Semiconductor equipment parts

Description

Semiconductor equipment parts in Asia. Valid Time: Subject to prior sale without notice. These items are only for end user.

Used Semicondutor Equipment,Scanner,Stepper,Aligner,Coat and Develop,Dry Etch,Asher,Furnace,RTP,Epitaxy,CVD,PVD,Ion Implant,Wet Etch,CMPC,lean and Dry,Plating,Lapping,Polishing,Slicer,Wire Saw,Ingot generation,ASSY (Back), DicerAssembley(Cut/Bend), Taping,WelderMachine Tool, Others, Anlysis/Measurement,CD Measure(CD-SEM),SEM(Exclude CD-SEM),Microscope,Inspection/Review tools,(Ion)ose , monitor, Measurement(Thickness/Resistivity),Electrical Test,Measurement,Common,Inspection,Test,Measurement.

1	45inst	CXS-2150E	cle: Inq.
2	45inst	SFQZ-404HLSX	cle: Inq.
3	ACCENT	PN4300PC	ELE:ECV profiling
4	ACTIVE	ACT-0LS	Microscope
5	ADC	R6144	Ele: Programmable DC voltage current generator
6	ADC	R6144	Ele: Programmable DC voltage current generator
7	ADC	R6144	Ele: Programmable DC voltage current generator
8	ADC	R6243	Ele: DC voltage generator
9	ADC	R6452A	Ele: Multi meter
10	ADC	TR6141	Ele: Programmable DC voltage current generator
11	ADC	TR6143	Ele: DC voltage generator
12	ADC	TR6143	Ele: DC voltage generator
13	ADC	TR6150	Ele: DC voltage generator
14	ADC	TR6150	Ele: DC voltage generator
15	ADE	6034	Measuring Instrument/Thickness
16	ADEX	AX-170A	Measure/Rs
17	Adixen	ASM182TD	other: 4Helium Leak Detector/4in
18	Adixen	ASM GRAPH D+	OTH:Leak Detector
19	Advantest	R3132	Ins: Spectrum Analyzer
20	ADVANTEST	R5361A	Elec: Freq. Counter
21	Advantest	R6144 32V/160 A	Ele: Voltage current generator
22	ADVANTEST	R6441A	Elec: Digital Multimeter
23	ADVANTEST	R6441A	Elec: Digital meter
24	ADVANTEST	TR5821	Elec: Universal Counter
25	ADVANTEST	TR6845	ELE:Digital Multimeters
26	ADVANTEST	TR6552	ELE:Digital Multimeters
27	ADVANTEST	TR6848	ELE:DIGITAL MULTIMETER
28	Advantest	TR6824	Ele: Multi meter
29	ADVANTEST	TR-6845	Elec: Digital meter
30	AG	HEATPULSE8108	RTP/RTO 8in.
31	Agilent	7500 series	insp: ICP-MS
32	Agilent	1671G	Elec: Logic Analysis
33	Agilent	16702B	Elec: Logic Analysis
34	Agilent	1670G	Elec: Logic Analysis
35	Agilent	89605B	Elec: Module(VXI)
36	Agilent	E1439C	Elec: Module(VXI)
37	Agilent	E8408A VXI mainframe 4slot	Elec: Signal Analysis
38	Agilent	E8491B	Elec: Module(VXI)
39	Agilent	N4220	Elec: Analysis Prober
40	Agilent	N8973A	Elec: Noize Anaiyzer
41	Aixtron	AIX2800G4HT	CVD: MOCVD/2in./4in./6in.
42	Aixtron	CRIUS II	CVD: MOCVD
43	Aixtron	2000/2400HT	CVD: MOCVD
44	AIXTRON	2400G3	CVD: MOCVD
45	AIXTRON	2400G3HT	CVD: MOCVD
46	AIXTRON	2400G3	CVD: MOCVD
47	Aixtron	2400G3 HT	CVD: MOCVD
48	Aixtron	2600G3	CVD: MOCVD(GaAs)/2in.
49	Aixtron	2600G3	CVD: MOCVD/4in.
50	Aixtron	2600G3	CVD: MOCVD/4in.
51	AIXTRON	2600G3	CVD: MOCVD
52	Aixtron	2800G4	CVD: MOCVD/4in.
53	Aixtron	2800G4	CVD: MOCVD
54	Aixtron	AIX2800G4	CVD: MOCVD/6in
55	AIXTRON	CIRCUSⅡ	CVD: MOCVD/4in.
56	AIXTRON	CRIUS II X-L	CVD: MOCVD/4in.
57	AIXTRON	CriusII	CVD: MOCVD
58	AIXTRON	R6	CVD: MOCVD
59	AIXTRON	SAM	CVD: MOCVD
60	Aixtron	TS Crius	CVD: MOCVD/2in.
61	AIXTRON AG	VP508GFR Hot-Wall CVD Reactor	CVD: MOCVD
62	AIXTRON AG	VP508GFR Hot-Wall CVD Second Cell	CVD: MOCVD
63	ALLIED HIGH TECH	TECHPREP	Polisher
64	AMA	SLM-20T	ELE:integrating sphere
65	AMA	SLM-20T	ELE:integrating sphere
66	AMA Optoelectronics	SLM-75T	Ele: Integrating sphere
67	AMAT	AMC-7810	EPI Reactors
68	AMAT	Centura-W	CVD
69	AMAT	Centris	dry: Etcher
70	AMAT	Enabler	Dry Etch
71	AMAT	Produce S	CVD/12in.
72	AMAT	Semvision 200CX	Insp: SEM Defect Inspection
73	AMAT（DNS）	MIRRA3400/AS-2000	CMP(with scrubber)
74	AMAT(Varian)	VSBD302	OTH:Leak Detector
75	AMAYA	AEC2250SP-296	CVD: APCVD
76	AMAYA	AMAX200	CVD: APCVD
77	American Scientific	L1800B	Microscope/Trinocular
78	AMI	SC-8900	Cleaner: Boxes&Cassette
79	AMT	ASL-36B4RM-F	Polisher
80	AMT	ASP-36B4R	Polisher
81	Anelva	ILC-1012	PVD: Sputter
82	ANELVA	ILC-1012	PVD: Sputter/5in.
83	Anelva	ILC-1012	PVD: Sputter/5in.
84	ANELVA	MIG-921	ele: Ion gauge
85	Anritsu	M-215C	Ele: Attenuator
86	Anritsu	MF1604A	elec: Frequency counter
87	Anritsu	MG44A	Elec: Oscillator
88	Anritsu	MG545B	Elec: ynthesizer
89	Anritsu	ML2438A	Elec: Power Meter
90	Anritsu	ML69A	Elec. Voltmeter
91	Anritsu	MS2691A	Elec: Spectrum Analyzer
92	Anritsu	MS420B	Elec: Network Analyzer
93	Anritsu	MT9810A	Elec: Optical Test Set
94	Anritsu	MT9810A	Elec: Optical Test Set
95	Anritsu	MG545A	Other: Synthesizer
96	Apollo Precision	KMA6-R	Microscope: Laser
97	Applied Material	P5000	CVD:Dry Etcher
98	AS ONE	DA1-180M	Microscope
99	AS ONE	HS-50D	Other: Magnetic Stirrer
100	ASIC	EL-A	OTH: ELECTROLUMINESCENCE TESTER
101	ASIC SHANGHAI	SCSS-EL02 Plus	OTH:EL Tester
102	ASM	PE-CVD PXJ-100LH	CVD: PECVD/5in.
103	ASM	E2000	Epitaxial furnace
104	ASM	Epsilon 2000+	Epitaxial furnace
105	ASM	ASM Calibration kit	other: Tester Calibration Kit
106	ASM	WS896	ste: Wafer Stepper
107	ASML	eScan310	Inspection: Wafer
108	ASSI	NA	CLE:Spin Rinse Dryer/4in
109	ASSI	SH-801	Clean: Spin Dryer
