 1 |
| 29 | Accretech TSK | MHF300L | Test head manipulators | 1 |
| 30 | Accretech TSK | MHF300L | Test head manipulators | 1 |
| 31 | Accretech TSK | MHF300L | Test head manipulators | 1 |
| 32 | Accretech TSK | MHF300L | Test head manipulators | 1 |
| 33 | Accretech TSK | MHF300L | Test head manipulators | 1 |
| 34 | Accretech TSK | MHF300L | Test head manipulators | 1 |
| 35 | Accretech TSK | MHF300L | Test head manipulators | 1 |
| 36 | ADVANTEST | TR6846 | Digital Multimeter | 1 |
| 37 | Advantest | T5335P (Spares) | Spare Boards from test system (See attached list for details) | 1 |
| 38 | Advantest | T5371 | Test system (With a single test head ) | 1 |
| 39 | Advantest | Hifix for PQFP80 (14 x 20) | Hi-fix for Advantest T5371 package type PQFP80 (14 x 20) | 1 |
| 40 | Advantest | T5335P | Boards from an Advantest T5335P Test system | 18 |
| 41 | Agilent | 41501B | SMU and PGU 2 units | 1 |
| 42 | Agilent | 1671G | Logic Analyzer | 1 |
| 43 | Agilent | 1671G | Logic Analyzer | 1 |
| 44 | ANGELANTONI | T600 TU5 | BAKE OVEN | 1 |
| 45 | Angelantoni | T600 TUS | Clean Room Oven | 1 |
| 46 | AP & S | TwinStep-B H3P04 | Semi-Automatic H3PO4 2 stage Megasonic QDR | 1 |
| 47 | Applied Materials | P5000 | CVD System, 2 Chamber TEOS Oxide CVD | 1 |
| 48 | Applied Materials | 0020-0323 REV H | Heat Exchanger | 1 |
| 49 | Applied Materials | Opal 7830i Enhanced | CD-SEM | 1 |
| 50 | Asyst | 1150-V1315S | SMIF Load port 150mm | 1 |
| 51 | Asyst | 1150-V1315S | SMIF Load port 150mm | 1 |
| 52 | Baccini | 35MW Solar Cell Line | Solar Cell Print line for Mono or Poly Crystalline Solar Cells | 1 |
| 53 | Baccini | Screen Printer 2 | screen printer | 1 |
| 54 | Baccini | Screen Printer 3 | screen printer | 1 |
| 55 | Baccini | CHIP AND CRACK CAMERA | Chip and Crack camera | 1 |
| 56 | Baccini | Cell electrical tester | Electrical Cell tester | 1 |
| 57 | Baccini | Dryer 1 | Dryer 1 | 1 |
| 58 | Baccini | Dryer 2 | Dryer 1 | 1 |
| 59 | Canon | FPA 3000 (Spares) | ALS System for FPA 3000 series | 1 |
| 60 | Canon | FPA 5000 ES2+ | 248 nm lithography exposure system | 1 |
| 61 | CentroTherm | DO 12.000-200-FF-HTO-CAN-NT4.0 | Fast Firing Funace with Dryer | 1 |
| 62 | Centrotherm | Centronic E2000 | Horizontal diffusion furnace for POCl3 doping | 1 |
| 63 | COLUSSI | UG 50 E | AUTOCLAVE FOR STERILIZATION | 1 |
| 64 | Credence | Duo SX (Spare Parts) | SPARE PARTS FROM AUTOMATED TEST SYSTEM | 1 |
| 65 | Credence | Personal Kalos I | Test system | 1 |
| 66 | DATA IO | UNISITE 68 | EPROM PROGRAMMER WITH USPIN 84 | 1 |
| 67 | Digital Analysis | PH10 Adjustment system | PH Adjustment system | 1 |
| 68 | Ebara | A30W | Vacuum Pump | 1 |
| 69 | Ebara | A30W | Vacuum Pump | 1 |
| 70 | Ebara | 306W | Turbo pump controller | 1 |
| 71 | Ebara | ET300WS | Turbo pump | 1 |
| 72 | Ebara | 306W | Turbo pump controller | 1 |
| 73 | Ebara | 306W | Turbo pump controller | 1 |
| 74 | Ebara | ET300WS | Turbo pump | 1 |
| 75 | Ebara | ET300WS | Turbo pump | 1 |
| 76 | Ebara | ET300WS | Turbo pump | 1 |
| 77 | Ebara | ET300WS | Turbo pump | 1 |
| 78 | Ebara | ET300WS | Turbo pump | 1 |