110	AST	Peva-600E	pvd: Evaporator
111	AST	PEVA-600I	PVD:Evaporator
112	AST	Peva-600E	pvd: Evaporator
113	AST	Peva-600T	pvd: Evaporator
114	ASTEC	BH-10RV-02	PVD:automatcher
115	ASTRO	VG-828D	Elec:Signal Generator
116	ASTRO	VG-845	Elec:Signal Generator
117	ATEM	CS-114	Elec: Switcher
118	ATM	CMP-910	Polisher
119	Avionics	TVS-8500	Meas: Infrared thermography
120	Avionics	NRW100	Elec: High-freq. Induction Heating
121	Aviza	Celsior	Furnace/12in.
122	AVIZA	Celsior	fur: Atomic Layer Deposition (ALD) systems
123	Axcelis	for GSD implanter	ion: Disk/5in.
124	Ayumi	ES-30DL	Other: Vacuum Sealer
125	B&W TEK inc + Sigma	BWR-20E/55869	OTH:1064 nm laser
126	Bausch & Lomb	StereoZoom4	Microscope/Stereo Zoom
127	BCT	E600	pvd: Evaporator
128	Beijing Beiyi Innovation Vacuum Technology	Inq.	CVD: MOCVD
129	Beijing Beiyi Innovation Vacuum Technology	Inq.	CVD/Plasma
130	BIO-RAD	Q8	Measurement/Overlay
131	Brookfield	LVDV-2+PRO-CP	other: Viscometer
132	BSC Filters	SH4457	oth: High pass filter
133	BSC Filters	SH4458	oth: High pass filter
134	BSC Filters	XN4455	oth: Notch filter
135	BSC Filters	XN4456	oth: Notch filter
136	BTU	Inq.	Furnace/4in
137	B-Well	SV-250	Furnace: vacuum
138	Canon	PLA-501FA	Aligner/3in./5in.
139	Canon	FPA-1550MK-IV	Stepper/6in.
140	Canon	FPA-1550MK-IV	Stepper/6in.
141	Canon	FPA-1550MK-IV	Stepper/6in.
142	Canon	MPA-500FAB	Aligner/5in
143	Canon	MPA-600FA	Aligner/5in
144	Canon	PLA501FA	Aligner/5in.
145	Canon	PLA-500F	Aligner:Mask/4in
146	Canon	PLA-501	Aligner:Mask/4in
147	Canon	PLA-501F	Aligner
148	Canon	CDS-630	COA:developer
149	Canon	MC-2	Cle: Mound crusher
150	Canon	G-LINE STEPPER FPA-1550M2	Stepper
151	Canon	G-LINE STEPPER FPA-1550M3	Stepper
152	CANON	I-1230	PVD/12in.
153	Canon	850670H-0312	Other: LABVIEWUPGRADE
154	CANON ANELVA	ANELVA1051	PVD: Sputter
155	CANON ANELVA	ILC-1051	PVD:Sputter/6in
156	Canon-anelva	I-4100SV	Dry etcher
157	Canon-anelva	I-4100WR	Dry etcher
158	Canon-anelva	I-4100SV	Dry: SiN/Plasma etcher
159	CATC	USB TRAFFIC GENERETOR	Ele: USB TRAFFIC GENERETOR
160	CATC	Advisor	Oth: USB 2.0 Bus & Protocol Analyzer
161	CBC	VM-10A-M	other: Viscometer
162	CDS Epitaxy	EpiPro 5000	EPI: Epitaxy Reactors/6in
163	Cho-onpa	UJ-246-1C	other: Wire pulltester
164	Chroma	19073	Inspection: Pressure tester
165	Chroma	Inq.	Inspection: Pressure tester
166	ChromTech	JA-5103N	OTH:Electronic Balance
167	CMIt	SAPPAS -V5-plus	Insp: PSS AOI
168	CMIt	SAPPAS-V7	Insp: PSS AOI
169	COMPUTEX	32M41	Oth: In-circuit debugger
170	Corial	300IL	Dry: ICP
171	Corial	Corial 300IL	DRY:ICP Etcher
172	DAGE	2400A	OTH:WIRE PULL TEST MACHINE
173	DAGE	3000	oth: Wire pull Tester
174	DAGE	BT-24	Other: Bond Tester
175	Dage/Nordson	SERIES 4000	Other: Bond tester
176	Daitron	WBM-210	POL:chamfering machine
177	DAITRON TECHNOLOGY	Custom order	Coater/5in.
178	DALTON	Inq.	Cleaning draft: SPM
179	Data Systems	ALP-7012LA	Other: LD DRIVER
180	DELATECH I	CDO 858IV-2 C/W	oth: Scrubber
181	Ding Jing	VM-200	Inspection/Precision two-dimensional visual
182	Disco	DFG-83H/6	CMP: Grinder/5in.
183	Disco	DCS141	oth: Cleaning machine/Wafer
184	DISCO	DAS8920	LAP:Surface Planer
185	Ditect	RDF-D3	Other: Hi-speed camera
186	DKL	RU-700	Inspection: Review/Defect
187	DNK	MA4201	Aligner
188	DNS	SKW-636-BV	Coater/Developer/5in
189	DNS	SS-W60A-AVR	oth: Wafer Scrubber
190	DNS	SSW-629_B	other: Wafer scrubber
191	DNS	CW-1500	cle: Wet Station
192	DNS	FC-821L	Cle: Wet Station/8in
193	DNS	FC-821L	Cle: Wet Station(PFC)/8in
194	DNS	FC-821L	Cle: Wet Station(PFC)/8in
195	DNS	FC-821L	Cle: Wet Station(PFC)/8in
196	DNS	FC-821L	Cle: Wet Station(PFC)/8in
197	DNS	FS820	Cle: Wet Station(UTC)　/8in
198	DNS	MP3000	Cle: Wet Station/12in
199	DNS	VL-M6000	Measurement/Thickness /6in.
200	DNS	VL-M6000	Measurement/Thickness /6in.
201	EBARA	FREX300	CMPsystem
202	Ecomott	サーモロイドPro　Ver１	OTH:Body temperature screening solution Thermoroid pro
203	ECOSYS	ECOSYS/Vector	OTH:Scrubber
204	EDWARDS	EDWARDS/GRCD	OTH:Scrubber
205	EIKO007/909	L0011Lamp.115V.PTC	Insp: EpimetⅡ lamp/125V 250W
206	Eisco	Inq.	Microscope/Vernier
207	ELDIM S.A.	XL88	Ins: Contrast Machine
208	EMCORE	E400	CVD: MOCVD
209	ENDO/Iwatsu	TT-506	ele: Curve Tracer
210	ENI	OEM Series	Ele: RFgenerator
211	ESPEC	TSA-71H-W	OTH:Thermal Shock Testing
212	ESPEC	TSA-201S-W	OTH:Thermal Shock Testing
213	Espec	TSA-71H-W	other: Thermal shock tester
214	ESPEC	TSB-2	Other: Thermal Shock Chamber
215	ETAC	NT510	mea: Temperature cycle tester
216	ETAC	NT2031W	Other: Temperature Cycle Chamber
217	ETE	ETD-62DF	Clean: Spin Dryer
218	EV Group Europe & Asia/Pacific	EVG40NT	Measurement/Semi-Automated
219	Everfine	KF-2	Other: Switching Transistor Selector
220	Everfine	KF-2	Other: Switching Transistor Selector
221	EVG	EV620	Aligner/Mask/6in.
222	EVG	EVG620	Aligner/4in.
223	EVG	EVG6200594	Aligner: Semi-Automated Bottom Sude Mask Aligner
224	FEI	DB235	sem: Focused Ion Beam System
225	FEI	FIB 800	sem: Focused Ion Beam System
226	FEI	V460L	SEM (Scanning Electron Microscope)
227	FEI	Verios 460L	SEM/Scanning Electron Microscope
228	FISCHER	XMDVM-T7.1-W	Measurement/Thickness
229	Fluke	51	Meas: thermometer
230	Fluke	83 SERIESⅢ	Ele: Multi meter
231	Force Precision	S8	Microscope: AFM
232	FSE	FU-16PEB	pvd: Evaporator
233	FSE	FU-20CE	pvd: Evaporator/4in
234	FSE	FU-20PEP	pvd: Evaporator/4in
235	FSE	FU-20PEB-1200	pvd: Evaporator/4in
236	FSE	FU-20PEB-1250	pvd: Evaporator/4in
237	FSE	FU-12CE	pvd: Evaporator/4in
238	FSE	FU-12CE	pvd: Evaporator/4in
239	FSE	FU-16CE	pvd: Evaporator/4in
240	FSE	FU-20PEB-RH-1200	pvd: Evaporator/4in
241	FSE	FU-20PEB	pvd: Evaporator/4in
242	FSE	FU-20PEB-1300	pvd: Evaporator
243	FSE	FU-16PEB	pvd: Evaporator
244	FSE	VTI-16C	pvd: E-Beam Evaporator System
245	FSE	VTI-16C	pvd: Evaporator
246	FSI	K120	Clean: Rinser Dryer/2.5in.
247	FTD	0.8*0.8 TR test socket and socket board	other: PCB Components and Test Station Socket
248	FU LIN TECH	FU-16PEB-ITO	PVD: Evaporator
249	FUJI ADVANCED Corp	FA-7SR	CLE:spin dryer
250	Fujita	APE904Ⅱ	Ele: Diode DC energizer
251	fujita	APE-PWIGBT	OTH:Bias tester
252	Fujita	FTH-100	other: Tharmalfet tester
253	FUKUDA	MSX-5086	Other: Leak Detector
254	GEMINI	3E	EPI reactor/4″-6″
255	Gentec-EO/thorlabs	CL-25/MVL50M23	INS:Beam profiler/Beamage-4M
256	Giant Force Instrument Enterprise	Inq.	Other: High / low temperature test equipment
257	GIGA TRONICS	80301A	Ele: Power sensor
258	GIGA TRONICS	8542B	elec: Power meter/dual
259	GIGAMAT	3806	Polisher
260	GW	GDM-8145	Elec: Digital meter
261	GW	GDM-8145	Elec: Digital meter
262	GW	GDM-8045	Elec: Digital meter
263	GW	GDM-8145	Elec: Digital meter
264	HACH	2100P	OTH:Turbidimeter
265	HAMAI	3BF2	Lapping
266	Hamamatsu	C7103	Polisher: IC back surface
267	Hamamatsu	C9334-01etc	Ins: FFP measurement unit
268	Hayashi-Repic	LAA-150UE	other: Light Source
269	Hayashi-Repic	Luminar Ace	other: Light Source
270	HelmutFischer	XDL-B	MEA:film thick test instrument
271	HILA	CHT-6A	Other: Thermometer
272	HIOKI	3531 Z HiTESTER	ELE: Impedance analyzer
273	Hioki	3127	Other: Clamp on tester
274	HIOKI	3158	OTH:Voltage HiTester
275	Hioki	3805	other: High Tester
276	HIOKI	LR8431	OTH:Memory High Logger
277	Hirayama	PC-204RⅢ	other: Pressurecooker
278	Hitachi	M308	Dry Etch/6in
279	Hitachi	M318	DRY:Gate etch
280	Hitachi	M-308A	Dry etcher/5in
281	HITACHI	UA3150A	Asher: U/V OZONE
282	HITACHI	UA3150A	Asher: U/V OZONE
283	HITACHI	UA3150A	Asher: (UV&O3)without Wafer
284	HITACHI	UA3150	Asher/Stripper
285	Hitachi	UA-5200A	Asher: O3/8in.
286	Hitachi	UV-7200	Asher: O3/8in.
287	HITACHI	FITZ	Waf: Film and Sheet Forming
288	Hitachi	S-6100	CD-SEM/6in.
289	HITACHI	S-6200H	CD-SEM
290	HITACHI	S-6200H	CD-SEM
291	HITACHI	S-6200H	CD-SEM
292	Hitachi	S-2500C	SEM
293	Hitachi	S-2300	SEM:Scanning electron microscope
294	Hitachi	S-2600N	SEM/Scanning electron microscope
295	HITACHI	S-3000H	SEM
296	HITACHI	S-4500	SEM/5in
297	Hitachi	IS3000	Inspection: Dark field
298	Hitachi	LS6800	Inspection: Wafer surface
299	Hitachi	PD-2000	Inspection: Reticle Surfscan
300	Hitachi	U-2000	Insp: spectrophotometer
301	Hitachi	U-2010	Insp: spectrophotometer
302	HITACHI	WI-890	Inspection/Wafer Visual /6in.
303	Hitachi	Z-5310	Insp: spectrophotometer/flame
304	Hitachi	Z-5010	Insp: spectrophotometer/Zeeman
305	HITACHI	VC-6023	Elec: Oscilloscope
306	Hitachi	EC-45MHPS	OTH:temperature and humidity Testing Chamber
307	Hitachi	ES-76LH	other: Thermal shock tester
308	Hitachi	I-20 MI-SCOPE-120	Other: Ultrasonic scan analyzer
309	Hitachi Power Solutions	mi-scopeMI-25	OTH:Ultrasonic imaging equipment
310	Hi-Tech Furnace	H4-7074	Furnace: Horizontal oxidation
311	HM	9010	Measure/Rs
312	HMI	eScan310	Inspection: Wafer
313	HMT	MFS-630	MEA:Distributed Bragg Reflector
314	Hoe ie	HIME8048	Cleaner/Parts
315	Horiba	EMAX-5770	Inspection: X-ray Microanalyxer
316	HORIBA	LB-500	Insp.: Size Analyzer
317	HOZAN	L-50	Microscope/Stereo
318	Hozan	DT-510	Meas: thermometer
319	HP	4062UX	Insp: Parametric Tester
320	HP	8153A	Meas: Optical Power Meter
321	HP	16500C	Elec: Logic Analyzer
322	HP	3488A	Elec:Frame controller
323	HP	4140B	ele: pA METER/DC VOLTAGE SOURCE
324	HP	4279A	Elec: CV Meter
325	HP	437B	Elec: Power Meter
326	HP	8405A	Elec: Voltmeter
327	HP	8508A	Elec: Vector Voltmeter
328	HP	8594E	Elec: Spectrum Analyzer
329	HP	87510A	Elec: Grain phase analyzer
330	HP	8752C	Ele: Network analyzer
331	HP	E4425B	Ele: signal generator
332	Humo	A-QB-210	Other: Blank Frequency Sorter
333	HUMO Laboratory	A-QB-150B	Elec: Crystal Blank Frequency Auto-Sorter
334	Hyoukaken	MK-USL-3S	Polisher/3B
335	Hyoukaken	MK-USL-3S	Polisher/3B
336	IMADA	SVF-500NA-SL	OTH:Tensile and Compression Testing
337	INFICON	UL1000	other: 4Helium Leak Detector/4in
338	inq.	TM06ASI10	PVD:sputter gun/6in
339	Inq.	Inq.	Microscope / Protect cover
340	Inq.	Inq.	Microscope / Protect cover
341	Inq.	OM Loader Spot Light	Microscope
342	Inq.	Inq.	Inspection: Wafer/4in.
343	Inq.	LE12520RNN	Meas: Temperature recorder
344	Inq.	TVS-110	Meas: Handy thermo