| 79 | Ebara | ET300WS | Turbo pump | 1 |
| 80 | Ebara | 306W | Turbo pump controller | 1 |
| 81 | Ebara | 306W | Turbo pump controller | 1 |
| 82 | Ebara | 306W | Turbo pump controller | 1 |
| 83 | EDA Industries | PCBA 05568 REV 1.6 | Pattern test Driver module for BIB oven | 1 |
| 84 | EDA Industries | PCBA 05758 | UBTS Diagnostic Board for BIB oven | 1 |
| 85 | EDA Industries | PCBA 05568 REV 1.6 | Pattern test Driver module for BIB oven | 1 |
| 86 | EDA Industries | PCBA 05431 | DRIVER module for BIB oven | 6 |
| 87 | EDA Industries | PCBA 07009 | PTDM TO ART 200 EXTENDER CARD | 1 |
| 88 | EDA Industries | PCBA 05568 REV 1.4 | Pattern test Driver module for BIB oven | 1 |
| 89 | EDA Industries | PCBA 05568 REV 1.4 | Pattern test Driver module for BIB oven | 1 |
| 90 | EDA Industries | PCBA 05568 REV 1.2 | Pattern test Driver module for BIB oven with 6 drivers | 1 |
| 91 | EDA Industries | PCBA 05568 REV 1.6 | Pattern test Driver module for BIB oven with 6 drivers | 1 |
| 92 | EDA Industries | PCBA 05568 REV 1.3 | Pattern test Driver module for BIB oven with 3 x PSU | 1 |
| 93 | EDA Industries | PCBA 05568 REV 1.4 | Pattern test Driver PCB for BIB oven | 1 |
| 94 | EDA Industries | PCBA 05568 REV 1.6 | Pattern test Driver PCB for BIB oven with 6 drivers | 1 |
| 95 | EDA Industries | PCBA 05568 REV 1.2 | Pattern test Driver module for BIB oven with 3 x PSU | 1 |
| 96 | EDA Industries | PCBA 05568 REV 1.6 | Pattern test Driver PCB for BIB oven with 6 drivers | 1 |
| 97 | Edwards | iQDP80 / QMB1200 | Dry Vacuum Pump combo | 1 |
| 98 | Edwards | iQDP80 / QMB1200 | Dry Vacuum Pump combo | 1 |
| 99 | Edwards | iQDP80 / QMB1200 | Dry Vacuum Pump combo | 1 |
| 100 | Edwards | iQDP80 / QMB1200 | Dry Vacuum Pump combo | 1 |
| 101 | Edwards | iQDP80 / QMB1200 | Dry Vacuum Pump combo | 1 |
| 102 | Edwards | QDP80 + QMB 250F | Dry Vacuum Pump combo | 1 |
| 103 | Edwards | QDP80 + QMB 250F | Dry Vacuum Pump combo | 1 |
| 104 | Edwards | QDP80 | Dry Vacuum Pump | 1 |
| 105 | Edwards | iQDP80 | Dry Vacuum Pump | 1 |
| 106 | Edwards | iQDP40 | Dry Vacuum Pump | 1 |
| 107 | Edwards | iQDP80 | Dry Vacuum Pump | 1 |
| 108 | Edwards | E2M40 FSPX | Rotary Vacuum Pump with oil filter | 1 |
| 109 | Edwards | D150 | Dual GRC unit | 1 |
| 110 | Edwards | D150 | Dual GRC unit | 1 |
| 111 | Electroglas | Horizon 4085X | Prober with an inker | 1 |
| 112 | ELES | ART 200 | Burn In Board testing system | 1 |
| 113 | Elind | KL 1200W | Laboratory Power supply | 8 |
| 114 | Entegris | RSPX-EUV-036 | EUV Reticle stocker | 1 |
| 115 | ESI | 44 | LASER TRIMMER SPARE PARTS | 1 |
| 116 | Extraction Systems | TMB 150 | Photoresist Contamination Monitor System / Total Amine Analyzer | 1 |
| 117 | FORTREND | F6000QS | 6 INCH WAFER TRANSFER | 1 |
| 118 | Fortrend | F6000QS | 6 INCH WAFER TRANSFER | 1 |
| 119 | FSI | Polaris 3500 (Spares) | Spares for DUV photoresist coater / developer track | 1 |
| 120 | Gigi Molina Brevetti Plastici SpA | Custom | Manual wet hood | 1 |
| 121 | Gigi Molina Brevetti Plastici SpA | Custom | Manual wet hood | 1 |
| 122 | Gigi Molina Brevetti Plastici SpA | Custom | Manual wet bench | 1 |