345	Inq.	AE043-01	Elec: Resistance Measurement
346	Inq.	Inq.	Ele: Socket resistance meter
347	inq.	EL140	OTH:EL Tester
348	Inq.	Inq.	Other: RPT
349	Inq.	Inq.	Other: Cleaning device
350	Inq.	Inq.	Other: Storage facility
351	Inq.	Inq.	other: Depth Gauge
352	Inq.	Inq.	Other: Performance Board
353	Inq.	JTXBJ-075	Other: Inq.
354	Inq.	LTA-330A	Other: Wafer Lifetime Measuring/5in.
355	IPEC/WESTECH	472	Polisher:CMP
356	IPI	IPI/ESC	OTH:Scrubber
357	Isothermal	VENUS 125B	Other: Thermometer Calibrator
358	iTEC	AP-20-3S-OP/AP-20-3S-BT	OTH:OP tester
359	IWATSU	DS-8623	ELE:DIGITAL STORAGESCOPE
360	Iwatsu	FC-8841	Elec: Freq. Counter
361	IWATSU	OS-8608	ELE:DIGITAL STORAGESCOPE
362	IWATSU	SC-7202	ELE:UNIVERSAL COUNTER
363	IWATSU	SS-7821	Elec: Oscilloscope
364	Iwatsu	VOAC757	Elec: Digital Multimeter
365	Iwatsu	VOAC7513	Ele: Multi meter
366	Iwatsu	VOAC83	Ele: Multi meter
367	JADEVER	LPWN-1530	Other: Elec. Balance For Analysis
368	JAI	JHS-100	Insp.: Purge & Trap Sampler
369	Japan Barrel Industry	C-3	Polisher
370	JDSU	RM3750	Ins: Optical Back Reflection Meter
371	JEOL	JWS-7555S	SEM
372	JEOL	JXA-8800R	ELE:EPMA
373	JOEL	JEM-2100F	sem: TEM
374	JOEL	JEM-2100F	sem: TEM
375	JOEL	JEM-2100F	sem: TEM
376	JTK	JTK-DIG32	other: Leakage tester
377	JTK	JTK-DIG32	other: Leakage tester
378	JTK	JTK-DIG32	other: Leakage tester
379	JTK	JTK-DIG32	other: Leakage tester
380	JTK	JTK-DIG32	other: Leakage tester
381	JTK	JTK-DIG32	other: Leakage tester
382	JTK	JTK-DIG32	other: Leakage tester
383	Jusung	JSA-1111-02	CVD: MOCVD
384	Jusung	Eureka 2000	CVD: Low Thermal/8in
385	K & W (KARL SUSS)	MA-1006	Aligner: Mask
386	KANKEN	KT/F5	OTH:Scrubber
387	KE	DD-825V-6L	Furnace
388	KE	DJ-825V-6L	CVD
389	Keithley	7001	Meas: Switch Control Unit
390	Keithley	7001	Meas: Switch Control Unit
391	KEITHLEY	KEITHLEY236	ELE:SMU
392	Ken-A-Vision	T-19541C-230	Mic: Digital comprehensive Scope
393	Kenwood	G8D-380HB	Elec: Signal generator
394	Keyence	VH-5000	Microscope
395	KEYENCE	VK-8510	Microscope
396	Keyence	CV-X290A	Insp: vision sensor
397	KEYENCE	LS-9500	Measuring:high-precision dimensional
398	Keyence	LC-2101	OTH:laser displacement meter
399	Keyence	LC-2210	OTH:laser displacement meter
400	Keysight	89441A	ele: Vector signal analyzer
401	Keysight	E2373A	Ele: Multi meter
402	Keysight	E2378A	Ele: Multi meter
403	Keysight	N5302A/N5343A	ele: DigRF Exerciser
404	Kikusui	DME1500	Ele: Multi meter
405	Kikusui	TOS8700(10kV[AC/DC])	ele: Hipot Tester
406	KINGSEMI	KS-S150-3C	Coater/Developer
407	KLA	7500	Inspection: Surfscan
408	KLA	Candela CS10R	Inspection equipment
409	KLA	ES-32	Inspection: Surface/12in.
410	KLA	SURFSCAN 7700	Inspection: Particle Analyzer
411	KLA	ZETA-300	Insp: Optical profiler/3D
412	KLA	ZETA-200	Insp: Optical profiler/3D
413	KLA / TENCOR	eS32	Inspection: Electron-beam/ Wafer
414	KLA Tencor	Candela CS10R	Inspection/Defect
415	KLA Tencor	CS920	Inspection device
416	KLA Tencor	KLA2135	Inspection/Defect
417	KLA Tencor	KLA-HRP-P350	INS:Profile meter
418	KLA/ICOS	CI-T620	Inspector
419	KLA-TENCOR	7600	Inspection: Surfscan
420	KLA-TENCOR	KLA-5500	Inspection system
421	KLA-Tencor	P-20H	Insp.: Profiler/Depth Measurement 8in
422	KLA-Tencor	SFS 6420	insp: Particle inspection/ 8in.
423	KLA-Tencor	SFS 7700	insp: Particle inspection system
424	KLA-Tencor	SFS6200	Inspection: Defect
425	KLA-TENCOR	5011	MEA:Washing
426	KLA-Tencor	FT750	Meas./Thickness/8in.
427	KLA-Tencor	FT-750 PRMX01	Meas./film thickness
428	K-Mac	STCM-7392AGL	Meas: Optical film thickness/Rs Meter+Color
429	Kohzu	K2-200	OTH:Flatness measuring
430	KOKUSAI	RAM61000	Asher
431	KOKUSAI	CX1000	fur: Controller for DD802V
432	Kokusai electric	CX1204	oth: Exhaust Controller
433	KOKUYO ELECTRIC	SCT-5T	ELE:curve tracer
434	Konica Minolta	CS-2000A	Insp: Spectroradiometer
435	KOYO	SC9-1000-3	Furnace/5in.
436	KOYO	VF5300B	Furnace: Alloy/8in.
437	Kurashiki kako	MICRO-ｇ	Other: surface plate
438	Kyowa riken	K-705RS	elec: Four-probe measuring instrument
439	LAM	490	Dry etcher/5in
440	Lam	490	dry: Etcher/6in.
441	LAM	590	Dry etcher/5in
442	LAM	NITRIDE AUTOETCH490	Dry Etcher
443	LAM	GEMINI2	EPI Reactors
444	LAM	LAM2300	Dry: Etching system/12in.
445	Lam Research	Rainbow 4428	Dry: Poly Nitride Etcher
446	LASERTEC	VH2000	CD-SEM/5in.
447	LEAD	1MHz	Elec: Freq. Reference
448	Leader	LDC-822A	Elec: Freq. Counter
449	Lecroy	9344C	Elec: Oscilloscope
450	Lecroy	Bus doctor USB1.1 and 2.0 Adaptor USB BOX	Elec: Analyzer
451	Lecroy	CATC3 Bus doctor DR－108－FIT－USB	Elec: Analyzer
452	LeCroy	LC574AL	ELE:Oscilloscope
453	Leica	Reichert Division	Microscope
454	Leica	Stereo Zoom 4	Microscope
455	Leica	MIS-200	Inspection/Defect
456	Lintech	M2220-46	Cleaning system: IPA CARRIER
457	Logitech	LP70(1WBS7)	CMP
458	LUCAS LABS	IB420	Elec: Mass Spectrum Analyzer
459	LUCAS LABS	IB420	Elec: Mass Spectrum Analyzer
460	Lumonics	WAFERMARK 345	other: Wafer marker/5in
461	LY-MI	Inq.	Other: Blank Sorter
462	LY-MI	Inq.	Other: Blank Sorter
463	M.SETEK	MS-132	Coater: Spin/SOG
464	Macoho	W8MN-P052(マルチサフェースJr.)	WET blast processing cell equipment
465	Materials Research(MRC)	METAL ECL360 SP01	pvd: Sputter
466	Matsunaga	TA-1010	Elec: Constant-voltage Power Supply
467	Matsuzawa	MMT-X7A	Other: Hardness Tester
468	MATTSON	AST3000	RTP/12in.
469	MATTSON	Helios	RTP/12in.
470	MAURY MICROWAVE	1819B	Oth: Stub tuner
471	MAURY MICROWAVE	8045C	Oth: Slide screw tuner
472	Meiji techno	EMZ	Microscope
473	MEISHO	MS-9000GTIR	Other: BGA Rework Station
474	Metron	HTC-8010	Cleaner: Boxes&Cassette
475	Mettler Toledo	TMA SDTA 1 LF/1100	Meas: Thermo-Mechanical Analyser
476	Michinokumachinery	Inq.	Other: strength tester
477	Micro Modular System	MERA-VT-A.A-MIMu	other: Semi-Automated Panel Test Machine
478	Micronix	MSA338	Elec: Spectrum Analyzer
479	Micronix	MMD850	oth: Microwave detector
480	Microtrac	MT3100II/SDC	OTH:Particle size distribution analyzer
481	Mimasu	MSE-2000F2	dry: Si etcher
482	Mimasu	MSE-2000FC	Cleaner: SC1
483	MINI-CIRCUITS	ZHL-4240	Oth: High frequency amplifier
484	MIRUC	Inq.	Microscope
485	MISUMI	MSND2.3-30	OTH:Temperature Sensor
486	MISUMI	MSND2.3-30	OTH:Temperature Sensor
487	Mitsutoyo	QV404	Microscope: Quick Vision System
488	Mitutoyo	MF-シリーズ	Microscope
489	MITUTOYO	MF-UD1010B	Microscope
490	MITUTOYO	TM-250	Microscope/Tool
491	Mitutoyo	M-Plan Apo 5X	INS:microscope objective lens
492	Mitutoyo	M-Plan Apo 10X	INS:microscope objective lens
493	Mitutoyo	M-Plan Apo 20X	INS:microscope objective lens
494	Mitutoyo	M-Plan Apo SL50X	INS:microscope objective lens
495	Mitutoyo	CD-45C	OTH:vernier calipers
496	MITUTOYO	ID-C112C	Other: Digimatic Indicator
497	Mitutoyo	Inq.	Other: Cage Block
498	MITUTOYO	inq.	OTH:CNC VISION MEASURING SYSTEM
499	Mitutoyo	LEGEX574	Other: CNC Image measurement /3D
500	Mitutoyo	PJ300　302-926	Other: Projector
501	Molecular Analytics	2427052-8	other: Multiopoint Sampling System
502	Motic	SMZ-140	Microscope: General
503	MSETEK	VRD-8000	COA:Developer
504	MT/Hitachi-hitech	Inq.	Other: EEPROM meas. board
505	MTK	CL61D102	Cleaning equipment/4-6in
506	Multitest	BGA1.6*1.6 test kit	Other: Kit
507	Multitest	TEST KIT for 0.8*0.8	Other: Kit
508	Murakamishikisaigijutsu	HM-150	OTH:haze meter
509	NANOMETRICS	NANOSPEC VT-210	Meas./film thickness
510	NANXUANKEJI	Inq.	Clean tool
511	NAPSON	RT-70V	Mea:Resistivity meter
512	Napson	NC-80M	Ele: resistance meter
513	Napson	RG-80	Ele: resistance meter
514	NAPSON	RT-70	MEA:resistivity meter
515	NARDA	3752	Oth: PHASE SHIFTER
516	NBS TECHNOLOGIES	WPC EVO	lap: Wafer Packing/12in.
517	NEC	NK-1	Ele: Static electricity measurement
518	NEC	QB-78F1026-ZZZ	Ele: In-circuit emulator
519	Newport	708 8-Channel	Ins: Butterfly Fixture
520	Newport	2832C	Ele: Power Meter
521	NF	WF1946B	Elec:Signal Generator
522	NF	1650	Oth: Pattarn synthesizer
523	NF	CK1620	Oth: Clock synthesizer
524	NF	CK1615	Oth: Clock synthesizer
525	NF	ES2000B	Oth: Power environment simulator
526	NF	ES2000S	Oth: Power environment simulator
527	NF ELECTRONIC　INSTRUMENTS	M-177	ELE:VOLTMETER
528	NF Electronics Instruments	5020	ELE:Frequency Response Analyzer
529	Nicolet	ECO-8S	INS:SPECTROMETERS
530	Nidec	R-5520ix	Elec: Insulation inspection
531	Nihon Koshuha	RW-1000E	Other: High-freq. Induction Heating
532	Nikka	GP-1-T	INS:Goniophotometer
533	Nikon	NSR-1755i7	Stepper/6in
534	Nikon	NSR1505G3A	Stepper/5in
535	Nikon	NSR-1505G4D	Stepper/5in
536	NIKON	NSR 1505G4D	Stepper
537	Nikon	NSR-1755i7	Stepper
538	Nikon	NSR-2205EX12B	Stepper/KrF
539	Nikon	NSR-2205i11D	Stepper
540	Nikon	NSR2005i8A	Stepper/8in
541	Nikon	NSR-S208D	Stepper:Lithograophy
542	Nikon	ECLIPSE l200	Microscope
543	Nikon	Inq.	Microscope
544	Nikon	Inq.	Microscope
545	Nikon	M33	Microscope
546	Nikon	ME600	Microscope
547	Nikon	ME600	Microscope
548	Nikon	MICROPHOT-FXL	Microscope
549	Nikon	MM60	Microscope
550	Nikon	OPTIPHOT　300	Microscope
551	Nikon	OPTIPHOT-88	Microscope/8in.
552	Nikon	SM5	Microscope
553	Nikon	SMZ800	Microscope
554	Nikon	SMZ800	Microscope
555	Nikon	SMZ-U	Microscope
556	Nikon	NWL-860	Inspection: wafer
557	NIKON	OPTISTATION-3A	Inspection: Wafer
558	NIKON	OST-3-2FM	Inspection: wafer
559	NIKON	OST-3-2F	Inspection: wafer
560	Nikon	6D	Other: Autocollimator
561	Nikon	V-12	OTH:projector
562	Nikon	V-128	other: Profile projector
563	Nikon	V-12	Other: Projector
564	Nikon	VMR-H3030	Other: CNC measurement
565	Nikon	VMZ-R3020	Other: CNC Image measurement /QV
566	NIPPON SANSO CORPORATION	BMC-311	CVD:MOCVD/4in
567	Nissin	NH-20SR	Ion: Implanter(M/C)/5in
568	NMC(North Microelectronics)	ELEDE 380	Dry: ICP Etcher
569	NODAX	AM-342	Elec: Voltmeter
570	Noiseken	ESS-603003 18KG	Ele: ESD tester
571	Nomura	PSM70	Slicer/Multi Blade
572	Nordson	X2.5	Insp: Auto X-Ray Inspection System
573	Nordson	XNC-S600	Insp: Auto X-Ray Inspection System
574	Nordson	XNC-V600	Insp: Auto X-Ray Inspection System
575	Nordson	YTX-X2	Insp: Auto X-Ray Inspection System
576	Nordson	DAGE4000	OTH:BOND TESTER
577	North Sutton NH	LMS-050CM	Meas: Labsphere