| 123 | GL Automation | IDSCOPE | Wafer bar code reader | 1 |
| 124 | GL Automation | IDSCOPE | Wafer bar code reader | 1 |
| 125 | GL Automation | IDSCOPE | Wafer bar code reader | 1 |
| 126 | GL Automation | IDSCOPE | Wafer bar code reader | 1 |
| 127 | GL Automation | IDSCOPE | Wafer bar code reader | 1 |
| 128 | Gossen Konstanter | IEC625 | Power supply Gossen Konstanter UOP | 1 |
| 129 | Hamamatsu | C7103 | PC Controlled IC Back-side Lapping and Wafer Grinding System | 1 |
| 130 | Hitachi | S9300 | CD-SEM | 1 |
| 131 | Innolas | ILS 700P | Laser Edge Isolation | 1 |
| 132 | Jonas and Redmann | Q2 WHD A | Loader for Centrotherm E2000 furnace | 1 |
| 133 | K Tech Engineering | BK04A | Blister tape applicator for microelectronic components | 1 |
| 134 | KEITHLEY | 487 | PICO AMMETER | 1 |
| 135 | KLA-TENCOR | 2132 | bright-field WAFER INSPECTION | 1 |
| 136 | KLA-TENCOR | 2122 | WAFER DEFECT INSPECTION | 1 |
| 137 | KLA-TENCOR | AIT UV | Dark field wafer particle inspection system | 1 |
| 138 | LAM RESEARCH | 4520 (spares) | REMOTE CART | 1 |
| 139 | LAM RESEARCH | 4520 (spares) | REMOTE CART | 1 |
| 140 | LAMBDA PHYSIK | Novaline K2005 | EXCIMER LASER | 1 |
| 141 | Liebherr | FKV 3610 | Fridge for photoresist | 1 |
| 142 | Mazzali | Climatest C320G5 | Temperature and humidity testing chamber | 1 |
| 143 | Mazzali | Climatest C320G5 | Temperature and humidity testing chamber | 1 |
| 144 | MDA Scientific | System 16 | Toxic Gas Monitor | 1 |
| 145 | MDC (Materials Development Corp.) | DUO CHUCK CSM16 | CV Measurement system | 1 |
| 146 | Microcontrol | MWE Plus | UV Wafer Eraser with cassette loading | 1 |
| 147 | Minato Electronics | 1940 | EPROM Programmer with additional memory | 1 |
| 148 | Minato Electronics | 1940 | EPROM Programmer | 1 |
| 149 | MRL | Black Max | Black max heater element, 850 celcius | 1 |
| 150 | Neslab | HX-2000 | 75 KW Recirculating Chiller | 1 |
| 151 | Oxford Plasma Technology | DP80 | PE CVD | 1 |
| 152 | PMS | Liquitrack 776200 | Non volatile residual Monitor | 1 |
| 153 | Poly Design Inc. | Custom | Heated Quartz Boat storage / drying system | 1 |
| 154 | Rasco | BCU-750 | Brine Chiller | 1 |
| 155 | Rena | Etcher | In-Line Etching System | 1 |
| 156 | Rorze | RR04L90 | Robot | 1 |
| 157 | Roth & Rau | SiNA Plus | PECVD – Deposition of Silicon Nitride | 1 |
| 158 | Roth & Rau | Chiller | Chiller | 1 |
| 159 | Salon Teknopaja OY | PWB | Printed Wire Board Level Drop Tester with Solder Joint Reliability tester | 1 |
| 160 | Sankei Giken | TCW-12000 CV | Process Module Chiller | 1 |
| 161 | SEIKO SEIKI | STP 1000C | TURBO PUMP TMP 100C 250 ISO-K/KF40 | 1 |
| 162 | SEKISUI | VANTEC SIGMA 200 K1 | Antistatic 200 MM Wafer shipping box | 9500 |
| 163 | Seminet | Infinity SACS 251216-120-CE | Semi-Automatic Carousel Boxed Reticle Stocker | 1 |
| 164 | Semitool | ST-921R-AA | Spin Rinse Dryer | 1 |
| 165 | Semitool | ST-240 | Spin Rinse Dryer | 1 |
| 166 | SHOWA | 341 | Laboratory Power Supply – 4 channel | 1 |
| 167 | SHOWA ELECTRONICS | 511-16 | REGURATED DC POWER SUPPLY | 1 |