578	NSK	HM-90	other: Micron Depth Tester
579	NTS	NSB-1050	Wafer: waxing machine
580	NTS	NSL-2024	Wafer: Polisher
581	Ogasawara Precision	GRT-04	OTH:Gear Meshing Tester
582	OHAUS	EX2202G	oth: Electronic scale
583	Okamoto	ASM-1HB	Slicer
584	Okamoto	ASM-1HB	Slicer
585	OLYMPUS	AL100n	Microscope
586	Olympus	BH2-RFL-T2	microscope
587	Olympus	BH2-MJL	microscope/Metallurgical
588	Olympus	BH2-UMA.SZ40	Microscope
589	Olympus	BH2-MJLT	Microscope
590	Olympus	BH2-UMA	Microscope
591	OLYMPUS	BH3-MJLT4	Microscope
592	Olympus	BH3-MJL	Microscope
593	Olympus	BHMJL	Microscope
594	Olympus	BHM-MD	Microscope
595	Olympus	BX51	Microscope
596	Olympus	BX60	Microscope
597	Olympus	Inq.	Microscope
598	Olympus	Inq.	Microscope
599	OLYMPUS	MX50L-TF	Microscope
600	Olympus	MX50	Microscope
601	Olympus	MX50L-TF	Microscope: Metallographic
602	Olympus	MX63-F	Microscope
603	Olympus	MXN-6R	Microscope
604	Olympus	MXN-6R	Microscope
605	Olympus	STM	microscope/Single-lens
606	OLYMPUS	STM-UM	Microscope: Measuring
607	Olympus	STM6-F10-3	Microscope
608	Olympus	STM-UM-BDZ	Microscope
609	OLYMPUS	STM-UM	Microscope/Tool
610	Olympus	SZ4045	Microscope
611	Olympus	SZ4045	Microscope
612	Olympus	SZ4045	Microscope
613	Olympus	SZ61	Microscope
614	Olympus	SZ61	Microscope
615	Olympus	SZ6045	Microscope
616	Olympus	AR2060	Measure: Line width/MCD
617	Optical Gaging	Smartscope ZIP 250	Measuring system: 3D multisensor dimensional
618	OPTORUN	OTFG-1000C	pvd: Sputter/4in.
619	ORSA	AOS303-445-30	OTH:Single-mode fiber blue light source
620	ORSA	HPB455-3	OTH:Multimode Fiber Blue Light Source
621	OSI	METRA 2100m	Inspection: Overlay/6″
622	OSI	METRA II	Inspection: Overlay/6″
623	Otsuka	QE2100	OTH:Quantum Effect Measurement System
624	Otsuka	RETS-1100ML	other: GAP measuring machine
625	OXFORD	Plasmalab 800Plus	CVD: PECVD/4in
626	oxford	Aztec X-Max 80T	Insp: EDS for TEM
627	OYO	AITOS	OTH:Light Source
628	OYO	AW1050	OTH:light source
629	OYO	AW1050	other: Light Source
630	Panasonic	E600L NM-EFE2AA	Dry Etcher
631	Panasonic	VP-7725B	Elec: Audio Analyzer
632	Panasonic	VP-8311A	Ele: signal generator
633	Panasonic	Panadac944A-210	Other: Coplanarity check system
634	Park Systems	XE15	Microscope: AFM(Atomic force microscope)
635	PARMI	3D-XCEED	Inspection: AOI
636	Pearl	AC-140F	Other: Autocollimator
637	Peide	EL-1.4MD-AS	OTH:EL Tester
638	Perkin Elmer	Lambda 900	Ins: Spectrometer
639	Perkin Elmer	D88647	Elec: Cooling Tool
640	Perkin Elmer	SIMAA6000	Elec:Atomic absorption spectrometer
641	Perkinelmer	Spectrum One	Microscope: Infrared
642	PerkinElmer	PinAAcle 900F	Insp: Spectrometer/Atomic absorption
643	PerkinElmer	SIMAA6000	Ins: Atomic absorption spectrometer
644	PerkinElmer	AANALYST 200	Elec: Spectrometer
645	Philips	IR3100	Ins: Infrared depth measuring systems/12in.
646	Philips	IR3100	Other: Wafer Infrared Depth Measuring Instrument/12in.
647	Plasma Sciences	RIE-600W	DRY:REACTIVE ION ETCHER
648	Plasma systems	DES-206	Asher
649	Production Technology Center Kyushu	Inq.	Other: Substrate strength tester
650	PROTEC	MTG-08A	OTH:Metal mask tension gauge
651	PSK	PSC354 ESA405	Dry Etcher
652	PSK	PSC354 ESA407	Asher
653	QES	DIS-8000	Inspection: Optical
654	Qingdao Jing Cheng	Inq.	Dry : Eching machine
655	Quicksun	820A	OTH:Power Simulation Test
656	Quintel	Q4000-4	Aligner
657	Quintel	Q4000-4TL	Aligner/4in
658	Quintel	Q4000-4	Aligner: Exposurer
659	R&K	AA160-RS	Other: RF Power Amplifier
660	REVERA	RVX1000	Meas./film thickness
661	Rheometric Scientific	RDA III	Elec: Dynamic Analyzer
662	RHESCA	PTR-10	OTH:Bond tester
663	Rhesca	PTR-1000	oth: Bonding tester
664	ROBERT	RO-27	Other: Aging machine
665	Rohde & Schwarz	Inq.	Oth: Radio tester
666	RSVI Inspection	WS-3800	Inspection: wafer
667	Rudolph	NSX320	INS:AOI
668	RUDOLPH	NSX100	Inspection/Defect/6in
669	RUDOLPH	metapulse@200 mm	Measuring instrument/Metal film thickness
670	Rudolph	MP300	Meas./Thickness
671	Rudolph	MP300	Meas./film thickness 12in.
672	S.E.Techno	BHF oxide remove	cle: Auto oxide remove/8in
673	S.E.Techno	RCA clean	Clean system: Auto/8in
674	SAMCO	RIE-200IPC	Dry: ICP Etcher
675	SAMCO	RIE-200ip	Dry etcher
676	Samco	RIE-10N	Dry etching:RIE equipment
677	Samco	PC-300	Ash: Stripper
678	SAMCO	PD-3800	CVD: PECVD
679	SAMCO	PD-4800	CVD: PECVD
680	Sanders	140A	Elec: CI Meter
681	Sanders	150C	Elec: CI Meter
682	Sanders	200VHF	Elec: CI Meter
683	Sansei	AD-8405B	Elec: Phase Meter Adapter
684	Sansei	Inq.	Elec: STD Freq. Distributer
685	Sansei	SCI-308A	Elec: Oscillator
686	Sansei	SF-87B	Elec: Freq. Counter
687	Sansei	SF-65LA	Elec: Freq. Counter
688	Sansei	SDC-1040	Other: Digital comparator
689	Sansei	SS-868E	Other: Universal Crossing Counter
690	Sanseidenshi	SX-5187	Inspection/Temperature /SMD Quartz
691	Sanseidenshi	ABS-28GF	Other: Blank Frequency Sorter
692	Sanseidenshi	AT-24AS	Other: Frequency Sorter
693	Sanseidenshi	AT-24AS	Other: Frequency Sorter
694	SANWA	MI-476	Inspection: Oxide Film Evaluation Tool
695	Sanwa	CD110	Ele: Multi meter