| 168 | SMC | INR-341-59A | DUAL CHILLER | 1 |
| 169 | SMC | INR-341-61A | Triple Loop Chiller | 1 |
| 170 | Solitec | 5110 | Spin Coater | 1 |
| 171 | SORENSEN | 220 VOLTS | POWER SUPPLY | 3 |
| 172 | ST Automation | test head | test head for Eprom U 1835 | 1 |
| 173 | ST Automation | PTM1 | Flash Memory Tester | 3 |
| 174 | ST Automation | MT32 | Flash Memory Test System | 1 |
| 175 | ST Automation | QT200 | Test System | 1 |
| 176 | ST Automation | QT200 | Tester System with monitor | 1 |
| 177 | ST Automation | R.S.V. | ST Memory Test System Electronic Automation | 1 |
| 178 | ST Automation | QT200 | Automated Tester System with monitor | 1 |
| 179 | ST Automation | QT200 | Automated Tester System with monitor | 1 |
| 180 | ST Automation | QT200 | Automated Tester System with monitor | 1 |
| 181 | ST Automation | QT200 | Automated Tester System with monitor | 1 |
| 182 | ST Automation | QT200 | Automated Tester System with monitor | 1 |
| 183 | ST Automation | QT200 | Automated Tester System with monitor | 1 |
| 184 | ST Automation | QT200 | Automated Tester System with monitor | 1 |
| 185 | ST Automation | QT200 | Automated Tester System with monitor | 1 |
| 186 | ST Automation | QT200 (spares) | boards from qt 200 test system – see attached list | 1 |
| 187 | ST Automation | MT 32 SX | Fully Automated Memory Test System for BIST and NAND Memories | 1 |
| 188 | STS | 320 PC | Reactive Ion Etcher | 1 |
| 189 | SYNAX | SX3100 | Handler Ambient/Hot | 1 |
| 190 | SYNAX | SX3100 | Handler | 1 |
| 191 | System General | T9600 | Universal Device Programmer | 1 |
| 192 | Sytrama | MTM 32 V01 | ST Test Head Manipulator QT 124 | 1 |
| 193 | Sytrama | MTM 32 V01 | ST Test Head Manipulator QT 124 | 1 |
| 194 | Tektronix | TDS694C | Digital 3 GHz real-time oscilloscope | 1 |
| 195 | Tektronix | TDS 544A | Color 4 channel digitizing oscilloscope | 1 |
| 196 | Tektronix | PS 280 | DC Power supply | 1 |
| 197 | Tektronix | 11801C | Digital Sampling Oscilloscope | 1 |
| 198 | Tektronix | 2432A | Digital Oscilloscope, 2 channel, with GPIB | 1 |
| 199 | TEL TOKYO ELECTRON | TE 5480 | Nitride Plasma Reactive Ion Etch | 1 |
| 200 | TEL TOKYO ELECTRON | MB2 730 HT HT | CVD SYSTEM, 2 CHAMBER WSi Process | 1 |
| 201 | TEL TOKYO ELECTRON | MB2 730HT | CVD SYSTEM, 3 CHAMBER WSi Process | 1 |
| 202 | TEL TOKYO ELECTRON | P8 | Wafer Prober | 1 |
| 203 | TEL TOKYO ELECTRON | P8XL | Fully Automatic Wafer Prober (Gold Chuck) | 1 |
| 204 | Teradyne | J994 | Memory Tester | 1 |
| 205 | Teradyne | J971SP (Spares) | Boards from VLSI test system | 1 |
| 206 | United Detector Technology, Inc. | 40X | Laser Power Meter | 1 |
| 207 | Varian | Turbo-V 250 MacroTorr | Turbo Pump DN ISO 100 Type | 1 |
| 208 | Varian | E11040440 Rev 7 | Secondary workstation for implanter | 1 |
| 209 | Varian | Turbo-V 250 MacroTorr | Turbo Pump DN ISO 100 Type | 1 |
| 210 | Verigy / Agilent | V6000e | Test system | 1 |
| 211 | VERTEQ | FLUOROCARBON RD4500 CLASSIC | SRD | 2 |
| 212 | Vision Engineering | Dynascope | Inspection Microscope | 1 |
| 213 | Weiss | TS130 | Thermal shock testing chamber | 1 |
SS5303