696	Sanwa	CD770	Ele: Multi meter
697	Sanwa	PC510	Ele: Multi meter
698	SANWA	Inq.	Other: TDDB Probe Station
699	SANYU	SC-701C	Other: Carbon Coater
700	Sartorius	CP224S	OTH:electronic balance
701	SCI	FilmTek 1000	MEA:Filmtek
702	SCIENCE PLUS	inq.	PVD:SPUTTER/6in
703	Scitec instruments	300CD	Insp: Optical chopper
704	Scitec instruments	420	Insp: lock-in amplifier
705	SEC	X-EYE 3000A	Inspection machine
706	SEIKO	SAI 9600S	INSPECTION:WAFER
707	Seiko	SEA1000A	Inspection: XRF
708	SEMI TOOL	WSST-608AG	Wet cleaning
709	Semiconductor Diagnostics Inc	FAaST 230-SPV	other: SPV measuring
710	SEMILAB	WT-85	Other: Life time measuring
711	Semitool	Equinox	Wet: GaAs Etch/6in.
712	SEMITOOL	870S	Clean: Spin Dryer/5in
713	SEMITOOL	PSC-101	Clean: Spin Dryer/5in
714	SEMITooL	SST-8	wet: Solvent tool
715	Semitool	Inq.	cle: SRD/ 8in.
716	Semsysco	Triton	DRY:chamber spin etcher + chemical delivery unit
717	Sensofar	Plu 2300	Insp: Optical surface profiler/4in
718	SHAW	MODEL　SHA	meas: Dew point meter
719	Shibaura	CDE-7-4	Dry Etching: CDE
720	Shimadzu	UV-2400	INS:spectrophotometer
721	Shimadzu	MSE-4000	Other: Leak Detector/He
722	SHIMADZU	MST-I	other: Micro Autograph
723	SHIMADZU	SMX-1000	Other: X-Ray system
724	Shimazu	EDX-800HS2	Inspection: EDX
725	SHIMAZU	SMX-100	Inspection: X-ray
726	Shimazu	EHF-FB10KN-10LA	Other: Servo Parsa
727	SHINDAIGO	UV225	OTH:vacuum packaging machine
728	SHINKO SEIKI	AAMF-C2280SPB	PVD: Sputter/5in.
729	SIGMA KOKI	inq	OTH:Auto-rotating stages and controllers
730	Sigma Koki	SGSP20-20+SHOT202	OTH:Autostage+ stage controller
731	SII	SPA465Le	Microscope: AFM
732	SIMCO	FMX-003	Electrostatic tester
733	SJ	KL-120-20DD	Furnace/6in
734	SJ	Lindberg A1200-2	Furnace
735	skSATO	SK-1100/SK-K010	Meas: thermometer
736	skSATO	SK-1250MCⅢ	Meas: thermometer
737	SOFTEX	SFX-90	Inspection:X-RAY
738	Songjaan	Inq.	Cleaner:Wafer/6in.
739	SONOSCAN	P300	Microscope: Scanning Acoustic
740	SONY	Inq.	oth: DD digital photo camera
741	Sony Tektronix	AFG2020	ELE:function generator
742	Speedfam	12B-5L	Lapping
743	Speedfam	24SWM	Lap: Semi-automatic waxing machine
744	SPEEDFAM	24DPAW-T0393	Polisher
745	SPEEDFAM	32BAW	Polisher
746	SPEEDFAM	36DPAW	Polisher
747	Speedfam	36GPAW-TD	Polisher
748	SPEEDFAM	36GPAW	Polishing: Single Side
749	SPEEDFAM	36GPAW	Polishing: Single Side
750	Speedfam	36GPAW-TD	Polishing Machine:Single Side
751	SPEEDFAM	36SWM	Wafer: Semi-waxing machine
752	Spirent	For SMA-2000 Parts	Elec: Parts
753	Spirent	For SMB-2000 Parts	Elec: Module-For ML7710
754	Spirent	For SMB-2000 Parts	Elec: Module-For ML7710
755	Spirent	For SMB-2000 Parts	Elec: Module-For GX1421A
756	SPTS	inq.	INS:APM process module
757	SSC	BPE2708SP	Plating/Gold/8in.
758	STS	Multiple	Dry: ICP
759	Sumitomo	NV-GSD-80	ION implanter
760	Sumitomo	NV-GSD３-90	Ion implant
761	Sunglory	Inq.	Cleaning: Cassette
762	Sunny optical technology	SZ45-ST2	Microscope: General
763	Sunny optical technology	SZ45-ST2	Microscope: General
764	Sunred	SRD-TH-091127	RTP/6in.
765	SUSS	MA100E	Aligner:Automatic MASK(2/3/4/6in)
766	SUSS	MA150E	Aligner/Mask
767	SUSS	MA200CC	Aligner/Mask
768	SUSS	MA-100E	Aligner
769	SUSS	MJB4	Aligner:Manual MASK/4in
770	SUSS MicroTec	GAMMA 4M	Coater/Developer for 6in/Si
771	SVG	860	coa: Developer/5in
772	SVS	MSX1000	Coater/Developer
773	SVS	MSX-1000	Coater/Developer
774	TA Instruments	DSC-Q20	Other: Differential Scanning Calorimeter
775	TA Instruments	DSC-Q10	Other: Differential Scanning Calorimeter
776	Taiwan Zhengen	BW-310FA	Waf: Splitter
777	Takatori	MWS 612-DN	Wire saw
778	Takatori	MWS-610SD	Wire Saw/ Multi
779	Takatori	MWS-610SD	Wire Saw/ Multi
780	Takeda	TR-5142	Elec: Freq. Counter
781	Takeda	TR-5142SN	Elec: Freq. Counter
782	Takeda	TR4120	Other: Tracking Scope
783	Taylor-Hobson	CCI6000	Measure fine shape
784	Taylor-Hobson	PGI-1240A	Measure shape roughness
785	TDK	GEN8-400-D	Other: Programmable Power Supplies/DC
786	TEAMS CORPORATION	ITO Sputter	PVD:Sputter
787	TechnoPro Marugen	MDS606-F	Polisher/Brush
788	TEGAL	6000	DRY:Plasma etcher
789	TEGAL	901e	DRY:Plasma etcher
790	TEKNOLOGUE	LX4670B	Meas: Control Unit
791	Teknologue	ER8940A	Other: Tester
792	TEKSCAN	I-Scan System	other: Pressure Mapping System
793	Tektronix	577	ele: Curve Tracer
794	Tektronix	DS3012B	Elec: Oscilloscope
795	Tektronix	P7225	ELE:active probe
796	Tektronix	TDS 3014B	Elec: Oscilloscope
797	Tektronix	TDS3014	Elec: Oscilloscope
798	Tektronix	TEK576	Elec: Curve Tracer
799	Tektronix	TEK176	Elec: Curve Tracer
800	Tektronix	STC399X-99158-7	Other: GPIB controller
801	TEL	CLEAN TRACK	Coat: wafer edge exclusion track/6in
802	TEL	Mark Vz	coa: Developer
803	TEL	TE_5000S ETO408	Dry Etcher
804	TEL	TE_5000S ETO409	Dry Etcher
805	TEL	TE-8400PE	Dry etcher/5in
806	TEL	TE-5000	Dry etcher/5in
807	TEL	615	FUR:LPCVD/6in
808	TEL	IW-6D	Furnace(O2/N2)
809	TEL	TE5000ATC	Wet Oxide Etcher
810	TEL	MARK Vz	Coater developer
811	TEL	TE8500	Dry: Contact Etch
812	TEL	Unity-85DI	Dry etcher: SiN E/B
813	TEL	ALPHA-8	Furnace: Vertical/8in.
814	TEL	ALPHA-8S	Furnace: Vertical/8in.
815	TEL	ALPHA-8SE	Furnace: Vertical/8in.
816	TEL	FTPS(SiN)	Furnace(FTPS)/8in.
817	TEL	Lithius I	Coat/Develop
818	TEL	Lithius i	Coat and Develop
819	TEL	(Inq.)	Dry Etch
820	TEL	308SCCM	Dry Etch
821	TEL	308SCCM	Dry Etch
822	TEL	Telius SPSCCMII Poly	Dry: Plasma Etching system/12in.
823	TEL	Trais	CVD/12in.
824	TEL	Trias (SFD TIN )	CVD: Chamber/12in
825	TEL	TRIAS	CVD/12in.
826	TEL	Trias	CVD/12in.
827	TEL	Trias (SFD TIN )	CVD/12in.
828	TEL	Trias (SFD TIN )	CVD/12in.
829	TEL	Trias TIN chamber	CVD/12in.
830	TEL	Trias TIN chamber	CVD/12in.
831	TEL	Trias TIN chamber	CVD/12in.
832	TEL	Trias SFD TIN chamber	CVD/12in.
833	TEL	Trias SFD TIN chamber	CVD/12in.
834	TEL	Trias TIN chamber	CVD/12in.
835	TEL-varian	350D	Ion implanter
836	Tempress	TS81254	Furnace/8in
837	Texio	DL-2050	Ele: Multi meter
838	Texio	DL-2051	Ele: Multi meter
839	Texio	LSG-1050	Electronic load device
840	Therma-wave	TP-500	other: Therma probe
841	Thermco	TMX-9000	Furnace: Annealing/5in
842	Thermo Fisher	DX600	Other: Metrology system
843	TOA Elec.	FS-1131	Elec: Synthesizer
844	TOA Elec.	SR-2	Elec: STD Resistor
845	Tok	ASP-LE（N）	Coater/5in
846	Tok	TCE2400	Dry etcher
847	Tok	TCE3822	Dry etcher
848	TOK	TSE-306W	dry: TiN etcher
849	TOK	TSE-306W	dry: TiN etcher
850	Tokyo Cathode	5100	Elec: Probe card inspection
851	Tokyo Cathode	5150	Elec: Probe card inspection
852	Tokyo Cathode	5200	Elec: Probe card inspection
853	Tokyo Electron	U2e-655II	DRY:UNITY-DI
854	Tokyo Electron	MB2-730 BLK-W	CVD:MB2
855	TOKYO OHKA KOGYO	OAPM-SH406	Dry-etcher/6in
856	Tokyo Riko	Riko　slidetrance　RSA-1	ELE:transformer
857	Tokyo Steel	VWS350	Wire Saw
858	TOP	20-A	Other: Thermometer
859	TOPCON CORP.	SM-200	SEM (Scanning Electron Microscope)
860	TOPWARD	1330	Elec: Digital meter
861	TOSHIBA	SK-110	Elec: Voltage Regulator
862	Toshiba itc	TOSMICRON　6130FP	Inspection:X-ray
863	Tropel	FM200	OTH:Flatness measuring
864	TRUE PING TECHNOLOGY	MD-40	Coater: HMDS
865	TSK	W-SL-500	Wire saw 200mm/300mm
866	TSK	W-SL-500	Wire saw 200mm/300mm
867	TSK	EM-21	other: Tester
868	TYSTAR	TYTAN II	Furnace
869	UIC	UIC/UIC30	OTH:Scrubber
870	Ultratech	sapphire 100	Stepper
871	Ultratech	UT1500	Stepper/4in.
872	Ultron	UH-101C	Other: Curing/UV irradiation
873	Ulvac	NE-5700	dry etch: ICP/6in
874	Ulvac	CME-200J	cvd: Plasma CVD System/6in
875	Ulvac	for SIH-450 Sputter	pvd: NiO Target/4in.
876	ULVAC	SRH820	PVD: Sputter
877	ULVAC	SV-9040-T14	PVD: Sputter
878	Ulvac	IDZ8001	ION:Implanter/6in
879	Ulvac	IDZ8000	Ion implant
880	Ulvac	IH-860DSIC	Ion implanter
881	ULVAC	VA2000	Dry Etch/8in.
882	ULVAC	ENTRON W300 EX	PVD/12in.
883	ULVAC	ENTRON	PVD/12in.
884	ULVAC	GI-PRAY	Other: Vacuum Meter
885	Union	NCL-2 KLA-150TX	Mic: Light unit for microscope
886	Union Optical	Excamet	Microscope
887	UNISEM	UN 2000A-FS	oth: Scrubber
888	USHIO	UMA-802-HC551MU	OTH:UV curing/6in
889	USHIO	UMA-802-H6	other: Exposure: UV/5in
890	USHIO	UMA-1002-HC82TT	OTH:UV Cure
891	Varian	120XP	Ion: Implanter(H/C)/5in
892	Varian	120/10	Ion: Implanter(H/C)/5in
893	Varian	200-CF5	Ion: Implanter(M/C)/5in
894	Varian	300Xp	Ion:Implanter/6in
895	Varian	350D	Ion implant /5in
896	Varian	350D	ION:Implanter/5in
897	Varian	350D	ION:Implanter/6in
898	Varian	350D	Ion Implanter
899	Varian	80/10	Ion: Implanter(H/C)/5in
900	Varian	80XP	Ion implanter
901	Varian	E220	Ion implanter
902	Varian	EHP500	ion: Implanter/8in
903	Veeco	K465i	CVD:MOCVD
904	VEECO	D300GaN	CVD: MOCVD
905	Veeco	E300	CVD: MOCVD
906	Veeco	K465	CVD: MOCVD
907	Veeco	K465	CVD: MOCVD
908	Vistec	LDS3300M	Inspection/Defect
909	Vistec	LDS3300M	Inspection: Surface/12in.
910	VJ Electronix	Vertex II Model V90	Inspection system: X-Ray
911	Watkins Johnson	WJ999R	CVD:APCVD/6in
912	Watkins-Johnson	WJ1000T	CVD: APCVD/6in
913	WaveCrest	SIA-3000	Ele: Signal Integrity Analyzer
914	WeiHai	SHK-18A	Polisher/Centerless
915	Werth Messtechnik	Scope Check 200 3D CNC	Insp: 3D-CNC multisensor CMM
916	WESTECH	MRV-Ⅱ-VAS	Aligner
917	World digital	NSZ-405	Microscope: Binocular solid
918	XYZTEC	CONDOR 70	OTH:Wire pull Tester
919	XYZTEC	CONDOR 100	OTH:Wire pull Tester
920	YEW	Inq.	Elec: Voltmeter(DC)
921	YEW	PV-13	Elec: Vacuumtube Voltmeter
922	Yokogawa	4720	DRY:Rainbow
923	Yokogawa	AQ2105	Ins: Multi meter
924	Yokogawa	706012-1-D	Ele: FG120 Function Generator
925	Yokogawa	7544 01	Ele: Multi meter
926	Yokogawa	AX100	Ele: Memory Stick Protocol Analyzer
927	Yokogawa	AX220	Ele: SD card protocol analyzer
928	Yokogawa	4177-100-11	Oth: μR100 RBI recorder
929	Yokogawa	AX220	Oth: SD card protocol analyzer
930	Yokogawa	CM500	Other: Gas monitor
931	YOKOGAWA	UR100	other: Chart Recorder
932	YSC	HTC-2	Other: Thermometer
933	Ysystems	YWAFER Mapper GS2	Meas: PL Mapper/2-4in
934	Yxlon	Cheetah	Inspection:X-RAY
935	Z.C. AUTO	TC-485	other: Ceramic disc appearance inspection
936	ZEISS	A300	INS:Optical Equipment
937	Zyves	KZ100	Other: NANO　probe
938	日本神岡	USC-6（Si3N4）	Furnace
939	日本神岡	USC-6（SIPOS）	Furnace